DE10353227A1 - Test pin for electrical or electronic components, has test head and contact pin that make connection at several contact points, and flexible contact elements, e.g. wire springs, lamellas or similar in bush - Google Patents

Test pin for electrical or electronic components, has test head and contact pin that make connection at several contact points, and flexible contact elements, e.g. wire springs, lamellas or similar in bush Download PDF

Info

Publication number
DE10353227A1
DE10353227A1 DE10353227A DE10353227A DE10353227A1 DE 10353227 A1 DE10353227 A1 DE 10353227A1 DE 10353227 A DE10353227 A DE 10353227A DE 10353227 A DE10353227 A DE 10353227A DE 10353227 A1 DE10353227 A1 DE 10353227A1
Authority
DE
Germany
Prior art keywords
pin
test
bush
contact
test head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE10353227A
Other languages
German (de)
Inventor
Andrea Berger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to DE10353227A priority Critical patent/DE10353227A1/en
Priority to DE202004002099U priority patent/DE202004002099U1/en
Publication of DE10353227A1 publication Critical patent/DE10353227A1/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02Contact members
    • H01R13/22Contacts for co-operating by abutting
    • H01R13/24Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18End pieces terminating in a probe
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00Connectors or connections adapted for particular applications
    • H01R2201/20Connectors or connections adapted for particular applications for testing or measuring purposes

Landscapes

  • Measuring Leads Or Probes (AREA)

Abstract

The test pin has a test head (2) movable in a housing (1) against the force of a force storage device and that interacts with a connecting pin (3). The test head and connecting pin make a connection at several contact points. Flexible contact elements, e.g. wire springs, lamellas or similar are arranged in a bush. The connecting pin engages the test head bush with a pin and a plug pin protrudes from a center part of the connecting pin on the opposite end. An independent claim is also included for the following: (a) a test head for a test pin.
DE10353227A 2003-10-10 2003-11-13 Test pin for electrical or electronic components, has test head and contact pin that make connection at several contact points, and flexible contact elements, e.g. wire springs, lamellas or similar in bush Withdrawn DE10353227A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE10353227A DE10353227A1 (en) 2003-10-10 2003-11-13 Test pin for electrical or electronic components, has test head and contact pin that make connection at several contact points, and flexible contact elements, e.g. wire springs, lamellas or similar in bush
DE202004002099U DE202004002099U1 (en) 2003-10-10 2004-02-11 Test pin for electrical or electronic components, has test head and contact pin that make connection at several contact points, and flexible contact elements, e.g. wire springs, lamellas or similar in bush

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10347804 2003-10-10
DE10353227A DE10353227A1 (en) 2003-10-10 2003-11-13 Test pin for electrical or electronic components, has test head and contact pin that make connection at several contact points, and flexible contact elements, e.g. wire springs, lamellas or similar in bush

Publications (1)

Publication Number Publication Date
DE10353227A1 true DE10353227A1 (en) 2005-05-12

Family

ID=34428411

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10353227A Withdrawn DE10353227A1 (en) 2003-10-10 2003-11-13 Test pin for electrical or electronic components, has test head and contact pin that make connection at several contact points, and flexible contact elements, e.g. wire springs, lamellas or similar in bush

Country Status (1)

Country Link
DE (1) DE10353227A1 (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4904213A (en) * 1989-04-06 1990-02-27 Motorola, Inc. Low impedance electric connector
US6159056A (en) * 1998-11-25 2000-12-12 Rika Electronics International, Inc. Electrical contact assembly for interconnecting test apparatus and the like

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4904213A (en) * 1989-04-06 1990-02-27 Motorola, Inc. Low impedance electric connector
US6159056A (en) * 1998-11-25 2000-12-12 Rika Electronics International, Inc. Electrical contact assembly for interconnecting test apparatus and the like

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8139 Disposal/non-payment of the annual fee