DE3381178D1 - Teilchendurchmesser-messvorrichtung. - Google Patents

Teilchendurchmesser-messvorrichtung.

Info

Publication number
DE3381178D1
DE3381178D1 DE8383306227T DE3381178T DE3381178D1 DE 3381178 D1 DE3381178 D1 DE 3381178D1 DE 8383306227 T DE8383306227 T DE 8383306227T DE 3381178 T DE3381178 T DE 3381178T DE 3381178 D1 DE3381178 D1 DE 3381178D1
Authority
DE
Germany
Prior art keywords
measuring device
particle diameter
diameter measuring
particle
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8383306227T
Other languages
English (en)
Inventor
Kyoichi Tatsuno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP57179739A external-priority patent/JPS5970944A/ja
Priority claimed from JP58049923A external-priority patent/JPS59174737A/ja
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE3381178D1 publication Critical patent/DE3381178D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE8383306227T 1982-10-15 1983-10-14 Teilchendurchmesser-messvorrichtung. Expired - Lifetime DE3381178D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP57179739A JPS5970944A (ja) 1982-10-15 1982-10-15 粒径測定装置
JP58049923A JPS59174737A (ja) 1983-03-25 1983-03-25 粒径測定装置

Publications (1)

Publication Number Publication Date
DE3381178D1 true DE3381178D1 (de) 1990-03-08

Family

ID=26390366

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383306227T Expired - Lifetime DE3381178D1 (de) 1982-10-15 1983-10-14 Teilchendurchmesser-messvorrichtung.

Country Status (3)

