EA201290828A1 - DEVICE AND METHOD OF PARTICLE CONTROL - Google Patents
DEVICE AND METHOD OF PARTICLE CONTROLInfo
- Publication number
- EA201290828A1 EA201290828A1 EA201290828A EA201290828A EA201290828A1 EA 201290828 A1 EA201290828 A1 EA 201290828A1 EA 201290828 A EA201290828 A EA 201290828A EA 201290828 A EA201290828 A EA 201290828A EA 201290828 A1 EA201290828 A1 EA 201290828A1
- Authority
- EA
- Eurasian Patent Office
- Prior art keywords
- channel
- space
- particle control
- flow
- particles
- Prior art date
Links
- 239000002245 particle Substances 0.000 title abstract 4
- 238000000034 method Methods 0.000 title abstract 2
- 230000003213 activating effect Effects 0.000 abstract 1
- 238000012544 monitoring process Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/2247—Sampling from a flowing stream of gas
- G01N1/2252—Sampling from a flowing stream of gas in a vehicle exhaust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
- G01N15/0656—Investigating concentration of particle suspensions using electric, e.g. electrostatic methods or magnetic methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/24—Suction devices
- G01N2001/242—Injectors or ejectors
- G01N2001/244—Injectors or ejectors using critical flow orifices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
- Y02T10/00—Road transport of goods or passengers
- Y02T10/10—Internal combustion engine [ICE] based vehicles
- Y02T10/12—Improving ICE efficiencies
Landscapes
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Immunology (AREA)
- Dispersion Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Biomedical Technology (AREA)
- Molecular Biology (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Sampling And Sample Adjustment (AREA)
- Devices And Processes Conducted In The Presence Of Fluids And Solid Particles (AREA)
Abstract
Устройство для контроля частиц в канале или пространстве, содержащее средство для включения потока устройства при заданной температуре. Способ измерения мелких частиц в канале или пространстве с устройством, в которое затекает по меньшей мере часть частиц в канале или пространстве, причем поток в устройство включается при заданной температуре.A device for monitoring particles in a channel or space, comprising means for activating the flow of the device at a given temperature. A method of measuring small particles in a channel or space with a device into which at least a part of the particles flow in a channel or space, with the flow entering the device at a given temperature.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20100093U FIU20100093U0 (en) | 2010-02-25 | 2010-02-25 | Measuring instruments for particle measurement |
PCT/FI2011/000011 WO2011104425A1 (en) | 2010-02-25 | 2011-02-24 | Apparatus and method for monitoring particles |
Publications (2)
Publication Number | Publication Date |
---|---|
EA201290828A1 true EA201290828A1 (en) | 2013-02-28 |
EA024372B1 EA024372B1 (en) | 2016-09-30 |
Family
ID=41727791
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EA201290828A EA024372B1 (en) | 2010-02-25 | 2011-02-24 | Apparatus and method for monitoring fine particles in aerosol |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP2539685A4 (en) |
CN (1) | CN102792142B (en) |
EA (1) | EA024372B1 (en) |
FI (1) | FIU20100093U0 (en) |
WO (1) | WO2011104425A1 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6138652B2 (en) * | 2013-10-01 | 2017-05-31 | 日本特殊陶業株式会社 | Fine particle measurement system |
AT513791B1 (en) * | 2014-04-25 | 2016-05-15 | Avl List Gmbh | Particle measuring device and a method for operating the particle measuring device |
DE102014211533A1 (en) * | 2014-06-17 | 2015-12-17 | Robert Bosch Gmbh | Method for operating a particle sensor |
JP2016223960A (en) * | 2015-06-02 | 2016-12-28 | 日本特殊陶業株式会社 | Fine particle sensor |
US10859485B2 (en) * | 2015-06-05 | 2020-12-08 | Koninklijke Philips N.V. | Particle sensor and sensing method |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3986386A (en) * | 1974-04-12 | 1976-10-19 | Exxon Research And Engineering Company | Particulate sampling system |
US4441356A (en) * | 1982-03-29 | 1984-04-10 | The Babcock & Wilcox Company | Temperature actuated air flow control and gas sampler |
US4998433A (en) * | 1989-06-19 | 1991-03-12 | Stumpf David K | Method and means for condensing trace air contaminates from gases |
US5922976A (en) * | 1995-10-12 | 1999-07-13 | California Institute Of Technology | Method of measuring aerosol particles using automated mobility-classified aerosol detector |
DE10143075C2 (en) * | 2001-09-03 | 2003-07-24 | Infineon Technologies Ag | Particle measuring device arrangement and device for processing semiconductor wafers with such an arrangement |
JP4128958B2 (en) * | 2002-01-22 | 2008-07-30 | プラクスエア・テクノロジー・インコーポレイテッド | Method for analyzing impurities in carbon dioxide |
DE10331643B4 (en) * | 2003-07-08 | 2005-08-04 | NOVA-MBB Meßtechnik GmbH & Co.KG | Device and method for detecting particles contained in internal combustion engine exhaust gases |
SE528313C2 (en) * | 2004-09-24 | 2006-10-17 | Spectronic Ab | Method and apparatus for separating particles using ultrasonic waves |
WO2006127803A2 (en) * | 2005-05-23 | 2006-11-30 | Tsi Incorporated | Instruments for measuring nanoparticle exposure |
KR100895542B1 (en) * | 2007-07-05 | 2009-05-06 | 안강호 | Condensation particle counter |
FI20080182A0 (en) | 2008-03-04 | 2008-03-04 | Navaro 245 Oy | Measurement method and apparatus |
WO2011033603A1 (en) * | 2009-09-15 | 2011-03-24 | イビデン株式会社 | Particulate matter sensor and exhaust gas purification device |
-
2010
- 2010-02-25 FI FI20100093U patent/FIU20100093U0/en not_active Application Discontinuation
-
2011
- 2011-02-24 EA EA201290828A patent/EA024372B1/en not_active IP Right Cessation
- 2011-02-24 CN CN201180010972.3A patent/CN102792142B/en not_active Expired - Fee Related
- 2011-02-24 EP EP11746909.8A patent/EP2539685A4/en not_active Withdrawn
- 2011-02-24 WO PCT/FI2011/000011 patent/WO2011104425A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
EA024372B1 (en) | 2016-09-30 |
CN102792142B (en) | 2015-09-23 |
CN102792142A (en) | 2012-11-21 |
EP2539685A1 (en) | 2013-01-02 |
WO2011104425A1 (en) | 2011-09-01 |
FIU20100093U0 (en) | 2010-02-25 |
EP2539685A4 (en) | 2018-01-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Lapse of a eurasian patent due to non-payment of renewal fees within the time limit in the following designated state(s) |
Designated state(s): AM AZ KZ KG MD TJ TM |
|
MM4A | Lapse of a eurasian patent due to non-payment of renewal fees within the time limit in the following designated state(s) |
Designated state(s): BY RU |