DE4004146A1 - 75 ohm reflection factor measurement bridge - with signal divider incorporating specified non-precision resistors, connected to indicator and reference resistor - Google Patents
75 ohm reflection factor measurement bridge - with signal divider incorporating specified non-precision resistors, connected to indicator and reference resistorInfo
- Publication number
- DE4004146A1 DE4004146A1 DE19904004146 DE4004146A DE4004146A1 DE 4004146 A1 DE4004146 A1 DE 4004146A1 DE 19904004146 DE19904004146 DE 19904004146 DE 4004146 A DE4004146 A DE 4004146A DE 4004146 A1 DE4004146 A1 DE 4004146A1
- Authority
- DE
- Germany
- Prior art keywords
- ohm
- bridge
- indicator
- reflection factor
- reference resistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
- G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
Description
Die Erfindung betrifft eine 75-Ω-Reflexionsfaktor-Meß brücke, wie sie zur Messung des komplexen Reflexions faktors von Filtern, Verstärkern, Mischern, Antennen und dergleichen Meßobjekten mit 75-Ω-Eingängen benutzt wird.The invention relates to a 75 Ω reflection factor measurement bridge as used to measure complex reflection factor of filters, amplifiers, mixers, antennas and similar objects with 75 Ω inputs becomes.
Reflexionsfaktor-Meßbrücken mit Bezugsimpedanzen von 50 oder 75 Ω sind bekannt (Neues von Rohde & Schwarz, Heft 106, Sommer 1984, Seiten 19 bis 21). Zum Messen von Meßobjekten in einem Bezugssystem von 75 Ω werden sogenannte 75 Ω-Meßbrücken benutzt, bei welchen sämtliche Brückenzweige und auch die Brückendiagonale aus 75-Ω-Wi derständen aufgebaut sind. Die Figur zeigt das Prinzip schaltbild einer solchen Reflexionsfaktor-Meßbrücke 1, deren Signalteiler 2 durch zwei Widerstände 3 und 4 ge bildet ist. In der Brückendiagonale liegt ein Widerstand 5 und die an diesem abfallende Meßspannung U wird an einem Indikator 6 angezeigt. Die Brücke wird ergänzt durch einen Referenzwiderstand 7 und das über das Meßtor 8 anschaltbare Meßobjekt Z. Gespeist wird die Brücke über den Signalteiler 2 aus einer Signalquelle Uo mit einem Innenwiderstand Zo.Reflection factor measuring bridges with reference impedances of 50 or 75 Ω are known (news from Rohde & Schwarz, number 106, summer 1984, pages 19 to 21). So-called 75 Ω measuring bridges are used to measure measurement objects in a reference system of 75 Ω, in which all bridge branches and the bridge diagonal are made up of 75 Ω resistors. The figure shows the principle circuit diagram of such a reflection factor measuring bridge 1 , the signal divider 2 is formed by two resistors 3 and 4 ge. A resistor 5 is located in the bridge diagonal and the measuring voltage U dropping across it is displayed on an indicator 6 . The bridge is supplemented by a reference resistor 7 and the measurement object Z which can be connected via the measuring gate 8. The bridge is fed via the signal divider 2 from a signal source U o with an internal resistance Z o .
Bei einer üblichen 75-Ω-Meßbrücke zum Messen von Meßob jekten im 75-Ω-Bezugssystem sind sämtliche Widerstände 3, 4, 5 und 7 der Meßbrücke 1 zu 75 Ω gewählt, wobei der Widerstand 7 als 75-Ω-Präzisionswiderstand ausgeführt ist.In a conventional 75 Ω measuring bridge for measuring objects in the 75 Ω reference system, all resistors 3 , 4 , 5 and 7 of measuring bridge 1 are selected to be 75 Ω, the resistor 7 being designed as a 75 Ω precision resistor.
Als Speisequellen für solche Meßbrücken stehen vielfach nur solche mit einem Innenwiderstand Zo = 50 Ω zur Ver fügung. Um damit eine 75-Ω-Meßbrücke reflexionsfrei spei sen zu können ist es bekannt, zwischen dem Ausgang 9 der Speisequelle und dem Eingang 10 der Meßbrücke ein Anpaßglied beispielsweise in Form eines 25-Ω-Serienwider standes anzuordnen. Dadurch wird der Schaltungsaufbau einer solchen 75-Ω-Meßbrücke relativ kompliziert.In many cases, only those with an internal resistance Z o = 50 Ω are available as supply sources for such measuring bridges. In order to be able to spei a 75 Ω measuring bridge without reflection, it is known to arrange an adapter, for example in the form of a 25 Ω series resistor, between the output 9 of the supply source and the input 10 of the measuring bridge. This makes the circuit construction of such a 75 Ω measuring bridge relatively complicated.
Um diesen Nachteil zu vermeiden wird erfindungsgemäß die Bemessungsvorschrift der Brückenwiderstände laut Patentanspruch vorgeschlagen.In order to avoid this disadvantage, the invention the design specification of the bridge resistances Claim proposed.
