DE69227092T2 - Druckentlastende membranabdeckung - Google Patents
Druckentlastende membranabdeckungInfo
- Publication number
- DE69227092T2 DE69227092T2 DE69227092T DE69227092T DE69227092T2 DE 69227092 T2 DE69227092 T2 DE 69227092T2 DE 69227092 T DE69227092 T DE 69227092T DE 69227092 T DE69227092 T DE 69227092T DE 69227092 T2 DE69227092 T2 DE 69227092T2
- Authority
- DE
- Germany
- Prior art keywords
- pressure release
- membrane cover
- release membrane
- cover
- pressure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70866—Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
- G03F1/64—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof characterised by the frames, e.g. structure or material, including bonding means therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Toxicology (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US70221491A | 1991-05-17 | 1991-05-17 | |
PCT/US1992/003315 WO1992021066A1 (en) | 1991-05-17 | 1992-04-28 | Pressure relieving pellicle |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69227092D1 DE69227092D1 (de) | 1998-10-29 |
DE69227092T2 true DE69227092T2 (de) | 1999-05-20 |
Family
ID=24820283
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69227092T Expired - Fee Related DE69227092T2 (de) | 1991-05-17 | 1992-04-28 | Druckentlastende membranabdeckung |
Country Status (7)
Country | Link |
---|---|
US (1) | US6103427A (de) |
EP (1) | EP0548312B1 (de) |
JP (1) | JP2992585B2 (de) |
KR (1) | KR960003908B1 (de) |
DE (1) | DE69227092T2 (de) |
SG (1) | SG63629A1 (de) |
WO (1) | WO1992021066A1 (de) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH098103A (ja) * | 1995-06-19 | 1997-01-10 | Nikon Corp | 投影露光装置及び投影露光方法 |
DE69727782T2 (de) * | 1996-07-17 | 2004-12-09 | Mitsui Chemicals, Inc. | Maskenschutzvorrichtung |
US6264773B1 (en) * | 1998-09-01 | 2001-07-24 | Mark Damian Cerio | Apparatus and method for temporary and permanent attachment of pellicle frame to photomask substrate |
JP2003504861A (ja) * | 1999-07-01 | 2003-02-04 | エイエスエムエル ネザランドズ ベスローテン フエンノートシャップ | 空間濾波による画像向上装置および方法 |
US6300019B1 (en) * | 1999-10-13 | 2001-10-09 | Oki Electric Industry Co., Ltd. | Pellicle |
TW480372B (en) * | 1999-11-05 | 2002-03-21 | Asm Lithography Bv | Lithographic projection apparatus, method of manufacturing a device using the apparatus, and device manufactured according to the method |
US20020089656A1 (en) * | 2001-01-09 | 2002-07-11 | Cheng Guo | Containers for lithography mask and method of use |
US6911283B1 (en) | 2001-02-07 | 2005-06-28 | Dupont Photomasks, Inc. | Method and apparatus for coupling a pellicle to a photomask using a non-distorting mechanism |
US6689219B2 (en) | 2001-03-15 | 2004-02-10 | Michael Antoine Birmingham | Apparatus and method for dispensing viscous liquid material |
US6841312B1 (en) * | 2001-04-11 | 2005-01-11 | Dupont Photomasks, Inc. | Method and apparatus for coupling a pellicle assembly to a photomask |
US6662718B2 (en) | 2001-06-29 | 2003-12-16 | International Business Machines Corporation | Screening mask having a stress-relieving area |
US6841317B2 (en) | 2002-08-27 | 2005-01-11 | Micro Lithography, Inc. | Vent for an optical pellicle system |
JP2006504996A (ja) * | 2002-10-29 | 2006-02-09 | トッパン、フォウタマスクス、インク | フォトマスク・アセンブリ、およびリソグラフィ工程中に生成される汚染物からそれを保護する方法 |
EP1429186A3 (de) * | 2002-12-09 | 2006-06-07 | ASML Holding N.V. | Rahmen mit porösen Einsätzen oder erhöhten Haftflächen für eine Abdeckungsmembran |
US7205074B2 (en) * | 2002-12-31 | 2007-04-17 | Intel Corporation | Venting of pellicle cavity for a mask |
JP4286194B2 (ja) * | 2004-08-18 | 2009-06-24 | 信越化学工業株式会社 | ペリクルフレーム、および該フレームを用いたフォトリソグラフィー用ペリクル |
JP6519190B2 (ja) * | 2015-01-16 | 2019-05-29 | 日本軽金属株式会社 | ペリクル用支持枠 |
JP2016139103A (ja) * | 2015-01-29 | 2016-08-04 | 日本軽金属株式会社 | ペリクル用支持枠 |
JP6395320B2 (ja) * | 2015-03-30 | 2018-09-26 | 信越化学工業株式会社 | ペリクル |
US9835940B2 (en) * | 2015-09-18 | 2017-12-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method to fabricate mask-pellicle system |
US10126644B2 (en) | 2016-02-09 | 2018-11-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Pellicle for advanced lithography |
US10843454B2 (en) * | 2018-01-16 | 2020-11-24 | Jsmd Key Products, Llc | Endurance fabric mesh panel for silk screening |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2036367A (en) * | 1978-10-17 | 1980-06-25 | Censor Patent Versuch | Masks for the Projection Exposure of Semiconductor Substrates |
DE2845147B1 (de) * | 1978-10-17 | 1980-01-17 | Censor Patent Versuch | Projektionsmaske |
US4833051A (en) * | 1984-08-20 | 1989-05-23 | Nippon Kogaku K.K. | Protective device for photographic masks |
JP2535971B2 (ja) * | 1987-11-05 | 1996-09-18 | 三井石油化学工業株式会社 | ペリクル |
JPH02250055A (ja) * | 1988-12-09 | 1990-10-05 | Seiko Epson Corp | フォトマスク及び半導体装置の製造方法 |
JPH02287355A (ja) * | 1989-04-27 | 1990-11-27 | Seiko Epson Corp | 保護部材つきガラスマスク構造 |
JP3652029B2 (ja) * | 1996-10-16 | 2005-05-25 | 積水化学工業株式会社 | 高感度免疫測定法 |
-
1992
- 1992-04-28 DE DE69227092T patent/DE69227092T2/de not_active Expired - Fee Related
- 1992-04-28 WO PCT/US1992/003315 patent/WO1992021066A1/en active IP Right Grant
- 1992-04-28 JP JP5500046A patent/JP2992585B2/ja not_active Expired - Fee Related
- 1992-04-28 EP EP92913957A patent/EP0548312B1/de not_active Expired - Lifetime
- 1992-04-28 SG SG1996008222A patent/SG63629A1/en unknown
- 1992-04-28 KR KR1019930700137A patent/KR960003908B1/ko not_active IP Right Cessation
-
1993
- 1993-04-13 US US08/046,470 patent/US6103427A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2992585B2 (ja) | 1999-12-20 |
KR960003908B1 (ko) | 1996-03-23 |
EP0548312A1 (de) | 1993-06-30 |
US6103427A (en) | 2000-08-15 |
SG63629A1 (en) | 1999-03-30 |
WO1992021066A1 (en) | 1992-11-26 |
EP0548312B1 (de) | 1998-09-23 |
JPH05508487A (ja) | 1993-11-25 |
DE69227092D1 (de) | 1998-10-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: MICRO LITHOGRAPHY, INC., SUNNYVALE, CALIF., US |
|
8339 | Ceased/non-payment of the annual fee |