DE102006026881A1 - Micromechanical sensor structure for pressure sensor, has sensor chip partially covered with passivation gel by one of enclosures in region, and another enclosure partially arranged on chip so that latter region is enclosed on chip - Google Patents
Micromechanical sensor structure for pressure sensor, has sensor chip partially covered with passivation gel by one of enclosures in region, and another enclosure partially arranged on chip so that latter region is enclosed on chip Download PDFInfo
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- DE102006026881A1 DE102006026881A1 DE102006026881A DE102006026881A DE102006026881A1 DE 102006026881 A1 DE102006026881 A1 DE 102006026881A1 DE 102006026881 A DE102006026881 A DE 102006026881A DE 102006026881 A DE102006026881 A DE 102006026881A DE 102006026881 A1 DE102006026881 A1 DE 102006026881A1
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-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L19/00—Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
- G01L19/14—Housings
- G01L19/147—Details about the mounting of the sensor to support or covering means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L19/00—Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
- G01L19/06—Means for preventing overload or deleterious influence of the measured medium on the measuring device or vice versa
- G01L19/0627—Protection against aggressive medium in general
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L19/00—Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
- G01L19/14—Housings
- G01L19/142—Multiple part housings
- G01L19/143—Two part housings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L19/00—Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
- G01L19/14—Housings
- G01L19/148—Details about the circuit board integration, e.g. integrated with the diaphragm surface or encapsulation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0264—Pressure sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2207/00—Microstructural systems or auxiliary parts thereof
- B81B2207/01—Microstructural systems or auxiliary parts thereof comprising a micromechanical device connected to control or processing electronics, i.e. Smart-MEMS
- B81B2207/012—Microstructural systems or auxiliary parts thereof comprising a micromechanical device connected to control or processing electronics, i.e. Smart-MEMS the micromechanical device and the control or processing electronics being separate parts in the same package
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2207/00—Microstructural systems or auxiliary parts thereof
- B81B2207/01—Microstructural systems or auxiliary parts thereof comprising a micromechanical device connected to control or processing electronics, i.e. Smart-MEMS
- B81B2207/015—Microstructural systems or auxiliary parts thereof comprising a micromechanical device connected to control or processing electronics, i.e. Smart-MEMS the micromechanical device and the control or processing electronics being integrated on the same substrate
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2207/00—Microstructural systems or auxiliary parts thereof
- B81B2207/11—Structural features, others than packages, for protecting a device against environmental influences
- B81B2207/115—Protective layers applied directly to the device before packaging
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2203/00—Forming microstructural systems
- B81C2203/01—Packaging MEMS
- B81C2203/0136—Growing or depositing of a covering layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/4847—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
- H01L2224/48472—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond the other connecting portion not on the bonding area also being a wedge bond, i.e. wedge-to-wedge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Pressure Sensors (AREA)
- Measuring Fluid Pressure (AREA)
Abstract
Description
Stand der TechnikState of the art
Bei einer Vielzahl von Bauelementen, speziell im Bereich der Sensorik, werden elektronische bzw. elektrische Komponenten in einem Gehäuse montiert und anschließend mit einem Passivierungsmaterial verfüllt. Dabei dient die Verfüllung in der Regel der Passivierung der Komponenten bzw. dem Schutz der Komponente gegenüber Umwelteinflüssen (Wasser, Luft, Benzin, Salz, etc.). Im Bereich der Sensorik mit mikromechanischen Sensorkomponenten stellt die zu vergießende Komponente neben der elektronischen bzw. elektrischen Schaltung meist auch bewegliche Strukturen, wie z. B. eine Membran oder Schwingungskörper dar, deren Eigenschaften durch die Verfüllung verändert werden. Um eine möglichst definierte Messwertaufnahme zu ermöglichen, ist es daher wünschenswert, die Bewegungseigenschaften der beweglichen Strukturen nach der Erzeugung nicht mehr oder nur noch gezielt zu verändern.at a variety of components, especially in the field of sensors, Electronic or electrical components are mounted in a housing and subsequently filled with a passivation material. It serves the backfilling in the rule of passivation of the components or the protection of the component across from environmental influences (Water, air, gasoline, salt, etc.). In the field of sensors with Micromechanical sensor components provides the component to be cast in addition to the electronic or electrical circuit usually also movable structures, such. B. is a membrane or vibration body, whose properties are changed by the filling. To one as possible defined reading, it is therefore desirable to the motion characteristics of moving structures after generation no more or only to change purposefully.
