DE2901231A1 - Ultrasonic non-destructive testing head - has composite piezo electric converter decoupled for independent variation reducing side lobes - Google Patents
Ultrasonic non-destructive testing head - has composite piezo electric converter decoupled for independent variation reducing side lobesInfo
- Publication number
- DE2901231A1 DE2901231A1 DE19792901231 DE2901231A DE2901231A1 DE 2901231 A1 DE2901231 A1 DE 2901231A1 DE 19792901231 DE19792901231 DE 19792901231 DE 2901231 A DE2901231 A DE 2901231A DE 2901231 A1 DE2901231 A1 DE 2901231A1
- Authority
- DE
- Germany
- Prior art keywords
- test head
- transducer
- decoupled
- transducers
- converter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2437—Piezoelectric probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
- G01N29/262—Arrangements for orientation or scanning by relative movement of the head and the sensor by electronic orientation or focusing, e.g. with phased arrays
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
- G10K11/00—Methods or devices for transmitting, conducting or directing sound in general; Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/18—Methods or devices for transmitting, conducting or directing sound
- G10K11/26—Sound-focusing or directing, e.g. scanning
- G10K11/34—Sound-focusing or directing, e.g. scanning using electrical steering of transducer arrays, e.g. beam steering
- G10K11/341—Circuits therefor
- G10K11/348—Circuits therefor using amplitude variation
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Acoustics & Sound (AREA)
- Multimedia (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
Description
Prüfkopftyp zur zerstörungsfreien WerkstoffprüfungProbe type for non-destructive material testing
Die Erfindung betrifft einen Prüfkopf gemäß Oberbegriff des Anspruchs 1.The invention relates to a test head according to the preamble of the claim 1.
Die heute in der Werkstoffprüfung üblichen Normal und Winkelprtifköpfe besitzen relativ hohe Nebenkeulen: die theoretische Grenze für einen Kolbenschwinger liegt bei etwa 1 x, 5 dB bzw. 27 dB im Puls-Echo-Betrieb, eine Grenze, die in der Praxis - insbesondere bei Winkelprüfköpfen - oft bei weitem nicht erreicht wird Dieses Nebenkeulenniveau ist jedoch für viele Anwendungen in der zerstörungsfreien Prüfung viel zu hoch: Formechos können von Fehlerechos häufig nur schwer oder sogar überhaupt nicht unterschieden werden.The normal and angled probes commonly used in materials testing today have relatively high side lobes: the theoretical limit for a piston oscillator is around 1 x.5 dB or 27 dB in pulse-echo mode, a limit that is in the Practice - especially with angle probes - is often far from being achieved However, this sidelobe level is essential for many non-destructive applications Check much too high: Form echoes can often be difficult or even difficult to get from false echoes cannot be distinguished at all.
Im folgenden soll ein neuer Prüfkopftyp für die Werkstoffprüfung beschrieben werden, der sich durch eine verminderte Nebenkeulenhöhe auszeichnet und darüber hinaus an jedes kommerzielle Ultraschallprüfgerät angeschlossen werden kann, Der erfindungsgemäße Prüfkopf ist durch die in Anspruch 1 oder Anspruch 6 angegebenen Merkmale gekennzeichnet. Vorteilhafte TTeiterbildungen sind in den Unteransprüchen angegeben.A new type of probe for materials testing is described below which is characterized by a reduced side lobe height and above can also be connected to any commercial ultrasonic testing device that The test head according to the invention is indicated by that specified in claim 1 or claim 6 Features marked. Advantageous further developments are in the subclaims specified.
Der Prüfkopf besteht aus einer mehr oder weniger großen Anzahl von in bestimmter räumlicher Konfiguration angeordneten Schwingern. Durch eine geeignete phasen- bzw. amplitudenmäßige Ansteuerung der Einzelstrahler kann die Richtcharakteristik der Gesamtanordnung weitreichend beeinflußt werden: die rirc:ensteuerung bestimmt die räumliche Orientierung der Strahlungskeulen, während die in diesem Zusammenhang interessantere Amplitudensteuerung (die einzelnen Elemente werden unterschiedlich stark angeregt) eine Beeinflussung der Nebenkeulenhöhe und der Peilschärfe erlaubt.The probe consists of a more or less large number of transducers arranged in a certain spatial configuration. Through a suitable The directional characteristic can be controlled in terms of phase or amplitude of the individual radiators the overall arrangement can be influenced to a large extent: the rirc: en control determines the spatial orientation of the radiation lobes, while those in this context more interesting Amplitude control (the individual elements are stimulated to different degrees) an influence on the side lobe height and the bearing sharpness permitted.
Eine Prinzipskizze des Prüfkopfkonzepts zeigt Abb. 1. Der Prüfkopf besteht aus zwei Teilen: einem piezoelektrischen Gruppenschwinger samt Dämpfungskörper und einem Widerstands-und Diodennetzwerk, sowie Steckanschluß zum Senden und EmFfangen des Ultraschallprüfgerätes, das sich ebenso gut außerhalb des Prüfkopfgehäuses befinden kann. Als Arrayanordnung kommen dabei lineare, flächenhafte oder auch Ring-Arrays in Frage (Abb. 2).A schematic diagram of the probe concept is shown in Fig. 1. The probe consists of two parts: a piezoelectric group oscillator with a damping body and a resistor and diode network, as well as a plug connection for sending and receiving of the ultrasonic testing device, which is also located outside the probe housing can. Linear, planar or ring arrays are used as the array arrangement in question (Fig. 2).
Die Anzahl der Einzelelemente richtet sich nach Prüfkopfgröße, Erregerfrequenz und dem geforderten Maß der Nebenkeulenbeeinflussung. Durch Vorsatz von keil- oder linsenförmigen Vorlauf strecken können sowohl Winkel- als auch Fokusprüfköpfe realisiert werden. Schließlich läßt das Prinzip auch den Bau getrennter Sende- und Empfängerköpfe zu.The number of individual elements depends on the size of the probe and the frequency of the excitation and the required degree of sidelobe influence. By intent of wedge or Lenticular lead stretch can be realized with both angle and focus probes will. Finally, the principle also allows the construction of separate transmitter and receiver heads to.
Eine mögliche Ausführung des Widerstands- und Diodennetzwerks zeigt Abb. 3.A possible implementation of the resistor and diode network is shown Fig. 3.
Die Amplitudenbelegung für den Sendefall wird mit den festen Widerständen R5 grob und mit den Potentiometern P5 fein eingestellt. Die Empfangsschwächung geschieht über die Potentiometer Pe; die Festwiderstände Re und die Dioden D dienen zur Entkopplung der Sende- und Empfängerbelegung des jeweiligen Wandlers. Statt einer Schwächung der Empfangssignale kann auch eine Verstärkung der Signale vorgesehen sein.The amplitude assignment for the transmission case is determined by the fixed resistances R5 coarse and finely adjusted with potentiometers P5. The reception is weakened via the potentiometer Pe; the fixed resistors Re and the diodes D are used for decoupling the sender and receiver assignment of the respective converter. Instead of a weakening The received signals can also be amplified.
Abb. 4 zeigt eine Prinzipskizze zu einem Prüfkopf gemaß Anspruch 6.Fig. 4 shows a schematic diagram of a test head according to claim 6.
Bei Ansteuerung einer Untergruppe miteinander gekoppelter winzelwandler stellt sich auf der schallabstrahlenden Fläche (gemeinsame Elektrode) über jedem Einzelrandler eine Teilchenverschiebung auf einer Teilfläche ein, die größer als die Grundfläche des Einzelwandlers ist.When activating a subgroup of coupled transducers is positioned on the sound-emitting surface (common electrode) above each one Single Randler a particle displacement on a partial area that is greater than is the footprint of the single converter.
Diese Teilchenverschiebung entspricht in ihrem Amplitudenverlauf über der Teilfläche einer Anregung wie unter Anspruch 2 geschildert.This particle shift corresponds in its amplitude curve to the partial area of an excitation as described in claim 2.
Claims (6)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19792901231 DE2901231A1 (en) | 1979-01-13 | 1979-01-13 | Ultrasonic non-destructive testing head - has composite piezo electric converter decoupled for independent variation reducing side lobes |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19792901231 DE2901231A1 (en) | 1979-01-13 | 1979-01-13 | Ultrasonic non-destructive testing head - has composite piezo electric converter decoupled for independent variation reducing side lobes |
Publications (1)
Publication Number | Publication Date |
---|---|
DE2901231A1 true DE2901231A1 (en) | 1980-07-17 |
Family
ID=6060524
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19792901231 Ceased DE2901231A1 (en) | 1979-01-13 | 1979-01-13 | Ultrasonic non-destructive testing head - has composite piezo electric converter decoupled for independent variation reducing side lobes |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE2901231A1 (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2508324A1 (en) * | 1981-06-26 | 1982-12-31 | Thomson Csf | Ultrasonic heating appts. for treatment of deep biological tissue - has piezoelectric plate divided into annular radiation zones of equal width divided by grooves |
DE3122036A1 (en) * | 1981-05-29 | 1983-01-05 | Mannesmann AG, 4000 Düsseldorf | TEST HEAD MOUNT FOR SINGLE AND MULTIPLE TEST HEADS |
EP0068961A2 (en) * | 1981-06-26 | 1983-01-05 | Thomson-Csf | Apparatus for the local heating of biological tissue |
DE3149732A1 (en) * | 1981-12-15 | 1983-07-21 | Siemens AG, 1000 Berlin und 8000 München | Ultrasonic transducer arrangement |
FR2523451A2 (en) * | 1982-03-19 | 1983-09-23 | Thomson Csf | Ultrasonic heating appts. for treatment of deep biological tissue - has piezoelectric plate divided into annular radiation zones of equal width divided by grooves |
FR2670898A1 (en) * | 1990-12-21 | 1992-06-26 | Framatome Sa | DEVICE FOR NON-DESTRUCTIVE ULTRASONIC TESTING OF ELONGATE ELEMENTS WITH SUBSTANTIALLY CONSTANT SECTION. |
WO2008119748A1 (en) * | 2007-03-30 | 2008-10-09 | Ge Inspection Technologies Gmbh | Method for controlling an array test head of a device for the ultrasonic testing of an animate or inanimate test object and device for carrying out said method |
DE102016115260B3 (en) * | 2016-08-17 | 2018-02-08 | Infineon Technologies Ag | SOUND WAVE SENSOR |
-
1979
- 1979-01-13 DE DE19792901231 patent/DE2901231A1/en not_active Ceased
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3122036A1 (en) * | 1981-05-29 | 1983-01-05 | Mannesmann AG, 4000 Düsseldorf | TEST HEAD MOUNT FOR SINGLE AND MULTIPLE TEST HEADS |
FR2508324A1 (en) * | 1981-06-26 | 1982-12-31 | Thomson Csf | Ultrasonic heating appts. for treatment of deep biological tissue - has piezoelectric plate divided into annular radiation zones of equal width divided by grooves |
EP0068961A2 (en) * | 1981-06-26 | 1983-01-05 | Thomson-Csf | Apparatus for the local heating of biological tissue |
EP0068961A3 (en) * | 1981-06-26 | 1983-02-02 | Thomson-Csf | Apparatus for the local heating of biological tissue |
DE3149732A1 (en) * | 1981-12-15 | 1983-07-21 | Siemens AG, 1000 Berlin und 8000 München | Ultrasonic transducer arrangement |
FR2523451A2 (en) * | 1982-03-19 | 1983-09-23 | Thomson Csf | Ultrasonic heating appts. for treatment of deep biological tissue - has piezoelectric plate divided into annular radiation zones of equal width divided by grooves |
FR2670898A1 (en) * | 1990-12-21 | 1992-06-26 | Framatome Sa | DEVICE FOR NON-DESTRUCTIVE ULTRASONIC TESTING OF ELONGATE ELEMENTS WITH SUBSTANTIALLY CONSTANT SECTION. |
US5454267A (en) * | 1990-12-21 | 1995-10-03 | Framatome | Multi-element ultrasonic probe for electronic scanning |
WO2008119748A1 (en) * | 2007-03-30 | 2008-10-09 | Ge Inspection Technologies Gmbh | Method for controlling an array test head of a device for the ultrasonic testing of an animate or inanimate test object and device for carrying out said method |
DE102016115260B3 (en) * | 2016-08-17 | 2018-02-08 | Infineon Technologies Ag | SOUND WAVE SENSOR |
US10684163B2 (en) | 2016-08-17 | 2020-06-16 | Infineon Technologies Ag | Acoustic wave sensor |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OAP | Request for examination filed | ||
OD | Request for examination | ||
8131 | Rejection |