CN2896287Y - 一种测试针 - Google Patents

一种测试针 Download PDF

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Publication number
CN2896287Y
CN2896287Y CNU2006200558540U CN200620055854U CN2896287Y CN 2896287 Y CN2896287 Y CN 2896287Y CN U2006200558540 U CNU2006200558540 U CN U2006200558540U CN 200620055854 U CN200620055854 U CN 200620055854U CN 2896287 Y CN2896287 Y CN 2896287Y
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CN
China
Prior art keywords
catapult
testing
general pin
needle
connector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNU2006200558540U
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English (en)
Inventor
左智勇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Deli Hardware Fittings Co., Ltd.
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Dongguan Centalic Electronic Testing Parts Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dongguan Centalic Electronic Testing Parts Co Ltd filed Critical Dongguan Centalic Electronic Testing Parts Co Ltd
Priority to CNU2006200558540U priority Critical patent/CN2896287Y/zh
Priority to US11/456,008 priority patent/US20070212948A1/en
Priority to KR1020060074421A priority patent/KR20070092081A/ko
Application granted granted Critical
Publication of CN2896287Y publication Critical patent/CN2896287Y/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/15—Pins, blades or sockets having separate spring member for producing or increasing contact pressure
    • H01R13/17—Pins, blades or sockets having separate spring member for producing or increasing contact pressure with spring member on the pin
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

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  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

本实用新型涉及一种测试针，具体涉及一种应用于测试线路板的组合式模具中的测试针。本实用新型包括位于组合式测试模具中的通用针，通用针一端与待测线路板各测试点相抵触，另一端通过弹弓与外置导线相接，其特征在于：通用针与弹弓之间设有联接件，所述联接件具有对接端和接合端，对接端位于联接件顶端与通用针相抵触处，对接端的中心处设有向下呈内凹圆弧形面的凹位，以容通用针一端置于凹位内相抵触，联接件下方延伸出的圆柱体与弹弓顶部密紧配合形成接合端。本实用新型可提高测试的准确性，使通用针自动导入最佳配合位置，达到压力传导均匀的目的，且弹弓变形小，制造简单。

Description

一种测试针
技术领域
本实用新型涉及应用于测试线路板的组合式模具中的测试针。
背景技术
现有业内的测试线路板所采用的测试针，多是通过通用针与其配合的弹弓实现，弹弓顶部直接与通用针一端相固定，其存在以下的缺陷：一、在测试高密度线路板过程中，由于通用针的摆动，其底部与弹弓中心轴线产生一定夹角，弹弓与模板发生磨擦，导致弹弓损坏，影响测试效果。二、弹弓顶部与通用针底部的传导性会随测试次数的增加而下降。通用针底部与弹弓顶部不断地磨擦后会破坏两者的镀层且产生碎屑，从而影响传导性能，致使用测试失效。三、模具维护困难。组合式模具的易损件是弹弓，在维护中必须拆除模座及弹弓导线的输出端才能取出失效弹弓，故操作繁琐，且增大工作量。四、弹弓制造困难，增加生产成本。在制造弹弓的工艺中，因要满足弹弓顶位处的内径小于通用针底部直径的要求，致使在卷制过程中对成型弹弓的机器及模具等工艺水平要求较高，故大大提高了弹弓的制造成本。
发明内容
针对上述缺陷，本实用新型的目的是提供一种传导性能高、测试准确、延长弹弓寿命的测试针。
本实用新型的技术方案：一种测试针，包括位于组合式测试模具中的通用针，通用针一端与待测线路板各测试点相抵触，另一端通过弹弓与外置导线相接，其特征在于：通用针与弹弓之间设有联接件，所述联接件具有对接端和接合端，对接端位于联接件顶端与通用针相抵触处，对接端的中心处设有向下的凹位，以容通用针一端置于凹位内相抵触，联接件下方延伸出的圆柱体与弹弓顶部密紧配合形成接合端。
依据上述特征，其中
所述联接件的凹位为一内凹圆弧形面。
所述联接件下方延伸的圆柱体上设有一段凹槽，弹弓顶端张口可固紧于凹槽内。
本实用新型的优点在于：由于在通用针与弹弓之间设置了联接件，通用针一端直接与联接件一端面接触，而弹弓与联接件另一端面接触，防止两者产生磨擦损坏，从而提高了测试的准确性；联接件与通用针的接触面上设有内凹的弧形面，可使通用针底部在弧形面内滑动，自动导入最佳配合位置，达到压力传导均匀的目的。弹弓顶部固定于联接件延伸出的圆柱体上，其变形小，制造简单，从而降低了弹弓的生产工艺要求。
附图说明
图1是现有测试针的结构示意图。
图2是图1的局部放大图。
图3是本实用新型的结构示意图。
图4是本实用新型的结构示意图(使用时)。
图5是图4的局部放大图。
具体实施方式
参见图3所示，本实用新型主要包括：通用针1、联接件2、弹弓3；其中：通用针1头、尾部呈圆锥状，尾部与联接件2相互抵触，联接件2上部具有对接端，下部具有接合端，上部对接端的中心处设有下陷的圆弧形凹位21，通用针1可在凹位21内滑动，联接件2下部的接合端设有一延伸的圆柱体23，圆柱体23上设有一段凹槽22，弹弓3顶端的张口可固紧于凹槽22内，使弹弓3顶端与圆柱体23呈紧密接合，从而使弹弓3固定于联接件2的下方，弹弓3末端与外置导线相连接。
参见图4、图5所示，组合式测试模具中，设有针座6、模座7和支柱8，通用针1放置于测试模具中，通用针1顶端露出针座6并当线路板4下压时与测试点5相接触，通用针1的尾部与置于模座7内的联接件2上的凹位21相抵触，当通用针1被线路板下压时，通用针1末端上的圆锥状可沿联接件2内的凹位21滑移，保证了通用针1与联接件2始终处于的导通状态；联接件2下部的圆柱体23设有一段凹槽22，可便于弹弓3与联接件2固定，防止松脱。
使用时，线路板4受力下压，线路板4上测试点5与通用针1头部相抵，压力由通用针1通过联接头2均匀地传递至弹弓3，电信号通过测试点5流经通用针1、联接头2、弹弓3，由导线传递到外置处理器，测试完成后，测试板4上移，通用针1通过弹弓3伸展复位。

Claims (3)

1、一种测试针，包括位于组合式测试模具中的通用针，通用针一端与待测线路板各测试点相抵触，另一端通过弹弓与外置导线相接，其特征在于：通用针与弹弓之间设有联接件，所述联接件具有对接端和接合端，对接端位于联接件顶端与通用针相抵触处，对接端的中心处设有向下的凹位，以容通用针一端置于凹位内相抵触，联接件下方延伸出的圆柱体与弹弓顶部密紧配合形成接合端。
2、根据权利要求1所述的测试针，其特征在于：所述联接件的凹位为一内凹圆弧形面。
3、根据权利要求1所述的测试针，其特征在于；所述联接件下方延伸的圆柱体上设有一段凹槽，弹弓顶端张口可固紧于凹槽内。
CNU2006200558540U 2006-03-07 2006-03-07 一种测试针 Expired - Fee Related CN2896287Y (zh)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CNU2006200558540U CN2896287Y (zh) 2006-03-07 2006-03-07 一种测试针
US11/456,008 US20070212948A1 (en) 2006-03-07 2006-07-06 Testing Pin Assembly And A Testing Apparatus With Such Assembly
KR1020060074421A KR20070092081A (ko) 2006-03-07 2006-08-07 시험 핀 조립체와 시험 핀 조립체를 구비한 시험 장치

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Application Number Priority Date Filing Date Title
CNU2006200558540U CN2896287Y (zh) 2006-03-07 2006-03-07 一种测试针

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CN2896287Y true CN2896287Y (zh) 2007-05-02

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KR (1) KR20070092081A (zh)
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101154519B1 (ko) * 2010-05-27 2012-06-13 하이콘 주식회사 스프링 콘택트 구조

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CN2491846Y (zh) * 2001-06-12 2002-05-15 吴志成 测试探针
JP2004247170A (ja) * 2003-02-13 2004-09-02 Smk Corp 押圧式スプリングコネクタ

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C14 Grant of patent or utility model
GR01 Patent grant
ASS Succession or assignment of patent right

Owner name: SHENZHEN CENTALIC HARDWARE FITTINGS CO., LTD.

Free format text: FORMER OWNER: XIANDELI ELECTRONIC TESTING FITTINGS CO., LTD., DONGGUAN

Effective date: 20110602

C41 Transfer of patent application or patent right or utility model
COR Change of bibliographic data

Free format text: CORRECT: ADDRESS; FROM: 523401 FENGHUA EAST ROAD, FENGHUA INDUSTRIAL ZONE, HECANG VILLAGE, FUSHAN MANAGEMENT ZONE, LIAOBU TOWN, DONGGUAN CITY, GUANGDONG PROVINCE TO: 518104 NO. 6, ZHU AO INDUSTRIAL ZONE 2, GUSHU, XIXIANG SUBDISTRICT, BAO AN DISTRICT, SHENZHEN CITY, GUANGDONG PROVINCE

TR01 Transfer of patent right

Effective date of registration: 20110602

Address after: Baoan District Xixiang street Shenzhen city Guangdong province 518104 Zhu Shu Ao Second Industrial Zone No. 6

Patentee after: Shenzhen Deli Hardware Fittings Co., Ltd.

Address before: 523401 Guangdong city of Dongguan province Liaobu Zhen He Cang Cun Fu Dong Lu Shan Fenghua Fenghua Industrial Zone Management District

Patentee before: Dongguan Centalic Electronic Testing Parts Co., Ltd.

CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20070502

Termination date: 20140307