DE102008024417B3 - Time delay-integration line detector for use in earth observance field, has selection register unit designed as shifting register, masking provided between pixels of lines, and registers of pixels widened corresponding to width of masking - Google Patents
Time delay-integration line detector for use in earth observance field, has selection register unit designed as shifting register, masking provided between pixels of lines, and registers of pixels widened corresponding to width of masking Download PDFInfo
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- DE102008024417B3 DE102008024417B3 DE102008024417A DE102008024417A DE102008024417B3 DE 102008024417 B3 DE102008024417 B3 DE 102008024417B3 DE 102008024417 A DE102008024417 A DE 102008024417A DE 102008024417 A DE102008024417 A DE 102008024417A DE 102008024417 B3 DE102008024417 B3 DE 102008024417B3
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- 230000000873 masking effect Effects 0.000 title claims abstract description 12
- 230000001360 synchronised effect Effects 0.000 claims description 4
- 238000003384 imaging method Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 238000009825 accumulation Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14831—Area CCD imagers
- H01L27/14843—Interline transfer
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/711—Time delay and integration [TDI] registers; TDI shift registers
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- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
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Abstract
Description
Die Erfindung betrifft einen TDI-Zeilendetektor und eine Detektoranordnung unter Verwendung von TDI-Zeilendetektoren.The The invention relates to a TDI line detector and a detector arrangement using TDI line detectors.
Insbesondere auf dem Gebiet der Erdbeobachtung sind verschiedene Verfahren und Sensoren bekannt, die mit Hilfe verschiedener Sensoren (Zeilen oder Matrizen) aus dem Orbit die Erde abtasten. Mit Hilfe verschiedener Technologien wird versucht, die Auflösung des Instrumentes sowohl spektral als auch geometrisch zu maximieren. Beispiele für derartige Technologien sind Sensorarchitekturen mit TDI-Zeilendetektoren oder bewegungskompensierte Matrix- und/oder Zeilendetektoren. Der Nachteil derartiger Technologien liegt in dem Problem der Auslesegeschwindigkeit und der damit verbundenen zu geringen Lastkapazität des Ausleseregisters, größere Anzahlen von Elektronen zu transportieren. Daher sind derartige Ansätze bisher auf Auflösungen von ca. 0,4 m GSD (Ground Sample Distance) beschränkt, welche mit Hilfe von SMC-Steuerungen des Satelliten erhöht werden können, die allerdings ein erhöhtes Jitter des Satelliten mit sich bringt.Especially In the field of earth observation are different methods and Sensors are known using different sensors (lines or Matrices) from Earth orbit the earth. With the help of various Technologies is trying to resolve the instrument as well spectrally and geometrically to maximize. Examples of such Technologies are sensor architectures with TDI line detectors or motion-compensated matrix and / or line detectors. The disadvantage Such technologies is the problem of read speed and the associated low load capacity of the readout register, larger numbers to transport electrons. Therefore, such approaches are so far on resolutions limited by about 0.4 m GSD (Ground Sample Distance), which with the help of SMC controllers of the Satellites increased can be which, however, an elevated Jitter of the satellite brings with it.
