DE3684525D1 - Digitale integrierte schaltungen. - Google Patents
Digitale integrierte schaltungen.Info
- Publication number
- DE3684525D1 DE3684525D1 DE8686304749T DE3684525T DE3684525D1 DE 3684525 D1 DE3684525 D1 DE 3684525D1 DE 8686304749 T DE8686304749 T DE 8686304749T DE 3684525 T DE3684525 T DE 3684525T DE 3684525 D1 DE3684525 D1 DE 3684525D1
- Authority
- DE
- Germany
- Prior art keywords
- integrated circuits
- digital integrated
- digital
- circuits
- integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318555—Control logic
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB858518859A GB8518859D0 (en) | 1985-07-25 | 1985-07-25 | Digital integrated circuits |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3684525D1 true DE3684525D1 (de) | 1992-04-30 |
Family
ID=10582877
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8686304749T Expired - Fee Related DE3684525D1 (de) | 1985-07-25 | 1986-06-20 | Digitale integrierte schaltungen. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4730316A (de) |
EP (1) | EP0209982B1 (de) |
DE (1) | DE3684525D1 (de) |
GB (1) | GB8518859D0 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL192801C (nl) * | 1986-09-10 | 1998-02-03 | Philips Electronics Nv | Werkwijze voor het testen van een drager met meerdere digitaal-werkende geïntegreerde schakelingen, geïntegreerde schakeling geschikt voor het aanbrengen op een aldus te testen drager, en drager voorzien van meerdere van zulke geïntegreerde schakelingen. |
JPH01270683A (ja) * | 1988-04-22 | 1989-10-27 | Mitsubishi Electric Corp | 半導体集積回路 |
KR910005615B1 (ko) * | 1988-07-18 | 1991-07-31 | 삼성전자 주식회사 | 프로그래머블 순차코오드 인식회로 |
DE3911939A1 (de) * | 1989-04-12 | 1990-10-18 | Philips Patentverwaltung | Integrierte schaltungsanordnung |
US5161159A (en) * | 1990-08-17 | 1992-11-03 | Sgs-Thomson Microelectronics, Inc. | Semiconductor memory with multiple clocking for test mode entry |
DE69120483T2 (de) * | 1990-08-17 | 1996-11-14 | Sgs Thomson Microelectronics | Halbleiter-Speicher mit unterdrücktem Testmodus-Eingang während des Strom-Einschaltens |
TW211094B (en) * | 1992-04-30 | 1993-08-11 | American Telephone & Telegraph | Built-in self-test network |
US5462532A (en) * | 1993-03-17 | 1995-10-31 | Origin Medsystems, Inc. | Trocar with safety sensing sleeve |
JPH10502181A (ja) * | 1994-06-20 | 1998-02-24 | ネオマジック・コーポレイション | メモリインタフェースのないグラフィックスコントローラ集積回路 |
GB2307568B (en) * | 1995-11-22 | 1998-06-03 | Holtek Microelectronics Inc | A test method for testing a micro-controller |
GB2399890B (en) * | 2002-04-30 | 2005-06-15 | Samsung Electronics Co Ltd | Multiple scan chains with pin sharing |
US7249298B2 (en) * | 2002-04-30 | 2007-07-24 | Samsung Electronics Co., Ltd. | Multiple scan chains with pin sharing |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4019033A (en) * | 1975-12-29 | 1977-04-19 | Honeywell Information Systems, Inc. | Control store checking system and method |
US4326266A (en) * | 1979-10-16 | 1982-04-20 | Burroughs Corporation | Monitoring system for a modular digital data processor |
US4357703A (en) * | 1980-10-09 | 1982-11-02 | Control Data Corporation | Test system for LSI circuits resident on LSI chips |
GB2121997B (en) * | 1982-06-11 | 1985-10-09 | Int Computers Ltd | Testing modular data processing systems |
US4488259A (en) * | 1982-10-29 | 1984-12-11 | Ibm Corporation | On chip monitor |
US4521884A (en) * | 1982-11-08 | 1985-06-04 | International Business Machines Corporation | Method and apparatus for error data feedback in a diskette drive |
NO843375L (no) * | 1983-10-06 | 1985-04-09 | Honeywell Inf Systems | Databehandlingssystem og fremgangsmaate til vedlikehold samt anrodning |
US4597080A (en) * | 1983-11-14 | 1986-06-24 | Texas Instruments Incorporated | Architecture and method for testing VLSI processors |
-
1985
- 1985-07-25 GB GB858518859A patent/GB8518859D0/en active Pending
-
1986
- 1986-06-20 EP EP86304749A patent/EP0209982B1/de not_active Expired - Lifetime
- 1986-06-20 DE DE8686304749T patent/DE3684525D1/de not_active Expired - Fee Related
- 1986-07-07 US US06/882,949 patent/US4730316A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0209982B1 (de) | 1992-03-25 |
EP0209982A2 (de) | 1987-01-28 |
GB8518859D0 (en) | 1985-08-29 |
EP0209982A3 (en) | 1989-03-08 |
US4730316A (en) | 1988-03-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |