DE69030869D1 - Bildverarbeitungsverfahren zur Bewertung von Objekten und Vorrichtung zur Qualitätsprüfung zur Durchführung des Verfahrens - Google Patents
Bildverarbeitungsverfahren zur Bewertung von Objekten und Vorrichtung zur Qualitätsprüfung zur Durchführung des VerfahrensInfo
- Publication number
- DE69030869D1 DE69030869D1 DE69030869T DE69030869T DE69030869D1 DE 69030869 D1 DE69030869 D1 DE 69030869D1 DE 69030869 T DE69030869 T DE 69030869T DE 69030869 T DE69030869 T DE 69030869T DE 69030869 D1 DE69030869 D1 DE 69030869D1
- Authority
- DE
- Germany
- Prior art keywords
- image processing
- carry out
- quality inspection
- processing method
- evaluating objects
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000007689 inspection Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 238000003672 processing method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0006—Industrial image inspection using a design-rule based approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/70—Denoising; Smoothing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10024—Color image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20076—Probabilistic image processing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30141—Printed circuit board [PCB]
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Image Analysis (AREA)
- Image Processing (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1343107A JP3020973B2 (ja) | 1989-12-29 | 1989-12-29 | 画像処理方法 |
JP1343108A JP2840347B2 (ja) | 1989-12-29 | 1989-12-29 | 基板実装検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69030869D1 true DE69030869D1 (de) | 1997-07-10 |
DE69030869T2 DE69030869T2 (de) | 1997-10-16 |
Family
ID=26577425
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69030869T Expired - Fee Related DE69030869T2 (de) | 1989-12-29 | 1990-12-24 | Bildverarbeitungsverfahren zur Bewertung von Objekten und Vorrichtung zur Qualitätsprüfung zur Durchführung des Verfahrens |
Country Status (3)
Country | Link |
---|---|
US (1) | US5638460A (de) |
EP (1) | EP0435660B1 (de) |
DE (1) | DE69030869T2 (de) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE69331433T2 (de) * | 1992-10-22 | 2002-10-02 | Advanced Interconnection Technology, Inc. | Einrichtung zur automatischen optischen Prüfung von Leiterplatten mit darin verlegten Drähten |
IL106007A0 (en) * | 1993-06-14 | 1993-10-20 | Galai Lab Ltd | Automatic inspection system |
US5793888A (en) * | 1994-11-14 | 1998-08-11 | Massachusetts Institute Of Technology | Machine learning apparatus and method for image searching |
US6249779B1 (en) * | 1998-05-13 | 2001-06-19 | Ben A. Hitt | Adaptive fuzzy feature mapping |
US6401007B1 (en) * | 1999-04-16 | 2002-06-04 | Kalish Canada Inc. | Gage element for performing automatic setting of a machine for manipulating articles, such as a palletization machine |
FR2802643B1 (fr) * | 1999-12-15 | 2002-03-08 | Sgcc | Procede de controle de la qualite d'un article notamment en verre |
JP4743805B2 (ja) * | 2000-04-06 | 2011-08-10 | ルネサスエレクトロニクス株式会社 | 外観検査方法および装置 |
US7167583B1 (en) | 2000-06-28 | 2007-01-23 | Landrex Technologies Co., Ltd. | Image processing system for use with inspection systems |
US7117192B2 (en) * | 2001-05-23 | 2006-10-03 | Veridian Erim International, Inc. | Text and imagery spatial correlator |
US7636636B2 (en) * | 2001-10-12 | 2009-12-22 | Abbott Laboratories | Imaging microarrays |
US7143352B2 (en) * | 2002-11-01 | 2006-11-28 | Mitsubishi Electric Research Laboratories, Inc | Blind summarization of video content |
