DE69409805D1 - Methode und apparat zur aufspürung von fehlern in linsen - Google Patents
Methode und apparat zur aufspürung von fehlern in linsenInfo
- Publication number
- DE69409805D1 DE69409805D1 DE69409805T DE69409805T DE69409805D1 DE 69409805 D1 DE69409805 D1 DE 69409805D1 DE 69409805 T DE69409805 T DE 69409805T DE 69409805 T DE69409805 T DE 69409805T DE 69409805 D1 DE69409805 D1 DE 69409805D1
- Authority
- DE
- Germany
- Prior art keywords
- lenses
- detecting faults
- faults
- detecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
- G01M11/0214—Details of devices holding the object to be tested
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Geometry (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IL10620793A IL106207A (en) | 1993-07-01 | 1993-07-01 | Method and device for detecting defects in lenses |
PCT/US1994/007483 WO1995001558A1 (en) | 1993-07-01 | 1994-07-01 | Method and apparatus for detecting defects in lenses |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69409805D1 true DE69409805D1 (de) | 1998-05-28 |
DE69409805T2 DE69409805T2 (de) | 1998-08-13 |
Family
ID=11065008
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69409805T Expired - Fee Related DE69409805T2 (de) | 1993-07-01 | 1994-07-01 | Methode und apparat zur aufspürung von fehlern in linsen |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP0706645B1 (de) |
AU (1) | AU687084B2 (de) |
DE (1) | DE69409805T2 (de) |
IL (1) | IL106207A (de) |
WO (1) | WO1995001558A1 (de) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19809505A1 (de) * | 1997-03-05 | 1998-09-17 | Asahi Optical Co Ltd | Einrichtung zum Prüfen optischer Elemente |
FR2984500B1 (fr) * | 2011-12-15 | 2014-01-10 | Essilor Int | Systeme et procede de lecture optique de marquages imprimes sur une face d'une lentille ophtalmique |
US9528906B1 (en) | 2013-12-19 | 2016-12-27 | Apple Inc. | Monitoring DOE performance using total internal reflection |
US10073004B2 (en) | 2016-09-19 | 2018-09-11 | Apple Inc. | DOE defect monitoring utilizing total internal reflection |
US20220233071A1 (en) * | 2021-01-26 | 2022-07-28 | Alcon Inc. | Method for the inspection of an ophthalmic lens for semi-opaque defects |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3892454A (en) * | 1972-06-28 | 1975-07-01 | Raytheon Co | Method of forming silicon storage target |
GB1403911A (en) * | 1972-07-26 | 1975-08-28 | Sira Institute | Method and apparatus for testing optical components |
US3988068A (en) * | 1974-05-09 | 1976-10-26 | Itek Corporation | Method and apparatus for detecting cosmetic defects in opthalmic lenses |
-
1993
- 1993-07-01 IL IL10620793A patent/IL106207A/en not_active IP Right Cessation
-
1994
- 1994-07-01 DE DE69409805T patent/DE69409805T2/de not_active Expired - Fee Related
- 1994-07-01 AU AU72543/94A patent/AU687084B2/en not_active Ceased
- 1994-07-01 WO PCT/US1994/007483 patent/WO1995001558A1/en active IP Right Grant
- 1994-07-01 EP EP94922078A patent/EP0706645B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0706645B1 (de) | 1998-04-22 |
WO1995001558A1 (en) | 1995-01-12 |
AU7254394A (en) | 1995-01-24 |
IL106207A (en) | 1996-08-04 |
IL106207A0 (en) | 1993-11-15 |
AU687084B2 (en) | 1998-02-19 |
EP0706645A1 (de) | 1996-04-17 |
DE69409805T2 (de) | 1998-08-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |