DE922866C - Arrangement for X-ray examination of elongated structures, e.g. B. Cable, in a continuous process - Google Patents

Arrangement for X-ray examination of elongated structures, e.g. B. Cable, in a continuous process

Info

Publication number
DE922866C
DE922866C DES27961A DES0027961A DE922866C DE 922866 C DE922866 C DE 922866C DE S27961 A DES27961 A DE S27961A DE S0027961 A DES0027961 A DE S0027961A DE 922866 C DE922866 C DE 922866C
Authority
DE
Germany
Prior art keywords
cable
arrangement
return
outward
continuous process
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DES27961A
Other languages
German (de)
Inventor
Helmut Kausche
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Reiniger Werke AG
Original Assignee
Siemens Reiniger Werke AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Reiniger Werke AG filed Critical Siemens Reiniger Werke AG
Priority to DES27961A priority Critical patent/DE922866C/en
Application granted granted Critical
Publication of DE922866C publication Critical patent/DE922866C/en
Expired legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18Investigating the presence of flaws defects or foreign matter
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

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  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Description

Es ist in der Materialprüfungstechnik bekannt, Prüflinge nacheinander in verschiedenen Proj ektionsrichtungen mit Röntgenstrahlen in der Weise zu durchleuchten, daß die Prüflinge mittels eines Transportbandes durch den Strahlenkegel einer Röntgenröhre geführt und während dieser Bewegung durch - einen Greifer in verschiedene Lagen gebracht werden. It is known in materials testing technology to test specimens one after the other x-rays in different projection directions in such a way that that the test specimens by means of a conveyor belt through the beam cone of an X-ray tube guided and during this movement by - a gripper in different positions to be brought.

Eine derartige Greiferanordnung läßt sich auf eine Vorrichtung zur Röntgendurchleuchtung langgestreckter Gebilde, z. B. Kabel, nach dem Durchlaufverfahren nicht übertragen. Erfindungsgemäß erreicht man in diesem Fall eine Durchleuchtung in verschiedenen Projektionsrichtungen in der Weise, daß man durch eine oder mehrere Rollen od. dgl. einen derartigen Hin- und Rücklauf des Gebildes am Untersuchungsort zur gesonderten Darstellung von je einem Durchleuchtungsbild von Hin- und Rücklauf bewirkt, daß am Untersuchungsort ein Querschnitt durch das Gebilde im Hinlauf ein Spiegelbild desselben Querschnittes im Rücklauf ist, wobei die Spiegeibildachse einen Winkel zwischen o und go0 mit der Richtung der Röntgenstrahlen bildet. Such a gripper arrangement can be applied to a device X-ray fluoroscopy of elongated structures, e.g. B. Cable, according to the continuous process not transferred. According to the invention, fluoroscopy is achieved in this case in different projection directions in such a way that one or more Rolls or the like such a back and forth movement of the structure at the examination site for the separate display of one fluoroscopic image each of the outward and return lines causes a cross section through the structure in the outward direction at the examination site The mirror image of the same cross-section is in the return, with the mirror image axis forms an angle between o and go0 with the direction of the X-rays.

Zur Veranschaulichung der Erfindung an einem besonders einfachen Ausführungsbeispiei dienen die Fig. I und 2. Einlauf H und Rücklauf K des Kabels werden über die Rolle R zwischen dem Leuchtschirm L und der senkrecht auf ihn strahlenden Röntgenstrahlenquelle S geführt. To illustrate the invention using a particularly simple one Exemplary embodiments are shown in FIGS. I and 2. Inlet H and return K of the cable are via the role R between the fluorescent screen L and the one radiating perpendicular to it X-ray source S out.

Fig. I stellt eine Aufsicht, Fig. 2 eine Seitenansicht aus der Blickrichtung B dar, wobei Leuchtschirm und Röntgenröhre im Vordergrund liegen, während die Rolle weiter zurückliegt. FIG. 1 shows a plan view, FIG. 2 shows a side view from the viewing direction B, with the fluorescent screen and X-ray tube in the foreground, while the role further back.

Bildet die Rollenebene einen Winkel 0 (in Fig. 2 450) mit der Leuchtschirmebene, wobei die Schnittgerade der beiden Ebenen parallel zu Hin- und Rücklauf des Kabels ist, und liegt im Querschnitt Q1 des HinlaufesH der PfeilP, der eine im Mittellängsschnitt des Kabels liegende röntgenstrahlenabsorbierende Struktur sei, inRichtung des Zentralstrahles, so steht er im Rücklauf K im Querschnitt Q2 um 2 <p ? (in Fig. 2 um 900) geneigt dazu. Im Rücklauf wird die Fehlerstelle F durch die Struktur verdeckt, während sie im Hinlauf zur Abbildung frei liegt. Wie aus Fig. 2 zu entnehmen ist, sind die Querschnitte von Hin- und Rücklauf Spiegelbilder in bezug auf die Rollenachse A, woraus sich die Verdoppelung des Winkels zwischen den Pfeilrichtungen gegenüber dem Winkel zwischen Achse und Pfeilrichtung ergibt. If the roller plane forms an angle 0 (in Fig. 2 450) with the screen plane, where the line of intersection of the two planes is parallel to the outward and return of the cable is, and lies in the cross-section Q1 of the trail H the arrow P, the one in the central longitudinal section The X-ray absorbing structure of the cable is, in the direction of the central ray, so it is in return K in cross section Q2 by 2 <p? (in Fig. 2 by 900) inclined to. In the return, the fault location F is covered by the structure, while it is exposed in the run-up to the figure. As can be seen from Fig. 2, the cross-sections are of back and forth mirror images with respect to the roller axis A, from which the doubling of the angle between the arrow directions compared to the angle between Axis and arrow direction results.

Claims (2)

PATENTANSPRUcHE: I. Anordnung zur Röntgenuntersuchung langgestreckter Gebilde, z. B. Kabel, im Durchlaufverfahren, dadurch gekennzeichnet, daß eine oder mehrere Rollen od. dgl. vorgesehen sind, die einen derartigen Hin- und Rücklauf des Gebildes am Untersuchungsort zur gesonderten Darstellung von je einem Durchleuchtungsbild von Hin- und Rücklauf bewirken, daß amUntersuchungsort ein Querschnitt durch das Gebilde im Hinlauf ein Spiegelbild desselben Querschnittes im Rücklauf ist, wobei die Spiegelbildachse einen Winkel zwischen o und go0 mit der Richtung der Röntgenstrahlen bildet. PATENT CLAIMS: I. Arrangement for X-ray examination of elongated Structure, e.g. B. cable, in a continuous process, characterized in that one or several roles od. Like. Are provided that such a back and forth of the structure at the examination site for the separate display of one fluoroscopic image each of the outward and return lines cause a cross-section through the Formation in the outward flow is a mirror image of the same cross-section in the return flow, with the mirror image axis forms an angle between o and go0 with the direction of the X-rays forms. 2. Anordnung nach Anspruch I, dadurch gekennzeichnet, daß eine Rolle außerhalb des Röntgenstrahlenkegels vorgesehen ist, deren Ebene mit der Leuchtschirmebene einen Winkel zwischen o und go0 bildet, wobei die Schnittgerade der Ebenen parallel zum Hin- und Rücklauf des Kabels liegt. 2. Arrangement according to claim I, characterized in that a role is provided outside the X-ray cone, the plane of which with the screen plane forms an angle between o and go0, the line of intersection of the planes being parallel to the outward and return of the cable. Angezogene Druckschriften: Deutsche Patentschrift Nr. 744944. Referenced publications: German patent specification No. 744944.
DES27961A 1952-04-04 1952-04-04 Arrangement for X-ray examination of elongated structures, e.g. B. Cable, in a continuous process Expired DE922866C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DES27961A DE922866C (en) 1952-04-04 1952-04-04 Arrangement for X-ray examination of elongated structures, e.g. B. Cable, in a continuous process

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES27961A DE922866C (en) 1952-04-04 1952-04-04 Arrangement for X-ray examination of elongated structures, e.g. B. Cable, in a continuous process

Publications (1)

Publication Number Publication Date
DE922866C true DE922866C (en) 1955-01-27

Family

ID=7479283

Family Applications (1)

Application Number Title Priority Date Filing Date
DES27961A Expired DE922866C (en) 1952-04-04 1952-04-04 Arrangement for X-ray examination of elongated structures, e.g. B. Cable, in a continuous process

Country Status (1)

Country Link
DE (1) DE922866C (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE744944C (en) * 1939-05-23 1944-01-31 Koch & Sterzel Ag Device for the non-destructive examination of materials or finished or semi-finished products with X-rays

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE744944C (en) * 1939-05-23 1944-01-31 Koch & Sterzel Ag Device for the non-destructive examination of materials or finished or semi-finished products with X-rays

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