DE69119057D1 - Sonden zur messung der kapazitanz - Google Patents
Sonden zur messung der kapazitanzInfo
- Publication number
- DE69119057D1 DE69119057D1 DE69119057T DE69119057T DE69119057D1 DE 69119057 D1 DE69119057 D1 DE 69119057D1 DE 69119057 T DE69119057 T DE 69119057T DE 69119057 T DE69119057 T DE 69119057T DE 69119057 D1 DE69119057 D1 DE 69119057D1
- Authority
- DE
- Germany
- Prior art keywords
- measurement probe
- capacity measurement
- capacity
- probe
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
- G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB909021447A GB9021447D0 (en) | 1990-10-03 | 1990-10-03 | Capacitance probes |
PCT/GB1991/001703 WO1992006350A1 (en) | 1990-10-03 | 1991-10-02 | Capacitance probes |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69119057D1 true DE69119057D1 (de) | 1996-05-30 |
DE69119057T2 DE69119057T2 (de) | 1996-08-29 |
Family
ID=10683129
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69132243T Expired - Fee Related DE69132243T2 (de) | 1990-10-03 | 1991-10-02 | Kalibrierung von kapazitiven Sonden |
DE69119057T Expired - Fee Related DE69119057T2 (de) | 1990-10-03 | 1991-10-02 | Sonden zur messung der kapazitanz |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69132243T Expired - Fee Related DE69132243T2 (de) | 1990-10-03 | 1991-10-02 | Kalibrierung von kapazitiven Sonden |
Country Status (7)
Country | Link |
---|---|
US (1) | US5583443A (de) |
EP (2) | EP0503037B1 (de) |
JP (1) | JP3267608B2 (de) |
DE (2) | DE69132243T2 (de) |
ES (1) | ES2146287T3 (de) |
GB (1) | GB9021447D0 (de) |
WO (1) | WO1992006350A1 (de) |
Families Citing this family (47)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB9107890D0 (en) * | 1991-04-13 | 1991-05-29 | T & N Technology Ltd | Mapping a surface of a workpiece |
US5315259A (en) * | 1992-05-26 | 1994-05-24 | Universities Research Association, Inc. | Omnidirectional capacitive probe for gauge of having a sensing tip formed as a substantially complete sphere |
DE19508861A1 (de) * | 1995-03-11 | 1996-09-12 | Zeiss Carl Fa | Koordinatenmeßgerät mit einer Einrichtung für die Rauheitsmessung |
JP4067565B2 (ja) * | 1995-11-30 | 2008-03-26 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 医療用診断装置用の電磁気的対象検出器 |
US5974869A (en) * | 1996-11-14 | 1999-11-02 | Georgia Tech Research Corp. | Non-vibrating capacitance probe for wear monitoring |
JP3526385B2 (ja) * | 1997-03-11 | 2004-05-10 | 株式会社東芝 | パターン形成装置 |
DE19727094C2 (de) * | 1997-06-25 | 2003-10-16 | Fraunhofer Ges Forschung | Verfahren zur Abstandsmessung zwischen einem Werkzeugendteil einer Manipulatoreinheit und einer mit dem Werkzeugendteil zu bearbeitenden Objektoberfläche oder eines zu manipulierenden Objektes |
US6152662A (en) | 1997-07-31 | 2000-11-28 | Machine Magic, Llc | Key duplication apparatus and method |
US5908273A (en) * | 1997-07-31 | 1999-06-01 | Machine Magic-Llc | Key duplication apparatus and method |
US6307385B1 (en) | 1997-12-30 | 2001-10-23 | Vibrosystm, Inc. | Capacitance measuring circuit for a capacitive sensor |
US6112423A (en) * | 1999-01-15 | 2000-09-05 | Brown & Sharpe Manufacturing Co. | Apparatus and method for calibrating a probe assembly of a measuring machine |
JP3831561B2 (ja) * | 1999-11-22 | 2006-10-11 | 株式会社ミツトヨ | 測定機の衝突防止装置 |
WO2001047420A1 (en) * | 1999-12-24 | 2001-07-05 | Koninklijke Philips Electronics N.V. | Electromagnetic object detector provided with an additional electrode and intended for a medical radiation apparatus |
JP2001330428A (ja) * | 2000-05-23 | 2001-11-30 | Natl Inst Of Advanced Industrial Science & Technology Meti | 3次元測定機の測定誤差評価方法及び3次元測定機用ゲージ |
WO2002067481A1 (en) * | 2001-02-20 | 2002-08-29 | University Of Maryland, Baltimore County | Widely tunable and integrated optical system and method |
GB0126232D0 (en) * | 2001-11-01 | 2002-01-02 | Renishaw Plc | Calibration of an analogue probe |
US6721675B1 (en) * | 2003-01-31 | 2004-04-13 | The Boeing Company | Machine capability verification and diagnostics (CAP/DIA) system, method and computer program product |
US7308367B2 (en) * | 2003-02-03 | 2007-12-11 | Qcept Technologies, Inc. | Wafer inspection system |
US6957154B2 (en) * | 2003-02-03 | 2005-10-18 | Qcept Technologies, Inc. | Semiconductor wafer inspection system |
US7103482B2 (en) * | 2003-02-03 | 2006-09-05 | Qcept Technologies, Inc. | Inspection system and apparatus |
US7107158B2 (en) | 2003-02-03 | 2006-09-12 | Qcept Technologies, Inc. | Inspection system and apparatus |
WO2005012853A1 (en) * | 2003-07-25 | 2005-02-10 | Qcept Technologies, Inc. | Measurement of motions of rotating shafts using non-vibrating contact potential difference sensor |
US7061245B2 (en) * | 2004-02-06 | 2006-06-13 | Snap-On Incorporated | Coil-on plug capacitive sensors and passive coil-on plug diagnostic system incorporating same |
JP2006297717A (ja) * | 2005-04-19 | 2006-11-02 | Sumitomo Electric Ind Ltd | 樹脂製薄膜の検査方法および検査装置 |
US9101990B2 (en) | 2006-01-23 | 2015-08-11 | Hy-Ko Products | Key duplication machine |
MX2008009440A (es) | 2006-01-23 | 2008-11-19 | Hy Ko Products Co | Máquina duplicadora de llaves. |
US7357018B2 (en) * | 2006-02-10 | 2008-04-15 | Agilent Technologies, Inc. | Method for performing a measurement inside a specimen using an insertable nanoscale FET probe |
JP4828316B2 (ja) | 2006-06-13 | 2011-11-30 | 三菱電機株式会社 | レーザ加工機用のギャップ検出装置及びレーザ加工システム並びにレーザ加工機用のギャップ検出方法 |
JP2008046080A (ja) * | 2006-08-21 | 2008-02-28 | Fujikura Ltd | 静電容量センサ |
US7659734B2 (en) * | 2007-03-07 | 2010-02-09 | Qcept Technologies, Inc. | Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination |
US7900526B2 (en) * | 2007-11-30 | 2011-03-08 | Qcept Technologies, Inc. | Defect classification utilizing data from a non-vibrating contact potential difference sensor |
GB0804114D0 (en) | 2008-03-05 | 2008-04-09 | Renishaw Plc | Surface sensing device |
US7752000B2 (en) * | 2008-05-02 | 2010-07-06 | Qcept Technologies, Inc. | Calibration of non-vibrating contact potential difference measurements to detect surface variations that are perpendicular to the direction of sensor motion |
GB0900878D0 (en) | 2009-01-20 | 2009-03-04 | Renishaw Plc | Method for optimising a measurement cycle |
MX343763B (es) | 2009-05-01 | 2016-11-18 | Hy-Ko Products | Sistema de identificación de llave en blanco con exploración digital de ranura. |
US8634655B2 (en) | 2009-05-01 | 2014-01-21 | Hy-Ko Products Company | Key blank identification system with bitting analysis |
JP2012137473A (ja) * | 2010-12-07 | 2012-07-19 | Kobe Steel Ltd | 粗さ測定装置 |
WO2012099586A1 (en) * | 2011-01-20 | 2012-07-26 | Carl Zeiss Industrial Metrology, Llc | Modular ceramic guideway member |
RU2504730C1 (ru) * | 2012-07-19 | 2014-01-20 | Федеральное Государственное Унитарное Предприятие "Государственный научно-производственный ракетно-космический центр "ЦСКБ-Прогресс" (ФГУП "ГНПРКЦ "ЦСКБ-Прогресс") | Способ контроля целостности токопроводящего покрытия на диэлектрическом материале |
US10077992B2 (en) | 2012-08-31 | 2018-09-18 | United Technologies Corporation | Tip clearance probe including anti-rotation feature |
GB201311600D0 (en) * | 2013-06-28 | 2013-08-14 | Renishaw Plc | Calibration of a contact probe |
US9658047B2 (en) | 2014-10-23 | 2017-05-23 | Caterpillar Inc. | Component measurement system having wavelength filtering |
US9879968B2 (en) | 2014-10-23 | 2018-01-30 | Caterpillar Inc. | Component measurement system having wavelength filtering |
EP3051253B1 (de) * | 2015-02-02 | 2018-08-22 | Rolls-Royce North American Technologies, Inc. | Mehrachsiger kalibrierungskörper |
WO2017024043A1 (en) | 2015-08-03 | 2017-02-09 | Hy-Ko Products Company | High security key scanning system |
US20170266744A1 (en) * | 2015-10-30 | 2017-09-21 | Mitsubishi Electric Corporation | Wire electric discharge machine, control method of control device of wire electric discharge machine, and positioning method |
