DE3585551D1 - Logikanalysator. - Google Patents
Logikanalysator.Info
- Publication number
- DE3585551D1 DE3585551D1 DE8585104000T DE3585551T DE3585551D1 DE 3585551 D1 DE3585551 D1 DE 3585551D1 DE 8585104000 T DE8585104000 T DE 8585104000T DE 3585551 T DE3585551 T DE 3585551T DE 3585551 D1 DE3585551 D1 DE 3585551D1
- Authority
- DE
- Germany
- Prior art keywords
- logic analyzer
- analyzer
- logic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/25—Testing of logic operation, e.g. by logic analysers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3177—Testing of logic operation, e.g. by logic analysers
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59069727A JPS60213873A (ja) | 1984-04-06 | 1984-04-06 | ロジツクアナライザ |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3585551D1 true DE3585551D1 (de) | 1992-04-16 |
Family
ID=13411154
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8585104000T Expired - Fee Related DE3585551D1 (de) | 1984-04-06 | 1985-04-02 | Logikanalysator. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4654848A (de) |
EP (1) | EP0159588B1 (de) |
JP (1) | JPS60213873A (de) |
DE (1) | DE3585551D1 (de) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61294375A (ja) * | 1985-06-21 | 1986-12-25 | Ando Electric Co Ltd | サンプリングデ−タの発生順序判定方法 |
DE3611872C1 (de) * | 1986-04-09 | 1987-04-30 | Rohle & Schwarz Gmbh & Co Kg | Logikanalysator |
US4835736A (en) * | 1986-08-25 | 1989-05-30 | Tektronix, Inc. | Data acquisition system for capturing and storing clustered test data occurring before and after an event of interest |
JPS63155340A (ja) * | 1986-12-19 | 1988-06-28 | Fujitsu Ltd | 記憶装置の読出し方式 |
US4907229A (en) * | 1988-06-23 | 1990-03-06 | The United States Of America As Represented By The Secretary Of The Navy | Selective multimode/multiconfigurable data acquisition and reduction processor system |
US5067130A (en) * | 1989-09-29 | 1991-11-19 | Tektronix, Inc. | Method for acquiring data in a logic analyzer |
EP0426281A3 (en) * | 1989-10-30 | 1992-02-05 | Tektronix, Inc. | Enhanced counter/timer behavior in a logic analyzer |
US5282213A (en) * | 1991-01-02 | 1994-01-25 | Compaq Computer Corporation | Computer-based logic analyzer timing and analysis system |
US5506850A (en) * | 1991-04-08 | 1996-04-09 | Osann, Jr.; Robert | Logic analyzer for high channel count applications |
US5581482A (en) * | 1994-04-26 | 1996-12-03 | Unisys Corporation | Performance monitor for digital computer system |
US7623754B1 (en) | 1995-02-23 | 2009-11-24 | Avid Technology, Inc. | Motion picture recording device using digital, computer-readable non-linear media |
US6977673B1 (en) | 1995-02-23 | 2005-12-20 | Avid Technology, Inc. | Portable moving picture recording device including switching control for multiple data flow configurations |
US7532807B2 (en) * | 1995-04-07 | 2009-05-12 | Avid Technology, Inc. | Combined editing system and digital moving picture recording system |
US6035367A (en) * | 1997-04-04 | 2000-03-07 | Avid Technology, Inc. | Computer file system providing looped file structure for post-occurrence data collection of asynchronous events |
US6405327B1 (en) | 1998-08-19 | 2002-06-11 | Unisys Corporation | Apparatus for and method of automatic monitoring of computer performance |
US6396517B1 (en) | 1999-03-01 | 2002-05-28 | Agilent Technologies, Inc. | Integrated trigger function display system and methodology for trigger definition development in a signal measurement system having a graphical user interface |
US6327544B1 (en) | 1999-03-01 | 2001-12-04 | Agilent Technologies, Inc. | Automatic storage of a trigger definition in a signal measurement system |
US6542985B1 (en) | 1999-09-23 | 2003-04-01 | Unisys Corporation | Event counter |
US6647479B1 (en) | 2000-01-03 | 2003-11-11 | Avid Technology, Inc. | Computer file system providing looped file structure for post-occurrence data collection of asynchronous events |
US7373557B1 (en) | 2003-04-04 | 2008-05-13 | Unisys Corporation | Performance monitor for data processing systems |
US7627790B2 (en) * | 2003-08-21 | 2009-12-01 | Credence Systems Corporation | Apparatus for jitter testing an IC |
US7409617B2 (en) * | 2004-09-30 | 2008-08-05 | Credence Systems Corporation | System for measuring characteristics of a digital signal |
US8793536B2 (en) * | 2012-08-22 | 2014-07-29 | Tektronix, Inc. | Test and measurement instrument with auto-sync for bit-error detection |
US9063831B1 (en) * | 2012-12-21 | 2015-06-23 | Cadence Design Systems, Inc. | Method and apparatus for optimizing access to control registers in an emulation chip |
CN105116318B (zh) * | 2015-09-02 | 2018-02-02 | 电子科技大学 | 一种逻辑分析仪中实现毛刺检测的方法 |
US10916252B2 (en) | 2017-11-10 | 2021-02-09 | Nvidia Corporation | Accelerated data transfer for latency reduction and real-time processing |
CN118095168A (zh) * | 2024-04-16 | 2024-05-28 | 苏州元脑智能科技有限公司 | 一种逻辑分析仪、***、方法及计算机可读存储介质 |
CN118150992A (zh) * | 2024-05-11 | 2024-06-07 | 杭州沃镭智能科技股份有限公司 | 一种分布式的集成逻辑分析仪及方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4313200A (en) * | 1978-08-28 | 1982-01-26 | Takeda Riken Kogyo Kabushikikaisha | Logic test system permitting test pattern changes without dummy cycles |
JPS5585265A (en) * | 1978-12-23 | 1980-06-27 | Toshiba Corp | Function test evaluation device for integrated circuit |
GB2070300B (en) * | 1980-02-27 | 1984-01-25 | Racal Automation Ltd | Electrical testing apparatus and methods |
US4434488A (en) * | 1981-06-08 | 1984-02-28 | Tektronix, Inc. | Logic analyzer for a multiplexed digital bus |
US4425643A (en) * | 1981-06-08 | 1984-01-10 | Tektronix, Inc. | Multi-speed logic analyzer |
JPS5832178A (ja) * | 1981-08-19 | 1983-02-25 | Advantest Corp | Icテスタ |
US4481627A (en) * | 1981-10-30 | 1984-11-06 | Honeywell Information Systems Inc. | Embedded memory testing method and apparatus |
US4551838A (en) * | 1983-06-20 | 1985-11-05 | At&T Bell Laboratories | Self-testing digital circuits |
-
1984
- 1984-04-06 JP JP59069727A patent/JPS60213873A/ja active Pending
-
1985
- 1985-04-02 EP EP85104000A patent/EP0159588B1/de not_active Expired
- 1985-04-02 DE DE8585104000T patent/DE3585551D1/de not_active Expired - Fee Related
- 1985-04-02 US US06/719,154 patent/US4654848A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US4654848A (en) | 1987-03-31 |
EP0159588A2 (de) | 1985-10-30 |
EP0159588A3 (en) | 1988-06-29 |
JPS60213873A (ja) | 1985-10-26 |
EP0159588B1 (de) | 1992-03-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |