DE59106652D1 - Kontaktierungsvorrichtung für Prüfzwecke. - Google Patents

Kontaktierungsvorrichtung für Prüfzwecke.

Info

Publication number: DE59106652D1
Authority: DE; Germany
Prior art keywords: contacting device; testing purposes; testing; purposes; contacting
Prior art date: 1990-07-25
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

DE59106652T

Other languages

English (en)

Inventor

Manfred Prokopp

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

ATG Luther and Maelzer GmbH

Original Assignee

atg electronic GmbH

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1990-07-25

Filing date

1991-05-11

Publication date

1995-11-16

1991-05-11 Application filed by atg electronic GmbH filed Critical atg electronic GmbH

1995-11-16 Application granted granted Critical

1995-11-16 Publication of DE59106652D1 publication Critical patent/DE59106652D1/de

2011-05-12 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07392—Multiple probes manipulating each probe element or tip individually

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Engineering & Computer Science (AREA)
Computer Hardware Design (AREA)
Microelectronics & Electronic Packaging (AREA)
General Engineering & Computer Science (AREA)
Tests Of Electronic Circuits (AREA)

DE59106652T 1990-07-25 1991-05-11 Kontaktierungsvorrichtung für Prüfzwecke. Expired - Lifetime DE59106652D1 (de)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
DE4023621		1990-07-25
DE4109684A DE4109684C2 (de)	1990-07-25	1991-03-23	Kontaktierungsvorrichtung für Prüfzwecke

Publications (1)

Publication Number	Publication Date
DE59106652D1 true DE59106652D1 (de)	1995-11-16

Family

ID=6410989

Family Applications (2)

Application Number	Title	Priority Date	Filing Date
DE4109684A Expired - Lifetime DE4109684C2 (de)	1990-07-25	1991-03-23	Kontaktierungsvorrichtung für Prüfzwecke
DE59106652T Expired - Lifetime DE59106652D1 (de)	1990-07-25	1991-05-11	Kontaktierungsvorrichtung für Prüfzwecke.

Family Applications Before (1)

Application Number	Title	Priority Date	Filing Date
DE4109684A Expired - Lifetime DE4109684C2 (de)	1990-07-25	1991-03-23	Kontaktierungsvorrichtung für Prüfzwecke

Country Status (1)

Country	Link
DE (2)	DE4109684C2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE4414770A1 (de) *	1994-04-27	1995-11-02	Hubert Driller	Testsystem für bestückte und unbestückte Leiterplatten
DE4441347C2 (de) *	1994-11-21	1998-10-29	Peter Fritzsche	Verfahren zum Prüfen von elektronischen Schaltungen auf Leiterplatten und Vorrichtung zum Durchführen des Verfahrens
DE19503329C2 (de) *	1995-02-02	2000-05-18	Ita Ingb Testaufgaben Gmbh	Testvorrichtung für elektronische Flachbaugruppen
DE19703982B4 (de) *	1997-02-03	2004-06-09	Atg Test Systems Gmbh & Co.Kg	Verfahren zum Prüfen von Leiterplatten
DE19748029C2 (de)	1997-10-30	2001-02-01	Siemens Nixdorf Inf Syst	Verfahren zum Testen von elektrische Bauelemente aufweisenden Baugruppen
DE10043726C2 (de) *	2000-09-05	2003-12-04	Atg Test Systems Gmbh	Verfahren zum Prüfen von Leiterplatten mit einem Paralleltester und eine Vorrichtung zum Ausführen des Verfahrens
DE10043728C2 (de) *	2000-09-05	2003-12-04	Atg Test Systems Gmbh	Verfahren zum Prüfen von Leiterplatten und Verwendung einer Vorrichtung zum Ausführen des Verfahrens
DE10220343B4 (de) *	2002-05-07	2007-04-05	Atg Test Systems Gmbh & Co. Kg Reicholzheim	Vorrichtung und Verfahren zum Prüfen von Leiterplatten und Prüfsonde

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
GB2038489A (en) *	1978-11-10	1980-07-23	Gen Electric Co Ltd	Arrangement for testing electric circuits on printed wiring boards
GB2039489B (en) *	1979-01-17	1983-01-26	Madaliev S	Powdered modified epoxy resin
US4626780A (en) *	1985-02-01	1986-12-02	Virginia Panel Corporation	Tri-axis automated test system for printed circuit boards

1991
- 1991-03-23 DE DE4109684A patent/DE4109684C2/de not_active Expired - Lifetime
- 1991-05-11 DE DE59106652T patent/DE59106652D1/de not_active Expired - Lifetime

Also Published As

Publication number	Publication date
DE4109684C2 (de)	2001-07-12
DE4109684A1 (de)	1992-01-30

Legal Events

Date	Code	Title	Description
1996-08-01	8327	Change in the person/name/address of the patent owner	Owner name: ATG TEST SYSTEMS GMBH, 97877 WERTHEIM, DE ADAPTRON
1996-11-07	8364	No opposition during term of opposition
2000-05-18	8327	Change in the person/name/address of the patent owner	Owner name: ATG TEST SYSTEMS GMBH, 97877 WERTHEIM, DE
2000-07-13	8327	Change in the person/name/address of the patent owner	Owner name: ATG TEST SYSTEMS GMBH & CO.KG, 97877 WERTHEIM, DE
2008-03-13	8327	Change in the person/name/address of the patent owner	Owner name: ATG LUTHER & MAELZER GMBH, 50668 KOELN, DE

Publication	Publication Date	Title
DE59101509D1 (de)	1994-06-01	Prüfgerät für banknoten.
DE69103930D1 (de)	1994-10-20	Mess-Fühlerprobe.
DE68923378D1 (de)	1995-08-10	Verbindungsvorrichtung für rohre.
DE68923796D1 (de)	1995-09-14	Antidiebstahlvorrichtung für brillengestelle.
DE69007113D1 (de)	1994-04-07	Prüfvorrichtung für thermalabbildungseinrichtungen.
DE3887937D1 (de)	1994-03-31	Inspektionsvorrichtung.
DE69112173D1 (de)	1995-09-21	Haltevorrichtung für Flachteilsockel.
DE69025388D1 (de)	1996-03-28	Gerät für Maximalwahrscheinlichkeitssequenzbewertung
DE69012837D1 (de)	1994-10-27	Messgerät.
DE69109659D1 (de)	1995-06-14	Messvorrichtung für erntegut.
DE69001445D1 (de)	1993-06-03	Maehvorrichtung.
DE69105345D1 (de)	1995-01-12	Haltevorrichtung für Triebwerke.
DE69014180D1 (de)	1994-12-22	Auswertungsapparat für Objektive.
DE59102989D1 (de)	1994-10-27	Halteeinrichtung für Säcke.
DE69204886D1 (de)	1995-10-26	Messgerät für bewegte Körper.
DE69012674D1 (de)	1994-10-27	Untersuchungsgerät für Rohre.
DE59102374D1 (de)	1994-09-01	Ultraschallprüfvorrichtung.
DE69024016D1 (de)	1996-01-18	Messvorrichtung.
DE3483249D1 (de)	1990-10-25	Vereinfachte pruefvorrichtung.
DE69109064D1 (de)	1995-05-24	Haltevorrichtung für batterien.
NO881557L (no)	1988-10-17	Anordning for testing av missil-systemer.
DE59105716D1 (de)	1995-07-20	Sehtestgerät.
DE69106290D1 (de)	1995-02-09	Testvorrichtung.
DE69015565D1 (de)	1995-02-09	Ultraschallprüfvorrichtung.
DE3781143D1 (de)	1992-09-17	Pruefungsgeraet.