DE602005002131D1 - Prüfvorrichtung mit Anpassung des Prüfparameters - Google Patents

Prüfvorrichtung mit Anpassung des Prüfparameters

Info

Publication number
DE602005002131D1
DE602005002131D1 DE602005002131T DE602005002131T DE602005002131D1 DE 602005002131 D1 DE602005002131 D1 DE 602005002131D1 DE 602005002131 T DE602005002131 T DE 602005002131T DE 602005002131 T DE602005002131 T DE 602005002131T DE 602005002131 D1 DE602005002131 D1 DE 602005002131D1
Authority
DE
Germany
Prior art keywords
test
adaptation
parameter
test device
test parameter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005002131T
Other languages
English (en)
Other versions
DE602005002131T2 (de
Inventor
Sabine Funke-Schaeff
Albrecht Schroth
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE602005002131D1 publication Critical patent/DE602005002131D1/de
Application granted granted Critical
Publication of DE602005002131T2 publication Critical patent/DE602005002131T2/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Tests Of Electronic Circuits (AREA)
DE602005002131T 2005-05-20 2005-05-20 Prüfvorrichtung mit Anpassung des Prüfparameters Active DE602005002131T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP05104303A EP1724599B1 (de) 2005-05-20 2005-05-20 Prüfvorrichtung mit Anpassung des Prüfparameters

Publications (2)

Publication Number Publication Date
DE602005002131D1 true DE602005002131D1 (de) 2007-10-04
DE602005002131T2 DE602005002131T2 (de) 2008-05-15

Family

ID=34939917

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005002131T Active DE602005002131T2 (de) 2005-05-20 2005-05-20 Prüfvorrichtung mit Anpassung des Prüfparameters

Country Status (3)

Country Link
US (2) US7550988B2 (de)
EP (1) EP1724599B1 (de)
DE (1) DE602005002131T2 (de)

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EP1724599B1 (de) 2005-05-20 2007-08-22 Agilent Technologies, Inc. Prüfvorrichtung mit Anpassung des Prüfparameters
US8365137B2 (en) * 2006-08-29 2013-01-29 Wave Semiconductor, Inc. Systems and methods using an invocation model of process expression
US7810001B2 (en) * 2007-07-31 2010-10-05 Texas Instruments Incorporated Parallel test system
US8045479B2 (en) * 2008-01-02 2011-10-25 At&T Intellectual Property I, L.P. Method and system of testing video access devices
DE102008008933A1 (de) * 2008-02-13 2009-08-27 Qimonda Ag Testgerät und Verfahren zum Testen von wenigstens zwei Testobjekten
US8059547B2 (en) * 2008-12-08 2011-11-15 Advantest Corporation Test apparatus and test method
US8483073B2 (en) 2008-12-08 2013-07-09 Advantest Corporation Test apparatus and test method
CN102110037A (zh) * 2009-12-29 2011-06-29 鸿富锦精密工业（深圳）有限公司 电子装置测试***
KR20120061140A (ko) * 2010-10-25 2012-06-13 삼성전자주식회사 피시험 소자의 테스트 장치 및 이를 이용한 피시험 소자의 테스트 방법
DE102011080169A1 (de) * 2011-08-01 2013-02-07 Robert Bosch Gmbh Kommunikationsanbindung für Sensorik in Fahrzeug-Regelsystemen
US9910086B2 (en) 2012-01-17 2018-03-06 Allen Czamara Test IP-based A.T.E. instrument architecture
US8914673B2 (en) 2012-02-20 2014-12-16 Microsoft Corporation Distributed testing within a serial testing infrastructure
CN103425560A (zh) * 2012-05-15 2013-12-04 鸿富锦精密工业（深圳）有限公司 测试装置
US20140177459A1 (en) * 2012-12-21 2014-06-26 Apple Inc. Methods and apparatus for rapid and cost effective testing of wireless systems
CN104237660A (zh) * 2013-06-07 2014-12-24 鸿富锦精密工业（深圳）有限公司 自动测试装置和方法
CN104678986B (zh) * 2013-11-28 2017-11-24 中车大连电力牵引研发中心有限公司 变流控制单元自动测试方法、控制器和自动测试***
CN106561085A (zh) * 2014-07-28 2017-04-12 英特尔公司 具有dut数据流送的半导体器件测试器
US10602082B2 (en) 2014-09-17 2020-03-24 Fluke Corporation Triggered operation and/or recording of test and measurement or imaging tools
US9568368B2 (en) * 2014-09-17 2017-02-14 Fluke Corporation Mobile device used with isolated test and measurement input block
WO2016065261A1 (en) 2014-10-24 2016-04-28 Fluke Corporation Imaging system employing fixed, modular mobile, and portable infrared cameras with ability to receive, communicate, and display data and images with proximity detection
US10491314B2 (en) 2014-12-05 2019-11-26 W2Bi, Inc. Smart box for automatic feature testing of smart phones and other devices
US20170078544A1 (en) 2015-09-16 2017-03-16 Fluke Corporation Electrical isolation for a camera in a test and measurement tool
WO2017070629A1 (en) 2015-10-23 2017-04-27 Fluke Corporation Imaging tool for vibration and/or misalignment analysis
US10548033B2 (en) * 2016-08-12 2020-01-28 W2Bi, Inc. Local portable test systems and methods
US10681570B2 (en) * 2016-08-12 2020-06-09 W2Bi, Inc. Automated configurable portable test systems and methods
US10701571B2 (en) * 2016-08-12 2020-06-30 W2Bi, Inc. Automated validation and calibration portable test systems and methods
CN106847144A (zh) * 2017-03-23 2017-06-13 京东方科技集团股份有限公司 测试用转接模块、终端测试***及测试方法
KR20190066482A (ko) * 2017-12-05 2019-06-13 삼성전자주식회사 인터포저를 사용하는 번 인 테스트 장치 및 테스트 방법
US11442098B2 (en) * 2019-06-20 2022-09-13 Teradyne, Inc. Generating a waveform based on digital pulses

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US4168796A (en) * 1978-04-13 1979-09-25 Ncr Corporation Tester with driver/sensor circuit having programmable termination devices
US4242751A (en) * 1978-08-28 1980-12-30 Genrad, Inc. Automatic fault-probing method and apparatus for checking electrical circuits and the like
US4709366A (en) * 1985-07-29 1987-11-24 John Fluke Mfg. Co., Inc. Computer assisted fault isolation in circuit board testing
JPH02246841A (ja) * 1989-03-17 1990-10-02 Hitachi Ltd 自動車の制御装置及び制御方法
JPH0670668B2 (ja) * 1989-09-08 1994-09-07 株式会社東芝 電子部品の検査装置
US5175495A (en) * 1991-04-30 1992-12-29 Lsi Logic Corporation Detection of semiconductor failures by photoemission and electron beam testing
US5777873A (en) * 1996-04-29 1998-07-07 Mitsubishi Semiconductor America, Inc. Automated test fixture control system
US5737512A (en) * 1996-05-22 1998-04-07 Teradyne, Inc. Fast vector loading for automatic test equipment
US6043667A (en) * 1997-04-17 2000-03-28 International Business Machines Corporation Substrate tester location clamping, sensing, and contacting method and apparatus
US6028439A (en) * 1997-10-31 2000-02-22 Credence Systems Corporation Modular integrated circuit tester with distributed synchronization and control
US6191600B1 (en) * 1999-01-22 2001-02-20 Delaware Capital Formation, Inc. Scan test apparatus for continuity testing of bare printed circuit boards
US7655482B2 (en) * 2000-04-18 2010-02-02 Kla-Tencor Chemical mechanical polishing test structures and methods for inspecting the same
US6779140B2 (en) * 2001-06-29 2004-08-17 Agilent Technologies, Inc. Algorithmically programmable memory tester with test sites operating in a slave mode
US6940271B2 (en) * 2001-08-17 2005-09-06 Nptest, Inc. Pin electronics interface circuit
TWI344595B (en) * 2003-02-14 2011-07-01 Advantest Corp Method and structure to develop a test program for semiconductor integrated circuits
EP1724599B1 (de) 2005-05-20 2007-08-22 Agilent Technologies, Inc. Prüfvorrichtung mit Anpassung des Prüfparameters

Also Published As

Publication number Publication date
US20090259428A1 (en) 2009-10-15
DE602005002131T2 (de) 2008-05-15
US7550988B2 (en) 2009-06-23
US7924043B2 (en) 2011-04-12
EP1724599B1 (de) 2007-08-22
EP1724599A1 (de) 2006-11-22
US20060282736A1 (en) 2006-12-14

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8327 Change in the person/name/address of the patent owner

Owner name: VERIGY (SINGAPORE) PTE. LTD., SINGAPORE, SG

8328 Change in the person/name/address of the agent

Representative=s name: SCHOPPE, ZIMMERMANN, STOECKELER & ZINKLER, 82049 P

8364 No opposition during term of opposition