DE3013352A1 - DEVICE FOR ELECTROSTATICALLY HOLDING WORKPIECES, IN PARTICULAR SEMICONDUCTOR DISCS - Google Patents

DEVICE FOR ELECTROSTATICALLY HOLDING WORKPIECES, IN PARTICULAR SEMICONDUCTOR DISCS

Info

Publication number
DE3013352A1
DE3013352A1 DE19803013352 DE3013352A DE3013352A1 DE 3013352 A1 DE3013352 A1 DE 3013352A1 DE 19803013352 DE19803013352 DE 19803013352 DE 3013352 A DE3013352 A DE 3013352A DE 3013352 A1 DE3013352 A1 DE 3013352A1
Authority
DE
Germany
Prior art keywords
dielectric layer
electrode
particular semiconductor
workpieces
holding workpieces
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19803013352
Other languages
German (de)
Inventor
Ute Bergner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jenoptik AG
Original Assignee
Jenoptik Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jenoptik Jena GmbH filed Critical Jenoptik Jena GmbH
Publication of DE3013352A1 publication Critical patent/DE3013352A1/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6831Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
    • H01L21/6833Details of electrostatic chucks
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02NELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
    • H02N13/00Clutches or holding devices using electrostatic attraction, e.g. using Johnson-Rahbek effect

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Jigs For Machine Tools (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Gripping Jigs, Holding Jigs, And Positioning Jigs (AREA)

Description

Vorrichtung zum elektrostatischen Halten von Werkstücken, insbesondere HalbleiterscheibenDevice for the electrostatic holding of workpieces, in particular semiconductor wafers

Die Erfindung bezieht sich auf das elektrostatische Halten von elektrisch leitenden oder halbleitenden Werkstücken während ihrer Bearbeitung oder Kontrolle. Bei der Herstellung von mikroelektronischen Bauelementen steht die Anforderung, Halbleiterscheiben (sogenannte Wafer) auf ebenen Trägern zu halten und glätten, damit sie zur Erzeugung von Lackhaftmasken strukturiert werden können. Die Halbleiterscheiben können mechanisch, durch Vakuum oder elektrostatisch gehalten werden. In der Elektronenstrabllitbografie findet vorzugsweise die elektrostatische Halterung Anwendung. Es sind auch Anwendungsbeispiele der elektrostatischen Halterung in der Fotolithografie und der Ionenimplantation bekannt. Ebenso ist es möglich, metallische Werkstücke, die z. B. geläppt oder poliert werden sollen, in solchen Halterungen zu befestigen.The invention relates to the electrostatic holding of electrically conductive or semiconducting workpieces during their processing or control. In the production of microelectronic components, the requirement is Holding semiconductor wafers on flat supports and smoothing them so that they can be produced can be structured by paint adhesive masks. The semiconductor wafers can be held mechanically, by vacuum or electrostatically. In the electron strabllitbography The electrostatic mounting is preferred. There are also application examples of the electrostatic mount known in photolithography and ion implantation. It is also possible metallic workpieces z. B. to be lapped or polished to attach in such brackets.

Wie bereits bekannt, beruht die elektrostatische Halterung auf der Grundlage der Anziehung zweier entgegengesetzt geladener Kondensatorplatten.Die dielektrische Schicht und die Elektrode bilden die Werkstückunterlage. Bei der elektrostatischen Halterung spielt die dielektrische Schicht zwischen Elektrode und Werkstück die entscheidende Rolle. Sie nimmt durch ihre Dicke Einfluß auf die notwendige Spannung und beeinflußt auch die Ebenheit der Werkstückunterlage zu 50%. Verschleißarme oder gut reproduzierbare dielektrische Schichten garantieren lang andauernden Einsatz.As already known, the electrostatic chuck is based on the attraction of two opposites charged capacitor plates. The dielectric The layer and the electrode form the workpiece base. The dielectric layer between the electrode and the workpiece plays the decisive role in electrostatic mounting Role. Due to its thickness, it influences the necessary tension and also influences the evenness of the workpiece support to 50%. Low-wear or easily reproducible dielectric layers guarantee long continuous use.

In den bekannten Veröffentlichungen (US Patent 3 983 401, Brit. Pat. 1 443 215 und in Rev. Sei. Instrum.,In the known publications (US Patent 3,983,401, Brit. Pat. 1 443 215 and in Rev. Sci. Instrum.,

030048/0846030048/0846

VoI „ 44 No 10 S. 1506, Wardly "Elektrostatic wafer chuck") werden als dielektrische Schichten Folien aus Glimmer, Polyester oder Bariumtitanat verwendet. Hier liegen die Bachteile darin, daß die Schichten mit Klebemitteln befestigt werden müssen. Klebemittel verschlechtern entscheidend die Ebenheit der Unterlage· Diese Klebemittel können auch keine sehr lang andauernde und genügend hohe Abreißfestigkeit garantieren. Dadurch ist die gesamte Elektrode nicht wieder verwendbar, sondern muß beginnend bei der Ebenheitsbearbeitung neu bearbeitet werden. Derselbe Nachteil tritt auf, wenn die dielektrische Schicht abgenutzt ist.VoI "44 No 10 p. 1506, Wardly" Electrostatic wafer chuck ") Foils made of mica or polyester are used as dielectric layers or barium titanate is used. Here the creek parts lie in the fact that the layers have to be attached with adhesives. Adhesives have a decisive negative impact on the evenness of the surface · These adhesives can also not be very long guarantee lasting and sufficiently high tear resistance. This means that the entire electrode cannot be reused. but must be re-machined starting with the flatness machining. The same disadvantage occurs when the dielectric layer is worn.

Das Minimum der Foliendicke ist aus technologischen Gründen auch nach unten begrenzt. Durch Schichtdicken der dielektrischen Schicht von ^ 10/Um werden Spannungen zwischen 300 V und 3 KV erforderlich. Das erfordert zusätzr liehe Arbeitssehutzmaßnahmen in den Geräten. Außerdem wird bei der Anwendung der bekannten elektrostatischen Halterungen in Elektronenstrahlgeräten der Elektronenstrahl durch elektrische Felder dieser Größenordnung stark beeinflußt, wodurch zusätzliche Maßnahmen notwendig werden, um diese Ablenkung einzuschränken (US Pat. 3 983 401).The minimum of the film thickness is for technological reasons also limited downwards. Due to the thickness of the dielectric layer of ^ 10 / µm, voltages between 300 V and 3 KV required. That requires additional Lent occupational safety measures in the devices. Also will when using the known electrostatic mounts in electron beam devices, the electron beam occurs Electric fields of this magnitude strongly influenced, whereby additional measures are necessary to this Limit distraction (US Pat. 3,983,401).

Ziel der Erfindung ist eine Vorrichtung zum elektrostatischen Halten und Ebenen von Werkstücken, insbesondere von Halbleiterscheiben, die eine vernachlässigbar kleine Beeinflussung des Elektronenstrahles bewirkt, mit der den Arbeitsschutzbestimmungen besser entsprochen wird und deren dielektrische Schicht verschleißarm ist bzw. sich gut regenerieren läßt.The aim of the invention is a device for the electrostatic holding and planing of workpieces, in particular of Semiconductor wafers that have a negligibly small effect on the electron beam, with which the Health and safety regulations are better complied with and the dielectric layer is low-wear or is good can regenerate.

Die Aufgabe der Erfindung besteht darin, eine entsprechende Halterung zu schaffen, welche mit möglichst geringen Spannungen betrieben werden kann. Die dielektrische Schicht soll eine hohe Standzeitbesitzen sowie leicht regenerierbar sein.The object of the invention is to provide a corresponding To create bracket that can be operated with the lowest possible voltages. The dielectric layer should have a long service life and be easy to regenerate.

030046/0646030046/0646

Die Lösung besteht darin, daß die dielektrische Schicht aus dem Oxid der Elektrode besteht. Das hat den Vorteil, daß die dielektrische Schicht und die Elektrode strukturell miteinander verwachsen sind» The solution is to make the dielectric layer the oxide of the electrode. This has the advantage that the dielectric layer and the electrode are structurally grown together »

Ils Elektrodenmaterialien kommen vorteilhaft Nichteisenmetalle wie Aluminium, Tantal und Titan und Halbleiterkristal= Ie wie Silizium in Frage. Die genannten Elektrodenmaterialien lassen sich hocheben bearbeiten mit einer Ebenheit"=· 1 /Um0 Die Oxide.der Nichteisenmetalle gewinnt man durch anodische Oxydation. Dabei sind die dielektischen Schichten von einer Dicke ^ 500 α elektrisch dicht. Die Oxide obengenannter Materialien verfügen über eine hohe mechanische Festigkeit. Außerdem sind die dielektrischen Schichten an derselben Elektrode leicht regenerierbar wegen der direkten Proportionalität von Schichtdicke und angelegter Spannung bei der Erzeugung von Ventilschichten.Non-ferrous metals such as aluminum, tantalum and titanium and semiconductor crystals such as silicon are advantageously used as electrode materials. The mentioned electrode materials can be machined very flat with a flatness "= · 1 / Um 0 The oxides of the non-ferrous metals are obtained by anodic oxidation. The dielectric layers of a thickness of 500 α are electrically dense. The oxides of the above-mentioned materials have a high mechanical strength In addition, the dielectric layers on the same electrode can easily be regenerated because of the direct proportionality of layer thickness and applied voltage when creating valve layers.

Die Verwendung solcher dünnen dielektrischen Schichten erlauben das Halten und Ebenen von scheibenförmigen Werkstücken mit geringer Dicke, z. B. von Siliziumscheiben? mit einer angelegten Spannung < 10 V, die keine besonderen Arbeitsschutzvorkehrungen erfordern und für den Fall der Elektronenstrahlbearbeitung auch eine minimale Einwirkung auf den Elektronenstrahl garantieren.The use of such thin dielectric layers allow the holding and leveling of disc-shaped workpieces with a small thickness, e.g. B. of silicon wafers ? with an applied voltage of <10 V, which do not require any special health and safety precautions and also guarantee a minimal effect on the electron beam in the event of electron beam processing.

Dielektrische Schichten gleicher Eigenschaften lassen sich auch durch thermische Oxydation oder Pyrolyse von Silizium= Elektroden erzeugen.Dielectric layers with the same properties can also be produced by thermal oxidation or pyrolysis of silicon = Generate electrodes.

Claims (1)

PatentansprücheClaims 1. Vorrichtung zum elektrostatischen Halten von Werkstücken, insbesondere von Halbleiterscheiben auf einer Unterlage, die aus einer mit einer isolierenden dielektrischen Schicht bedeckten Elektrode besteht, dadurch gekennzeichnet, daß die dielektrische Schicht aus dem Oxid der Elektrode besteht.1. Device for the electrostatic holding of workpieces, in particular of semiconductor wafers on a base, which consists of a with an insulating dielectric Layer covered electrode, characterized in that the dielectric layer consists of the oxide of the Electrode. 2. Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, daß die dielektrische Schicht aus anodisch oxydierten Nichteisenmetallen, vorzugsweise aus Titan, Aluminium oder Tantal besteht.2. Apparatus according to claim 1, characterized in that the dielectric layer made of anodically oxidized Non-ferrous metals, preferably made of titanium, aluminum or tantalum. 3. Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, daß die dielektrische Schicht aus thermisch oder pyrolytisch oxydiertem Halbleitermaterial, vorzugsweise aus Silizium besteht.3. Apparatus according to claim 1, characterized in that the dielectric layer consists of thermal or pyrolytic oxidized semiconductor material, preferably made of silicon. 24.01.1980
Kel/Thi
01/24/1980
Kel / Thi
34613461 030046/0646030046/0646
DE19803013352 1979-04-26 1980-04-05 DEVICE FOR ELECTROSTATICALLY HOLDING WORKPIECES, IN PARTICULAR SEMICONDUCTOR DISCS Withdrawn DE3013352A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD21251179A DD143131A1 (en) 1979-04-26 1979-04-26 DEVICE FOR ELECTROSTATIC HOLDING OF WORKPIECES, PARTICULARLY SEMICONDUCTED DISCS

Publications (1)

Publication Number Publication Date
DE3013352A1 true DE3013352A1 (en) 1980-11-13

Family

ID=5517859

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19803013352 Withdrawn DE3013352A1 (en) 1979-04-26 1980-04-05 DEVICE FOR ELECTROSTATICALLY HOLDING WORKPIECES, IN PARTICULAR SEMICONDUCTOR DISCS

Country Status (5)

Country Link
JP (1) JPS55145351A (en)
DD (1) DD143131A1 (en)
DE (1) DE3013352A1 (en)
FR (1) FR2455360A1 (en)
GB (1) GB2050064A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT383439B (en) * 1985-11-04 1987-07-10 Akad Wissenschaften Ddr Apparatus for loading devices of dry etching installations
US5600530A (en) * 1992-08-04 1997-02-04 The Morgan Crucible Company Plc Electrostatic chuck

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2106325A (en) * 1981-09-14 1983-04-07 Philips Electronic Associated Electrostatic chuck
JPS6059104B2 (en) * 1982-02-03 1985-12-23 株式会社東芝 electrostatic chuck board
JPS5928354A (en) * 1982-08-10 1984-02-15 Toshiba Corp Thin film for electrostatic chuck
US4551192A (en) * 1983-06-30 1985-11-05 International Business Machines Corporation Electrostatic or vacuum pinchuck formed with microcircuit lithography
GB2147459A (en) * 1983-09-30 1985-05-09 Philips Electronic Associated Electrostatic chuck for semiconductor wafers
EP0138254B1 (en) * 1983-09-30 1988-06-01 Philips Electronics Uk Limited Electrostatic chuck and loading method
JPS6099538A (en) * 1983-11-01 1985-06-03 横河・ヒュ−レット・パッカ−ド株式会社 Pin chuck
JPS61161713A (en) * 1985-01-10 1986-07-22 Sumitomo Electric Ind Ltd Parts for manufacture of semiconductor
US5325261A (en) * 1991-05-17 1994-06-28 Unisearch Limited Electrostatic chuck with improved release
US5315473A (en) * 1992-01-21 1994-05-24 Applied Materials, Inc. Isolated electrostatic chuck and excitation method
EP0635870A1 (en) * 1993-07-20 1995-01-25 Applied Materials, Inc. An electrostatic chuck having a grooved surface
US5535507A (en) * 1993-12-20 1996-07-16 International Business Machines Corporation Method of making electrostatic chuck with oxide insulator
JP3425249B2 (en) * 1995-01-23 2003-07-14 東芝機械株式会社 Sample holder fixing device
US5656093A (en) * 1996-03-08 1997-08-12 Applied Materials, Inc. Wafer spacing mask for a substrate support chuck and method of fabricating same
US5745332A (en) * 1996-05-08 1998-04-28 Applied Materials, Inc. Monopolar electrostatic chuck having an electrode in contact with a workpiece

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT383439B (en) * 1985-11-04 1987-07-10 Akad Wissenschaften Ddr Apparatus for loading devices of dry etching installations
US5600530A (en) * 1992-08-04 1997-02-04 The Morgan Crucible Company Plc Electrostatic chuck

Also Published As

Publication number Publication date
DD143131A1 (en) 1980-07-30
GB2050064A (en) 1980-12-31
JPS55145351A (en) 1980-11-12
FR2455360A1 (en) 1980-11-21

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