DE102005047413B8 - Magnetfeldsensorelement und Verfahren zum Durchführen eines On-Wafer-Funktionstests, sowie Verfahren zur Herstellung von Magnetfeldsensorelementen und Verfahren zur Herstellung von Magnetfeldsensorelementen mit On-Wafer-Funktionstest - Google Patents
Magnetfeldsensorelement und Verfahren zum Durchführen eines On-Wafer-Funktionstests, sowie Verfahren zur Herstellung von Magnetfeldsensorelementen und Verfahren zur Herstellung von Magnetfeldsensorelementen mit On-Wafer-Funktionstest Download PDFInfo
- Publication number
- DE102005047413B8 DE102005047413B8 DE102005047413A DE102005047413A DE102005047413B8 DE 102005047413 B8 DE102005047413 B8 DE 102005047413B8 DE 102005047413 A DE102005047413 A DE 102005047413A DE 102005047413 A DE102005047413 A DE 102005047413A DE 102005047413 B8 DE102005047413 B8 DE 102005047413B8
- Authority
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- Germany
- Prior art keywords
- magnetic field
- field sensor
- methods
- function test
- sensor elements
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L25/00—Testing or calibrating of apparatus for measuring force, torque, work, mechanical power, or mechanical efficiency
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L25/00—Testing or calibrating of apparatus for measuring force, torque, work, mechanical power, or mechanical efficiency
- G01L25/003—Testing or calibrating of apparatus for measuring force, torque, work, mechanical power, or mechanical efficiency for measuring torque
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/315—Contactless testing by inductive methods
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2829—Testing of circuits in sensor or actuator systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Measuring Magnetic Variables (AREA)
- Hall/Mr Elements (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102005047413A DE102005047413B8 (de) | 2005-02-23 | 2005-10-04 | Magnetfeldsensorelement und Verfahren zum Durchführen eines On-Wafer-Funktionstests, sowie Verfahren zur Herstellung von Magnetfeldsensorelementen und Verfahren zur Herstellung von Magnetfeldsensorelementen mit On-Wafer-Funktionstest |
US11/360,315 US7323870B2 (en) | 2005-02-23 | 2006-02-23 | Magnetoresistive sensor element and method of assembling magnetic field sensor elements with on-wafer functional test |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102005008368.4 | 2005-02-23 | ||
DE102005008368 | 2005-02-23 | ||
DE102005047413A DE102005047413B8 (de) | 2005-02-23 | 2005-10-04 | Magnetfeldsensorelement und Verfahren zum Durchführen eines On-Wafer-Funktionstests, sowie Verfahren zur Herstellung von Magnetfeldsensorelementen und Verfahren zur Herstellung von Magnetfeldsensorelementen mit On-Wafer-Funktionstest |
Publications (3)
Publication Number | Publication Date |
---|---|
DE102005047413A1 DE102005047413A1 (de) | 2006-09-14 |
DE102005047413B4 DE102005047413B4 (de) | 2012-01-05 |
DE102005047413B8 true DE102005047413B8 (de) | 2012-06-06 |
Family
ID=36914856
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102005047413A Expired - Fee Related DE102005047413B8 (de) | 2005-02-23 | 2005-10-04 | Magnetfeldsensorelement und Verfahren zum Durchführen eines On-Wafer-Funktionstests, sowie Verfahren zur Herstellung von Magnetfeldsensorelementen und Verfahren zur Herstellung von Magnetfeldsensorelementen mit On-Wafer-Funktionstest |
Country Status (2)
Country | Link |
---|---|
US (1) | US7323870B2 (de) |
DE (1) | DE102005047413B8 (de) |
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Also Published As
Publication number | Publication date |
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DE102005047413A1 (de) | 2006-09-14 |
US20060202692A1 (en) | 2006-09-14 |
US7323870B2 (en) | 2008-01-29 |
DE102005047413B4 (de) | 2012-01-05 |
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