DE69015122D1 - Prüfsystem für einen Mikroprozessor. - Google Patents

Prüfsystem für einen Mikroprozessor.

Info

Publication number
DE69015122D1
DE69015122D1 DE69015122T DE69015122T DE69015122D1 DE 69015122 D1 DE69015122 D1 DE 69015122D1 DE 69015122 T DE69015122 T DE 69015122T DE 69015122 T DE69015122 T DE 69015122T DE 69015122 D1 DE69015122 D1 DE 69015122D1
Authority
DE
Germany
Prior art keywords
microprocessor
test system
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69015122T
Other languages
English (en)
Other versions
DE69015122T2 (de
Inventor
Jean-Pierre Charvin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
SGS Thomson Microelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA filed Critical SGS Thomson Microelectronics SA
Publication of DE69015122D1 publication Critical patent/DE69015122D1/de
Application granted granted Critical
Publication of DE69015122T2 publication Critical patent/DE69015122T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Microcomputers (AREA)
  • Tests Of Electronic Circuits (AREA)
DE69015122T 1989-10-31 1990-10-24 Prüfsystem für einen Mikroprozessor. Expired - Fee Related DE69015122T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8914298A FR2653913B1 (fr) 1989-10-31 1989-10-31 Systeme de test d'un microprocesseur.

Publications (2)

Publication Number Publication Date
DE69015122D1 true DE69015122D1 (de) 1995-01-26
DE69015122T2 DE69015122T2 (de) 1995-05-24

Family

ID=9386978

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69015122T Expired - Fee Related DE69015122T2 (de) 1989-10-31 1990-10-24 Prüfsystem für einen Mikroprozessor.

Country Status (4)

Country Link
US (1) US5121393A (de)
EP (1) EP0426531B1 (de)
DE (1) DE69015122T2 (de)
FR (1) FR2653913B1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5359547A (en) * 1992-06-26 1994-10-25 Digital Equipment Corporation Method and apparatus for testing processor-based computer modules
FI92261C (fi) * 1992-12-03 1994-10-10 Nokia Telecommunications Oy Menetelmä mikroprosessorin toiminnan tarkastamiseksi ja järjestelmä menetelmän toteuttamiseksi
US6230290B1 (en) * 1997-07-02 2001-05-08 International Business Machines Corporation Method of self programmed built in self test
US6581019B1 (en) * 2000-03-20 2003-06-17 Koninklijke Philips Electronics N.V. Computer-system-on-a-chip with test-mode addressing of normally off-bus input/output ports
US20090055805A1 (en) * 2007-08-24 2009-02-26 International Business Machines Corporation Method and System for Testing Software

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4185190A (en) * 1974-10-28 1980-01-22 Compagnie Internationale pour L'Informatique, CII-Honeywell Bull (Societe Anonyme) Data accumulation and compression apparatus
US3961252A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
FR2451672A1 (fr) * 1979-03-15 1980-10-10 Nippon Electric Co Circuit logique integre pour l'execution de tests
US4598245B1 (en) * 1983-06-13 1993-11-16 Circuit tester having indirect counters
IT1184054B (it) * 1985-03-25 1987-10-22 Cselt Centro Studi Lab Telecom Unita di controllo di microprogramma autocollaudante con rilevazione in linea degli errori in tecnologia mos
JPS63193237A (ja) * 1987-02-06 1988-08-10 Toshiba Corp 半導体集積回路装置

Also Published As

Publication number Publication date
US5121393A (en) 1992-06-09
FR2653913B1 (fr) 1992-01-03
EP0426531B1 (de) 1994-12-14
FR2653913A1 (fr) 1991-05-03
EP0426531A1 (de) 1991-05-08
DE69015122T2 (de) 1995-05-24

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee