CN221281127U

CN221281127U - Fault testing system

Info

Publication number: CN221281127U
Application number: CN202322917226.5U
Authority: CN
Inventors: 夏宇
Original assignee: Siemens Ltd China
Current assignee: Siemens Ltd China
Priority date: 2023-10-30
Filing date: 2023-10-30
Publication date: 2024-07-05
Anticipated expiration: 2033-10-30

Abstract

The embodiment of the utility model provides a fault test system. The fault test system comprises a master station device, a slave station device to be tested, a first test cable and a second test cable. The primary station device includes a test controller. The first control terminal is connected with the test controller and one end of the first test cable; the first device terminal array is connected with the test controller and one end of the second test cable. The slave station device to be tested comprises an addressing controller, a second control terminal and a second device terminal array. The second control terminal is connected with the addressing controller and the other end of the first test cable, and the second equipment terminal array is connected with the addressing controller and the other end of the second test cable. Each terminal in the second device terminal array is connected with each accessory device of the to-be-tested slave station device, and each accessory device comprises at least one sensor and/or at least one actuator. The fault test system of the embodiment of the utility model improves the efficiency of fault test.

Description

Fault testing system

Technical Field

The embodiment of the utility model relates to the technical field of electronic circuits, in particular to a fault test system.

Background

In modern industrial automation systems, the actuator sensor interface (Actuator Sensor Interface, AS-I) is a common communication protocol, and the AS-I communication protocol can realize communication connection between the master station device and each slave station device, and the slave station device is used AS a transfer device and a socket extension device of each sensor and each actuator, so that the management efficiency of the devices such AS the sensor and the actuator is improved. That is, upon failure of the slave device, reliable management of the respective sensors and the respective actuators connected thereto is not performed.

However, there is a flexible position setting between the secondary station device and the primary station device, even if the physical distance is long, and in general, a tester needs to carry a test device with test software installed near the secondary station device, and perform a fault test by connecting the test device with the secondary station device, resulting in a relatively low fault test efficiency of the secondary station device.

Disclosure of utility model

Therefore, one of the technical problems to be solved by the embodiments of the present utility model is to provide a fault testing system, which can improve the fault testing efficiency.

The fault test system provided by the embodiment of the utility model is applied to an industrial equipment network. The fault test system comprises a master station device, a slave station device to be tested, a first test cable and a second test cable. The master device includes a test controller, a first control terminal, and a first device terminal array. The first control terminal is connected with the test controller and one end of the first test cable; the first device terminal array connects the test controller with one end of the second test cable. The slave station device to be tested comprises an addressing controller, a second control terminal and a second device terminal array. The second control terminal is connected with the addressing controller and the other end of the first test cable, and the second equipment terminal array is connected with the addressing controller and the other end of the second test cable. Each terminal in the second equipment terminal array is connected with each accessory equipment of the to-be-tested slave station equipment, each accessory equipment comprises at least one sensor and/or at least one actuator, each terminal in the first equipment terminal array corresponds to each terminal in the second equipment terminal array one by one, a test transmission channel of each accessory equipment is formed in the second test cable, and each local addressing address configured by the addressing controller corresponds to each terminal. The test controller is configured to send the addressing test instruction via one of the first test cable and the second test cable and receive a test response to the addressing test instruction via the other. The addressing controller is configured to forward the addressing test instruction between the second device terminal array and the second control terminal.

In the scheme of the embodiment of the utility model, one end of the first test cable is connected to the test controller, and the other end of the first test cable is connected to the addressing controller, so that a transmission channel of the addressing test instruction between the test controller and the addressing controller is formed. In addition, in the second test cable, each terminal of the first equipment terminal array corresponds to each terminal of the second equipment terminal array one by one to form a test transmission channel of each accessory equipment of the to-be-tested slave station equipment, so that the transmission channel of the first test cable and each test transmission channel of the second test cable realize a closed loop transmission channel for addressing test instructions, fault test can be realized without complicated equipment connection between the test equipment and the slave station equipment, and the fault test efficiency of the to-be-tested slave station equipment is improved.

In another implementation of the utility model, the first device terminal array includes a plurality of first proximal test terminals and a plurality of second proximal test terminals, and the second device terminal array includes a plurality of input device terminals and a plurality of output device terminals. In the second test cable, a plurality of first near-end test terminals are in one-to-one correspondence with the input device terminals to form respective test transmission channels of the plurality of sensors. The second near-end test terminals are in one-to-one correspondence with the output device terminals to form test transmission channels of the actuators.

The test transmission channel of each sensor and the test transmission channel of each actuator are favorable for independently testing each sensor and each actuator.

In another implementation of the present utility model, the master station device further includes a test configuration interface and a third test cable connected between the test configuration interface and the test controller for generating the addressing test instruction according to the instruction of the test configuration interface.

The test configuration interface is connected to the test controller through the third test cable, is independent of the first test cable and the second test cable, and is beneficial to conveniently configuring the test configuration interface at the main station equipment side, and in addition, the test configuration interface is beneficial to test operation so as to improve the test efficiency.

In another implementation of the present utility model, the test configuration interface is disposed outside a cabinet of the primary station device, and the test controller is housed within the cabinet.

Through the arrangement mode, the test configuration interface is arranged outside the cabinet to be beneficial to acquiring test operation, and the test controller is contained in the cabinet to be beneficial to multiplexing the inherent controller of the master station equipment.

In another implementation of the present utility model, the second control terminal is connected to a control pin of the address controller, and the second device terminal array is connected to a device pin of the address controller.

By this arrangement, the wiring efficiency between the connection of the second control terminal to the address controller is improved, and the wiring efficiency between the connection of the second device terminal array to the address controller is improved.

In another implementation of the present utility model, the address controller is disposed inside a cabinet of the slave station apparatus to be tested, and the second control terminal and the second device terminal array are disposed on an insulating terminal board outside the cabinet of the slave station apparatus to be tested.

Through such setting mode, can compatible traditional rack outside insulating terminal board that sets up reliably, and promote the test efficiency of slave station equipment through second equipment terminal array.

In another implementation of the present utility model, the second device terminal array is connected to device pins of the addressing controller via external sockets of the accessory device, the external sockets being disposed on a socket expansion board outside a cabinet of the slave device to be tested.

Through such setting mode, need not to change the socket extension board that traditional rack outside set up, auxiliary assembly's external socket can be connected to on the socket extension board, has further compatible traditional rack outside layout mode.

In another implementation of the utility model, the second device terminal array includes an input device terminal connected to a sensor socket of the industrial device network, the addressing controller receives the addressing test instruction via a test transmission channel corresponding to the input device terminal, and forwards the addressing test instruction to the second control terminal as the test response.

Because the input equipment terminal is connected to the sensor socket of the industrial equipment network, the addressing test instruction of the second test cable can be received through the input equipment terminal, so that the test response acquired by the second control terminal is transmitted to the first test cable, a closed loop transmission path of the sensor of the secondary station equipment is formed, and the fault test efficiency of the secondary station equipment is further improved.

In another implementation of the utility model, the second device terminal array includes output device terminals connected to actuator sockets of the industrial device network, the addressing controller receives the addressing test instructions via the second control terminals and forwards the addressing test instructions to test transmission channels corresponding to the output device terminals as the test responses.

Because the addressing test instruction of the first test cable can be received through the second control terminal, the addressing test instruction can be transmitted to the second test cable through the output equipment terminal under the condition that the output equipment terminal is connected to an actuator socket of an industrial equipment network, a closed loop transmission path of an actuator of the secondary station equipment is formed, and the fault test efficiency of the secondary station equipment is further improved.

In another implementation of the utility model, the second device terminal array includes an input device terminal connected to a sensor socket of the industrial device network and an output device terminal connected to an actuator socket of the industrial device network; the addressing controller receives the addressing test instruction through a test transmission channel corresponding to the input device terminal, and forwards the addressing test instruction from the test transmission channel corresponding to the input device terminal to the test transmission channel corresponding to the output device terminal through the first control terminal as the test response.

The input device terminal is connected to the sensor socket of the industrial equipment network, so that the addressing test instruction of the second test cable can be received from the input device terminal, the addressing test instruction can be transmitted to the output device terminal of the actuator socket connected to the industrial equipment network through the first control terminal, and then the addressing test instruction is transmitted back to the second test cable through the output device terminal, thereby forming a closed loop transmission path from the sensor of the secondary station equipment to the actuator, and further improving the fault test efficiency of the secondary station equipment.

