DE69410685D1 - Hochauflösendes Strahlungsabbildungssystem - Google Patents
Hochauflösendes StrahlungsabbildungssystemInfo
- Publication number
- DE69410685D1 DE69410685D1 DE69410685T DE69410685T DE69410685D1 DE 69410685 D1 DE69410685 D1 DE 69410685D1 DE 69410685 T DE69410685 T DE 69410685T DE 69410685 T DE69410685 T DE 69410685T DE 69410685 D1 DE69410685 D1 DE 69410685D1
- Authority
- DE
- Germany
- Prior art keywords
- imaging system
- high resolution
- radiation imaging
- resolution radiation
- resolution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000003384 imaging method Methods 0.000 title 1
- 230000005855 radiation Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/48—Increasing resolution by shifting the sensor relative to the scene
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20188—Auxiliary details, e.g. casings or cooling
- G01T1/2019—Shielding against direct hits
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
Landscapes
- Spectroscopy & Molecular Physics (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Health & Medical Sciences (AREA)
- Multimedia (AREA)
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Radiography Using Non-Light Waves (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/043,116 US5340988A (en) | 1993-04-05 | 1993-04-05 | High resolution radiation imaging system |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69410685D1 true DE69410685D1 (de) | 1998-07-09 |
DE69410685T2 DE69410685T2 (de) | 1999-02-18 |
Family
ID=21925584
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69410685T Expired - Lifetime DE69410685T2 (de) | 1993-04-05 | 1994-03-29 | Hochauflösendes Strahlungsabbildungssystem |
Country Status (4)
Country | Link |
---|---|
US (1) | US5340988A (de) |
EP (1) | EP0619503B1 (de) |
JP (1) | JPH0737075A (de) |
DE (1) | DE69410685T2 (de) |
Families Citing this family (47)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5982953A (en) * | 1994-09-02 | 1999-11-09 | Konica Corporation | Image displaying apparatus of a processed image from temporally sequential images |
US5712890A (en) * | 1994-11-23 | 1998-01-27 | Thermotrex Corp. | Full breast digital mammography device |
WO1996015722A1 (en) * | 1994-11-23 | 1996-05-30 | Thermotrex Corporation | X-ray imaging device |
US5715292A (en) * | 1994-11-25 | 1998-02-03 | Loral Fairchild Corporation | Digital sensor cassette for mammography |
US5510623A (en) * | 1995-02-24 | 1996-04-23 | Loral Fairchild Corp. | Center readout intra-oral image sensor |
US7136452B2 (en) * | 1995-05-31 | 2006-11-14 | Goldpower Limited | Radiation imaging system, device and method for scan imaging |
US5841911A (en) * | 1995-06-06 | 1998-11-24 | Ben Gurion, University Of The Negev | Method for the restoration of images disturbed by the atmosphere |
US5693948A (en) * | 1995-11-21 | 1997-12-02 | Loral Fairchild Corporation | Advanced CCD-based x-ray image sensor system |
WO1997042661A1 (en) | 1996-05-08 | 1997-11-13 | 1294339 Ontario Inc. | High resolution flat panel for radiation imaging |
US6388258B1 (en) * | 1996-11-24 | 2002-05-14 | Ge. Medical Systems Israel Ltd. | Solid state gamma camera |
US5822392A (en) * | 1996-12-26 | 1998-10-13 | General Electric Company | Multi-resolution detection for increasing in an x-ray imaging implementation of an object |
US6166853A (en) * | 1997-01-09 | 2000-12-26 | The University Of Connecticut | Method and apparatus for three-dimensional deconvolution of optical microscope images |
US5847398A (en) * | 1997-07-17 | 1998-12-08 | Imarad Imaging Systems Ltd. | Gamma-ray imaging with sub-pixel resolution |
US6486470B2 (en) | 1998-11-02 | 2002-11-26 | 1294339 Ontario, Inc. | Compensation circuit for use in a high resolution amplified flat panel for radiation imaging |
US6166384A (en) * | 1998-11-06 | 2000-12-26 | General Electric Company | Method and apparatus for minimizing blurring and generating a high resolution image in a radiation imaging system |
EP1014709A3 (de) * | 1998-12-24 | 2000-12-13 | Fuji Photo Film Co., Ltd. | Strahlungsbildausleseverfahren und -vorrichtung |
US6570613B1 (en) * | 1999-02-26 | 2003-05-27 | Paul Howell | Resolution-enhancement method for digital imaging |
US6350985B1 (en) | 1999-04-26 | 2002-02-26 | Direct Radiography Corp. | Method for calculating gain correction factors in a digital imaging system |
US6266391B1 (en) | 1999-08-31 | 2001-07-24 | General Electric Company | Artifact compensation system for matrix-addressed x-ray imaging panel |
US6393098B1 (en) | 1999-08-31 | 2002-05-21 | General Electric Company | Amplifier offset and gain correction system for X-ray imaging panel |
US6404851B1 (en) | 2000-03-30 | 2002-06-11 | General Electric Company | Method and apparatus for automatic exposure control using localized capacitive coupling in a matrix-addressed imaging panel |
