DE102008050798A1 - Method for positioning and fixing e.g. semiconductor chip, on e.g. direct copper Bonding substrate, involves pressing components together such that electrical connection and mechanical fixing of components are obtained - Google Patents
Method for positioning and fixing e.g. semiconductor chip, on e.g. direct copper Bonding substrate, involves pressing components together such that electrical connection and mechanical fixing of components are obtained Download PDFInfo
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- DE102008050798A1 DE102008050798A1 DE102008050798A DE102008050798A DE102008050798A1 DE 102008050798 A1 DE102008050798 A1 DE 102008050798A1 DE 102008050798 A DE102008050798 A DE 102008050798A DE 102008050798 A DE102008050798 A DE 102008050798A DE 102008050798 A1 DE102008050798 A1 DE 102008050798A1
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- component
- setting device
- pressure element
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/328—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by welding
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3735—Laminates or multilayers, e.g. direct bond copper ceramic substrates
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
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- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
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- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
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- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
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- H01L2224/83191—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on the semiconductor or solid-state body
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- H01L2224/83905—Combinations of bonding methods provided for in at least two different groups from H01L2224/838 - H01L2224/83904
- H01L2224/83907—Intermediate bonding, i.e. intermediate bonding step for temporarily bonding the semiconductor or solid-state body, followed by at least a further bonding step
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- H01L2924/01047—Silver [Ag]
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0306—Inorganic insulating substrates, e.g. ceramic, glass
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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- H05K2203/02—Details related to mechanical or acoustic processing, e.g. drilling, punching, cutting, using ultrasound
- H05K2203/0278—Flat pressure, e.g. for connecting terminals with anisotropic conductive adhesive
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- H05K2203/02—Details related to mechanical or acoustic processing, e.g. drilling, punching, cutting, using ultrasound
- H05K2203/0285—Using ultrasound, e.g. for cleaning, soldering or wet treatment
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Abstract
Description
TECHNISCHES GEBIETTECHNICAL AREA
Die Erfindung betrifft ein Verfahren zum Positionieren und Fixieren eines elektrischen oder elektronischen Bauteils auf einem anderen Bauteil sowie eine dabei anwendbare Anordnung zum Positionieren und Vorfixieren eines elektrischen oder elektronischen Bauteils auf einem anderen Bauteil.The The invention relates to a method for positioning and fixing an electrical or electronic component on another Component and an applicable arrangement for positioning and prefixing an electrical or electronic component on another component.
HINTERGRUNDBACKGROUND
Bekannte Verfahren zum Verbinden von Bauelementen untereinander oder zum Aufbringen auf Schaltungsträger sind das Drucksintern, bei dem von einem in Pulverform vorliegenden Verbindungsmaterial ausgegangen wird, und das Diffusionsschweißen, bei dem von einer kompakten Verbindungsschicht ausgegangen wird. In beiden Fällen wird mit moderatem Druck und einer erhöhten, unter dem Schmelzpunkt liegenden Temperatur gearbeitet. Auf molekularer Ebene ist der wesentliche Verbindungsmechanismus beider Verfahren die Oberflächendiffusion. Im Zuge der weiteren Beschreibung wird für alle Verfahren nach diesem Prinzip vereinfachend der Begriff „Sintern” angewendet.Known Method for connecting components to each other or to Applying to circuit carriers are the pressure sintering, in the case of a compound material in powder form is assumed, and the diffusion welding, in which is assumed by a compact connection layer. In both Cases will be moderated and increased, worked below the melting temperature. On molecular Level is the essential link mechanism of both procedures the surface diffusion. In the course of further description will for all procedures according to this principle simplifying the Term "sintering" applied.
Durch Sintern sind mechanisch und elektrisch zuverlässige und temperaturstabile, metallische Verbindungsschichten beispielsweise zwischen einem Halbleiterchip und einem Substrat und/oder zwischen einem Substrat und einer Bodenplatte herstellbar. Dazu wird vor dem Verbindungsprozess (Fügeprozess) auf einer dem einen Verbindungspartner zugewandten Seite des anderen Verbindungspartners oder umgekehrt ein Sintermaterial, beispielsweise Silberpulver durch einen Dispens-, Sput ter-, Aufdampf-, Druck- oder Sprühprozess aufgebracht. Anschließend werden die Bauteile positionsgenau aufeinander gefügt. Danach werden die Bauteile durch zwei Pressstempel aneinander gedrückt und soweit erwärmt, dass sich die Partikel des Sintermaterials durch Oberflächendiffusion verbinden. Damit wird die Schicht aus Sintermaterial in eine formfeste, in der Regel, hochschmelzende, metallische Verbindungsschicht zwischen den Verbindungspartnern umgewandelt.By Sintering is mechanically and electrically reliable and Temperature-stable, metallic bonding layers, for example between a semiconductor chip and a substrate and / or between a substrate and a bottom plate produced. This is going to happen the connection process (joining process) on one Connection partner facing side of the other connection partner or conversely a sintered material, for example silver powder a dispensing, sput ter, evaporation, pressure or spray process applied. Subsequently, the components are accurately positioned joined together. After that, the components are replaced by two Pressing stamp pressed together and heated as far as that the particles of the sintered material by surface diffusion connect. Thus, the layer of sintered material in a dimensionally stable, usually, high-melting, metallic compound layer between converted to the connection partners.
Wenn
bei der Herstellung der Verbindung der Anpressdruck erhöht
wird, können Temperatur und Dauer des Verbindungsvorganges
verringert werden. Es ist damit prinzipiell wünschenswert,
den Anpressdruck möglichst hoch einzustellen. Um allerdings
Beschädigungen von empfindlichen elektronischen Bauteilen
beim Aufbringen einer hohen Druckkraft zu vermeiden und um reproduzierbar
eine gleichmäßige Verteilung des Anpressdruckes
zu erreichen, wird in der
Die eingesetzten Druckkissen bzw. Stempelwerkzeuge stellen jedoch hohe Ansprüche an die Positioniergenauigkeit der Verbindungspartner zueinander dar, um höhere Standzeiten zu erreichen und Beschädigungen von Bauteilen zu vermeiden. Daher wird heute üblicherweise vor dem eigentlichen Sinterprozess ein Vorsinterprozess durchgeführt. Dadurch sind die elektronischen Bauteile am Substrat schon vor dem Einlegen in das eigentliche Sinterwerkzeug zumindest mit geringer Festigkeit vorfixiert. Diese können dann als kompakte Baugruppe so in das Sinterwerkzeug eingelegt werden, dass sie darin eine gut reproduzierbare Kontur aufweisen, welche auch nicht durch Anstoßen beim Anlegen eines Stempelwerkzeuges verändert wird.The However, used pressure pad or stamping tools provide high Claims to the positioning accuracy of the connection partners each other in order to achieve longer service life and Damage to components should be avoided. Therefore, today is becoming common performed a pre-sintering process before the actual sintering process. As a result, the electronic components on the substrate before the Inserting into the actual sintering tool at least with less Firmness prefixed. These can then be used as a compact assembly be so inserted into the sintering tool that they are a well reproducible Contour, which also not by bumping Creation of a stamping tool is changed.
Die damit mögliche, vorteilhafterweise genauere Anpassung der Stempelwerkzeuge wird allerdings durch einen zusätzlichen, zeitintensiven Prozessschritt „Vorsintern” erkauft.The thus possible, advantageously more accurate adaptation of However, stamping tools will be replaced by an additional time-intensive process step "pre-sintering".
Es ist daher wünschenswert, das bekannte Verbindungsverfahren dahingehend zu verbessern, dass trotz einer Vorfixierung die Gesamtprozesszeit nur unwesentlich vergrößert wird.It is therefore desirable, the known connection method be improved so that despite a prefix the total process time only is increased negligible.
ÜBERSICHTOVERVIEW
Es wird ein Verfahren zum Positionieren und Fixieren eines elektrischen oder elektronischen Bauteils auf einem anderen Bauteil vorgestellt, bei dem das eine Bauteil von einer Setzvorrichtung durch Ansaugen aufgenommen wird, wobei zwischen dem einen Bauteil und der Setzvorrichtung ein Druckelement angeordnet ist, das die Haftreibung zwischen dem einen Bauteil und der Setzvorrichtung derart erhöht, dass diese bei aufeinander aufgesetzten Bauteilen größer ist als die Haftreibung des einen Bauteils gegenüber dem anderen. Das eine Bauteil wird auf die passende Position am anderen Bauteil über mindestens eine dazwischen befindliche elektrisch leitende Zwischenschicht durch die Setzvorrichtung aufgesetzt. Die Setzvorrichtung wird relativ zum anderen Bauteil und parallel zur Montageebene zu Ultraschallschwingungen angeregt derart, dass durch die dabei entstehende Reibungswärme zwischen der Zwischenschicht und zumindest einem der Bauteile eine Vorfixierung erzielt wird. Dann wird die Zwischenschicht auf eine gegenüber Raumtemperatur erhöhte Temperatur aufgeheizt und die Bauteile werden aneinander gedrückt derart, dass eine elektrische Verbindung und mechanische Fixierung erzielt wird.The invention relates to a method for positioning and fixing an electrical or electronic component on another component, wherein the component is picked up by a setting device by suction, wherein between the one component and the setting device, a pressure element is arranged, the static friction between the a component and the setting device increases such that it is greater in successive components placed on the static friction of a component relative to the other. The one component is placed on the appropriate position on the other component via at least one interposed electrically conductive intermediate layer by the setting device. The setting device is excited relative to the other component and parallel to the mounting plane to ultrasonic vibrations such that a prefixing is achieved by the resulting frictional heat between the intermediate layer and at least one of the components. Then, the intermediate layer is heated to a temperature higher than room temperature and the components are pressed against each other such that a elektri cal connection and mechanical fixation is achieved.
Eine dabei anwendbare Anordnung zum Positionieren und Vorfixieren eines elektrischen oder elektronischen Bauteils auf einem anderen Bauteil mit einer Setzvorrichtung sieht vor, dass die Setzvorrichtung eine Ansaugvorrichtung zum Ansaugen des einen Bauteils aufweist und derart ausgebildet ist, dass sie zum Absetzen des angesaugten einen Bauteils auf dem anderen Bauteil zumindest senkrecht zur Montageebene beweglich ist und dass sie relativ zum anderen Bauteil und parallel zur Montageebene zu Ultraschallschwingungen anregbar ist, und zwischen dem einen Bauteil und der Setzvorrichtung ein Druckelement angeordnet ist, das dazu ausgebildet ist, die Haftreibung zwischen dem einen Bauteil und der Setzvorrichtung derart zu erhöhen, dass diese bei aufeinander aufgesetzten Bauteilen größer ist als die Haftreibung des einen Bauteils gegenüber dem anderen.A Applicable arrangement for positioning and prefixing a electrical or electronic component on another component with a setting device provides that the setting device, a suction device for sucking the one component and formed in such a way is that they are used to settle the sucked a component on the other component is at least perpendicular to the mounting plane movable and that they are relative to the other component and parallel to the mounting plane too Ultrasonic vibrations can be excited, and between the one component and the setting device, a pressure element is arranged, the thereto is formed, the static friction between the one component and the To increase setting device such that these at each other attached components is greater than the static friction one component over the other.
KURZBESCHREIBUNG DER ZEICHNUNGENBRIEF DESCRIPTION OF THE DRAWINGS
Die Erfindung wird nachfolgend anhand der in den Figuren der Zeichnung gezeigten Ausführungsbeispiele näher erläutert, wobei gleiche Elemente mit gleichen Bezugszeichen versehen sind.The Invention will be described below with reference to the figures in the drawing shown embodiments explained in more detail, wherein like elements are provided with like reference numerals.
DETAILLIERTE BESCHREIBUNGDETAILED DESCRIPTION
Die
in
Eine
in
Durch
eine hauptsächlich senkrechte Bewegung der Setzvorrichtung
Damit
die Ultraschallschwingung in ausreichend hohem Maße an
den Chip
Die
dem Chip
Mit
dem beschriebenen Verfahren können jedoch nicht nur Chips
Gemäß
Gemäß
Die
Anordnung gemäß
Es
ist vorteilhaft, wenn bei allen gezeigten Anordnungen die sinterbaren
Zwischenschichten
Das beschriebene Verfahren ist besonders für die Herstellung von Leistungshalbleitermodulen von Bedeutung, da dabei großflächige metallische, relativ hochschmelzende Verbindungsschichten besonders vorteilhaft sind. Es wird dabei insbesondere das Problem der stabilen Positionierung von Halbleiterbauelementen relativ zu ihren Verbindungspartnern für den nachfolgenden Sinterprozess durch Zusammenfassen der aufeinanderfolgenden Arbeitsgänge Positionieren und Vorfixieren der Halbleiterbauelemente gelöst. Dazu kann beispielsweise auf einfache Weise die mit Ultraschall anregbare Setzvorrichtung eines handelsüblichen Die-Bonders für Halbleiterbauelemente mit einem die Haftreibung in Bezug zum zu verarbeitenden Halbleiterbauelement erhöhendem Druckelement ausgestattet werden. Regt man nun zum Zeitpunkt des Aufsetzens der Halbleiterbauelemente auf ihre Verbindungspartner wie etwa Substraten, die mit an sich bekannten Verfahren bereits mit dem für den nachfolgenden Sinterprozess erforderlichen Verbindungsmaterial an den entsprechenden Positionen beschichtet sind, die Setzvorrichtung mit einer auf das zu verarbeitende Halbleiterbauelement abgestimmten Ultraschallenergie an, so kann über die bei der Ultraschallschwingung entstehende Reibungswärme zwischen dem Verbindungsmaterial und dem Halbleiterbauelement der Sinterprozess begonnen werden. Diesen Sinterprozess führt man bei sehr schwachen Prozessdrücken aus und hat damit den sonst üblichen, gesonderten Vorsinterschritt in den Positioniervorgang eines Halbleiterbauelementes miteingebunden.The described method is especially for the production of power semiconductor modules of importance, as doing large-scale metallic, relatively high-melting compound layers particularly are advantageous. It is especially the problem of stable Positioning of semiconductor devices relative to their connection partners for the subsequent sintering process by combining of consecutive operations Positioning and Pre-fixing the semiconductor devices solved. This can for example, in a simple way the excitable with ultrasound Setting device of a commercial die-bonder for semiconductor devices with a static friction in relation to the semiconductor device to be processed Be equipped pressure element. Regretted now at the time of Placing the semiconductor devices on their connection partners as for example, substrates already known with methods known per se required for the subsequent sintering process Joining compound coated at the appropriate positions are, the setting device with a semiconductor device to be processed on the tuned ultrasound energy, so on the at the heat generated by the ultrasonic vibration between the bonding material and the semiconductor device, the sintering process to be started. This sintering process leads you a lot weak process pressures and thus has the usual, separate pre-sintering step in the positioning process of a semiconductor device miteingebunden.
Wie oben bereits dargelegt, kann die Setzvorrichtung eines handelsüblichen Die-Bonders mit einem luftdurchlässigem, beispielsweise porösen Druckelement (z. B. aus gesintertem Metallwerkstoff oder einem Keramikwerkstoff) ausgestattet werden. Wird nun über den in einem Die-Bonder meistens vorhandenen Vakuumanschluss ein entsprechendes Vakuum angelegt, so kann durch die Bohrung in der Setzvorrichtung sowie durch das luftdurchlässige Druckelement ein Halbleiterbauelement angesaugt und an der Setzvorrichtung fixiert werden. Über einen Ultraschallgenerator sowie einen entsprechenden Konverter wird die Setzvorrichtung mit dem anhaftenden Halbleiterbauelement unmittelbar nach dem Aufsetzen auf den zuvor präparierten Verbindungspartner mit zuvor aufgetragenem Verbindungsmaterial in Schwingung versetzt und so zur Sonotrode einer Ultraschallschweisseinheit. Durch die über die Setzvorrichtung eingeleitete Schwingung entsteht zwischen den Verbindungsflächen des Halbleiterbauelementes und seinem Verbindungspartner Reibungswärme, die zum Start des Sinterprozesses an der Oberfläche des auf den Verbindungspartner aufgetragenen Verbindungsmaterial ausgenutzt werden kann. Durch einen leichten Andruck während dieses Prozesses sowie einem rechtzeitigem Abbruch dieses Prozess durch das Abschalten der zugeführten Ultraschallenergie kann so das Halbleiterbauelement auf seinem Verbindungspartner vorfixiert werden. Auf diese Weise vorfixierte Halbleiterbauelemente können dann mit ihrem Verbindungspartner als zusammenhängende Baugruppe dem Folgeprozess zugeführt werden.As already explained above, the setting device of a commercially available die-bonder can be equipped with an air-permeable, for example, porous pressure element (for example made of sintered metal material or a ceramic material). If a corresponding vacuum is then applied via the vacuum connection which is usually present in a die bonder, a semiconductor component can be sucked through the bore in the setting device and through the air-permeable pressure element and fixed to the setting device. About an ultrasonic generator and a corresponding converter, the setting device with the adhering semiconductor device immediately after the up put on the previously prepared connection partner with previously applied compound material vibrated and so to the sonotrode of an ultrasonic welding unit. The vibration introduced via the setting device produces frictional heat between the connection surfaces of the semiconductor component and its connection partner, which can be utilized to start the sintering process on the surface of the connection material applied to the connection partner. By a slight pressure during this process and a timely termination of this process by switching off the supplied ultrasound energy so the semiconductor device can be prefixed on its connection partner. In this way prefixed semiconductor devices can then be supplied with their connection partner as a contiguous assembly the follow-up process.
Möglich
ist es auch, auf diese Weise mehrere Bauteile auf einander zu stapeln
und im anschließenden Sinterprozess mit einander zu verbinden. Beispielsweise
Substrate, Halbleiterbauelemente und zusätzliche metallische
Kontakte für die Halbleiterbauelemente (siehe
Wie bereits oben erwähnt, kann das vorgestellte Verfahren insbesondere bei der Nieder-Temperatur-Verbindungstechnik verwendet werden, bei der es darauf ankommt, einen gleichmäßigen statischen Druck auf ein Objekt unter Einfluss einer hohen Temperatur einleiten zu können. Durch die Vorfixierung der Halbleiterbauelemente auf dem Verbindungspartner wird verhindert, dass die Halbleiterbauelemente während des Schließens der notwendigen Werkzeuge verrutschen. Denn durch das Verrutschen der Bauteile zueinander kommt es immer wieder zu einer nicht positionsgenauen Verbindung der Verbindungspartner oder zu einer Beschädigung der Halbleiterbauelemente im Sinterprozess.As already mentioned above, the presented method can in particular used in the low-temperature connection technology, in the It matters a steady static Pressure on an object under the influence of a high temperature initiate to be able to. By prefixing the semiconductor components on the connection partner prevents the semiconductor devices while closing the necessary tools slip. Because by the slipping of the components to each other it always comes back to a non-positional connection the connection partner or damage to the semiconductor devices in the sintering process.
ZITATE ENTHALTEN IN DER BESCHREIBUNGQUOTES INCLUDE IN THE DESCRIPTION
Diese Liste der vom Anmelder aufgeführten Dokumente wurde automatisiert erzeugt und ist ausschließlich zur besseren Information des Lesers aufgenommen. Die Liste ist nicht Bestandteil der deutschen Patent- bzw. Gebrauchsmusteranmeldung. Das DPMA übernimmt keinerlei Haftung für etwaige Fehler oder Auslassungen.This list The documents listed by the applicant have been automated generated and is solely for better information recorded by the reader. The list is not part of the German Patent or utility model application. The DPMA takes over no liability for any errors or omissions.
Zitierte PatentliteraturCited patent literature
- - EP 0330895 B1 [0004] - EP 0330895 B1 [0004]
- - DE 4233073 A1 [0004] - DE 4233073 A1 [0004]
Claims (28)
Priority Applications (1)
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DE102008050798A DE102008050798A1 (en) | 2008-10-08 | 2008-10-08 | Method for positioning and fixing e.g. semiconductor chip, on e.g. direct copper Bonding substrate, involves pressing components together such that electrical connection and mechanical fixing of components are obtained |
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DE102008050798A DE102008050798A1 (en) | 2008-10-08 | 2008-10-08 | Method for positioning and fixing e.g. semiconductor chip, on e.g. direct copper Bonding substrate, involves pressing components together such that electrical connection and mechanical fixing of components are obtained |
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DE102008050798A1 true DE102008050798A1 (en) | 2010-04-15 |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012065202A1 (en) | 2010-11-19 | 2012-05-24 | At & S Austria Technologie & Systemtechnik Aktiengesellschaft | Method for mounting a component in or on a circuit board, and circuit board |
WO2015176715A1 (en) * | 2014-05-23 | 2015-11-26 | Hesse Gmbh | Method for the vibration-assisted, metallic joining of components face to face |
CN106206522A (en) * | 2015-05-29 | 2016-12-07 | 英飞凌科技股份有限公司 | For manufacturing method and the automatic assembly equipment of the connection of material fit |
WO2017009586A1 (en) * | 2015-07-16 | 2017-01-19 | Valeo Equipements Electriques Moteur | Brazing process involving sintering a conductive powder by ultrasonic thermocompression and electronic power module produced by this process |
US10607962B2 (en) | 2015-08-14 | 2020-03-31 | Danfoss Silicon Power Gmbh | Method for manufacturing semiconductor chips |
TWI818312B (en) * | 2021-09-10 | 2023-10-11 | 萬潤科技股份有限公司 | Pressing seat, object pressing method and device |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4233073A1 (en) | 1992-10-01 | 1994-04-07 | Siemens Ag | Semiconductor modular structure prodn. - by convexly shaping and bonding in single hot pressing operation |
EP0330895B1 (en) | 1988-03-03 | 1994-12-14 | Siemens Aktiengesellschaft | Method for attaching electronic components to substrates, and arrangement for carrying it out |
DE19747846A1 (en) * | 1997-10-30 | 1999-05-06 | Daimler Benz Ag | Component and method for producing the component |
US6269999B1 (en) * | 1999-08-06 | 2001-08-07 | Texas Instruments Incorporated | Semiconductor chip mounting method utilizing ultrasonic vibrations |
-
2008
- 2008-10-08 DE DE102008050798A patent/DE102008050798A1/en not_active Withdrawn
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0330895B1 (en) | 1988-03-03 | 1994-12-14 | Siemens Aktiengesellschaft | Method for attaching electronic components to substrates, and arrangement for carrying it out |
DE4233073A1 (en) | 1992-10-01 | 1994-04-07 | Siemens Ag | Semiconductor modular structure prodn. - by convexly shaping and bonding in single hot pressing operation |
DE19747846A1 (en) * | 1997-10-30 | 1999-05-06 | Daimler Benz Ag | Component and method for producing the component |
US6269999B1 (en) * | 1999-08-06 | 2001-08-07 | Texas Instruments Incorporated | Semiconductor chip mounting method utilizing ultrasonic vibrations |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012065202A1 (en) | 2010-11-19 | 2012-05-24 | At & S Austria Technologie & Systemtechnik Aktiengesellschaft | Method for mounting a component in or on a circuit board, and circuit board |
AT13430U1 (en) * | 2010-11-19 | 2013-12-15 | Austria Tech & System Tech | METHOD FOR DETERMINING A COMPONENT IN BZW. ON A PCB AND LADDER PLATE |
US9462701B2 (en) | 2010-11-19 | 2016-10-04 | At & S Austria Technologie & Systemtechnik Aktiengesellschaft | Method for mounting a component in or on a circuit board, and circuit board |
WO2015176715A1 (en) * | 2014-05-23 | 2015-11-26 | Hesse Gmbh | Method for the vibration-assisted, metallic joining of components face to face |
CN106206522A (en) * | 2015-05-29 | 2016-12-07 | 英飞凌科技股份有限公司 | For manufacturing method and the automatic assembly equipment of the connection of material fit |
CN106206522B (en) * | 2015-05-29 | 2018-11-13 | 英飞凌科技股份有限公司 | The method and automatic assembly equipment of connection for manufacture material cooperation |
US11081464B2 (en) | 2015-05-29 | 2021-08-03 | Infineon Technologies Ag | Method for producing an integral join and automatic placement machine |
WO2017009586A1 (en) * | 2015-07-16 | 2017-01-19 | Valeo Equipements Electriques Moteur | Brazing process involving sintering a conductive powder by ultrasonic thermocompression and electronic power module produced by this process |
FR3039025A1 (en) * | 2015-07-16 | 2017-01-20 | Valeo Equip Electr Moteur | WELDING PROCESS WITH MATERIAL SUPPLY AND ELECTRONIC POWER MODULE MADE THEREBY |
US10607962B2 (en) | 2015-08-14 | 2020-03-31 | Danfoss Silicon Power Gmbh | Method for manufacturing semiconductor chips |
TWI818312B (en) * | 2021-09-10 | 2023-10-11 | 萬潤科技股份有限公司 | Pressing seat, object pressing method and device |
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