Drawings

Some specific embodiments of the present utility model will be described in detail below by way of example and not by way of limitation with reference to the accompanying drawings. The same reference numbers will be used throughout the drawings to refer to the same or like parts or portions. It will be appreciated by those skilled in the art that the drawings are not necessarily drawn to scale. In the accompanying drawings:

Fig. 1 is a communication architecture diagram of an industrial equipment network according to some embodiments of the present utility model.

Fig. 2 is a schematic block diagram of a fault testing system according to further embodiments of the present utility model.

Fig. 3 is a schematic block diagram of a fault testing system according to further embodiments of the present utility model.

Fig. 4 is a schematic diagram of a socket expansion board of the secondary station device under test of the embodiment of fig. 3.

Fig. 5 is a further schematic block diagram of the primary station device of the embodiment of fig. 3.

List of reference numerals:

110: a master station device; 120: a slave station apparatus; 130: a sensor; 140: an actuator; a1, A2, AN: an actuator; s1, S2, SN: a sensor;

210: a master station device; 211: a test controller; 212: a first control terminal; 213: a first device terminal array; 214: testing a configuration interface; 10: a cabinet;

220: a slave station device to be tested; 221: an addressing controller; 222: a second control terminal; 223: a second device terminal array; 20: a cabinet; 21: a socket expansion board; 22: an insulating terminal plate;

230: a first test cable; 240: a second test cable; 250: a third test cable;

I1, I2, IN: a sensor socket; q1, Q2, QN: an actuator socket.

Detailed Description

The utility model is described in further detail below with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely configured to illustrate the related utility model, and are not limiting of the utility model. It should be noted that, for convenience of description, only the portions related to the present utility model are shown in the drawings.

It should be noted that, without conflict, the embodiments of the present utility model and features of the embodiments may be combined with each other. The utility model will be described in detail below with reference to the drawings in connection with embodiments.

AS shown in fig. 1, the industrial device network may be an AS-I network, the communication protocol of which enables a communication connection between the master device 110 and the respective slave devices 120. The slave station device 120 is used as a relay device for each sensor 130 and each actuator 140, which is beneficial to improving the management efficiency of the devices such as the sensors 130 and the actuators 140. The slave device 120 is exemplarily shown in fig. 1 to plug in the connected N sensors S1, S2 through N sensor sockets, the term, SN, and the connected N actuators A1, A2, the term, AN through N actuator sockets. It should be understood that the number of sensors may or may not be the same as the number of actuators.

In an industrial equipment network such AS an AS-I network, failure testing of secondary station equipment is an important step in ensuring that the system is operating properly and that the performance of the equipment is expected. Because the number of the secondary station devices is huge and the secondary station devices are widely distributed, flexible position setting exists between the secondary station devices and the primary station device, even the physical distance is far, the traditional fault test scheme needs to carry test devices with test software installed near the secondary station devices by test personnel, and fault tests can be executed only by device connection between the test devices and the secondary station devices, so that a great amount of time and manpower resources are consumed, and the fault test efficiency of the secondary station devices is relatively low.

Therefore, improving the failure test efficiency of the AS-I slave station device is a technical problem to be solved. To this end, embodiments of the present utility model provide a failure test system capable of performing an efficient and reliable failure test on a slave device.

Fig. 2 is a schematic block diagram of a fault testing system according to further embodiments of the present utility model. The fault testing system 200 of fig. 2 is applied to an industrial equipment network, such AS an AS-I network.

The fault testing system 200 includes a master device 210, a slave device under test 220, a first test cable 230, and a second test cable 240.

Further, the master device 210 comprises a test controller 211, a first control terminal 212 and a first device terminal array 213. The slave device under test 220 is a slave device under test and includes an address controller 221, a second control terminal 222, and a second device terminal array 223. It should be appreciated that the test controller 211 may be implemented as a programmable logic controller (Programmable Logic Controller, PLC). The test controller 211 may be a controller (integrated into) inherent to the master device itself, so as to perform a fault test by means of the communication cable (e.g. the first test cable) of the master device. In addition, the test controller 211 is typically located inside the cabinet of the primary station device, avoiding damage or exposure to harsh external environmental factors. The addressing controller 221 may also be implemented as a programmable logic controller, for example, as a controller inherent to (integrated into) the slave station apparatus itself to be tested. In addition, the addressing controller 221 is typically located inside the cabinet of the primary station device, avoiding damage or exposure to harsh external environmental factors.

