CN2739644Y - IC measuring switch board - Google Patents
IC measuring switch board Download PDFInfo
- Publication number
- CN2739644Y CN2739644Y CN 200420118534 CN200420118534U CN2739644Y CN 2739644 Y CN2739644 Y CN 2739644Y CN 200420118534 CN200420118534 CN 200420118534 CN 200420118534 U CN200420118534 U CN 200420118534U CN 2739644 Y CN2739644 Y CN 2739644Y
- Authority
- CN
- China
- Prior art keywords
- template
- test
- card extender
- unit card
- support body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to an IC test switching board which comprises a rack body, and the upper part of the rack body can be combined and sheathed with a template. The IC test switching board is characterized in that a modularized unit switching board comprising a plurality of unit switching boards is arranged below the rack body, and electric wires are connected between the template and the unit switching boards. By using the applying combination of the modularized unit switching board, the IC test switching board is respectively connected with the template on the upper part of a test device to perform the function of switching, so that if the IC is normal can be tested; the programming process can be accelerated through using the separate connection of the plurality of unit switching boards; as a part is broken, the broken part can be replaced to avoid wasting phenomena.
Description
Technical field
The utility model relates to a kind of IC test adaptor plate.
Background technology
The making of general integrated circuit, whether normal in order to confirm its function, usually must be earlier after tested, and, just must use different socket templates in order to test the IC of different size and function, and single proving installation is provided, can be applicable to detect different IC.Traditional test device (as Fig. 1) includes a support body 1, and the template with fit IC can be assembled in top, and the below is then in conjunction with the card extender 3 with a monolithic, and other utilizes electric wire 4 to connect the circuit of template bottom surface and the circuit on card extender 3 surfaces, is provided as test loop.This conventional apparatus is owing to use monolithic card extender 3, therefore when connecting electric wire, and suitable trouble, during production costs and easily give birth to mistake, and in case local when impaired, then must integral replacing, cause waste.
Summary of the invention
The purpose of this utility model provides a kind of IC test adaptor plate.
Above-mentioned purpose of the present utility model is achieved in that a kind of IC test adaptor plate, comprises a support body, supply combination with the socket template in top, it is characterized in that: modular unit card extender is established in the support body below, comprises a plurality of unit card extender, and electric wire is connected between template and the unit card extender.
The utility model utilizes the application combination of modular unit card extender, template with proving installation top is connected respectively, form the function of switching, use test I C normally whether, and utilize the separate connection of a plurality of unit card extender, can quicken processing procedure, and one portion is when damaging, can change at this one, thereby avoid waste.
Below in conjunction with example shown in the drawings the utility model is elaborated.
Description of drawings
Fig. 1 is the structural drawing of known IC test adaptor plate;
Fig. 2 is a stereo appearance figure of the present utility model;
Fig. 3 is the part exploded view of Fig. 2;
Fig. 4 is another angle stereographic map of Fig. 2;
Fig. 5 is the structural map of known grounding rack;
Fig. 6 is the structural map of the utility model grounding rack.
Description of reference numerals: 1 support body; 2 socket templates; 3 known card extenders; 4 electric wires; 5 unit card extenders; 6 grounding racks; 61,62 abutments; 63 metal blocks; 64 abutments.
Embodiment
See also Fig. 2 to Fig. 4, the utility model comprises a support body 1, provide combination with socket template 2 in top, and principal character of the present utility model is: establish with modular unit card extender 5 support body 1 below, promptly utilize a plurality of unit card extender 5 to replace traditional one chip card extender 3, and electric wire 4 is connected between template 2 and the unit card extender 5, forms test circuit.
During use, IC can directly be combined in the connecting support of template 2, and whether by electric wire 4 and each unit card extender 5 formed circuit, can finish test I C is normal usefulness.And advantage of the present utility model is: when using unit card extender 5, it can implement the processing procedure that is connected with electric wire 4 separately, and is therefore more or less freely and can not make mistakes.In addition, when in use,, can change this unit card extender 5 easily and get final product, and needn't all change, so can obtain better economy and practicality if any wherein a part of when impaired.
Please consult Fig. 5, traditional grounding rack shown in Figure 6 and the structure of the utility model grounding rack again, it is located at the inside of proving installation, conventional construction (as Fig. 5) mainly be grounding rack 6 establish with alternate positive and negative every abutment 61,62, as abutment 61 is anodal, then abutment 62 must be a negative pole, order is located on the grounding rack 6 according to this, forms rows of states, but the utilization of this mode and not convenient.As shown in Figure 6, the utility model is then established on grounding rack 6 with several long-bar metal blocks 63, and establishes the abutment 64 with identical polar respectively in its both sides, makes metal blocks 63 opposite with the polarity at abutment 64, can reach the effect of expection.
Claims (2)
1, a kind of IC test adaptor plate comprises a support body,, it is characterized in that for making up with the socket template in top: modular unit card extender is established in the support body below, comprises a plurality of unit card extender, and electric wire is connected between template and the unit card extender.
2, IC test adaptor plate as claimed in claim 1, it is characterized in that also comprising the grounding rack of being located in the support body, this grounding rack is provided with several long-bar metal blocks, and the abutment of identical polar is respectively established in the both sides of each metal blocks, makes metal blocks opposite with the polarity at each abutment.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 200420118534 CN2739644Y (en) | 2004-10-12 | 2004-10-12 | IC measuring switch board |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 200420118534 CN2739644Y (en) | 2004-10-12 | 2004-10-12 | IC measuring switch board |
Publications (1)
Publication Number | Publication Date |
---|---|
CN2739644Y true CN2739644Y (en) | 2005-11-09 |
Family
ID=35354710
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN 200420118534 Expired - Lifetime CN2739644Y (en) | 2004-10-12 | 2004-10-12 | IC measuring switch board |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN2739644Y (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103926430A (en) * | 2014-04-23 | 2014-07-16 | 华进半导体封装先导技术研发中心有限公司 | Through-silicon via patch board testing method |
CN104375076A (en) * | 2014-11-12 | 2015-02-25 | 中国人民解放军第五三一一工厂 | Circuit module measurement switching device |
CN113092994A (en) * | 2021-06-08 | 2021-07-09 | 上海菲莱测试技术有限公司 | High-power optical chip detection platform |
-
2004
- 2004-10-12 CN CN 200420118534 patent/CN2739644Y/en not_active Expired - Lifetime
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103926430A (en) * | 2014-04-23 | 2014-07-16 | 华进半导体封装先导技术研发中心有限公司 | Through-silicon via patch board testing method |
CN103926430B (en) * | 2014-04-23 | 2016-09-21 | 华进半导体封装先导技术研发中心有限公司 | A kind of silicon through hole keyset method of testing |
CN104375076A (en) * | 2014-11-12 | 2015-02-25 | 中国人民解放军第五三一一工厂 | Circuit module measurement switching device |
CN104375076B (en) * | 2014-11-12 | 2018-09-04 | 中国人民解放军第五三一一工厂 | A kind of circuit module measurement switching device |
CN113092994A (en) * | 2021-06-08 | 2021-07-09 | 上海菲莱测试技术有限公司 | High-power optical chip detection platform |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C17 | Cessation of patent right | ||
CX01 | Expiry of patent term |
Expiration termination date: 20141012 Granted publication date: 20051109 |