DE69719784D1 - Vorrichtung und verfahren zur markierung von defekten - Google Patents

Vorrichtung und verfahren zur markierung von defekten

Info

Publication number: DE69719784D1
Authority: DE; Germany
Prior art keywords: marking; marking device; device marking
Prior art date: 1996-11-13
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Revoked

Application number

DE69719784T

Other languages

English (en)

Other versions

DE69719784T2 (de

Inventor

Svante Bjoerk

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

SVANTE BJOERK KUNGSBACKA AB

Original Assignee

SVANTE BJOERK KUNGSBACKA AB

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1996-11-13

Filing date

1997-11-11

Publication date

2003-04-17

Family has litigation

First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=20404574&utm_source=***_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE69719784(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.

1997-11-11 Application filed by SVANTE BJOERK KUNGSBACKA AB filed Critical SVANTE BJOERK KUNGSBACKA AB

2003-04-17 Publication of DE69719784D1 publication Critical patent/DE69719784D1/de

2003-12-24 Application granted granted Critical

2003-12-24 Publication of DE69719784T2 publication Critical patent/DE69719784T2/de

2017-11-12 Anticipated expiration legal-status Critical

Status Revoked legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

Engineering & Computer Science (AREA)
Textile Engineering (AREA)
Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

DE69719784T 1996-11-13 1997-11-11 Vorrichtung und verfahren zur markierung von defekten Revoked DE69719784T2 (de)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
SE9604131A SE511822C2 (sv)	1996-11-13	1996-11-13	Anordning och metod för att markera defekter på en transparent remsa
PCT/SE1997/001880 WO1998021568A1 (en)	1996-11-13	1997-11-11	Arrangement and method for marking defects

Publications (2)

Publication Number	Publication Date
DE69719784D1 true DE69719784D1 (de)	2003-04-17
DE69719784T2 DE69719784T2 (de)	2003-12-24

Family

ID=20404574

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE69719784T Revoked DE69719784T2 (de)	1996-11-13	1997-11-11	Vorrichtung und verfahren zur markierung von defekten

Country Status (6)

Country	Link
US (1)	US6295129B1 (de)
EP (1)	EP0938664B1 (de)
JP (1)	JP2001504225A (de)
DE (1)	DE69719784T2 (de)
SE (1)	SE511822C2 (de)
WO (1)	WO1998021568A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US6674523B2 (en) *	2000-07-27	2004-01-06	Canon Kabushiki Kaisha	Pre-viewing inspection method for article and device therefor
US7171033B2 (en) *	2001-03-28	2007-01-30	The Boeing Company	System and method for identifying defects in a composite structure
SE0101374L (sv)	2001-04-19	2002-10-20	Svante Bjoerk Ab	Förfarande och anordning för optisk avsyning
GB0207874D0 (en) *	2002-04-05	2002-05-15	Pelcombe Ltd	Web marking systems and methods
JP2007517232A (ja) *	2003-12-31	2007-06-28	スリーエムイノベイティブプロパティズカンパニー	ウェブに基づく物品の歩留まりの最大化
US7623699B2 (en)	2004-04-19	2009-11-24	3M Innovative Properties Company	Apparatus and method for the automated marking of defects on webs of material
US20060090319A1 (en) *	2004-11-01	2006-05-04	Howe Major K	Defect locating system for moving web
US8158210B2 (en) *	2005-10-28	2012-04-17	The Boeing Company	Systems and methods for tape flaw and splice avoidance in manufacturing
US20120247643A1 (en) *	2005-10-28	2012-10-04	The Boeing Company	Tape flaw and splice avoidance
US7542821B2 (en) *	2007-07-26	2009-06-02	3M Innovative Properties Company	Multi-unit process spatial synchronization of image inspection systems
US8175739B2 (en) *	2007-07-26	2012-05-08	3M Innovative Properties Company	Multi-unit process spatial synchronization
US20090028417A1 (en) *	2007-07-26	2009-01-29	3M Innovative Properties Company	Fiducial marking for multi-unit process spatial synchronization
US7797133B2 (en) *	2008-09-10	2010-09-14	3M Innovative Properties Company	Multi-roller registered repeat defect detection of a web process line
TWI411557B (zh) *	2010-11-26	2013-10-11	Primax Electronics Ltd	標籤列印裝置
DE102020202096B3 (de) *	2020-02-19	2021-05-27	Greenerity Gmbh	Verfahren und Vorrichtung zur Markierung eines Defekts in einer funktionalen Schicht einer Brennstoffzelle, einer Elektrolysezelle oder einer elektrochemischen Sensoranwendung

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
GB1077561A (en) *	1964-02-18	1967-08-02	Omron Tateisi Electronics Co	System of detecting and marking defects in a moving web
US3989387A (en)	1971-09-24	1976-11-02	Saint-Gobain Industries	Method and apparatus for detecting optical defects in transparent sheets
US4038544A (en)	1976-05-03	1977-07-26	Xerox Corporation	Apparatus and method for developing an electrostatic latent image
FR2500630A1 (fr) *	1981-02-25	1982-08-27	Leser Jacques	Procede pour la recherche des defauts des feuilles de verre et dispositif mettant en oeuvre ce procede
JPS5974040A (ja) *	1982-10-08	1984-04-26	大日本印刷株式会社	ラベル貼付方法及び装置
DE3325125C1 (de)	1983-07-12	1985-02-14	Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch	Anordnung zur Markierung von Fehlstellen an schnell laufenden Materialbahnen
DE3629004A1 (de) *	1986-08-27	1988-03-10	Agie Ag Ind Elektronik	Stromzufuehrung fuer eine drahtelektrode einer elektroerosionsmaschine
US4865872A (en) *	1987-02-17	1989-09-12	Enamel Products & Plating Company	Strip inspecting apparatus and associated method
US4817424A (en) *	1987-02-17	1989-04-04	Enamel Products & Planting Company	Strip inspecting apparatus and associated method

1996
- 1996-11-13 SE SE9604131A patent/SE511822C2/sv not_active IP Right Cessation
1997
- 1997-11-11 JP JP52247098A patent/JP2001504225A/ja active Pending
- 1997-11-11 WO PCT/SE1997/001880 patent/WO1998021568A1/en active IP Right Grant
- 1997-11-11 US US09/284,612 patent/US6295129B1/en not_active Expired - Fee Related
- 1997-11-11 DE DE69719784T patent/DE69719784T2/de not_active Revoked
- 1997-11-11 EP EP97913600A patent/EP0938664B1/de not_active Revoked

Also Published As

Publication number	Publication date
WO1998021568A1 (en)	1998-05-22
EP0938664B1 (de)	2003-03-12
SE511822C2 (sv)	1999-11-29
EP0938664A1 (de)	1999-09-01
JP2001504225A (ja)	2001-03-27
US6295129B1 (en)	2001-09-25
SE9604131D0 (sv)	1996-11-13
SE9604131L (sv)	1998-05-15
DE69719784T2 (de)	2003-12-24

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Legal Events

Date	Code	Title	Description
2004-02-26	8363	Opposition against the patent
2010-05-27	8331	Complete revocation