Further, one end of the first test cable 230 is connected to the test controller 211 through the first control terminal 212, and the second control terminal 222 connects the address controller 221 with the other end of the first test cable 230. It should be understood that addressing test instructions include, but are not limited to, sensor addressing test instructions, actuator addressing test instructions, and the like.

Further, one end of the second test cable 240 is connected to the test controller 211 through the first device terminal array 212, and the second device terminal array 223 connects the address controller 221 with the other end of the second test cable 240. Each terminal in the second device terminal array 223 connects to each accessory device of the slave station device 220 to be tested, each accessory device including at least one sensor and/or at least one actuator.

Each terminal of the first device terminal array 213 corresponds to each terminal of the second device terminal array 223 one by one, and a test transmission channel of each accessory device is formed in the second test cable 240.

The respective local address addresses configured by the address controller 221 correspond to the respective terminals, and the local address addresses may be identifications of test transmission channels of the accessory devices or identifications of terminals to which the accessory devices are connected.

It should be appreciated that each accessory device includes at least one sensor and/or at least one actuator such that each terminal may be connected to an external socket of the accessory device through wiring within the cabinet of the slave station device to be tested, respectively, such that the accessory device such as the at least one sensor and/or the at least one actuator is plugged into each external socket, respectively.

The test controller 211 is configured to transmit an addressing test instruction via one of the first test cable 230 and the second test cable 240 and receive a test response to the addressing test instruction via the other.

The addressing controller 221 is configured to forward addressing test instructions between the second device terminal array 223 and the second control terminal 222. For example, the address controller 221 can control the second control terminal 222 to forward the address test instruction between one test transmission channel and another test transmission channel in the second device terminal array 223, or the address controller 221 can forward the address test instruction between the second device terminal array 223 and one test transmission channel of the second control terminal 222.

In some examples, the first device terminal array 213 includes a plurality of first proximal test terminals and a plurality of second proximal test terminals. The second device terminal array 223 includes a plurality of input device terminals and a plurality of output device terminals. The plurality of first proximal test terminals are in one-to-one correspondence with the input device terminals, and a test transmission channel for each of the plurality of sensors is formed in the second test cable 240. The plurality of second proximal test terminals are in one-to-one correspondence with the plurality of output device terminals, and a test transmission channel of each of the plurality of actuators is formed in the second test cable 240. The test transmission channel of each sensor and the test transmission channel of each actuator are favorable for independently testing each sensor and each actuator.

In other examples, as shown in fig. 5, the primary station device 210 further includes a test configuration interface 214 and a third test cable 250. A third test cable 250 is connected between the test configuration interface 214 and the test controller 211 for generating the addressing test instructions according to the instructions of the test configuration interface 214. For example, the test configuration interface 214 may be implemented as a human-machine interaction interface, and the hardware of the test configuration interface may be disposed on a side of the cabinet 10 of the master station device, or in another location convenient for a user to perform manual operations, so as to implement reliable installation of the controller and the human-machine interaction interface by virtue of the supporting function of the cabinet.

Furthermore, the actual test result included in the test response may be returned to the man-machine interface through the first test cable or the second test cable, and the fault-free reference test result may be configured in the man-machine interface. Correspondingly, when the man-machine interaction interface executes the fault test operation, the display area of the secondary station equipment to be tested currently can be selected in different display areas in the man-machine interaction interface, or the display page of the secondary station equipment to be tested currently can be selected in different display pages.

Further, as shown in fig. 5, the test configuration interface may be disposed outside the cabinet 10 of the master station device, and the test controller is accommodated in the cabinet 10. By such arrangement, the test configuration interface is arranged outside the cabinet 10 to facilitate the acquisition of test operation, and the test controller is accommodated in the cabinet 10 to facilitate multiplexing of the inherent controller of the master station device.

Further, for the pin configuration of the test controller, it may include a power pin, a ground pin, a control pin (e.g., an AS-I bus pin). The test controller may also include device pins (e.g., pins connected to the first device terminal array) and test pins connected to the test configuration interface.