In
der
Demgegenüber weist
die
Vorteile der ErfindungAdvantages of the invention
Die vorliegende Erfindung beschreibt ein mikromechanisches Bauelement bzw. ein Verfahren zur Herstellung dieses mikromechanischen Bauelements. Als wesentliches Teil des mikromechanischen Bauelements ist ein Sensorelement vorgesehen, welches insbesondere eine physikalische Messgröße erfasst. Dieses Sensorelement wird in einem ersten Bereich wenigstens teilweise mit einem Passivierungsmaterial bedeckt, um einen Schutz gegenüber Umwelteinflüssen zu erzeugen. Um die Bedeckung in diesem abgegrenzten ersten Bereich zu erreichen ist eine erste Einfassung zur Aufnahme des Passivierungsmaterials vorgesehen. Erfindungsgemäß ist darüber hinaus vorgesehen, dass auf dem Sensorelement mittels einer zweiten Einfassung ein zweiter Bereich vorgesehen ist, der vom ersten Bereich abgetrennt ist. Dabei kann insbesondere vorgesehen sein, dass die erste und die zweite Einfassung teilweise durch das gleiche Bauteil realisiert wird.The The present invention describes a micromechanical device or a method for producing this micromechanical component. As an essential part of the micromechanical device is a Sensor element provided, which in particular a physical Measured variable recorded. This sensor element is at least partially in a first area covered with a passivation material to provide protection against environmental influences produce. To the covering in this demarcated first area to reach is a first enclosure for receiving the passivation material intended. In addition, according to the invention provided that on the sensor element by means of a second enclosure a second area is provided which is separated from the first area is. It can be provided in particular that the first and the second enclosure partially realized by the same component becomes.
Durch die Trennung des Sensorelements in einen ersten und zweiten Bereich kann das Sensorelement gezielt partiell mit einer Passivierung versehen werden. Dies hat den Vorteil, dass einzelne Bereiche auf dem Sensorelement, die gegenüber Umwelteinflüssen bzw. einem Medium ausgesetzt sind, gezielt durch eine Passivierungsschicht geschützt werden können, während andere Bereiche, die empfindlicher auf eine Bedeckung mit zusätzlichem Passivierungsmaterial reagieren, ausgespart werden können.By the separation of the sensor element in a first and second area can selectively provide the sensor element partially with a passivation become. This has the advantage that individual areas on the sensor element, the opposite environmental influences or a medium are exposed, specifically by a passivation layer to be protected can, while other areas more sensitive to a covering with additional Passivation material react, can be spared.
Durch die Trennung in einen ersten und zweiten Bereich ist somit denkbar, dass der zweite Bereich eine sehr viel geringe Bedeckung erhält oder überhaupt kein Passivierungsmaterial aufweist. Weiterhin ist denkbar, dass die beiden Bereiche unterschiedliche Passivierungsmaterialien aufweisen oder dass in einem der beiden Bereiche zusätzlich oder alternativ ein zweites Passivierungsmaterial aufgebracht wird. Somit kann erreicht werden, dass die unterschiedlichen Komponenten, z.B. Schaltungen oder Messelemente, in den beiden Bereichen gezielt mit einer entsprechenden Passivierung versehen werden können, die auf die Eigenschaft der Komponenten optimal abgestimmt ist.By the separation into a first and second area is thus conceivable that the second area receives a very low coverage, or at all has no passivation material. Furthermore, it is conceivable that the two areas have different passivation materials or that in one of the two areas additionally or alternatively a second passivation material is applied. Thus can be achieved be that the different components, e.g. Circuits or Measuring elements, targeted in the two areas with a corresponding passivation can be provided which is optimally adapted to the property of the components.
In einer Weiterbildung der Erfindung ist vorgesehen, den zweiten Bereich des Sensorelements derart vom ersten Bereich abzutrennen, dass eine Messwert erfassende Komponente des Sensorelements eingeschlossen wird. Dabei kann es sich beispielsweise um eine Komponente handeln, die eine Beschleunigung, Drehrate, Temperatur und/oder eine Druckgröße erfasst. Typischerweise werden zur Erfassung von Druckgrößen Membranen eingesetzt, die durch eine derartige zweite Einfassung von der Passivierung einer Anschlussverdrahtung, eines Kontaktierbereichs oder einer Auswerteschaltung auf dem Sensorelement abgetrennt werden kann.In a development of the invention is provided, the second area of the sensor element in such a way to separate from the first region that a measured value detecting component of the sensor element is included. there For example, it may be a component that has an acceleration, Rate of rotation, temperature and / or a pressure recorded. typically, are used to capture pressure sizes membranes used by such a second enclosure of the passivation a connection wiring, a Kontaktierbereichs or a Evaluation circuit can be separated on the sensor element.
Die räumliche Trennung und Abdichtung des Kontaktierbereichs mit optionaler Auswerteelektronik von der mikromechanischen Membran ermöglicht einen wirkungsvollen Schutz der Chipelektronik, vor allem der Anschlusspads gegen aggressive Medien, unter gleichzeitiger Vermeidung störender Gel-/Schutzschichten auf der Membran. Außerdem bietet die Trennung einen besseren Schutz der Sensormembrane vor dem Einfluss der mechanischen Spannung der Chipbefestigung und der Passivierung im Anschlussbereich. Darüber hinaus wird bei einem Drucksensor durch die Vermeidung einer zusätzlichen Masse auf der Membran die Beschleunigungsempfindlichkeit des Sensors reduziert.The spatial Separation and sealing of the contacting area with optional evaluation electronics from The micromechanical membrane allows an effective Protection of chip electronics, especially the connection pads against aggressive Media, while avoiding interfering gel / protective layers on the membrane. Also offers the separation provides better protection of the sensor membrane from the influence the mechanical stress of the chip mounting and the passivation in the Terminal area. About that In addition, in a pressure sensor by avoiding an additional Mass on the diaphragm the acceleration sensitivity of the sensor reduced.
Eine mögliche Ausgestaltung der Trennung des ersten und zweiten Bereichs besteht darin, dass ein Gelring verwendet wird, der vollständig auf dem Sensorelement aufgebracht wird, beispielsweise mittels eines Haftmittels.A possible embodiment of the separation of the first and second region is that a gel ring is used which is completely applied to the sensor element, for example with an adhesive.
In einer Ausgestaltung der Erfindung kann auch vorgesehen sein, dass die zweite Einfassung ein Volumen einschließt und einen Zugang aufweist, durch den ein Medienaustausch mit der Umgebung oder einem weiteren speziellen Volumen zum zweiten Bereich des Sensorelements, z.B. zur Membran ermöglicht wird.In An embodiment of the invention can also be provided that the second enclosure includes a volume and has access a media exchange with the environment or another special Volume to the second region of the sensor element, e.g. is made possible to the membrane.
Vorteilhafterweise wird das Sensorelement in das Gehäuse des Bauelements eingebracht. Dabei kann das Gehäuse selbst als erste Einfassung dienen. Typischerweise sind für mikromechanische Bauelemente bzw. Sensorelemente Gehäuse in Form von Premold- Gehäusen vorgesehen. Derartige Premold-Gehäuse können in einem weiteren Schritt mittels einer Moldmasse teilweise oder vollständig verkapselt werden, wobei im vorliegenden Fall insbesondere darauf zu achten ist, dass ein Zugang zum zweiten Bereich des Sensorelements freigehalten werden muss, um einen Medien- oder Druckaustausch zu ermöglichen.advantageously, the sensor element is introduced into the housing of the component. In this case, the housing to serve as the first enclosure. Typically, for micromechanical devices or sensor elements housing provided in the form of premold housings. Such premold housing can in a further step by means of a molding compound partially or completely encapsulated particular attention should be paid in the present case in that an access to the second area of the sensor element is kept free necessary to allow a media or pressure exchange.
Weitere Vorteile ergeben sich aus der nachfolgenden Beschreibung von Ausführungsbeispielen bzw. aus den abhängigen Patentansprüchen.Further Benefits emerge from the following description of exemplary embodiments or from the dependent ones Claims.
Zeichnungendrawings
Die
Ausführungsbeispielembodiment
Der
in
Ergänzend sei
noch erwähnt,
dass zur Erfassung des Drucksignals eine Durchbiegung der Sensormembran
Bekannt
ist auch, die Auswerteschaltung
Allgemein
ist bei den beiden Sensoraufbauten gemäß
Zur
Abhilfe dieser für
die Erfassung eines Drucksignals nachteiligen Effekte wird deshalb
anhand der
Optional
kann auf die zweite Einfassung, die aus den Wänden
Alternativ
zu der geringen Bedeckung der Membran
Eine
weitere Möglichkeit,
eine Membran und eine darunter liegende Kaverne
In
Eine
weitere mögliche
Ausführungsform
in
In
der
Um
eine derartige Massebelegung zu verhindern, kann mit Hilfe eines
Gelrings
Claims (11)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102006026881A DE102006026881A1 (en) | 2006-06-09 | 2006-06-09 | Micromechanical sensor structure for pressure sensor, has sensor chip partially covered with passivation gel by one of enclosures in region, and another enclosure partially arranged on chip so that latter region is enclosed on chip |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102006026881A DE102006026881A1 (en) | 2006-06-09 | 2006-06-09 | Micromechanical sensor structure for pressure sensor, has sensor chip partially covered with passivation gel by one of enclosures in region, and another enclosure partially arranged on chip so that latter region is enclosed on chip |
Publications (1)
Publication Number | Publication Date |
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DE102006026881A1 true DE102006026881A1 (en) | 2007-12-13 |
Family
ID=38663767
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DE102006026881A Ceased DE102006026881A1 (en) | 2006-06-09 | 2006-06-09 | Micromechanical sensor structure for pressure sensor, has sensor chip partially covered with passivation gel by one of enclosures in region, and another enclosure partially arranged on chip so that latter region is enclosed on chip |
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DE (1) | DE102006026881A1 (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102009026676A1 (en) | 2009-06-03 | 2010-12-09 | Robert Bosch Gmbh | Pressure sensor device for semiconductor chip arrangement, has sensor chip projecting pressure intake regions in housing chambers, where chambers include through-holes and pressure intake regions are supplied with absolute pressure |
EP2312290A3 (en) * | 2009-10-16 | 2011-06-22 | Silicon Micro Sensors GmbH | Pressure sensor and use of same in a fluid tank |
DE102010001711A1 (en) | 2010-02-09 | 2011-08-11 | Robert Bosch GmbH, 70469 | Semiconductor device and corresponding manufacturing method |
CN103063357A (en) * | 2011-10-20 | 2013-04-24 | 刘胜 | Gas pressure transmitter based on ceramic packaging |
EP2589945A2 (en) | 2011-11-03 | 2013-05-08 | Robert Bosch Gmbh | Device for detecting a pressure of a fluid medium |
DE102011085653A1 (en) | 2011-11-03 | 2013-05-08 | Robert Bosch Gmbh | Sensor device for detecting property of fluid medium, particularly for detecting pressure of gas, has sensor element for detecting property, particularly pressure sensor, and carrier unit, which has circuit carrier |
DE102013225226A1 (en) | 2013-12-09 | 2015-06-11 | Robert Bosch Gmbh | A sensor for detecting a first property and a second property of a fluid medium |
-
2006
- 2006-06-09 DE DE102006026881A patent/DE102006026881A1/en not_active Ceased
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102009026676A1 (en) | 2009-06-03 | 2010-12-09 | Robert Bosch Gmbh | Pressure sensor device for semiconductor chip arrangement, has sensor chip projecting pressure intake regions in housing chambers, where chambers include through-holes and pressure intake regions are supplied with absolute pressure |
EP2312290A3 (en) * | 2009-10-16 | 2011-06-22 | Silicon Micro Sensors GmbH | Pressure sensor and use of same in a fluid tank |
US8522620B2 (en) | 2009-10-16 | 2013-09-03 | Silicon Micro Sensors Gmbh | Pressure sensor and use thereof in a fluid tank |
WO2011098187A2 (en) | 2010-02-09 | 2011-08-18 | Robert Bosch Gmbh | Semiconductor component and corresponding production method |
CN102741154A (en) * | 2010-02-09 | 2012-10-17 | 罗伯特·博世有限公司 | Semiconductor component and corresponding production method |
DE102010001711A1 (en) | 2010-02-09 | 2011-08-11 | Robert Bosch GmbH, 70469 | Semiconductor device and corresponding manufacturing method |
CN102741154B (en) * | 2010-02-09 | 2015-05-20 | 罗伯特·博世有限公司 | Semiconductor component and corresponding production method |
US9105649B2 (en) | 2010-02-09 | 2015-08-11 | Robert Bosch Gmbh | Semiconductor component and corresponding production method |
CN103063357A (en) * | 2011-10-20 | 2013-04-24 | 刘胜 | Gas pressure transmitter based on ceramic packaging |
EP2589945A2 (en) | 2011-11-03 | 2013-05-08 | Robert Bosch Gmbh | Device for detecting a pressure of a fluid medium |
DE102011085652A1 (en) | 2011-11-03 | 2013-05-08 | Robert Bosch Gmbh | Apparatus for detecting a pressure of a fluid medium |
DE102011085653A1 (en) | 2011-11-03 | 2013-05-08 | Robert Bosch Gmbh | Sensor device for detecting property of fluid medium, particularly for detecting pressure of gas, has sensor element for detecting property, particularly pressure sensor, and carrier unit, which has circuit carrier |
DE102013225226A1 (en) | 2013-12-09 | 2015-06-11 | Robert Bosch Gmbh | A sensor for detecting a first property and a second property of a fluid medium |
WO2015086188A1 (en) | 2013-12-09 | 2015-06-18 | Robert Bosch Gmbh | Sensor for recording a first property and a second property of a fluid medium |
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