DE4497995T1 - Vorrichtung und Verfahren zur Frequenzmessung - Google Patents

Vorrichtung und Verfahren zur Frequenzmessung

Info

Publication number
DE4497995T1
DE4497995T1 DE4497995T DE4497995T DE4497995T1 DE 4497995 T1 DE4497995 T1 DE 4497995T1 DE 4497995 T DE4497995 T DE 4497995T DE 4497995 T DE4497995 T DE 4497995T DE 4497995 T1 DE4497995 T1 DE 4497995T1
Authority
DE
Germany
Prior art keywords
measurement device
frequency measurement
frequency
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE4497995T
Other languages
English (en)
Inventor
Teruyoshi Mitsuoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyo Communication Equipment Co Ltd
Original Assignee
Toyo Communication Equipment Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP28765793A external-priority patent/JPH07122935A/ja
Priority claimed from JP5339693A external-priority patent/JPH07159455A/ja
Application filed by Toyo Communication Equipment Co Ltd filed Critical Toyo Communication Equipment Co Ltd
Publication of DE4497995T1 publication Critical patent/DE4497995T1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G01R23/10—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into a train of pulses, which are then counted, i.e. converting the signal into a square wave

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
DE4497995T 1993-10-22 1994-10-19 Vorrichtung und Verfahren zur Frequenzmessung Withdrawn DE4497995T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP28765793A JPH07122935A (ja) 1993-10-22 1993-10-22 水晶発振器及びそれを用いた測定装置
JP5339693A JPH07159455A (ja) 1993-12-06 1993-12-06 周波数計測器および周波数計測方法
PCT/JP1994/001758 WO1995011456A1 (fr) 1993-10-22 1994-10-19 Compteur de frequences et procede de comptage de frequences

Publications (1)

Publication Number Publication Date
DE4497995T1 true DE4497995T1 (de) 1995-11-23

Family

ID=26556822

Family Applications (1)

Application Number Title Priority Date Filing Date
DE4497995T Withdrawn DE4497995T1 (de) 1993-10-22 1994-10-19 Vorrichtung und Verfahren zur Frequenzmessung

Country Status (3)

Country Link
US (1) US5719782A (de)
DE (1) DE4497995T1 (de)
WO (1) WO1995011456A1 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3543493B2 (ja) * 1996-06-07 2004-07-14 株式会社デンソー 電子回路の動作特性補正装置
EP0821515B1 (de) 1996-07-26 2003-05-14 Texas Instruments Incorporated Digitaler Auflösungsumsetzer
JP2984614B2 (ja) * 1997-01-24 1999-11-29 日本電気アイシーマイコンシステム株式会社 移動体通信装置の間欠受信方式
IT1293457B1 (it) * 1997-07-15 1999-03-01 Alsthom Cge Alcatel Sistema per fornire un'informazione relativa alla frequenza di sorgente in un sistema di rice-trasmissione digitale.
US5930294A (en) * 1997-08-07 1999-07-27 Cisco Technology, Inc. Frequency measurement circuit
US6304517B1 (en) 1999-06-18 2001-10-16 Telefonaktiebolaget Lm Ericsson (Publ) Method and apparatus for real time clock frequency error correction
AU6349900A (en) * 1999-07-16 2001-02-05 Advanced Testing Technologies, Inc. Method and device for spectrally pure, programmable signal generation
JP3634228B2 (ja) * 2000-03-02 2005-03-30 日本電波工業株式会社 恒温槽を用いた発振器
FR2808597B1 (fr) * 2000-05-02 2002-07-12 Schneider Electric Ind Sa Detecteur inductif ou capacitif
WO2003049391A1 (en) * 2001-12-05 2003-06-12 Nokia Corporation Frequency offset correction based on the presence or absence of a received signal
US6784756B2 (en) * 2001-12-21 2004-08-31 Corning Incorporated On-board processor compensated oven controlled crystal oscillator
JP4317675B2 (ja) * 2002-03-05 2009-08-19 株式会社ヒューモラボラトリー 水晶振動子の割れ、欠け、傷の検査方法
US7395447B2 (en) 2002-09-16 2008-07-01 Silicon Labs Cp, Inc. Precision oscillator for an asynchronous transmission system
JP4467350B2 (ja) * 2004-04-09 2010-05-26 富士通マイクロエレクトロニクス株式会社 情報処理システム及びタイミング調整方法
US7310024B2 (en) * 2005-02-28 2007-12-18 Milliren Bryan T High stability double oven crystal oscillator
DE102006053827A1 (de) * 2005-11-14 2007-06-06 Continental Teves Ag & Co. Ohg Verfahren zur Erkennung der Beladung eines Kraftfahrzeugs
US7649426B2 (en) * 2006-09-12 2010-01-19 Cts Corporation Apparatus and method for temperature compensation of crystal oscillators
CN113759187B (zh) * 2021-01-07 2023-05-05 大唐移动通信设备有限公司 由晶片污染引起的晶振跳频失效的检测方法、装置和***

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4297657A (en) * 1979-10-29 1981-10-27 Rockwell International Corporation Closed loop temperature compensated frequency reference
US4380745A (en) * 1980-11-07 1983-04-19 The United States Of America As Represented By The Secretary Of The Navy Digitally controlled temperature compensated oscillator system
US4513259A (en) * 1982-12-23 1985-04-23 Rockwell International Corporation Closed loop temperature compensated frequency reference
JPS59116863U (ja) * 1983-01-27 1984-08-07 ジエコ−株式会社 周波数測定装置
JPS6166410A (ja) * 1984-09-10 1986-04-05 Nec Corp 温度補償発振装置
DE3629588A1 (de) * 1986-08-30 1988-03-03 Franz Dipl Ing Leitl Kristalloszillator-kompensationsschaltung
JPS6387003A (ja) * 1986-09-30 1988-04-18 Toshiba Corp 水晶発振器
DE3871893D1 (de) * 1987-09-28 1992-07-16 Siemens Ag Verfahren zur temperaturkompensation eines spannungsgesteuerten quarzoszillators in einem phasenregelkreis.
JPH03113903A (ja) * 1989-09-27 1991-05-15 Nippon Dempa Kogyo Co Ltd デジタル温度補償発振器
JPH0465696A (ja) * 1990-07-06 1992-03-02 Jeco Co Ltd 電子時計
US5126699A (en) * 1991-09-27 1992-06-30 Allied-Signal Inc. Digitally compensated modulation system for frequency synthesizers
US5319324A (en) * 1991-10-02 1994-06-07 Matsushita Electric Industrial Co., Ltd. Method of direct bonding of crystals and crystal devices
US5392005A (en) * 1993-09-30 1995-02-21 At&T Corp. Field calibration of a digitally compensated crystal oscillator over a temperature range

Also Published As

Publication number Publication date
US5719782A (en) 1998-02-17
WO1995011456A1 (fr) 1995-04-27

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Legal Events

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8139 Disposal/non-payment of the annual fee