DE10292357D2 - Process for automated detection, spectroscopic analysis and identification of particles - Google Patents
Process for automated detection, spectroscopic analysis and identification of particlesInfo
- Publication number
- DE10292357D2 DE10292357D2 DE10292357T DE10292357T DE10292357D2 DE 10292357 D2 DE10292357 D2 DE 10292357D2 DE 10292357 T DE10292357 T DE 10292357T DE 10292357 T DE10292357 T DE 10292357T DE 10292357 D2 DE10292357 D2 DE 10292357D2
- Authority
- DE
- Germany
- Prior art keywords
- identification
- particles
- spectroscopic analysis
- automated detection
- automated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000001514 detection method Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 239000002245 particle Substances 0.000 title 1
- 238000004611 spectroscopical analysis Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
- G01N15/0211—Investigating a scatter or diffraction pattern
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
- G01J3/4412—Scattering spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Electro-optical investigation, e.g. flow cytometers
- G01N15/1468—Electro-optical investigation, e.g. flow cytometers with spatial resolution of the texture or inner structure of the particle
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Electro-optical investigation, e.g. flow cytometers
- G01N15/1434—Electro-optical investigation, e.g. flow cytometers using an analyser being characterised by its optical arrangement
- G01N2015/1452—Adjustment of focus; Alignment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N2021/646—Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N2021/653—Coherent methods [CARS]
- G01N2021/656—Raman microprobe
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/103—Scanning by mechanical motion of stage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/108—Miscellaneous
- G01N2201/1087—Focussed scan beam, e.g. laser
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10292357T DE10292357D2 (en) | 2001-05-31 | 2002-05-24 | Process for automated detection, spectroscopic analysis and identification of particles |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10127538 | 2001-05-31 | ||
DE10292357T DE10292357D2 (en) | 2001-05-31 | 2002-05-24 | Process for automated detection, spectroscopic analysis and identification of particles |
PCT/EP2002/005779 WO2002097409A1 (en) | 2001-05-31 | 2002-05-24 | Method for the automated recognition, spectroscopic analysis and identification of particles |
Publications (1)
Publication Number | Publication Date |
---|---|
DE10292357D2 true DE10292357D2 (en) | 2004-07-01 |
Family
ID=7687430
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE10292357T Ceased DE10292357D2 (en) | 2001-05-31 | 2002-05-24 | Process for automated detection, spectroscopic analysis and identification of particles |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE10292357D2 (en) |
WO (1) | WO2002097409A1 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004008762B4 (en) * | 2004-02-23 | 2006-10-12 | Erwin Kayser-Threde Gmbh | Method and device for detecting and identifying bioparticles |
US7993585B2 (en) * | 2005-07-14 | 2011-08-09 | Battelle Memorial Institute | Biological and chemical monitoring |
ZA200901160B (en) * | 2006-08-18 | 2010-05-26 | Primus Special Projects Pty Ltd | A sorter |
NL1039263C2 (en) * | 2011-12-23 | 2013-06-26 | Zevenaar Elektronica & Sensoren B V | DEVICE AND METHOD FOR COUNTING AND MEASURING PARTICLES. |
CN110346042B (en) * | 2019-08-01 | 2022-03-08 | 南京邮电大学 | Multi-sensor stray light elimination spectrometer |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3037983C2 (en) * | 1980-10-08 | 1983-03-31 | Fa. Carl Zeiss, 7920 Heidenheim | Method and device for the light-induced scanning microscopic representation of sample parameters in their spatial distribution |
US4766324A (en) * | 1987-08-07 | 1988-08-23 | Tencor Instruments | Particle detection method including comparison between sequential scans |
DE4111903A1 (en) * | 1991-04-12 | 1992-10-15 | Bayer Ag | SPECTROSCOPY-CORRECTED LIGHT-SCREEN MICROSCOPY |
JP3258821B2 (en) * | 1994-06-02 | 2002-02-18 | 三菱電機株式会社 | Method for positioning and analyzing minute foreign matter, analyzer used for the method, and method for manufacturing semiconductor element or liquid crystal display element using the same |
DE19946110C1 (en) * | 1999-09-17 | 2001-02-01 | Apsys Advanced Particle System | Optical particle characterisation method for clean room for electronics industry has sampled air fed to light dispersion measuring device triggering particle identification unit using monochromatic light |
-
2002
- 2002-05-24 WO PCT/EP2002/005779 patent/WO2002097409A1/en not_active Application Discontinuation
- 2002-05-24 DE DE10292357T patent/DE10292357D2/en not_active Ceased
Also Published As
Publication number | Publication date |
---|---|
WO2002097409A1 (en) | 2002-12-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law |
Ref document number: 10292357 Country of ref document: DE Date of ref document: 20040701 Kind code of ref document: P |
|
8125 | Change of the main classification |
Ipc: G01N 1500 |
|
8131 | Rejection |