DE19882501T1 - Ablationsprofilierer - Google Patents

Ablationsprofilierer

Info

Publication number
DE19882501T1
DE19882501T1 DE19882501T DE19882501T DE19882501T1 DE 19882501 T1 DE19882501 T1 DE 19882501T1 DE 19882501 T DE19882501 T DE 19882501T DE 19882501 T DE19882501 T DE 19882501T DE 19882501 T1 DE19882501 T1 DE 19882501T1
Authority
DE
Germany
Prior art keywords
profiler
ablation
ablation profiler
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19882501T
Other languages
English (en)
Inventor
David Macpherson
Jon Dishler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of DE19882501T1 publication Critical patent/DE19882501T1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/255—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring radius of curvature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G01B9/02087—Combining two or more images of the same region
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G01B9/02088—Matching signals with a database
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Databases & Information Systems (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE19882501T 1997-07-01 1998-07-01 Ablationsprofilierer Withdrawn DE19882501T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US5162097P 1997-07-01 1997-07-01
PCT/US1998/013539 WO1999001716A1 (en) 1997-07-01 1998-07-01 Ablation profiler

Publications (1)

Publication Number Publication Date
DE19882501T1 true DE19882501T1 (de) 2000-07-20

Family

ID=21972405

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19882501T Withdrawn DE19882501T1 (de) 1997-07-01 1998-07-01 Ablationsprofilierer

Country Status (4)

Country Link
AU (1) AU8274398A (de)
CA (1) CA2294185A1 (de)
DE (1) DE19882501T1 (de)
WO (1) WO1999001716A1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6396069B1 (en) * 1999-06-25 2002-05-28 Macpherson David C. Topographer for real time ablation feedback having synthetic wavelength generators
AUPQ139899A0 (en) * 1999-07-02 1999-07-29 University Of Western Australia, The Closed loop optical coherence topography
DE10041041A1 (de) * 2000-08-22 2002-03-07 Zeiss Carl Interferometeranordnung und Interferometrisches Verfahren
AUPR086100A0 (en) * 2000-10-20 2000-11-16 Q-Vis Limited Improved surface profiling apparatus
WO2003058163A1 (en) * 2001-12-05 2003-07-17 Semiconductor Technologies & Instruments, Inc. System and method for inspection using white light intererometry
US20030204180A1 (en) 2002-04-30 2003-10-30 Kimberly-Clark Worldwide, Inc. Temperature responsive delivery systems
US7133137B2 (en) 2002-06-27 2006-11-07 Visx, Incorporated Integrated scanning and ocular tomography system and method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4387994A (en) * 1980-02-04 1983-06-14 Balasubramanian N Optical system for surface topography measurement
US5317389A (en) * 1989-06-12 1994-05-31 California Institute Of Technology Method and apparatus for white-light dispersed-fringe interferometric measurement of corneal topography

Also Published As

Publication number Publication date
CA2294185A1 (en) 1999-01-14
AU8274398A (en) 1999-01-25
WO1999001716A1 (en) 1999-01-14

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Legal Events

Date Code Title Description
8139 Disposal/non-payment of the annual fee