DE602007008216D1 - TEST APPARATUS AND TEST METHOD - Google Patents
TEST APPARATUS AND TEST METHODInfo
- Publication number
- DE602007008216D1 DE602007008216D1 DE602007008216T DE602007008216T DE602007008216D1 DE 602007008216 D1 DE602007008216 D1 DE 602007008216D1 DE 602007008216 T DE602007008216 T DE 602007008216T DE 602007008216 T DE602007008216 T DE 602007008216T DE 602007008216 D1 DE602007008216 D1 DE 602007008216D1
- Authority
- DE
- Germany
- Prior art keywords
- page
- dut
- grade
- failure information
- pass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31932—Comparators
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C29/56008—Error analysis, representation of errors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5602—Interface to device under test
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5606—Error catch memory
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Tests Of Electronic Circuits (AREA)
- Maintenance And Management Of Digital Transmission (AREA)
- Diaphragms For Electromechanical Transducers (AREA)
Abstract
An object is to efficiently test a memory under test (hereinafter, DUT) storing a data sequence affixed with an error check and correction. This test apparatus compares each bit included in a data sequence read out from the DUT with an expectation value. The result of comparison is stored in a first failure memory (hereinafter, FM) as bit pass/failure information indicating whether each storage cell of the DUT is good or defective. The storage device counts the number of bits that do not match the expectation values for each page, and judges for each grade and page of the DUT whether the number of bits that do not match the expectation value meets the condition of that grade. The result of judgment is stored in a second FM as page pass/failure information indicating whether each page is good or defective with respect to each grade. Then, if page pass/failure information of a page including a bit corresponding to a given storage cell indicating that this page meets the condition of a given grade is stored in the second FM, the test apparatus outputs the bit pass/failure information in the first FM by changing it to a value indicating that that storage cell is not defective.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006105394 | 2006-04-06 | ||
PCT/JP2007/055879 WO2007119485A1 (en) | 2006-04-06 | 2007-03-22 | Test device and test method |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602007008216D1 true DE602007008216D1 (en) | 2010-09-16 |
Family
ID=38609270
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602007008216T Active DE602007008216D1 (en) | 2006-04-06 | 2007-03-22 | TEST APPARATUS AND TEST METHOD |
Country Status (9)
Country | Link |
---|---|
US (1) | US7984345B2 (en) |
EP (1) | EP2003653B1 (en) |
JP (1) | JP4864006B2 (en) |
KR (2) | KR20080007544A (en) |
CN (1) | CN101310342A (en) |
AT (1) | ATE476741T1 (en) |
DE (1) | DE602007008216D1 (en) |
TW (1) | TW200739593A (en) |
WO (1) | WO2007119485A1 (en) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5029883B2 (en) * | 2007-05-17 | 2012-09-19 | 横河電機株式会社 | Semiconductor test equipment |
US8234539B2 (en) * | 2007-12-06 | 2012-07-31 | Sandisk Il Ltd. | Correction of errors in a memory array |
JP2009181600A (en) * | 2008-01-29 | 2009-08-13 | Renesas Technology Corp | Semiconductor device |
KR101413137B1 (en) | 2008-07-04 | 2014-07-01 | 삼성전자주식회사 | Memory device and memory programming method |
JP5038256B2 (en) * | 2008-08-14 | 2012-10-03 | 株式会社アドバンテスト | Test module and test method |
US8149730B1 (en) | 2009-05-12 | 2012-04-03 | Juniper Networks, Inc. | Methods and apparatus related to packet generation and analysis |
US8174991B1 (en) * | 2009-06-29 | 2012-05-08 | Juniper Networks, Inc. | Methods and apparatus related to analysis of test packets |
JP2011170950A (en) * | 2010-01-21 | 2011-09-01 | Renesas Electronics Corp | Information storage device and test method therefor |
US8258803B2 (en) * | 2010-01-26 | 2012-09-04 | Advantest Corporation | Test apparatus and test method |
US8201024B2 (en) | 2010-05-17 | 2012-06-12 | Microsoft Corporation | Managing memory faults |
JP2012069180A (en) * | 2010-09-21 | 2012-04-05 | Toshiba Corp | Semiconductor storage device |
US8798077B2 (en) | 2010-12-29 | 2014-08-05 | Juniper Networks, Inc. | Methods and apparatus for standard protocol validation mechanisms deployed over a switch fabric system |
US8780896B2 (en) | 2010-12-29 | 2014-07-15 | Juniper Networks, Inc. | Methods and apparatus for validation of equal cost multi path (ECMP) paths in a switch fabric system |
TWI459393B (en) * | 2011-01-19 | 2014-11-01 | Phison Electronics Corp | Data writing method for a non-volatile memory module, memory controller and memory storage apparatus |
KR101824068B1 (en) * | 2011-07-28 | 2018-03-15 | 삼성전자주식회사 | A method of operating the memory controller, a memory system having the memory controller and a memory card and a portable electronic device |
US8995196B2 (en) | 2011-08-15 | 2015-03-31 | Skymedi Corporation | Method of sorting a multi-bit per cell non-volatile memory and a multi-mode configuration method |
KR101944793B1 (en) | 2012-09-04 | 2019-02-08 | 삼성전자주식회사 | Flash memory system including flash memory and detecting method of abnormal wordline thereof |
CN102788951B (en) * | 2012-09-05 | 2015-02-11 | 无锡江南计算技术研究所 | Automatic test equipment (ATE) test result judging method and ATE test method |
US9032244B2 (en) | 2012-11-16 | 2015-05-12 | Microsoft Technology Licensing, Llc | Memory segment remapping to address fragmentation |
US9911509B2 (en) | 2013-12-06 | 2018-03-06 | Intel Corporation | Counter to locate faulty die in a distributed codeword storage system |
US9600385B2 (en) * | 2014-02-25 | 2017-03-21 | Arrow Devices Pvt Ltd | Analyzing behavior of a device under test |
CN104979017B (en) * | 2014-04-03 | 2020-10-27 | 皇虎科技(加拿大)有限公司 | System and method for testing and assembling memory modules |
US20150363330A1 (en) * | 2014-06-17 | 2015-12-17 | Daniel Robert Watkins | Flash NAND device bad page replacement |
KR101527690B1 (en) * | 2014-10-10 | 2015-06-11 | (주) 에이블리 | NAND flash memory test interface apparatus and operating method thereof |
KR102238706B1 (en) * | 2014-11-28 | 2021-04-09 | 삼성전자주식회사 | Semiconductor memory device and memory system including the same |
KR20160121230A (en) * | 2015-04-10 | 2016-10-19 | 에스케이하이닉스 주식회사 | Semiconductor Memory Apparatus, Repair System therefor, and Method for Managing of Apparatus Quality |
WO2016188571A1 (en) * | 2015-05-27 | 2016-12-01 | Telefonaktiebolaget Lm Ericsson (Publ) | Method and apparatus for analysing performance of a network by managing network data relating to operation of the network |
KR20160146332A (en) * | 2015-06-12 | 2016-12-21 | 에스케이하이닉스 주식회사 | Memory system including plurality of storage areas and method of operating the same |
CN105139893B (en) * | 2015-09-27 | 2018-10-16 | 上海华力微电子有限公司 | A kind of memorizer test device and a kind of storage core chip test method |
TWI581093B (en) * | 2016-06-24 | 2017-05-01 | 慧榮科技股份有限公司 | Method for selecting bad columns within data storage media |
KR102545698B1 (en) * | 2016-09-27 | 2023-06-19 | 삼성전자주식회사 | Data storage system |
KR102458563B1 (en) * | 2018-02-12 | 2022-10-28 | 한국전자통신연구원 | Communication method and communication device using ambient backscatter communication |
KR102507774B1 (en) * | 2018-03-08 | 2023-03-09 | 에스케이하이닉스 주식회사 | Memory chip and test system including the same |
JP7295954B2 (en) * | 2019-01-22 | 2023-06-21 | 株式会社アドバンテスト | Automated test equipment with on-chip system test controller |
US11342044B2 (en) * | 2019-05-28 | 2022-05-24 | Nuvoton Technology Corporation | System and method for prioritization of bit error correction attempts |
KR20210004135A (en) * | 2019-07-03 | 2021-01-13 | 에스케이하이닉스 주식회사 | Fail information control circuit, semiconductor apparatus including the same and fail information control method of the semiconductor apparatus |
TWI764297B (en) * | 2019-11-20 | 2022-05-11 | 大陸商珠海南北極科技有限公司 | accumulator circuit |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19990029646A (en) | 1997-09-09 | 1999-04-26 | 오우라 히로시 | Memory tester |
JP2000173289A (en) * | 1998-12-10 | 2000-06-23 | Toshiba Corp | Flash memory system which can correct error |
JP4323707B2 (en) * | 2000-10-25 | 2009-09-02 | 富士通マイクロエレクトロニクス株式会社 | Flash memory defect management method |
JP4250325B2 (en) * | 2000-11-01 | 2009-04-08 | 株式会社東芝 | Semiconductor memory device |
JP4296092B2 (en) | 2001-12-18 | 2009-07-15 | 株式会社アドバンテスト | Semiconductor test equipment |
JP4158526B2 (en) * | 2003-01-09 | 2008-10-01 | 松下電器産業株式会社 | Memory card and data writing method to memory |
JP2005056394A (en) * | 2003-07-18 | 2005-03-03 | Toshiba Corp | Storage device and memory card |
US7493534B2 (en) * | 2003-08-29 | 2009-02-17 | Hewlett-Packard Development Company, L.P. | Memory error ranking |
JP4041076B2 (en) * | 2004-02-27 | 2008-01-30 | 株式会社東芝 | Data storage system |
JP2006012367A (en) * | 2004-06-29 | 2006-01-12 | Toshiba Corp | Nonvolatile semiconductor storage device |
JP4261462B2 (en) * | 2004-11-05 | 2009-04-30 | 株式会社東芝 | Nonvolatile memory system |
US7447955B2 (en) * | 2005-11-30 | 2008-11-04 | Advantest Corporation | Test apparatus and test method |
-
2007
- 2007-03-22 EP EP07739322A patent/EP2003653B1/en not_active Not-in-force
- 2007-03-22 CN CNA200780000113XA patent/CN101310342A/en active Pending
- 2007-03-22 JP JP2007541563A patent/JP4864006B2/en not_active Expired - Fee Related
- 2007-03-22 KR KR1020077020964A patent/KR20080007544A/en active Application Filing
- 2007-03-22 KR KR1020097007788A patent/KR20090053960A/en active Search and Examination
- 2007-03-22 DE DE602007008216T patent/DE602007008216D1/en active Active
- 2007-03-22 AT AT07739322T patent/ATE476741T1/en not_active IP Right Cessation
- 2007-03-22 WO PCT/JP2007/055879 patent/WO2007119485A1/en active Application Filing
- 2007-03-29 TW TW096110985A patent/TW200739593A/en unknown
- 2007-09-19 US US11/857,453 patent/US7984345B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
WO2007119485A1 (en) | 2007-10-25 |
JP4864006B2 (en) | 2012-01-25 |
EP2003653B1 (en) | 2010-08-04 |
JPWO2007119485A1 (en) | 2009-08-27 |
EP2003653A1 (en) | 2008-12-17 |
TW200739593A (en) | 2007-10-16 |
US7984345B2 (en) | 2011-07-19 |
CN101310342A (en) | 2008-11-19 |
KR20090053960A (en) | 2009-05-28 |
KR20080007544A (en) | 2008-01-22 |
US20080052015A1 (en) | 2008-02-28 |
EP2003653A4 (en) | 2009-10-28 |
ATE476741T1 (en) | 2010-08-15 |
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