US20020063923A1 (en) * | 2000-06-02 | 2002-05-30 | Lightchip, Inc. | System and method for improving optical signal-to-noise ratio measurement range of a monitoring device |
WO2002052505A2 (en) * | 2000-12-22 | 2002-07-04 | Simage Oy | A radiation imaging system and scanning device |
US7132636B1 (en) * | 2001-07-06 | 2006-11-07 | Palantyr Research, Llc | Imaging system and methodology employing reciprocal space optical design |
KR100505355B1 (ko) * | 2002-07-22 | 2005-08-01 | 남상희 | 고해상도 디지털 엑스레이 검출용 tft 기판 |
JP2005077913A (ja) * | 2003-09-02 | 2005-03-24 | Toshiba Matsushita Display Technology Co Ltd | 表示装置 |
KR101166013B1 (ko) * | 2003-10-20 | 2012-07-19 | 조르단 밸리 세미컨덕터즈 리미티드 | 증진된 정밀성을 가진 박막층의 x-레이 반사광 측정법 |
US7590306B2 (en) * | 2003-11-26 | 2009-09-15 | Ge Medical Systems Global Technology Company, Llc | Resolution adaptive image filtering system and method |
US7105828B2 (en) * | 2004-02-10 | 2006-09-12 | Ge Medical Systems Global Technology Company, Llc | Hybrid x-ray detector |
US20060018566A1 (en) * | 2004-07-26 | 2006-01-26 | Coleman Christopher R | System and method for adding spatial frequency into an image |
JP4640589B2 (ja) * | 2005-05-12 | 2011-03-02 | 株式会社島津製作所 | X線撮影装置 |
US7113566B1 (en) * | 2005-07-15 | 2006-09-26 | Jordan Valley Applied Radiation Ltd. | Enhancing resolution of X-ray measurements by sample motion |
US20070223572A1 (en) * | 2006-03-24 | 2007-09-27 | Samsung Electronics Co., Ltd. | Method and system of pixel interleaving for improving video signal transmission quality in wireless communication |
US8194750B2 (en) | 2006-10-16 | 2012-06-05 | Samsung Electronics Co., Ltd. | System and method for digital communication having a circulant bit interleaver for equal error protection (EEP) and unequal error protection (UEP) |
US20100295973A1 (en) * | 2007-11-06 | 2010-11-25 | Tessera North America, Inc. | Determinate and indeterminate optical systems |
US8582052B2 (en) * | 2008-08-22 | 2013-11-12 | Gentex Corporation | Discrete LED backlight control for a reduced power LCD display system |
JP5106323B2 (ja) * | 2008-09-04 | 2012-12-26 | 三菱電機株式会社 | レーダ画像再生装置 |
JP2010066131A (ja) * | 2008-09-11 | 2010-03-25 | Mitsubishi Electric Corp | 画像レーダ装置および画像レーダシステム |
ITMI20081798A1 (it) * | 2008-10-10 | 2010-04-11 | Cnr Consiglio Naz Delle Ric Erche | Dispositivo scintigrafico a super-risoluzione spaziale |
US8243878B2 (en) | 2010-01-07 | 2012-08-14 | Jordan Valley Semiconductors Ltd. | High-resolution X-ray diffraction measurement with enhanced sensitivity |
US8687766B2 (en) | 2010-07-13 | 2014-04-01 | Jordan Valley Semiconductors Ltd. | Enhancing accuracy of fast high-resolution X-ray diffractometry |
US8437450B2 (en) | 2010-12-02 | 2013-05-07 | Jordan Valley Semiconductors Ltd. | Fast measurement of X-ray diffraction from tilted layers |
US8781070B2 (en) | 2011-08-11 | 2014-07-15 | Jordan Valley Semiconductors Ltd. | Detection of wafer-edge defects |
WO2014165455A2 (en) | 2013-04-04 | 2014-10-09 | Illinois Tool Works Inc. | Helical computed tomography |
CA2904111C (en) | 2013-04-12 | 2017-05-16 | Illnois Tool Works Inc. | High-resolution computed tomography |
US9726624B2 (en) | 2014-06-18 | 2017-08-08 | Bruker Jv Israel Ltd. | Using multiple sources/detectors for high-throughput X-ray topography measurement |
US10261213B2 (en) * | 2017-06-07 | 2019-04-16 | General Electric Company | Apparatus and method for flexible gamma ray detectors |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS574675A (en) * | 1980-06-12 | 1982-01-11 | Matsushita Electric Ind Co Ltd | Band compressing device of video signal |
JPS5856581A (ja) * | 1981-09-30 | 1983-04-04 | Hitachi Ltd | ビデオカメラ |
CA1219086A (en) * | 1983-08-19 | 1987-03-10 | Kazuhiro Iinuma | Radiation imaging apparatus |
GB8611432D0 (en) * | 1986-05-09 | 1986-06-18 | Flor Henry M | Sheet sensor assembly |
JPH0447288A (ja) * | 1990-06-14 | 1992-02-17 | Shimadzu Corp | マルチラインセンサ型放射線像撮像装置 |
JPH04296064A (ja) * | 1991-03-26 | 1992-10-20 | Shimadzu Corp | 放射線検出器アレイ |
US5182652A (en) * | 1991-09-06 | 1993-01-26 | Eastman Kodak Company | High resolution thermal printing by imaging a hard copy image in vertical and horizontal increments smaller than the pixel pitch of a video imager array |
-
1993
- 1993-04-05 US US08/043,116 patent/US5340988A/en not_active Expired - Lifetime
-
1994
- 1994-03-29 DE DE69410685T patent/DE69410685T2/de not_active Expired - Lifetime
- 1994-03-29 EP EP94302245A patent/EP0619503B1/de not_active Expired - Lifetime
- 1994-04-04 JP JP6065364A patent/JPH0737075A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
US5340988A (en) | 1994-08-23 |
EP0619503B1 (de) | 1998-06-03 |
DE69410685T2 (de) | 1999-02-18 |
JPH0737075A (ja) | 1995-02-07 |
EP0619503A1 (de) | 1994-10-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Representative=s name: ROEGER UND KOLLEGEN, 73728 ESSLINGEN |