Aus "Theuwissen, Albert J. P.: Solid-State Imaging with Charge-Coupled Devices. Reprinted with corrections 1996. ISBN 0-7923-3456-6. Dordrecht; Boston; London: Kluwer Academic Publishers, 1996. Chapter 4: Solid-State Imaging at a Glance, pp. 109–130; Chapter 9: Advanced Imaging: Device Architectures, pp. 247–278" und "Burke, Michael W.: Image Acquisition. Handbook of Machine Vision Engineering, Volume 1. First Edition. London; Weinheim; New York: Chapman & Hall, 1996. Chapter 5: Image Sensor Basics, Abschnitt 5.3.6: Storage/architectures, pp. 604–626." sind verschiedene Aufbauten bekannter Zeilen- und Flächen-Halbleiter-Bildsensoren bekannt, die unterschiedlich gestaltete Maskierungen für die Transportregister offenbaren. Des Weiteren werden TDI-Zeilendetektoren erläutert.From "Theuwissen, Albert J.P .: Solid-State Imaging with Charge-Coupled Devices. Reprinted with corrections 1996. ISBN 0-7923-3456-6. Dordrecht; Boston; London: Kluwer Academic Publishers, 1996. Chapter 4: Solid-State Imaging at a Glance, pp. 109-130; Chapter 9: Advanced Imaging: Device Architectures, pp. 247-278 "and" Burke, Michael W .: Image Acquisition. Handbook of Machine Vision Engineering, Volume 1st First Edition. London; Weinheim; New York: Chapman & Hall, 1996. Chapter 5: Image Sensor Basics, Section 5.3.6: Storage / architectures, pp. 604-626. "Are different constructions known line and area semiconductor image sensors known, the differently shaped masks for the transport registers reveal. Furthermore, TDI line detectors will be explained.
Aus
der
Der Erfindung liegt daher das technische Problem zugrunde, einen TDI-Zeilendetektor sowie eine Detektoranordnung unter Verwendung von TDI-Detektoren zu schaffen, mittels derer die Lastkapazität der Ausleseregister erhöht werden kann.Of the The invention is therefore based on the technical problem of a TDI line detector and a detector array using TDI detectors to create, by means of which the load capacity of the readout registers are increased can.
Die Lösung des technischen Problems ergibt sich durch die Gegenstände mit den Merkmalen der Ansprüche 1 und 3. Weitere vorteilhafte Ausgestaltungen der Erfindung ergeben sich aus den Unteransprüchen.The solution the technical problem arises from the objects with the features of the claims 1 and 3. Further advantageous embodiments of the invention result from the dependent claims.
Hierzu umfasst der TDI-Zeilendetektor n TDI-Zeilen, wobei jede TDI-Zeile m Pixel aufweist, wobei mindestens einer äußeren TDI-Zeile eine Ausleseregister-Einheit zugeordnet ist, wobei jedem Pixel der ersten und/oder n-ten Zeile ein eigenes Register zugeordnet ist, wobei zwischen zwei Pixeln jeder Zeile eine Maskierung vorgesehen ist, wobei die Maskierung eine Breite von einem Pixel oder einem ganzzahligen Vielfachen eines Pixels aufweist, wobei die Register der Pixel entsprechend der Breite der Maskierung verbreitert sind. Hierdurch kann die Lastkapazität der Register entsprechend vergrößert werden. Andererseits kann die Auslesegeschwindigkeit der einzelnen Zeile reduziert werden. Dies wird allerdings durch einen Informationsverlust erkauft, der aber durch eine Detektoranordnung mit mindestens zwei solcher TDI-Zeilendetektoren kompensiert werden kann. Ein weiterer Vorteil des TDI-Zeilendetektors ist, dass das Übersprechen von einem Pixel zum benachbarten Pixel durch Diffusionseffekte ausgeschlossen wird, was wiederum zu einer Verbesserung der MTF führt. Vorzugsweise ist die Ausleseregister-Einheit als Schieberegister ausgebildet.For this The TDI line detector includes n TDI lines, each TDI line m pixels, wherein at least one outer TDI line is a readout register unit associated with each pixel of the first and / or nth row a separate register is assigned, with between two pixels Each line is provided with a mask, the masking a width of one pixel or an integer multiple of one Pixels, wherein the registers of the pixels corresponding to the width the masking are broadened. This allows the load capacity of the registers be increased accordingly. On the other hand, the read speed of the single line can be reduced become. However, this is bought by a loss of information, but by a detector arrangement with at least two such TDI line detectors can be compensated. Another advantage of the TDI line detector is that crosstalk from one pixel to the neighboring pixel is excluded by diffusion effects, which in turn leads to an improvement of the MTF. Preferably, the readout register unit designed as a shift register.
Die erfindungsgemäße Detektoranordnung umfasst mindestens zwei erfindungsgemäße TDI-Zeilendetektoren, wobei die TDI-Zeilendetektoren in Querrichtung um eine Pixelbreite jeweils versetzt zueinander angeordnet sind und in Längsrichtung jeweils um ein ganzzahliges Vielfaches einer Pixellänge zueinander versetzt angeordnet sind. Hierdurch wird erreicht, dass die durch einen TDI-Zeilendetektor verlorene Information durch die nachfolgenden TDI-Zeilendetektoren geliefert wird. Dabei sind die TDI-Zeilendetektoren vorzugsweise miteinander synchronisiert, so dass die Bildstreifen sich einfach zu einem vollständigen Bild zusammensetzen lassen. Die Längsrichtung ist dabei die Richtung der Akkumulation.The inventive detector arrangement comprises at least two TDI line detectors according to the invention, wherein the TDI line detectors in the transverse direction by one pixel width each offset from each other and are arranged in the longitudinal direction each by an integer multiple of a pixel length to each other are arranged offset. This ensures that the by a TDI line detector lost information through the following TDI line detectors is delivered. Here are the TDI line detectors preferably synchronized with each other, so that the image strips easy to complete Assemble picture. The longitudinal direction is the direction the accumulation.
Weiter vorzugsweise beträgt die Breite der Markierungen X-1 Pixelbreiten, wobei X gleich die Anzahl der TDI-Zeilendetektoren ist.Further preferably the width of the markers X-1 pixel widths, where X equals the number of the TDI line detectors.
Die Erfindung wird nachfolgend anhand eines bevorzugten Ausführungsbeispieles näher erläutert. Die Fig. zeigen:The Invention will be described below with reference to a preferred embodiment explained in more detail. The Fig. Show:
Die
Detektoranordnung
In
der
Claims (6)
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DE102008024417A DE102008024417B3 (en) | 2008-05-16 | 2008-05-16 | Time delay-integration line detector for use in earth observance field, has selection register unit designed as shifting register, masking provided between pixels of lines, and registers of pixels widened corresponding to width of masking |
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DE102008024417A DE102008024417B3 (en) | 2008-05-16 | 2008-05-16 | Time delay-integration line detector for use in earth observance field, has selection register unit designed as shifting register, masking provided between pixels of lines, and registers of pixels widened corresponding to width of masking |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102010021819A1 (en) | 2010-05-28 | 2011-12-01 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Detector Module |
WO2014122198A1 (en) | 2013-02-07 | 2014-08-14 | E2V Semiconductors | Moving image sensor, and summation having movement error detection |
CN108604593A (en) * | 2016-01-22 | 2018-09-28 | 特利丹E2V半导体简化股份公司 | Polyteny imaging sensor with time of integration adjustment charge transmission |
DE102017208041A1 (en) * | 2017-05-12 | 2018-11-15 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | TDI-line detector |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2186149A (en) * | 1985-12-23 | 1987-08-05 | Dr John Gordon Rushbrooke | Image differencing using masked CCD |
GB2262383A (en) * | 1991-12-09 | 1993-06-16 | Sony Broadcast & Communication | Charge-coupled image sensor |
GB2302472A (en) * | 1995-06-21 | 1997-01-15 | Eastman Kodak Co | Compensation for relative motion during aerial scanning |
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2008
- 2008-05-16 DE DE102008024417A patent/DE102008024417B3/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2186149A (en) * | 1985-12-23 | 1987-08-05 | Dr John Gordon Rushbrooke | Image differencing using masked CCD |
GB2262383A (en) * | 1991-12-09 | 1993-06-16 | Sony Broadcast & Communication | Charge-coupled image sensor |
GB2302472A (en) * | 1995-06-21 | 1997-01-15 | Eastman Kodak Co | Compensation for relative motion during aerial scanning |
Non-Patent Citations (6)
Title |
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Berger, Michael J. Lauber, Yair Z.: Meira Citroen et al.: Cos4 compensation and optimal TDI operation in multi element linear TDI IR detectors. Proc. SPIE, Vol. 4820 (2003), pp. 830-839 * |
Burke, Michael W.: Image Acquisition. Handbook of Machine Vision Engineering, Volume 1. First Edition. London, Weinheim, New York: Chapman & Hall, 1996. Chapter 5: Image Sensor Basics, Abschnitt 5 3.6: Storage/architectures, pp. 604-626 * |
Crawford, F.I.: Electro-optical Sensors Overview. 16th Digital Avionics Systems Conference, 26-30 Oct. 1997, DASC 1997. Proceedings, Vol. 1, pp. 5.1-7 - 5.1-14 * |
Theuwissen, Albert J.P.: Solid-State Imaging with Charge-Coupled Devices. Reprinted with corrections 1996. ISBN 0-7923-3456-6. Dordrecht, Boston, London: Kluwer Academic Publishers, 1996, Chapter 4: Solid-State Imaging at a Glance, pp. 109-130, Chapter 9: Advanced Imaging: Device Architectures, pp. 247-278 * |
Theuwissen, Albert J.P.: Solid-State Imaging with Charge-Coupled Devices. Reprinted with corrections 1996. ISBN 0-7923-3456-6. Dordrecht, Boston, London: Kluwer Academic Publishers, 1996, Chapter 4: Solid-State Imaging at a Glance, pp. 109-130, Chapter 9: Advanced Imaging: Device Architectures, pp. 247-278 Burke, Michael W.: Image Acquisition. Handbook of Machine Vision Engineering, Volume 1. First Edition. London, Weinheim, New York: Chapman & Hall, 1996. Chapter 5: Image Sensor Basics, Abschnitt 5 3.6: Storage/architectures, pp. 604-626 Webster, John G. (Ed.): Measurement, Instrumentation, and Sensors Handbook. CRC Press LLC, 1999. ISBN 0-8493-2145-X. Section VIII: Optical Variables Measurement, Chapter 64: Vision and Image Sensors, by Stanley S. Ipson, C. Okereke, pp. 64-1 - 64-19 Berger, Michael J. Lauber, Yair Z.: Meira Citroen et al.: Cos4 compensation and optimal TDI operation in multi element linear TDI IR detectors. Proc. SPIE, Vol. 4820 (2003), pp. 830-839 Crawford, F.I.: Ele |
Webster, John G. (Ed.): Measurement, Instrumentation, and Sensors Handbook. CRC Press LLC, 1999. ISBN 0-8493-2145-X. Section VIII: Optical Variables Measurement, Chapter 64: Vision and Image Sensors, by Stanley S. Ipson, C. Okereke, pp. 64-1 - 64-19 * |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102010021819A1 (en) | 2010-05-28 | 2011-12-01 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Detector Module |
US8421133B2 (en) | 2010-05-28 | 2013-04-16 | Deutsches Zentrum Fuer Luft- Und Raumfahrt E.V. | Detector module |
DE102010021819B4 (en) | 2010-05-28 | 2018-10-18 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Detector Module and High Resolution Satellite |
WO2014122198A1 (en) | 2013-02-07 | 2014-08-14 | E2V Semiconductors | Moving image sensor, and summation having movement error detection |
US9967490B2 (en) | 2013-02-07 | 2018-05-08 | E2V Semiconductors | Time delay integration image sensor with detection of travelling errors |
CN108604593A (en) * | 2016-01-22 | 2018-09-28 | 特利丹E2V半导体简化股份公司 | Polyteny imaging sensor with time of integration adjustment charge transmission |
DE102017208041A1 (en) * | 2017-05-12 | 2018-11-15 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | TDI-line detector |
WO2018206694A1 (en) | 2017-05-12 | 2018-11-15 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Tdi line detector |
US11257859B2 (en) * | 2017-05-12 | 2022-02-22 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | TDI line detector |
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