Country Link
US (1) US4595291A (de)
EP (1) EP0106684B1 (de)
DE (1) DE3381178D1 (de)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4596035A (en) * 1983-06-27 1986-06-17 Ortho Diagnostic Systems Inc. Methods for enumerating 3-part white cell differential clusters
EP0167272B1 (de) * 1984-06-30 1991-01-16 Kabushiki Kaisha Toshiba Apparat zur Messung der Abmessungen von Teilchen
EP0198670A3 (de) * 1985-04-11 1989-08-23 Nippon Steel Corporation Messung der Grösse von fallenden Partikeln
US4662749A (en) * 1985-11-08 1987-05-05 Massachusetts Institute Of Technology Fiber optic probe and system for particle size and velocity measurement
US4890920A (en) * 1986-02-12 1990-01-02 Combustion Engineering, Inc. In situ particle size measuring device
CA1292628C (en) * 1986-02-12 1991-12-03 James Phinazee Sutton Iii In situ particle size measuring device
US4665760A (en) * 1986-02-12 1987-05-19 Combustion Engineering, Inc. Mounting and traversing assembly for in situ particle size measuring device
JPS62222144A (ja) * 1986-03-25 1987-09-30 Toshiba Corp 粒径測定装置
JPS6319506A (ja) * 1986-07-14 1988-01-27 Power Reactor & Nuclear Fuel Dev Corp 滴下液滴の検出方法
GB8624587D0 (en) * 1986-10-14 1986-11-19 North Sea Instr Ltd Particle analysis apparatus
US4783599A (en) * 1987-02-10 1988-11-08 High Yield Technology Particle detector for flowing liquids with the ability to distinguish bubbles via photodiodes disposed 180° apart
GB8705844D0 (en) * 1987-03-12 1987-04-15 Secr Defence Dynamic light scattering apparatus
JP2529966B2 (ja) * 1987-03-28 1996-09-04 株式会社東芝 粒径測定装置
US4896048A (en) * 1988-05-27 1990-01-23 High Yield Technology Scattering-type particle detection device for use in high temperature process chambers
JP2641927B2 (ja) * 1988-11-16 1997-08-20 興和株式会社 微粒子測定装置
US4953978A (en) * 1989-03-03 1990-09-04 Coulter Electronics Of New England, Inc. Particle size analysis utilizing polarization intensity differential scattering
US5056918A (en) * 1989-03-03 1991-10-15 Coulter Electronics Of New England, Inc. Method and apparatus for particle size analysis
US5104221A (en) * 1989-03-03 1992-04-14 Coulter Electronics Of New England, Inc. Particle size analysis utilizing polarization intensity differential scattering
SE465338B (sv) * 1990-01-05 1991-08-26 Abb Stal Ab Saett och anordning foer detektering av partiklar i stroemmande medier
US5386819A (en) * 1990-03-29 1995-02-07 Olympus Optical Co., Ltd. Method and apparatus for inhibiting a scattered component in a light having passed through an examined object
JPH0816646B2 (ja) * 1992-09-28 1996-02-21 株式会社島津製作所 粒度分布測定装置
JP3375203B2 (ja) * 1994-08-08 2003-02-10 シスメックス株式会社 細胞分析装置
DE19510034B4 (de) * 1995-03-20 2005-08-11 Sympatec Gmbh System-Partikel-Technik Vorrichtung zur Bestimmung von Partikelgrößen und/oder Partikelgrößenverteilungen mittels Lichtbeugung
US5973779A (en) * 1996-03-29 1999-10-26 Ansari; Rafat R. Fiber-optic imaging probe
US6005662A (en) * 1996-11-04 1999-12-21 Certainteed Corporation Apparatus and method for the measurement and separation of airborne fibers
US6512583B1 (en) * 1996-11-04 2003-01-28 Certainteed Corporation Apparatus and method for the dimensional measurement of airborne fibers
US6034769A (en) * 1997-06-27 2000-03-07 Yufa; Aleksandr L. Method and device for counting and measuring particles
GB9818348D0 (en) * 1998-08-22 1998-10-14 Malvern Instr Ltd Improvements relating to the measurement of particle size distribution
US6738144B1 (en) 1999-12-17 2004-05-18 University Of Central Florida Non-invasive method and low-coherence apparatus system analysis and process control
US6798508B2 (en) * 2002-08-23 2004-09-28 Coulter International Corp. Fiber optic apparatus for detecting light scatter to differentiate blood cells and the like
JP3891925B2 (ja) * 2002-12-03 2007-03-14 ベイバイオサイエンス株式会社 生物学的粒子の情報を得る装置
US7365835B2 (en) * 2003-12-02 2008-04-29 California Institute Of Technology Dark-field laser-scattering microscope for analyzing single macromolecules
WO2011004781A1 (ja) 2009-07-10 2011-01-13 株式会社日立ハイテクノロジーズ 自動分析装置
CN104266945B (zh) * 2014-10-18 2017-01-18 山东理工大学 动态光散射颗粒检测装置的检测方法
WO2016063364A1 (ja) * 2014-10-22 2016-04-28 株式会社日立ハイテクノロジーズ 細胞計測機構及びそれを有する細胞培養装置並びに細胞計測方法
CN104374676B (zh) * 2014-11-25 2017-02-22 中国科学技术大学 一种基于光学俘获的颗粒粒径检测方法
CN106323826B (zh) * 2016-11-15 2023-11-10 上海理工大学 一种超低排放烟尘监测装置及监测方法
CN107941665B (zh) * 2017-12-21 2024-03-15 北京厚力德仪器设备有限公司 一种高分辨率气溶胶粒径探测仪
CN108225198B (zh) * 2018-01-19 2020-01-03 北京敏视达雷达有限公司 一种下落粒子的直径测量方法及激光雨滴谱仪
JPWO2021131578A1 (de) * 2019-12-27 2021-07-01

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3549264A (en) * 1968-11-13 1970-12-22 Hunter Associates Lab Inc Instrument for measuring the geometric attributes of metallic appearance by measuring light reflected at various angles from a surface
US4192613A (en) * 1976-01-08 1980-03-11 Martin Hammar Contour detecting and dimension measuring apparatus
GB1556029A (en) * 1976-10-29 1979-11-14 Standard Telephones Cables Ltd Oil in water detection
GB1588862A (en) * 1978-05-11 1981-04-29 Standard Telephones Cables Ltd Measuring oil in water
US4265538A (en) * 1979-10-18 1981-05-05 Leeds & Northrup Company Optical sample cell for analysis of particles in liquid suspension
JPS57199943A (en) * 1981-06-03 1982-12-08 Hitachi Ltd Measuring device for wetness of steam

Also Published As

Publication number Publication date
EP0106684B1 (de) 1990-01-31
EP0106684A2 (de) 1984-04-25
EP0106684A3 (en) 1986-12-10
US4595291A (en) 1986-06-17

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee