DK0502005T3 - Optisk scanning-mikroskop med fasemåling - Google Patents
Optisk scanning-mikroskop med fasemålingInfo
- Publication number
- DK0502005T3 DK0502005T3 DK90916789.2T DK90916789T DK0502005T3 DK 0502005 T3 DK0502005 T3 DK 0502005T3 DK 90916789 T DK90916789 T DK 90916789T DK 0502005 T3 DK0502005 T3 DK 0502005T3
- Authority
- DK
- Denmark
- Prior art keywords
- image
- phase measurement
- optical scanning
- scanning microscope
- light
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/46—Systems using spatial filters
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/50—Optics for phase object visualisation
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Microscoopes, Condenser (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB898926435A GB8926435D0 (en) | 1989-11-22 | 1989-11-22 | Phase measuring scanning optical microscope |
Publications (1)
Publication Number | Publication Date |
---|---|
DK0502005T3 true DK0502005T3 (da) | 1995-11-06 |
Family
ID=10666744
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DK90916789.2T DK0502005T3 (da) | 1989-11-22 | 1990-11-20 | Optisk scanning-mikroskop med fasemåling |
Country Status (10)
Country | Link |
---|---|
EP (1) | EP0502005B1 (da) |
JP (1) | JPH05501617A (da) |
AT (1) | ATE127594T1 (da) |
CA (1) | CA2077754A1 (da) |
DE (1) | DE69022243T2 (da) |
DK (1) | DK0502005T3 (da) |
ES (1) | ES2077081T3 (da) |
GB (2) | GB8926435D0 (da) |
GR (1) | GR3018072T3 (da) |
WO (1) | WO1991007682A1 (da) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4429416A1 (de) * | 1994-08-19 | 1996-02-22 | Velzel Christiaan H F | Verfahren und Interferenzmikroskop zum Mikroskopieren eines Objektes zur Erzielung einer Auflösung jenseits der Beugungsgrenze (Superauflösung) |
US5969855A (en) * | 1995-10-13 | 1999-10-19 | Olympus Optical Co., Ltd. | Microscope apparatus |
DE19908883A1 (de) * | 1999-03-02 | 2000-09-07 | Rainer Heintzmann | Verfahren zur Erhöhung der Auflösung optischer Abbildung |
US7057806B2 (en) | 2003-05-09 | 2006-06-06 | 3M Innovative Properties Company | Scanning laser microscope with wavefront sensor |
DE102007009661A1 (de) * | 2006-08-31 | 2008-03-13 | Carl Zeiss Sms Gmbh | Verfahren und Vorrichtung zur ortsaufgelösten Bestimmung der Phase und Amplitude des elektromagnetischen Feldes in der Bildebene einer Abbildung eines Objektes |
DE102013226932A1 (de) * | 2013-12-20 | 2015-06-25 | Carl Zeiss Ag | Verfahren zur Ermittlung der Phasenverteilung |
DE102019120668A1 (de) * | 2019-07-31 | 2021-02-04 | Leica Camera Aktiengesellschaft | Sensoreinheit |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL8702071A (nl) * | 1987-09-03 | 1989-04-03 | Philips Nv | Inrichting voor het puntsgewijs aftasten van een voorwerp. |
-
1989
- 1989-11-22 GB GB898926435A patent/GB8926435D0/en active Pending
-
1990
- 1990-11-20 CA CA002077754A patent/CA2077754A1/en not_active Abandoned
- 1990-11-20 JP JP2515432A patent/JPH05501617A/ja active Pending
- 1990-11-20 ES ES90916789T patent/ES2077081T3/es not_active Expired - Lifetime
- 1990-11-20 EP EP90916789A patent/EP0502005B1/en not_active Expired - Lifetime
- 1990-11-20 WO PCT/GB1990/001785 patent/WO1991007682A1/en active IP Right Grant
- 1990-11-20 DE DE69022243T patent/DE69022243T2/de not_active Expired - Fee Related
- 1990-11-20 AT AT90916789T patent/ATE127594T1/de not_active IP Right Cessation
- 1990-11-20 DK DK90916789.2T patent/DK0502005T3/da active
-
1992
- 1992-05-01 GB GB9209554A patent/GB2253762B/en not_active Revoked
-
1995
- 1995-11-13 GR GR950403184T patent/GR3018072T3/el unknown
Also Published As
Publication number | Publication date |
---|---|
EP0502005A1 (en) | 1992-09-09 |
DE69022243T2 (de) | 1996-07-25 |
EP0502005B1 (en) | 1995-09-06 |
GR3018072T3 (en) | 1996-02-29 |
ATE127594T1 (de) | 1995-09-15 |
GB8926435D0 (en) | 1990-01-10 |
WO1991007682A1 (en) | 1991-05-30 |
ES2077081T3 (es) | 1995-11-16 |
GB2253762A (en) | 1992-09-16 |
DE69022243D1 (de) | 1995-10-12 |
GB2253762B (en) | 1994-09-21 |
CA2077754A1 (en) | 1991-05-23 |
GB9209554D0 (en) | 1992-07-01 |
JPH05501617A (ja) | 1993-03-25 |
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