KR101875694B1 (ko) * | 2016-10-17 | 2018-08-02 | 에이티아이 주식회사 | 레이저 커팅 장치, 파이프 센터링 장치 및 파이프 센터링 방법 |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3400331A (en) * | 1965-01-18 | 1968-09-03 | Pratt & Whitney Inc | Gaging device including a probe having a plurality of concentric and coextensive electrodes |
US3593127A (en) * | 1968-06-12 | 1971-07-13 | Reliance Electric & Eng Co | Directional displacement capacitive pickup |
US4153998A (en) | 1972-09-21 | 1979-05-15 | Rolls-Royce (1971) Limited | Probes |
US3986109A (en) * | 1975-01-29 | 1976-10-12 | Ade Corporation | Self-calibrating dimension gauge |
US4067225A (en) * | 1977-03-21 | 1978-01-10 | Mechanical Technology Incorporated | Capacitance type non-contact displacement and vibration measuring device and method of maintaining calibration |
US4130796A (en) * | 1977-12-07 | 1978-12-19 | Westinghouse Electric Corp. | Calibrating and measuring circuit for a capacitive probe-type instrument |
US4190797A (en) * | 1978-03-31 | 1980-02-26 | Gould Inc. | Capacitive gauging system utilizing a low internal capacitance, high impedance amplifier means |
FR2495308A1 (fr) * | 1980-12-01 | 1982-06-04 | Commissariat Energie Atomique | Palpeur a pression de contact nulle pour controle de pieces |
GB2101325B (en) * | 1981-06-23 | 1984-10-17 | Rank Organisation Ltd | Contact sensitive probes using capacitative sensors |
US4429463A (en) * | 1981-10-21 | 1984-02-07 | Angell Bruce R | Machinist electro-mechanical dynamic datum point locator tool |
US4509266A (en) * | 1982-06-14 | 1985-04-09 | Gte Valeron Corporation | Touch probe |
US4539835A (en) * | 1983-10-28 | 1985-09-10 | Control Data Corporation | Calibration apparatus for capacitance height gauges |
US4814691A (en) * | 1985-08-09 | 1989-03-21 | Washington Research Foundation | Fringe field capacitive sensor for measuring profile of a surface |
GB8610087D0 (en) | 1986-04-24 | 1986-05-29 | Renishaw Plc | Probe |
US4908574A (en) * | 1986-09-03 | 1990-03-13 | Extrude Hone Corporation | Capacitor array sensors for determining conformity to surface shape |
US4816744A (en) * | 1987-05-18 | 1989-03-28 | Laser Metric Systems, Inc. | Method and device for measuring inside diameters using a laser interferometer and capacitance measurements |
US5021740A (en) * | 1989-03-07 | 1991-06-04 | The Boeing Company | Method and apparatus for measuring the distance between a body and a capacitance probe |
US5189377A (en) * | 1990-09-04 | 1993-02-23 | Extrude Hone Corporation | Method and apparatus for co-ordinate measuring using a capacitance probe |
GB9021448D0 (en) | 1990-10-03 | 1990-11-14 | Renishaw Plc | Capacitance sensing probe |
US5315259A (en) * | 1992-05-26 | 1994-05-24 | Universities Research Association, Inc. | Omnidirectional capacitive probe for gauge of having a sensing tip formed as a substantially complete sphere |
-
1990
- 1990-10-03 GB GB909021447A patent/GB9021447D0/en active Pending
-
1991
- 1991-10-02 EP EP91917304A patent/EP0503037B1/de not_active Expired - Lifetime
- 1991-10-02 DE DE69132243T patent/DE69132243T2/de not_active Expired - Fee Related
- 1991-10-02 ES ES95202101T patent/ES2146287T3/es not_active Expired - Lifetime
- 1991-10-02 EP EP95202101A patent/EP0683378B1/de not_active Expired - Lifetime
- 1991-10-02 WO PCT/GB1991/001703 patent/WO1992006350A1/en active IP Right Grant
- 1991-10-02 DE DE69119057T patent/DE69119057T2/de not_active Expired - Fee Related
- 1991-10-02 JP JP51580591A patent/JP3267608B2/ja not_active Expired - Fee Related
-
1995
- 1995-06-07 US US08/481,161 patent/US5583443A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69119057T2 (de) | 1996-08-29 |
EP0683378B1 (de) | 2000-05-31 |
ES2146287T3 (es) | 2000-08-01 |
WO1992006350A1 (en) | 1992-04-16 |
EP0503037A1 (de) | 1992-09-16 |
JPH05502948A (ja) | 1993-05-20 |
JP3267608B2 (ja) | 2002-03-18 |
EP0683378A3 (de) | 1998-02-04 |
DE69132243D1 (de) | 2000-07-06 |
EP0503037B1 (de) | 1996-04-24 |
DE69132243T2 (de) | 2000-09-28 |
GB9021447D0 (en) | 1990-11-14 |
EP0683378A2 (de) | 1995-11-22 |
US5583443A (en) | 1996-12-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |