DE69030869D1 - Bildverarbeitungsverfahren zur Bewertung von Objekten und Vorrichtung zur Qualitätsprüfung zur Durchführung des Verfahrens - Google Patents

Bildverarbeitungsverfahren zur Bewertung von Objekten und Vorrichtung zur Qualitätsprüfung zur Durchführung des Verfahrens

Info

Publication number
DE69030869D1
DE69030869D1 DE69030869T DE69030869T DE69030869D1 DE 69030869 D1 DE69030869 D1 DE 69030869D1 DE 69030869 T DE69030869 T DE 69030869T DE 69030869 T DE69030869 T DE 69030869T DE 69030869 D1 DE69030869 D1 DE 69030869D1
Authority
DE
Germany
Prior art keywords
image processing
carry out
quality inspection
processing method
evaluating objects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69030869T
Other languages
English (en)
Other versions
DE69030869T2 (de
Inventor
Eiji Nishimori
Toshiaki Shingu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP1343107A external-priority patent/JP3020973B2/ja
Priority claimed from JP1343108A external-priority patent/JP2840347B2/ja
Application filed by Canon Inc filed Critical Canon Inc
Application granted granted Critical
Publication of DE69030869D1 publication Critical patent/DE69030869D1/de
Publication of DE69030869T2 publication Critical patent/DE69030869T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/70—Denoising; Smoothing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20076—Probabilistic image processing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
DE69030869T 1989-12-29 1990-12-24 Bildverarbeitungsverfahren zur Bewertung von Objekten und Vorrichtung zur Qualitätsprüfung zur Durchführung des Verfahrens Expired - Fee Related DE69030869T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP1343107A JP3020973B2 (ja) 1989-12-29 1989-12-29 画像処理方法
JP1343108A JP2840347B2 (ja) 1989-12-29 1989-12-29 基板実装検査装置

Publications (2)

Publication Number Publication Date
DE69030869D1 true DE69030869D1 (de) 1997-07-10
DE69030869T2 DE69030869T2 (de) 1997-10-16

Family

ID=26577425

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69030869T Expired - Fee Related DE69030869T2 (de) 1989-12-29 1990-12-24 Bildverarbeitungsverfahren zur Bewertung von Objekten und Vorrichtung zur Qualitätsprüfung zur Durchführung des Verfahrens

Country Status (3)

Country Link
US (1) US5638460A (de)
EP (1) EP0435660B1 (de)
DE (1) DE69030869T2 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69331433T2 (de) * 1992-10-22 2002-10-02 Advanced Interconnection Technology, Inc. Einrichtung zur automatischen optischen Prüfung von Leiterplatten mit darin verlegten Drähten
IL106007A0 (en) * 1993-06-14 1993-10-20 Galai Lab Ltd Automatic inspection system
US5793888A (en) * 1994-11-14 1998-08-11 Massachusetts Institute Of Technology Machine learning apparatus and method for image searching
US6249779B1 (en) * 1998-05-13 2001-06-19 Ben A. Hitt Adaptive fuzzy feature mapping
US6401007B1 (en) * 1999-04-16 2002-06-04 Kalish Canada Inc. Gage element for performing automatic setting of a machine for manipulating articles, such as a palletization machine
FR2802643B1 (fr) * 1999-12-15 2002-03-08 Sgcc Procede de controle de la qualite d'un article notamment en verre
JP4743805B2 (ja) * 2000-04-06 2011-08-10 ルネサスエレクトロニクス株式会社 外観検査方法および装置
US7167583B1 (en) 2000-06-28 2007-01-23 Landrex Technologies Co., Ltd. Image processing system for use with inspection systems
US7117192B2 (en) * 2001-05-23 2006-10-03 Veridian Erim International, Inc. Text and imagery spatial correlator
US7636636B2 (en) * 2001-10-12 2009-12-22 Abbott Laboratories Imaging microarrays
US7143352B2 (en) * 2002-11-01 2006-11-28 Mitsubishi Electric Research Laboratories, Inc Blind summarization of video content
US7103222B2 (en) * 2002-11-01 2006-09-05 Mitsubishi Electric Research Laboratories, Inc. Pattern discovery in multi-dimensional time series using multi-resolution matching
WO2007074770A1 (ja) * 2005-12-26 2007-07-05 Nikon Corporation 画像解析によって欠陥検査を行う欠陥検査装置
JP5045652B2 (ja) * 2008-11-21 2012-10-10 富士通株式会社 相関処理装置及びその相関処理装置で読みとり可能な媒体
CN103186789B (zh) * 2011-12-27 2016-09-07 英业达股份有限公司 自动判别零件正确性的方法
CN107065834B (zh) * 2017-05-25 2019-01-22 东北大学 湿法冶金过程中浓密机的故障诊断方法
CN112526931B (zh) * 2020-11-27 2022-03-11 江苏科技大学 一种船用柴油机机身孔系镗削加工过程质量控制方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU7529981A (en) * 1980-09-19 1982-03-25 Hitachi Limited Language analysis by pattern recognition
US4589140A (en) * 1983-03-21 1986-05-13 Beltronics, Inc. Method of and apparatus for real-time high-speed inspection of objects for identifying or recognizing known and unknown portions thereof, including defects and the like
DE3347645C1 (de) * 1983-12-30 1985-10-10 Dr.-Ing. Ludwig Pietzsch Gmbh & Co, 7505 Ettlingen Verfahren und Einrichtung zum opto-elektronischen Pruefen eines Flaechenmusters an einem Objekt
JPS60244803A (ja) * 1984-05-21 1985-12-04 Disco Abrasive Sys Ltd 自動精密位置合せシステム
US4881269A (en) * 1985-07-29 1989-11-14 French Limited Company - Centaure Robotique Automatic method of optically scanning a two-dimensional scene line-by-line and of electronically inspecting patterns therein by "shape-tracking"
US4916745A (en) * 1986-02-07 1990-04-10 Hart Hiram E Bayesian image processing method and apparatus
US4817184A (en) * 1986-04-14 1989-03-28 Vartec Corporation Electronic inspection system and methods of inspection
US4809341A (en) * 1986-07-18 1989-02-28 Fujitsu Limited Test method and apparatus for a reticle or mask pattern used in semiconductor device fabrication
US4953100A (en) * 1986-10-03 1990-08-28 Omron Tateisi Electronics Co. Apparatus for inspecting packaged electronic device
US4958375A (en) * 1988-02-17 1990-09-18 Nestor, Inc. Parallel, multi-unit, adaptive pattern classification system using inter-unit correlations and an intra-unit class separator methodology
US4991092A (en) * 1988-08-12 1991-02-05 The Regents Of The University Of California Image processor for enhancing contrast between subregions of a region of interest
US5079545A (en) * 1989-01-13 1992-01-07 Sun Microsystems, Inc. Apparatus and method for processing graphical information to minimize page crossings and eliminate processing of information outside a predetermined clip window
US5123057A (en) * 1989-07-28 1992-06-16 Massachusetts Institute Of Technology Model based pattern recognition
FR2653563B1 (fr) * 1989-10-24 1992-01-10 Aerospatiale Procede et dispositif pour la reconnaissance d'une cible.

Also Published As

Publication number Publication date
EP0435660B1 (de) 1997-06-04
EP0435660A2 (de) 1991-07-03
US5638460A (en) 1997-06-10
EP0435660A3 (en) 1992-02-12
DE69030869T2 (de) 1997-10-16

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Legal Events

Date Code Title Description
8381 Inventor (new situation)

Free format text: NISHIMORI, EIJI, YOKOHAMA-SHI, KANAGAWA-KEN, JP SHINGU, TOSHIAKI,C/OCANON DAINI AOBADAI-RYO, 2-CHOME, YOKOHAMA-SHI, KANAGAWA-KEN, JP

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee