DE69332604D1 - Federkontaktstift mit zwei Kontaktnadeln - Google Patents
Federkontaktstift mit zwei KontaktnadelnInfo
- Publication number
- DE69332604D1 DE69332604D1 DE69332604T DE69332604T DE69332604D1 DE 69332604 D1 DE69332604 D1 DE 69332604D1 DE 69332604 T DE69332604 T DE 69332604T DE 69332604 T DE69332604 T DE 69332604T DE 69332604 D1 DE69332604 D1 DE 69332604D1
- Authority
- DE
- Germany
- Prior art keywords
- contact
- spring
- pins
- pin
- contact pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/049,395 US5420519A (en) | 1992-03-10 | 1993-04-21 | Double-headed spring contact probe assembly |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69332604D1 true DE69332604D1 (de) | 2003-02-06 |
DE69332604T2 DE69332604T2 (de) | 2003-12-18 |
Family
ID=21959597
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69332604T Expired - Fee Related DE69332604T2 (de) | 1993-04-21 | 1993-07-09 | Federkontaktstift mit zwei Kontaktnadeln |
Country Status (3)
Country | Link |
---|---|
US (1) | US5420519A (de) |
EP (1) | EP0621485B1 (de) |
DE (1) | DE69332604T2 (de) |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5576631A (en) * | 1992-03-10 | 1996-11-19 | Virginia Panel Corporation | Coaxial double-headed spring contact probe assembly |
US5942906A (en) * | 1994-11-18 | 1999-08-24 | Virginia Panel Corporation | Interface system utilizing engagement mechanism |
DE29519413U1 (de) * | 1995-12-07 | 1996-01-25 | TSK Prüfsysteme GmbH, 32457 Porta Westfalica | Prüfstift |
TW406454B (en) | 1996-10-10 | 2000-09-21 | Berg Tech Inc | High density connector and method of manufacture |
US5877554A (en) * | 1997-11-03 | 1999-03-02 | Advanced Interconnections Corp. | Converter socket terminal |
US6222377B1 (en) * | 1998-01-13 | 2001-04-24 | Masatoshi Kato | Circuit board probe device |
US6104205A (en) * | 1998-02-26 | 2000-08-15 | Interconnect Devices, Inc. | Probe with tab retainer |
US6020635A (en) * | 1998-07-07 | 2000-02-01 | Advanced Interconnections Corporation | Converter socket terminal |
US5973267A (en) * | 1998-07-13 | 1999-10-26 | Huang; Jason | Probe sheath |
US6326799B1 (en) * | 2000-02-29 | 2001-12-04 | Charles A. Schein | Wireless test fixture for testing printed circuit boards |
KR100745104B1 (ko) | 2000-06-16 | 2007-08-01 | 니혼 하츠쵸 가부시키가이샤 | 컨택터 프로브, 전기 프로브 유닛, 컨택터 프로브를 위한 프로브 어셈블리와 절연체의 조합체 및 컨택터 프로브를 위한 탄성의 도전성 프로브 어셈블리 |
US6605952B2 (en) * | 2001-06-27 | 2003-08-12 | Intel Corporation | Zero connection for on-chip testing |
US6882138B2 (en) * | 2002-01-11 | 2005-04-19 | Virginia Panel Corporation | Modular test adapter for rapid action engagement interface |
US6677772B1 (en) | 2002-08-21 | 2004-01-13 | Micron Technology, Inc. | Contactor with isolated spring tips |
JP3768183B2 (ja) * | 2002-10-28 | 2006-04-19 | 山一電機株式会社 | 狭ピッチicパッケージ用icソケット |
US6910924B1 (en) | 2004-01-20 | 2005-06-28 | The Boeing Company | Wireless CASS interface device |
US7091415B2 (en) * | 2004-08-16 | 2006-08-15 | Virginia Panel Corporation | Low profile mass interconnect device |
US7114996B2 (en) * | 2004-09-08 | 2006-10-03 | Advanced Interconnections Corporation | Double-pogo converter socket terminal |
US7179108B2 (en) * | 2004-09-08 | 2007-02-20 | Advanced Interconnections Corporation | Hermaphroditic socket/adapter |
US7435102B2 (en) * | 2005-02-24 | 2008-10-14 | Advanced Interconnections Corporation | Interconnecting electrical devices |
US7690925B2 (en) * | 2005-02-24 | 2010-04-06 | Advanced Interconnections Corp. | Terminal assembly with pin-retaining socket |
US7220134B2 (en) * | 2005-02-24 | 2007-05-22 | Advanced Interconnections Corporation | Low profile LGA socket assembly |
US7267563B2 (en) * | 2005-03-08 | 2007-09-11 | Virginia Panel Corporation | Dual engagement lever interface |
US20070167038A1 (en) * | 2006-01-18 | 2007-07-19 | Glenn Goodman | Hermaphroditic socket/adapter |
US20080009148A1 (en) * | 2006-07-07 | 2008-01-10 | Glenn Goodman | Guided pin and plunger |
US7297014B1 (en) | 2006-07-10 | 2007-11-20 | Virginia Panel Corporation | Spring lock interface engagement system |
US8351218B2 (en) * | 2008-03-05 | 2013-01-08 | Virginia Panel Corporation | Multi-tier mass interconnect device |
US20100267291A1 (en) * | 2009-04-20 | 2010-10-21 | Scott Chabineau-Lovgren | Swaging process for improved compliant contact electrical test performance |
US8777675B2 (en) * | 2012-09-26 | 2014-07-15 | Intel Corporation | Vertical contact for shielded sockets |
CN106099486B (zh) * | 2016-08-22 | 2019-11-26 | 深圳市华惠连接器有限公司 | 电连接器可伸缩接触件 |
CN110036300B (zh) * | 2016-11-30 | 2020-03-06 | 日本电产理德股份有限公司 | 接触端子、检查夹具和检查装置 |
CN109103644A (zh) * | 2018-08-31 | 2018-12-28 | 东莞中探探针有限公司 | 弹簧式探针 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3157455A (en) * | 1962-12-24 | 1964-11-17 | Nippon Electric Co | Electrical connector |
US3255430A (en) * | 1964-12-07 | 1966-06-07 | New Twist Connector Corp | Spirally wound pin connector |
US4528500A (en) * | 1980-11-25 | 1985-07-09 | Lightbody James D | Apparatus and method for testing circuit boards |
CH645730A5 (fr) * | 1982-01-08 | 1984-10-15 | Technobal Sa | Contact d'essai pour le test de circuits imprimes, et tete de contact amovible pour un tel contact d'essai. |
JPS60127466A (ja) * | 1983-12-14 | 1985-07-08 | Yamaichi Seikou:Kk | プロ−ブコンタクト |
CH667925A5 (de) * | 1984-03-08 | 1988-11-15 | Feinmetall Gmbh | Federkontaktstift fuer pruefadapter zum kontaktieren von prueflingen zwecks pruefung auf deren elektrische fehlerfreiheit. |
US4749943A (en) * | 1984-06-11 | 1988-06-07 | Thomas Black | Automatic test system |
US4721903A (en) * | 1985-02-27 | 1988-01-26 | The Boeing Company | Probe and method for electrically contacting surfaces with protective coatings |
US4884024A (en) * | 1985-11-19 | 1989-11-28 | Teradyne, Inc. | Test pin assembly for circuit board tester |
US4636026A (en) * | 1985-12-20 | 1987-01-13 | Augat Inc. | Electrical test probe |
EP0242542A1 (de) * | 1986-03-26 | 1987-10-28 | Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung | Prüfadapter |
DE3774624D1 (de) * | 1986-06-23 | 1992-01-02 | Feinmetall Gmbh | Federkontaktstift und verfahren zu seiner herstellung. |
JPS6398566A (ja) * | 1986-10-15 | 1988-04-30 | Seiko Epson Corp | コンタクトプロ−ブ |
US4935696A (en) * | 1987-04-16 | 1990-06-19 | Teradyne, Inc. | Test pin assembly for circuit board tester |
DE3820795A1 (de) * | 1988-06-20 | 1989-12-21 | Ingun Pruefmittelbau Gmbh | Gefederter kontaktstift zum pruefen von prueflingen |
US5034749A (en) * | 1988-10-06 | 1991-07-23 | Electro Scientific Industries, Inc. | Sliding contact test apparatus |
US5032787A (en) * | 1989-11-03 | 1991-07-16 | Everett/Charles Contact Products, Inc. | Electrical test probe having rotational control of the probe shaft |
US4983909A (en) * | 1989-11-28 | 1991-01-08 | Everett/Charles Contact Products, Inc. | Repetitive-switching |
-
1993
- 1993-04-21 US US08/049,395 patent/US5420519A/en not_active Expired - Lifetime
- 1993-07-09 DE DE69332604T patent/DE69332604T2/de not_active Expired - Fee Related
- 1993-07-09 EP EP93305396A patent/EP0621485B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69332604T2 (de) | 2003-12-18 |
EP0621485B1 (de) | 2003-01-02 |
US5420519A (en) | 1995-05-30 |
EP0621485A2 (de) | 1994-10-26 |
EP0621485A3 (de) | 1994-12-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |