DE69227092T2 - Druckentlastende membranabdeckung - Google Patents

Druckentlastende membranabdeckung

Info

Publication number
DE69227092T2
DE69227092T2 DE69227092T DE69227092T DE69227092T2 DE 69227092 T2 DE69227092 T2 DE 69227092T2 DE 69227092 T DE69227092 T DE 69227092T DE 69227092 T DE69227092 T DE 69227092T DE 69227092 T2 DE69227092 T2 DE 69227092T2
Authority
DE
Germany
Prior art keywords
pressure release
membrane cover
release membrane
cover
pressure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69227092T
Other languages
English (en)
Other versions
DE69227092D1 (de
Inventor
Glenn Storm
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micro Lithography Inc
Original Assignee
DuPont Photomasks Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=24820283&utm_source=***_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE69227092(T2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by DuPont Photomasks Inc filed Critical DuPont Photomasks Inc
Application granted granted Critical
Publication of DE69227092D1 publication Critical patent/DE69227092D1/de
Publication of DE69227092T2 publication Critical patent/DE69227092T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/70866Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/62Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
    • G03F1/64Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof characterised by the frames, e.g. structure or material, including bonding means therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Atmospheric Sciences (AREA)
  • Toxicology (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
DE69227092T 1991-05-17 1992-04-28 Druckentlastende membranabdeckung Expired - Fee Related DE69227092T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US70221491A 1991-05-17 1991-05-17
PCT/US1992/003315 WO1992021066A1 (en) 1991-05-17 1992-04-28 Pressure relieving pellicle

Publications (2)

Publication Number Publication Date
DE69227092D1 DE69227092D1 (de) 1998-10-29
DE69227092T2 true DE69227092T2 (de) 1999-05-20

Family

ID=24820283

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69227092T Expired - Fee Related DE69227092T2 (de) 1991-05-17 1992-04-28 Druckentlastende membranabdeckung

Country Status (7)

Country Link
US (1) US6103427A (de)
EP (1) EP0548312B1 (de)
JP (1) JP2992585B2 (de)
KR (1) KR960003908B1 (de)
DE (1) DE69227092T2 (de)
SG (1) SG63629A1 (de)
WO (1) WO1992021066A1 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH098103A (ja) * 1995-06-19 1997-01-10 Nikon Corp 投影露光装置及び投影露光方法
DE69727782T2 (de) * 1996-07-17 2004-12-09 Mitsui Chemicals, Inc. Maskenschutzvorrichtung
US6264773B1 (en) * 1998-09-01 2001-07-24 Mark Damian Cerio Apparatus and method for temporary and permanent attachment of pellicle frame to photomask substrate
JP2003504861A (ja) * 1999-07-01 2003-02-04 エイエスエムエル ネザランドズ ベスローテン フエンノートシャップ 空間濾波による画像向上装置および方法
US6300019B1 (en) * 1999-10-13 2001-10-09 Oki Electric Industry Co., Ltd. Pellicle
TW480372B (en) * 1999-11-05 2002-03-21 Asm Lithography Bv Lithographic projection apparatus, method of manufacturing a device using the apparatus, and device manufactured according to the method
US20020089656A1 (en) * 2001-01-09 2002-07-11 Cheng Guo Containers for lithography mask and method of use
US6911283B1 (en) 2001-02-07 2005-06-28 Dupont Photomasks, Inc. Method and apparatus for coupling a pellicle to a photomask using a non-distorting mechanism
US6689219B2 (en) 2001-03-15 2004-02-10 Michael Antoine Birmingham Apparatus and method for dispensing viscous liquid material
US6841312B1 (en) * 2001-04-11 2005-01-11 Dupont Photomasks, Inc. Method and apparatus for coupling a pellicle assembly to a photomask
US6662718B2 (en) 2001-06-29 2003-12-16 International Business Machines Corporation Screening mask having a stress-relieving area
US6841317B2 (en) 2002-08-27 2005-01-11 Micro Lithography, Inc. Vent for an optical pellicle system
JP2006504996A (ja) * 2002-10-29 2006-02-09 トッパン、フォウタマスクス、インク フォトマスク・アセンブリ、およびリソグラフィ工程中に生成される汚染物からそれを保護する方法
EP1429186A3 (de) * 2002-12-09 2006-06-07 ASML Holding N.V. Rahmen mit porösen Einsätzen oder erhöhten Haftflächen für eine Abdeckungsmembran
US7205074B2 (en) * 2002-12-31 2007-04-17 Intel Corporation Venting of pellicle cavity for a mask
JP4286194B2 (ja) * 2004-08-18 2009-06-24 信越化学工業株式会社 ペリクルフレーム、および該フレームを用いたフォトリソグラフィー用ペリクル
JP6519190B2 (ja) * 2015-01-16 2019-05-29 日本軽金属株式会社 ペリクル用支持枠
JP2016139103A (ja) * 2015-01-29 2016-08-04 日本軽金属株式会社 ペリクル用支持枠
JP6395320B2 (ja) * 2015-03-30 2018-09-26 信越化学工業株式会社 ペリクル
US9835940B2 (en) * 2015-09-18 2017-12-05 Taiwan Semiconductor Manufacturing Company, Ltd. Method to fabricate mask-pellicle system
US10126644B2 (en) 2016-02-09 2018-11-13 Taiwan Semiconductor Manufacturing Company, Ltd. Pellicle for advanced lithography
US10843454B2 (en) * 2018-01-16 2020-11-24 Jsmd Key Products, Llc Endurance fabric mesh panel for silk screening

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2036367A (en) * 1978-10-17 1980-06-25 Censor Patent Versuch Masks for the Projection Exposure of Semiconductor Substrates
DE2845147B1 (de) * 1978-10-17 1980-01-17 Censor Patent Versuch Projektionsmaske
US4833051A (en) * 1984-08-20 1989-05-23 Nippon Kogaku K.K. Protective device for photographic masks
JP2535971B2 (ja) * 1987-11-05 1996-09-18 三井石油化学工業株式会社 ペリクル
JPH02250055A (ja) * 1988-12-09 1990-10-05 Seiko Epson Corp フォトマスク及び半導体装置の製造方法
JPH02287355A (ja) * 1989-04-27 1990-11-27 Seiko Epson Corp 保護部材つきガラスマスク構造
JP3652029B2 (ja) * 1996-10-16 2005-05-25 積水化学工業株式会社 高感度免疫測定法

Also Published As

Publication number Publication date
JP2992585B2 (ja) 1999-12-20
KR960003908B1 (ko) 1996-03-23
EP0548312A1 (de) 1993-06-30
US6103427A (en) 2000-08-15
SG63629A1 (en) 1999-03-30
WO1992021066A1 (en) 1992-11-26
EP0548312B1 (de) 1998-09-23
JPH05508487A (ja) 1993-11-25
DE69227092D1 (de) 1998-10-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: MICRO LITHOGRAPHY, INC., SUNNYVALE, CALIF., US

8339 Ceased/non-payment of the annual fee