DE60202443D1 - Methode zum Testen eines elektronischen Bauteils - Google Patents

Methode zum Testen eines elektronischen Bauteils

Info

Publication number
DE60202443D1
DE60202443D1 DE60202443T DE60202443T DE60202443D1 DE 60202443 D1 DE60202443 D1 DE 60202443D1 DE 60202443 T DE60202443 T DE 60202443T DE 60202443 T DE60202443 T DE 60202443T DE 60202443 D1 DE60202443 D1 DE 60202443D1
Authority
DE
Germany
Prior art keywords
testing
electronic component
electronic
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60202443T
Other languages
English (en)
Other versions
DE60202443T2 (de
Inventor
Hong Eric Chee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Qimonda AG
Original Assignee
Infineon Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies AG filed Critical Infineon Technologies AG
Publication of DE60202443D1 publication Critical patent/DE60202443D1/de
Application granted granted Critical
Publication of DE60202443T2 publication Critical patent/DE60202443T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56004—Pattern generation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C2029/5006—Current

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE60202443T 2002-05-08 2002-05-08 Methode zum Testen eines elektronischen Bauteils Expired - Lifetime DE60202443T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP02010478A EP1361450B1 (de) 2002-05-08 2002-05-08 Methode zum Testen eines elektronischen Bauteils

Publications (2)

Publication Number Publication Date
DE60202443D1 true DE60202443D1 (de) 2005-02-03
DE60202443T2 DE60202443T2 (de) 2006-01-12

Family

ID=29225632

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60202443T Expired - Lifetime DE60202443T2 (de) 2002-05-08 2002-05-08 Methode zum Testen eines elektronischen Bauteils

Country Status (3)

Country Link
US (1) US6842712B2 (de)
EP (1) EP1361450B1 (de)
DE (1) DE60202443T2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050273685A1 (en) * 2004-06-08 2005-12-08 Sanjay Sachdev Automated and customizable generation of efficient test programs for multiple electrical test equipment platforms
JP5021499B2 (ja) * 2005-01-24 2012-09-05 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 複数の装置のための制御システムを構成するシステム及び方法
CN101666853B (zh) * 2008-09-03 2011-08-17 京元电子股份有限公司 测试排程***与方法
CN102222526B (zh) * 2010-04-14 2015-04-01 苹果公司 用于对电子装置的处理过程进行控制的方法和装置
TW201232253A (en) * 2011-01-24 2012-08-01 Hon Hai Prec Ind Co Ltd System and method for arranging test data
CN102636704B (zh) * 2012-03-05 2015-07-15 深圳市英威腾电气股份有限公司 一种电子产品的测试方法、装置及***
CN103809102B (zh) * 2012-11-06 2017-08-22 比亚迪股份有限公司 一种在编程时对芯片进行测试的方法及测试***
KR102185871B1 (ko) * 2014-01-23 2020-12-02 삼성전자주식회사 부분 칩과 이를 포함하는 시스템
CN103760443A (zh) * 2014-01-24 2014-04-30 浙江众合机电股份有限公司 一种板卡自动测试***及其测试方法
US10782339B2 (en) 2016-04-29 2020-09-22 Teradyne, Inc. Method and test system for providing accurate analog signals
CN106093632B (zh) * 2016-06-03 2018-11-06 温州大学 基于扫描被测电子设备位置的ip地址设定方法及***

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4646299A (en) * 1983-08-01 1987-02-24 Fairchild Semiconductor Corporation Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits
US4606025A (en) * 1983-09-28 1986-08-12 International Business Machines Corp. Automatically testing a plurality of memory arrays on selected memory array testers
US5592077A (en) * 1995-02-13 1997-01-07 Cirrus Logic, Inc. Circuits, systems and methods for testing ASIC and RAM memory devices
JP2921476B2 (ja) * 1996-03-28 1999-07-19 日本電気株式会社 Ｌｓｉの電源電流テスト方法
US5742177A (en) * 1996-09-27 1998-04-21 Intel Corporation Method for testing a semiconductor device by measuring quiescent currents (IDDQ) at two different temperatures
US6239609B1 (en) * 1998-02-11 2001-05-29 Lsi Logic Corporation Reduced voltage quiescent current test methodology for integrated circuits

Also Published As

Publication number Publication date
US20030212517A1 (en) 2003-11-13
EP1361450A1 (de) 2003-11-12
DE60202443T2 (de) 2006-01-12
EP1361450B1 (de) 2004-12-29
US6842712B2 (en) 2005-01-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: QIMONDA AG, 81739 MUENCHEN, DE