EP0270968A3 - Roentgen microscope - Google Patents
Roentgen microscope Download PDFInfo
- Publication number
- EP0270968A3 EP0270968A3 EP87117658A EP87117658A EP0270968A3 EP 0270968 A3 EP0270968 A3 EP 0270968A3 EP 87117658 A EP87117658 A EP 87117658A EP 87117658 A EP87117658 A EP 87117658A EP 0270968 A3 EP0270968 A3 EP 0270968A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- roentgen
- microscope
- roentgen microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K7/00—Gamma- or X-ray microscopes
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Microscoopes, Condenser (AREA)
- Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
- Liquid Crystal Substances (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19863642457 DE3642457A1 (en) | 1986-12-12 | 1986-12-12 | ROENTGEN MICROSCOPE |
| DE3642457 | 1986-12-12 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| EP0270968A2 EP0270968A2 (en) | 1988-06-15 |
| EP0270968A3 true EP0270968A3 (en) | 1989-08-02 |
| EP0270968B1 EP0270968B1 (en) | 1993-12-15 |
Family
ID=6316038
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP87117658A Expired - Lifetime EP0270968B1 (en) | 1986-12-12 | 1987-11-28 | Roentgen microscope |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4870674A (en) |
| EP (1) | EP0270968B1 (en) |
| JP (1) | JPH0814640B2 (en) |
| DE (2) | DE3642457A1 (en) |
| DK (1) | DK174016B1 (en) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CH678663A5 (en) * | 1988-06-09 | 1991-10-15 | Zeiss Carl Fa | |
| US5199057A (en) * | 1989-08-09 | 1993-03-30 | Nikon Corporation | Image formation-type soft X-ray microscopic apparatus |
| JP2775949B2 (en) * | 1990-01-10 | 1998-07-16 | 株式会社ニコン | X-ray optical element holding frame |
| US5022061A (en) * | 1990-04-30 | 1991-06-04 | The United States Of America As Represented By The United States Department Of Energy | An image focusing means by using an opaque object to diffract x-rays |
| US5204887A (en) * | 1990-06-01 | 1993-04-20 | Canon Kabushiki Kaisha | X-ray microscope |
| DE4027285A1 (en) * | 1990-08-29 | 1992-03-05 | Zeiss Carl Fa | X-RAY MICROSCOPE |
| US5432607A (en) * | 1993-02-22 | 1995-07-11 | International Business Machines Corporation | Method and apparatus for inspecting patterned thin films using diffracted beam ellipsometry |
| US5432349A (en) * | 1993-03-15 | 1995-07-11 | The United State Of America As Represented By The Secretary Of The Navy | Fourier transform microscope for x-ray and/or gamma-ray imaging |
| JP3703483B2 (en) * | 1993-09-15 | 2005-10-05 | カール−ツァイス−スチフツング | Phase contrast-X-ray microscope |
| JP3741411B2 (en) * | 1999-10-01 | 2006-02-01 | 株式会社リガク | X-ray focusing apparatus and X-ray apparatus |
| CN1280835C (en) * | 2002-03-05 | 2006-10-18 | 姆拉丁·阿布比奇罗维奇·库马科夫 | X-ray microscope |
| US7245696B2 (en) * | 2002-05-29 | 2007-07-17 | Xradia, Inc. | Element-specific X-ray fluorescence microscope and method of operation |
| US7365909B2 (en) * | 2002-10-17 | 2008-04-29 | Xradia, Inc. | Fabrication methods for micro compounds optics |
| US7119953B2 (en) * | 2002-12-27 | 2006-10-10 | Xradia, Inc. | Phase contrast microscope for short wavelength radiation and imaging method |
| DE10352741B4 (en) * | 2003-11-12 | 2012-08-16 | Austriamicrosystems Ag | Radiation-detecting optoelectronic component, process for its production and use |
| WO2005094318A2 (en) * | 2004-03-29 | 2005-10-13 | Jmar Research, Inc. | Morphology and spectroscopy of nanoscale regions using x-rays generated by laser produced plasma |
| GB0409572D0 (en) * | 2004-04-29 | 2004-06-02 | Univ Sheffield | High resolution imaging |
| US7302043B2 (en) * | 2004-07-27 | 2007-11-27 | Gatan, Inc. | Rotating shutter for laser-produced plasma debris mitigation |
| US7452820B2 (en) * | 2004-08-05 | 2008-11-18 | Gatan, Inc. | Radiation-resistant zone plates and method of manufacturing thereof |
| US7466796B2 (en) * | 2004-08-05 | 2008-12-16 | Gatan, Inc. | Condenser zone plate illumination for point X-ray sources |
| US8001862B2 (en) * | 2007-11-20 | 2011-08-23 | Harley-Davidson Motor Company Group, Inc. | Reverse drive assembly for a motorcycle |
| WO2010109368A1 (en) * | 2009-03-27 | 2010-09-30 | Koninklijke Philips Electronics N.V. | Differential phase-contrast imaging with circular gratings |
| US9291578B2 (en) | 2012-08-03 | 2016-03-22 | David L. Adler | X-ray photoemission microscope for integrated devices |
| US9129715B2 (en) | 2012-09-05 | 2015-09-08 | SVXR, Inc. | High speed x-ray inspection microscope |
| JP2022069273A (en) * | 2020-10-23 | 2022-05-11 | 株式会社リガク | Image forming type x-ray microscope |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4105289A (en) * | 1976-04-29 | 1978-08-08 | University Patents, Inc. | Apparatus and method for image sampling |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS49300A (en) * | 1972-03-15 | 1974-01-05 | ||
| JPS6049300A (en) * | 1983-08-29 | 1985-03-18 | 日本電子株式会社 | X-ray microscope |
-
1986
- 1986-12-12 DE DE19863642457 patent/DE3642457A1/en not_active Withdrawn
-
1987
- 1987-11-28 EP EP87117658A patent/EP0270968B1/en not_active Expired - Lifetime
- 1987-11-28 DE DE87117658T patent/DE3788508D1/en not_active Expired - Fee Related
- 1987-12-08 JP JP62308806A patent/JPH0814640B2/en not_active Expired - Fee Related
- 1987-12-09 US US07/130,755 patent/US4870674A/en not_active Expired - Lifetime
- 1987-12-11 DK DK198706522A patent/DK174016B1/en not_active IP Right Cessation
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4105289A (en) * | 1976-04-29 | 1978-08-08 | University Patents, Inc. | Apparatus and method for image sampling |
Non-Patent Citations (2)
| Title |
|---|
| JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, Band 64, Nr. 3, März 1974, Seiten 301-309, New York, US; J. KIRZ: "Phase zone plates for X rays and the extreme UV" * |
| NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, Sektion A, Band A246, Nr. 1/3, Mai 1986, Seiten 698-701, Elsevier Science Publishers B.V., Amsterdam, NL; X.-S. XIE et al.: "Soft X-ray microscopy at the hefei synchrotron radiation laboratory" * |
Also Published As
| Publication number | Publication date |
|---|---|
| DK174016B1 (en) | 2002-04-15 |
| DE3642457A1 (en) | 1988-06-30 |
| JPH0814640B2 (en) | 1996-02-14 |
| EP0270968A2 (en) | 1988-06-15 |
| US4870674A (en) | 1989-09-26 |
| EP0270968B1 (en) | 1993-12-15 |
| DE3788508D1 (en) | 1994-01-27 |
| JPS63163300A (en) | 1988-07-06 |
| DK652287D0 (en) | 1987-12-11 |
| DK652287A (en) | 1988-06-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0270968A3 (en) | Roentgen microscope | |
| GB8508090D0 (en) | Microscope | |
| EP0169387A3 (en) | Microscope | |
| GB8422109D0 (en) | Surgical microscope | |
| GB8622976D0 (en) | Scanning electron microscopes | |
| DE3760288D1 (en) | Stereo microscope | |
| EP0245089A3 (en) | Microscope | |
| GB2193859B (en) | Microscopes | |
| GB9017725D0 (en) | Microscope | |
| GB2187905B (en) | Microscope turret | |
| GB8415709D0 (en) | Scanning microscope | |
| GB8625611D0 (en) | Microscope | |
| GB8712020D0 (en) | Microscopes | |
| GB8512045D0 (en) | Scanning microscope | |
| GB8724115D0 (en) | First & second screw-threaded elements | |
| GB8720398D0 (en) | Polyfluoroaldehydes & polyfluoroacetals | |
| PT80407A (en) | Microscope | |
| PT80457A (en) | Microscope | |
| GB8816162D0 (en) | Simple microscopes | |
| GB2194115B (en) | Microscopy | |
| GB2212943B (en) | Microscopes | |
| GB8604546D0 (en) | Beam | |
| GB8625122D0 (en) | Beam | |
| GB8605963D0 (en) | Scanning microscopes | |
| GB8630524D0 (en) | Microscope |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
| AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): BE CH DE FR GB IT LI NL SE |
|
| PUAL | Search report despatched |
Free format text: ORIGINAL CODE: 0009013 |
|
| AK | Designated contracting states |
Kind code of ref document: A3 Designated state(s): BE CH DE FR GB IT LI NL SE |
|
| 17P | Request for examination filed |
Effective date: 19900201 |
|
| 17Q | First examination report despatched |
Effective date: 19911106 |
|
| ITF | It: translation for a ep patent filed |
Owner name: DE DOMINICIS & MAYER S. |
|
| GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
| AK | Designated contracting states |
Kind code of ref document: B1 Designated state(s): BE CH DE FR GB IT LI NL SE |
|
| REF | Corresponds to: |
Ref document number: 3788508 Country of ref document: DE Date of ref document: 19940127 |
|
| GBT | Gb: translation of ep patent filed (gb section 77(6)(a)/1977) |
Effective date: 19940124 |
|
| ET | Fr: translation filed | ||
| PLBE | No opposition filed within time limit |
Free format text: ORIGINAL CODE: 0009261 |
|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT |
|
| 26N | No opposition filed | ||
| EAL | Se: european patent in force in sweden |
Ref document number: 87117658.2 |
|
| REG | Reference to a national code |
Ref country code: GB Ref legal event code: IF02 |
|
| PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: CH Payment date: 20021017 Year of fee payment: 16 |
|
| PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: SE Payment date: 20021028 Year of fee payment: 16 |
|
| PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: GB Payment date: 20021030 Year of fee payment: 16 |
|
| PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: FR Payment date: 20021104 Year of fee payment: 16 |
|
| PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: DE Payment date: 20021111 Year of fee payment: 16 |
|
| PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: NL Payment date: 20021114 Year of fee payment: 16 |
|
| PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: GB Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20031128 |
|
| PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: SE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20031129 |
|
| PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: LI Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20031130 Ref country code: CH Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20031130 |
|
| PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: BE Payment date: 20031209 Year of fee payment: 17 |
|
| PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: NL Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20040601 |
|
| PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: DE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20040602 |
|
| EUG | Se: european patent has lapsed | ||
| REG | Reference to a national code |
Ref country code: CH Ref legal event code: PL |
|
| GBPC | Gb: european patent ceased through non-payment of renewal fee |
Effective date: 20031128 |
|
| PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: FR Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20040730 |
|
| NLV4 | Nl: lapsed or anulled due to non-payment of the annual fee |
Effective date: 20040601 |
|
| REG | Reference to a national code |
Ref country code: FR Ref legal event code: ST |
|
| PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: BE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20041130 |
|
| BERE | Be: lapsed |
Owner name: FIRMA CARL *ZEISS Effective date: 20041130 |
|
| PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: IT Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES;WARNING: LAPSES OF ITALIAN PATENTS WITH EFFECTIVE DATE BEFORE 2007 MAY HAVE OCCURRED AT ANY TIME BEFORE 2007. THE CORRECT EFFECTIVE DATE MAY BE DIFFERENT FROM THE ONE RECORDED. Effective date: 20051128 |
|
| BERE | Be: lapsed |
Owner name: FIRMA CARL *ZEISS Effective date: 20041130 |