Bei der erfindungsgemäßen 75-Ω-Meßbrücke ist ein zusätz liches Anpaßglied zwischen einer 50-Ω-Signalquelle und der eigentlichen Meßbrücke überflüssig, der Meßaufbau wird also wesentlich vereinfacht. Die Herstellung einer erfindungsgemäßen Meßbrücke ist dabei in keiner Weise aufwendiger als die Herstellung einer bekannten Meßbrücke mit nur 75-Ω-Brückenwiderständen, da die Schaltungs struktur der Widerstandsanordnung unverändert bleibt und nur die Widerstandswerte anders gewählt werden. Damit kann eine erfindungsgemäße Meßbrücke genauso einfach und billig beispielsweise in Dünnschichttechnik herge stellt werden, es kann hierfür ein Substrat mit einem identischen Layout wie zur Herstellung bisheriger Brücken benutzt werden und es ist nur eine geänderte Trimmung der Widerstände erforderlich. Bei Speisung der Brücke 1 aus einer Signalquelle mit einem Innenwiderstand von Zo=50 Ω ergibt sich durch Rechnung exakt eine Ein gangsimpedanz von 75 Ω am Meßtor 8 der Brücke, die Brücke ist also trotz der 50-Ω-Signalquelle ideal angepaßt.In the 75 Ω measuring bridge according to the invention, an additional adapter between a 50 Ω signal source and the actual measuring bridge is superfluous, so the measurement setup is considerably simplified. The production of a measuring bridge according to the invention is in no way more complex than the production of a known measuring bridge with only 75 Ω bridge resistors, since the circuit structure of the resistor arrangement remains unchanged and only the resistance values are chosen differently. Thus, a measuring bridge according to the invention can be produced just as easily and cheaply, for example in thin-film technology, a substrate with an identical layout as for the production of previous bridges can be used for this and only a modified trimming of the resistors is required. When supplying bridge 1 from a signal source with an internal resistance of Z o = 50 Ω, the calculation results in an input impedance of 75 Ω at measuring gate 8 of the bridge, so the bridge is ideally adapted despite the 50 Ω signal source.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19904004146 DE4004146C2 (en) | 1990-02-10 | 1990-02-10 | 75 Æ reflection factor measuring bridge |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19904004146 DE4004146C2 (en) | 1990-02-10 | 1990-02-10 | 75 Æ reflection factor measuring bridge |
Publications (2)
Publication Number | Publication Date |
---|---|
DE4004146A1 true DE4004146A1 (en) | 1991-10-02 |
DE4004146C2 DE4004146C2 (en) | 1994-02-24 |
Family
ID=6399904
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19904004146 Expired - Fee Related DE4004146C2 (en) | 1990-02-10 | 1990-02-10 | 75 Æ reflection factor measuring bridge |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE4004146C2 (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE734916C (en) * | ||||
DE2413573B2 (en) * | 1974-03-21 | 1976-09-02 | Heiden, Kurt, Ing.(grad), 8000 München | ELECTRIC MEASURING DEVICE FOR DETERMINING THE DEVIATION OF AN UNKNOWN FROM A KNOWN RESISTOR, IN PARTICULAR FOR DETERMINING REFLECTION FACTORS IN HIGH FREQUENCY TECHNOLOGY, USING A BRIDGE CIRCUIT |
-
1990
- 1990-02-10 DE DE19904004146 patent/DE4004146C2/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE734916C (en) * | ||||
DE2413573B2 (en) * | 1974-03-21 | 1976-09-02 | Heiden, Kurt, Ing.(grad), 8000 München | ELECTRIC MEASURING DEVICE FOR DETERMINING THE DEVIATION OF AN UNKNOWN FROM A KNOWN RESISTOR, IN PARTICULAR FOR DETERMINING REFLECTION FACTORS IN HIGH FREQUENCY TECHNOLOGY, USING A BRIDGE CIRCUIT |
Non-Patent Citations (4)
Title |
---|
"Breitband-Impedanzmessung mit der Reflexions- faktor-Meßbrücke ZRB2" in: Neues von Rohde & Schwarz 106, Sommer 1984, S. 19-21 * |
F. VILBIG: "Lehrbuch der Hochfrequenztechnik", Leipzig 1942, Akademische Verlagsgesellschaft Becker u. Erler, Bd. 1, S. 28 u. 29 * |
K. Hoffmann u. K. Kahler: "Koaxiale Reflexionsfak-tor-Meßbrücken für den Frequenzbereich 50-3000 MHz" in Siemens Zeitschrift, Dezember 1958, H. 12,S. 807-811 * |
M. Ebisch: "Reflexionsfaktor-Meßeinrichtung für 1-100 (200) MHz" in: Siemens-Zeitschrift 41 (1967)H. 10, S. 810-813 * |
Also Published As
Publication number | Publication date |
---|---|
DE4004146C2 (en) | 1994-02-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
D2 | Grant after examination | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |