DE3884498D1 - Programmierbares geraet und verfahren zur pruefung eines programmierbaren geraets. - Google Patents

Programmierbares geraet und verfahren zur pruefung eines programmierbaren geraets.

Info

Publication number
DE3884498D1
DE3884498D1 DE88111697T DE3884498T DE3884498D1 DE 3884498 D1 DE3884498 D1 DE 3884498D1 DE 88111697 T DE88111697 T DE 88111697T DE 3884498 T DE3884498 T DE 3884498T DE 3884498 D1 DE3884498 D1 DE 3884498D1
Authority
DE
Germany
Prior art keywords
programmable device
testing
programmable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE88111697T
Other languages
English (en)
Inventor
Kouji Ueno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of DE3884498D1 publication Critical patent/DE3884498D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/10—Program control for peripheral devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/52—Protection of memory contents; Detection of errors in memory contents
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
DE88111697T 1987-07-21 1988-07-20 Programmierbares geraet und verfahren zur pruefung eines programmierbaren geraets. Expired - Lifetime DE3884498D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62181963A JPS6425399A (en) 1987-07-21 1987-07-21 Programmable device and its test method

Publications (1)

Publication Number Publication Date
DE3884498D1 true DE3884498D1 (de) 1993-11-04

Family

ID=16109929

Family Applications (1)

Application Number Title Priority Date Filing Date
DE88111697T Expired - Lifetime DE3884498D1 (de) 1987-07-21 1988-07-20 Programmierbares geraet und verfahren zur pruefung eines programmierbaren geraets.

Country Status (5)

Country Link
US (1) US4972372A (de)
EP (1) EP0300455B1 (de)
JP (1) JPS6425399A (de)
KR (1) KR910004421B1 (de)
DE (1) DE3884498D1 (de)

Families Citing this family (56)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5329470A (en) * 1988-12-02 1994-07-12 Quickturn Systems, Inc. Reconfigurable hardware emulation system
US5109353A (en) * 1988-12-02 1992-04-28 Quickturn Systems, Incorporated Apparatus for emulation of electronic hardware system
US5353243A (en) 1989-05-31 1994-10-04 Synopsys Inc. Hardware modeling system and method of use
US5369593A (en) 1989-05-31 1994-11-29 Synopsys Inc. System for and method of connecting a hardware modeling element to a hardware modeling system
US5254482A (en) * 1990-04-16 1993-10-19 National Semiconductor Corporation Ferroelectric capacitor test structure for chip die
US5341383A (en) * 1990-07-30 1994-08-23 Fujitsu Limited Circuit arrangement suitable for testing cells arranged in rows and columns, semiconductor integrated circuit device having the same, and method for arranging circuit blocks on chip
JPH0770620B2 (ja) * 1990-12-26 1995-07-31 株式会社東芝 半導体記憶装置
JPH0620465A (ja) * 1991-09-02 1994-01-28 Mitsubishi Electric Corp 半導体記憶装置
FR2682522B1 (fr) * 1991-10-11 1997-01-10 Sgs Thomson Microelectronics Procede pour verifier le contenu apres effacement d'une memoire permanente effacable, notamment de type eprom, dispositif pour sa mise en óoeuvre et memoire integrant ce dispositif.
US6781895B1 (en) * 1991-12-19 2004-08-24 Kabushiki Kaisha Toshiba Non-volatile semiconductor memory device and memory system using the same
US5361227A (en) * 1991-12-19 1994-11-01 Kabushiki Kaisha Toshiba Non-volatile semiconductor memory device and memory system using the same
DE4223532A1 (de) * 1992-07-17 1994-01-20 Philips Patentverwaltung Schaltungsanordnung zum Prüfen der Adressierung wenigstens einer Matrix
US5465341A (en) * 1992-10-23 1995-11-07 Vlsi Technology, Inc. Verifiable security circuitry for preventing unauthorized access to programmed read only memory
KR950034271A (ko) * 1994-01-26 1995-12-28 오오가 노리오 비휘발성 반도체 플래쉬 메모리
US5680583A (en) 1994-02-16 1997-10-21 Arkos Design, Inc. Method and apparatus for a trace buffer in an emulation system
US5841967A (en) * 1996-10-17 1998-11-24 Quickturn Design Systems, Inc. Method and apparatus for design verification using emulation and simulation
US5960191A (en) 1997-05-30 1999-09-28 Quickturn Design Systems, Inc. Emulation system with time-multiplexed interconnect
US5970240A (en) 1997-06-25 1999-10-19 Quickturn Design Systems, Inc. Method and apparatus for configurable memory emulation
US7765095B1 (en) 2000-10-26 2010-07-27 Cypress Semiconductor Corporation Conditional branching in an in-circuit emulation system
US8176296B2 (en) 2000-10-26 2012-05-08 Cypress Semiconductor Corporation Programmable microcontroller architecture
US6724220B1 (en) 2000-10-26 2004-04-20 Cyress Semiconductor Corporation Programmable microcontroller architecture (mixed analog/digital)
US8103496B1 (en) 2000-10-26 2012-01-24 Cypress Semicondutor Corporation Breakpoint control in an in-circuit emulation system
US8149048B1 (en) 2000-10-26 2012-04-03 Cypress Semiconductor Corporation Apparatus and method for programmable power management in a programmable analog circuit block
US6407953B1 (en) * 2001-02-02 2002-06-18 Matrix Semiconductor, Inc. Memory array organization and related test method particularly well suited for integrated circuits having write-once memory arrays
US7406674B1 (en) 2001-10-24 2008-07-29 Cypress Semiconductor Corporation Method and apparatus for generating microcontroller configuration information
US8078970B1 (en) 2001-11-09 2011-12-13 Cypress Semiconductor Corporation Graphical user interface with user-selectable list-box
US8042093B1 (en) 2001-11-15 2011-10-18 Cypress Semiconductor Corporation System providing automatic source code generation for personalization and parameterization of user modules
US6971004B1 (en) 2001-11-19 2005-11-29 Cypress Semiconductor Corp. System and method of dynamically reconfiguring a programmable integrated circuit
US7774190B1 (en) 2001-11-19 2010-08-10 Cypress Semiconductor Corporation Sleep and stall in an in-circuit emulation system
US7770113B1 (en) 2001-11-19 2010-08-03 Cypress Semiconductor Corporation System and method for dynamically generating a configuration datasheet
US8069405B1 (en) 2001-11-19 2011-11-29 Cypress Semiconductor Corporation User interface for efficiently browsing an electronic document using data-driven tabs
US7844437B1 (en) 2001-11-19 2010-11-30 Cypress Semiconductor Corporation System and method for performing next placements and pruning of disallowed placements for programming an integrated circuit
US8103497B1 (en) 2002-03-28 2012-01-24 Cypress Semiconductor Corporation External interface for event architecture
JP2003308700A (ja) * 2002-04-10 2003-10-31 Oki Electric Ind Co Ltd 半導体記憶装置
US7308608B1 (en) 2002-05-01 2007-12-11 Cypress Semiconductor Corporation Reconfigurable testing system and method
US7761845B1 (en) 2002-09-09 2010-07-20 Cypress Semiconductor Corporation Method for parameterizing a user module
US7295049B1 (en) * 2004-03-25 2007-11-13 Cypress Semiconductor Corporation Method and circuit for rapid alignment of signals
US7332976B1 (en) 2005-02-04 2008-02-19 Cypress Semiconductor Corporation Poly-phase frequency synthesis oscillator
US7400183B1 (en) 2005-05-05 2008-07-15 Cypress Semiconductor Corporation Voltage controlled oscillator delay cell and method
US8089461B2 (en) 2005-06-23 2012-01-03 Cypress Semiconductor Corporation Touch wake for electronic devices
US8085067B1 (en) 2005-12-21 2011-12-27 Cypress Semiconductor Corporation Differential-to-single ended signal converter circuit and method
US8067948B2 (en) 2006-03-27 2011-11-29 Cypress Semiconductor Corporation Input/output multiplexer bus
US7737724B2 (en) * 2007-04-17 2010-06-15 Cypress Semiconductor Corporation Universal digital block interconnection and channel routing
US9564902B2 (en) 2007-04-17 2017-02-07 Cypress Semiconductor Corporation Dynamically configurable and re-configurable data path
US8516025B2 (en) 2007-04-17 2013-08-20 Cypress Semiconductor Corporation Clock driven dynamic datapath chaining
US8130025B2 (en) 2007-04-17 2012-03-06 Cypress Semiconductor Corporation Numerical band gap
US20080259703A1 (en) * 2007-04-17 2008-10-23 Cypress Semiconductor Corp. Self-timed synchronous memory
US8111577B2 (en) 2007-04-17 2012-02-07 Cypress Semiconductor Corporation System comprising a state-monitoring memory element
US8026739B2 (en) 2007-04-17 2011-09-27 Cypress Semiconductor Corporation System level interconnect with programmable switching
US8092083B2 (en) 2007-04-17 2012-01-10 Cypress Semiconductor Corporation Temperature sensor with digital bandgap
US8040266B2 (en) 2007-04-17 2011-10-18 Cypress Semiconductor Corporation Programmable sigma-delta analog-to-digital converter
US8065653B1 (en) 2007-04-25 2011-11-22 Cypress Semiconductor Corporation Configuration of programmable IC design elements
US8266575B1 (en) 2007-04-25 2012-09-11 Cypress Semiconductor Corporation Systems and methods for dynamically reconfiguring a programmable system on a chip
US9720805B1 (en) 2007-04-25 2017-08-01 Cypress Semiconductor Corporation System and method for controlling a target device
US8049569B1 (en) 2007-09-05 2011-11-01 Cypress Semiconductor Corporation Circuit and method for improving the accuracy of a crystal-less oscillator having dual-frequency modes
US9448964B2 (en) 2009-05-04 2016-09-20 Cypress Semiconductor Corporation Autonomous control in a programmable system