US7103222B2 (en) * | 2002-11-01 | 2006-09-05 | Mitsubishi Electric Research Laboratories, Inc. | Pattern discovery in multi-dimensional time series using multi-resolution matching |
WO2007074770A1 (ja) * | 2005-12-26 | 2007-07-05 | Nikon Corporation | 画像解析によって欠陥検査を行う欠陥検査装置 |
JP5045652B2 (ja) * | 2008-11-21 | 2012-10-10 | 富士通株式会社 | 相関処理装置及びその相関処理装置で読みとり可能な媒体 |
CN103186789B (zh) * | 2011-12-27 | 2016-09-07 | 英业达股份有限公司 | 自动判别零件正确性的方法 |
CN107065834B (zh) * | 2017-05-25 | 2019-01-22 | 东北大学 | 湿法冶金过程中浓密机的故障诊断方法 |
CN112526931B (zh) * | 2020-11-27 | 2022-03-11 | 江苏科技大学 | 一种船用柴油机机身孔系镗削加工过程质量控制方法 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU7529981A (en) * | 1980-09-19 | 1982-03-25 | Hitachi Limited | Language analysis by pattern recognition |
US4589140A (en) * | 1983-03-21 | 1986-05-13 | Beltronics, Inc. | Method of and apparatus for real-time high-speed inspection of objects for identifying or recognizing known and unknown portions thereof, including defects and the like |
DE3347645C1 (de) * | 1983-12-30 | 1985-10-10 | Dr.-Ing. Ludwig Pietzsch Gmbh & Co, 7505 Ettlingen | Verfahren und Einrichtung zum opto-elektronischen Pruefen eines Flaechenmusters an einem Objekt |
JPS60244803A (ja) * | 1984-05-21 | 1985-12-04 | Disco Abrasive Sys Ltd | 自動精密位置合せシステム |
US4881269A (en) * | 1985-07-29 | 1989-11-14 | French Limited Company - Centaure Robotique | Automatic method of optically scanning a two-dimensional scene line-by-line and of electronically inspecting patterns therein by "shape-tracking" |
US4916745A (en) * | 1986-02-07 | 1990-04-10 | Hart Hiram E | Bayesian image processing method and apparatus |
US4817184A (en) * | 1986-04-14 | 1989-03-28 | Vartec Corporation | Electronic inspection system and methods of inspection |
US4809341A (en) * | 1986-07-18 | 1989-02-28 | Fujitsu Limited | Test method and apparatus for a reticle or mask pattern used in semiconductor device fabrication |
US4953100A (en) * | 1986-10-03 | 1990-08-28 | Omron Tateisi Electronics Co. | Apparatus for inspecting packaged electronic device |
US4958375A (en) * | 1988-02-17 | 1990-09-18 | Nestor, Inc. | Parallel, multi-unit, adaptive pattern classification system using inter-unit correlations and an intra-unit class separator methodology |
US4991092A (en) * | 1988-08-12 | 1991-02-05 | The Regents Of The University Of California | Image processor for enhancing contrast between subregions of a region of interest |
US5079545A (en) * | 1989-01-13 | 1992-01-07 | Sun Microsystems, Inc. | Apparatus and method for processing graphical information to minimize page crossings and eliminate processing of information outside a predetermined clip window |
US5123057A (en) * | 1989-07-28 | 1992-06-16 | Massachusetts Institute Of Technology | Model based pattern recognition |
FR2653563B1 (fr) * | 1989-10-24 | 1992-01-10 | Aerospatiale | Procede et dispositif pour la reconnaissance d'une cible. |
-
1990
- 1990-12-24 EP EP90314291A patent/EP0435660B1/de not_active Expired - Lifetime
- 1990-12-24 DE DE69030869T patent/DE69030869T2/de not_active Expired - Fee Related
-
1993
- 1993-12-29 US US08/174,174 patent/US5638460A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0435660B1 (de) | 1997-06-04 |
EP0435660A2 (de) | 1991-07-03 |
US5638460A (en) | 1997-06-10 |
EP0435660A3 (en) | 1992-02-12 |
DE69030869T2 (de) | 1997-10-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8381 | Inventor (new situation) |
Free format text: NISHIMORI, EIJI, YOKOHAMA-SHI, KANAGAWA-KEN, JP SHINGU, TOSHIAKI,C/OCANON DAINI AOBADAI-RYO, 2-CHOME, YOKOHAMA-SHI, KANAGAWA-KEN, JP |
|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |