DE69405896D1 - Ladungsträger Analysator - Google Patents
Ladungsträger AnalysatorInfo
- Publication number
- DE69405896D1 DE69405896D1 DE69405896T DE69405896T DE69405896D1 DE 69405896 D1 DE69405896 D1 DE 69405896D1 DE 69405896 T DE69405896 T DE 69405896T DE 69405896 T DE69405896 T DE 69405896T DE 69405896 D1 DE69405896 D1 DE 69405896D1
- Authority
- DE
- Germany
- Prior art keywords
- carrier analyzer
- analyzer
- carrier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
- H01J49/484—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with spherical mirrors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/285—Emission microscopes, e.g. field-emission microscopes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/04—Means for controlling the discharge
- H01J2237/049—Focusing means
- H01J2237/0492—Lens systems
- H01J2237/04926—Lens systems combined
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/25—Tubes for localised analysis using electron or ion beams
- H01J2237/2505—Tubes for localised analysis using electron or ion beams characterised by their application
- H01J2237/2516—Secondary particles mass or energy spectrometry
- H01J2237/2522—Secondary particles mass or energy spectrometry of electrons (ESCA, XPS)
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/285—Emission microscopes
- H01J2237/2855—Photo-emission
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB939306375A GB9306375D0 (en) | 1993-03-26 | 1993-03-26 | Charged-particle analyser |
GB939320954A GB9320954D0 (en) | 1993-03-26 | 1993-10-12 | Charged-particle analyser |
Publications (1)
Publication Number | Publication Date |
---|---|
DE69405896D1 true DE69405896D1 (de) | 1997-11-06 |
Family
ID=26302656
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69405896T Expired - Lifetime DE69405896D1 (de) | 1993-03-26 | 1994-03-28 | Ladungsträger Analysator |
Country Status (3)
Country | Link |
---|---|
US (1) | US5506414A (de) |
EP (1) | EP0617453B1 (de) |
DE (1) | DE69405896D1 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB9718012D0 (en) * | 1997-08-26 | 1997-10-29 | Vg Systems Ltd | A spectrometer and method of spectroscopy |
JP3441955B2 (ja) * | 1998-02-23 | 2003-09-02 | 株式会社日立製作所 | 投射方式の荷電粒子顕微鏡および基板検査システム |
GB0225791D0 (en) * | 2002-11-05 | 2002-12-11 | Kratos Analytical Ltd | Charged particle spectrometer and detector therefor |
GB0801663D0 (en) * | 2008-01-30 | 2008-03-05 | Krizek Jiri G F | Electromagnetic imaging analyzer |
ES2602055T3 (es) | 2012-03-06 | 2017-02-17 | Scienta Omicron Ab | Disposición de análisis para espectrómetro de partículas |
CN103512912A (zh) * | 2013-09-09 | 2014-01-15 | 长春理工大学 | 采用光学空间滤波器的便携x射线实时成像检测仪 |
US9754772B2 (en) * | 2015-09-02 | 2017-09-05 | Canon Kabushiki Kaisha | Charged particle image measuring device and imaging mass spectrometry apparatus |
CN111052298B (zh) * | 2017-08-02 | 2022-09-02 | Asml荷兰有限公司 | 用于带电粒子浸没以增强电压对比缺陷信号的***和方法 |
DE102019107327A1 (de) * | 2019-03-21 | 2020-09-24 | Specs Surface Nano Analysis Gmbh | Vorrichtung und Verfahren zum Elektronentransfer von einer Probe zu einem Energieanalysator und Elektronen-Spektrometervorrichtung |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5129437B1 (de) * | 1970-08-19 | 1976-08-25 | ||
GB1332207A (en) * | 1971-05-07 | 1973-10-03 | Ass Elect Ind | Apparatus for charged particle spectroscopy |
US3822382A (en) * | 1971-08-17 | 1974-07-02 | Jeol Ltd | Apparatus for analyzing electron energy |
DE2331091C3 (de) * | 1973-06-19 | 1980-03-20 | Leybold-Heraeus Gmbh, 5000 Koeln | Einrichtung zur Bestimmung der Energie geladener Teilchen |
DE3236273A1 (de) * | 1982-09-30 | 1984-04-05 | Siemens AG, 1000 Berlin und 8000 München | Spektrometerobjektiv mit parallelen objektiv- und spektrometerfeldern fuer die potentialmesstechnik |
US4737639A (en) * | 1985-07-15 | 1988-04-12 | The Perkin-Elmer Corporation | Energy and analysis detection system for surface chemical analysis |
GB8609740D0 (en) * | 1986-04-22 | 1986-05-29 | Spectros Ltd | Charged particle energy analyser |
GB8612099D0 (en) * | 1986-05-19 | 1986-06-25 | Vg Instr Group | Spectrometer |
US4810880A (en) * | 1987-06-05 | 1989-03-07 | The Perkin-Elmer Corporation | Direct imaging monochromatic electron microscope |
US4882487A (en) * | 1987-06-05 | 1989-11-21 | The Perkin-Elmer Corporation | Direct imaging monochromatic electron microscope |
-
1994
- 1994-03-25 US US08/218,132 patent/US5506414A/en not_active Expired - Fee Related
- 1994-03-28 DE DE69405896T patent/DE69405896D1/de not_active Expired - Lifetime
- 1994-03-28 EP EP94302188A patent/EP0617453B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0617453A1 (de) | 1994-09-28 |
US5506414A (en) | 1996-04-09 |
EP0617453B1 (de) | 1997-10-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |