DE10353227A1 - Test pin for electrical or electronic components, has test head and contact pin that make connection at several contact points, and flexible contact elements, e.g. wire springs, lamellas or similar in bush - Google Patents
Test pin for electrical or electronic components, has test head and contact pin that make connection at several contact points, and flexible contact elements, e.g. wire springs, lamellas or similar in bush Download PDFInfo
- Publication number
- DE10353227A1 DE10353227A1 DE10353227A DE10353227A DE10353227A1 DE 10353227 A1 DE10353227 A1 DE 10353227A1 DE 10353227 A DE10353227 A DE 10353227A DE 10353227 A DE10353227 A DE 10353227A DE 10353227 A1 DE10353227 A1 DE 10353227A1
- Authority
- DE
- Germany
- Prior art keywords
- pin
- test
- bush
- contact
- test head
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
- H01R11/18—End pieces terminating in a probe
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The test pin has a test head (2) movable in a housing (1) against the force of a force storage device and that interacts with a connecting pin (3). The test head and connecting pin make a connection at several contact points. Flexible contact elements, e.g. wire springs, lamellas or similar are arranged in a bush. The connecting pin engages the test head bush with a pin and a plug pin protrudes from a center part of the connecting pin on the opposite end. An independent claim is also included for the following: (a) a test head for a test pin.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10353227A DE10353227A1 (en) | 2003-10-10 | 2003-11-13 | Test pin for electrical or electronic components, has test head and contact pin that make connection at several contact points, and flexible contact elements, e.g. wire springs, lamellas or similar in bush |
DE202004002099U DE202004002099U1 (en) | 2003-10-10 | 2004-02-11 | Test pin for electrical or electronic components, has test head and contact pin that make connection at several contact points, and flexible contact elements, e.g. wire springs, lamellas or similar in bush |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10347804 | 2003-10-10 | ||
DE10353227A DE10353227A1 (en) | 2003-10-10 | 2003-11-13 | Test pin for electrical or electronic components, has test head and contact pin that make connection at several contact points, and flexible contact elements, e.g. wire springs, lamellas or similar in bush |
Publications (1)
Publication Number | Publication Date |
---|---|
DE10353227A1 true DE10353227A1 (en) | 2005-05-12 |
Family
ID=34428411
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE10353227A Withdrawn DE10353227A1 (en) | 2003-10-10 | 2003-11-13 | Test pin for electrical or electronic components, has test head and contact pin that make connection at several contact points, and flexible contact elements, e.g. wire springs, lamellas or similar in bush |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE10353227A1 (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4904213A (en) * | 1989-04-06 | 1990-02-27 | Motorola, Inc. | Low impedance electric connector |
US6159056A (en) * | 1998-11-25 | 2000-12-12 | Rika Electronics International, Inc. | Electrical contact assembly for interconnecting test apparatus and the like |
-
2003
- 2003-11-13 DE DE10353227A patent/DE10353227A1/en not_active Withdrawn
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4904213A (en) * | 1989-04-06 | 1990-02-27 | Motorola, Inc. | Low impedance electric connector |
US6159056A (en) * | 1998-11-25 | 2000-12-12 | Rika Electronics International, Inc. | Electrical contact assembly for interconnecting test apparatus and the like |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
8139 | Disposal/non-payment of the annual fee |