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5914838B2 (ja) * 1978-11-25 1984-04-06 富士通株式会社 フィ−ルドプログラマブル素子
JPS5693189A (en) * 1979-12-18 1981-07-28 Fujitsu Ltd Field programable element
JPS57105898A (en) * 1980-12-23 1982-07-01 Fujitsu Ltd Field programmable element

Also Published As

Publication number Publication date
EP0300455A2 (de) 1989-01-25
KR890002776A (ko) 1989-04-11
EP0300455A3 (en) 1990-05-02
JPS6425399A (en) 1989-01-27
EP0300455B1 (de) 1993-09-29
KR910004421B1 (ko) 1991-06-27
US4972372A (en) 1990-11-20

Similar Documents

Publication Publication Date Title
DE3884498D1 (de) Programmierbares geraet und verfahren zur pruefung eines programmierbaren geraets.
DE3854546D1 (de) Verfahren und Gerät zur Programmablaufmessung.
DE69021659D1 (de) Verfahren und Vorrichtung zur reihenweisen Parallelprogrammfehlersuche.
DE3877516D1 (de) Geraet und verfahren zur bohrlochmessung.
DE58906917D1 (de) Vorrichtung und Verfahren zur Leckprüfung.
DE3772702D1 (de) Verfahren und vorrichtung zur konfiguration eines messinstruments und konfigurierbares messinstrument.
DE69013790D1 (de) Verfahren und Vorrichtung zur Positionsbestimmung.
DE3689406D1 (de) Verfahren zur Plazierung eines oberflächenmontierten Teiles und eine Vorrichtung dazu.
DE3866067D1 (de) Verfahren und vorrichtung zur messung eines reflektirenden konus.
DE3888522D1 (de) Vorrichtung und verfahren zum filtrieren.
DE59001543D1 (de) Verfahren und vorrichtung zum automatischen anspinnen.
DE3884946D1 (de) Verfahren und Vorrichtung zur automatischen Blutdruckmessung.
DE68924563D1 (de) Verfahren und Vorrichtung zur Oberflächenanalyse.
DE69015319D1 (de) Vorrichtung und Verfahren zum automatischen Positionieren von Behältern.
DE3878213D1 (de) Verfahren und vorrichtung zum pruefen eines transparenten behaelters.
DE69016818D1 (de) Verfahren und Vorrichtung zum Aufwickeln.
DE68914667D1 (de) Verfahren und vorrichtung für temporäre linienmarkierung.
DE69127742D1 (de) Verfahren und Vorrichtung zur Ultraschallfehlerprüfung
DE3877201D1 (de) Vorrichtung und verfahren zur intervallbehandlung eines bandes.
DE68916482D1 (de) Verfahren und Vorrichtung zum Zentrieren eines Edelsteines.
DE69017029D1 (de) Verfahren und vorrichtung zur nichtzerstörenden prüfung.
DE68910203D1 (de) Verfahren und Vorrichtung zur Kühlmittelleckprüfung.
DE3770728D1 (de) Verfahren und vorrichtung zur impulsechomessung.
DE3771416D1 (de) Verfahren und vorrichtung zum mikroloeten.
DE68922084D1 (de) Verfahren und Apparat zur automatischen Beobachtung eines Ortes.

Legal Events

Date Code Title Description
8332 No legal effect for de