Further, for the pin configuration of the addressed controller, it may include a power pin, a ground pin, a control pin (e.g., an AS-I bus pin). The addressing controller may also include device pins (e.g., pins connected to the second device terminal array). As shown in fig. 3, the second control terminal 222 is connected to the control pin C of the address controller, and the second device terminal array 223 is connected to the device pin D of the address controller. By this arrangement, the wiring efficiency between the connection of the second control terminal to the address controller is improved, and the wiring efficiency between the connection of the second device terminal array to the address controller is improved.

Further, as shown in fig. 3, an insulating terminal plate 22 and a socket expansion plate 21 may be provided on the cabinet of the slave station apparatus 220 to be tested. In some examples, the address controller 221 may be disposed inside the cabinet 20 of the slave station apparatus 220 to be tested, and the second control terminal 222 and the second apparatus terminal array 223 are disposed on the insulating terminal board 22 outside the cabinet 20 of the slave station apparatus to be tested. By such arrangement, the insulating terminal board provided outside the conventional cabinet 20 can be reliably compatible, and the test efficiency of the slave station apparatus can be improved by the second apparatus terminal array.

Further, the second device terminal array 223 is connected to the device pin D of the addressing controller via external sockets (respective sockets of the socket expansion board 21) of the accessory device, which are provided on the socket expansion board 21 on the outside of the cabinet 20 of the slave device to be tested. The external outlets of the accessory devices may include sensor outlets, such as I1 … IN shown IN FIG. 4. The external outlets of the accessory devices may also include actuator outlets, such as Q1 … QN shown in FIG. 4. By such arrangement, the socket expansion board 21 arranged on the outer side of the conventional cabinet 20 is not required to be changed, and the external socket of the accessory device can be connected to the socket expansion board 21, so that the layout mode of the outer side of the conventional cabinet 20 is further compatible.

As some examples of fault testing, the second device terminal array includes input device terminals that are connected to sensor sockets of the industrial device network, the addressing controller receives addressing test instructions (e.g., sensor addressing test instructions including sensor socket identifications) via test transmission channels corresponding to the input device terminals, and forwards the addressing test instructions to the second control terminals as test responses. Because the input equipment terminal is connected to the sensor socket of the industrial equipment network, the addressing test instruction of the second test cable can be received through the input equipment terminal, so that the test response acquired by the second control terminal is transmitted to the first test cable, a closed loop transmission path of the sensor of the secondary station equipment is formed, and the fault test efficiency of the secondary station equipment is further improved.

Alternatively, as further examples of fault testing, the second device terminal array includes output device terminals connected to actuator sockets of the industrial device network, the addressing controller receives addressing test instructions (e.g., actuator addressing test instructions including an actuator socket identification) via the second control terminals, and forwards the addressing test instructions to corresponding test transmission channels of the output device terminals as test responses. Because the addressing test instruction of the first test cable can be received through the second control terminal, the addressing test instruction can be transmitted to the second test cable through the output equipment terminal under the condition that the output equipment terminal is connected to an actuator socket of an industrial equipment network, a closed loop transmission path of an actuator of the secondary station equipment is formed, and the fault test efficiency of the secondary station equipment is further improved.

Alternatively, as further examples of fault testing, the second device terminal array includes an input device terminal connected to a sensor socket of the industrial device network and an output device terminal connected to an actuator socket of the industrial device network; the addressing controller receives an addressing test instruction through a test transmission channel corresponding to the input device terminal, and forwards the addressing test instruction from the test transmission channel corresponding to the input device terminal to the test transmission channel corresponding to the output device terminal through the first control terminal as a test response. The input device terminal is connected to the sensor socket of the industrial equipment network, so that the addressing test instruction of the second test cable can be received from the input device terminal, the addressing test instruction can be transmitted to the output device terminal of the actuator socket connected to the industrial equipment network through the first control terminal, and then the addressing test instruction is transmitted back to the second test cable through the output device terminal, thereby forming a closed loop transmission path from the sensor of the secondary station equipment to the actuator, and further improving the fault test efficiency of the secondary station equipment.

Thus, particular embodiments of the present subject matter have been described. Other embodiments are within the scope of the following claims. In some cases, the actions recited in the claims can be performed in a different order and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing may be advantageous.

It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a article or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such article or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a commodity or device comprising such elements.

In this specification, each embodiment is described in a progressive manner, and identical and similar parts of each embodiment are all referred to each other, and each embodiment mainly describes differences from other embodiments.

The foregoing is merely exemplary of the present utility model and is not intended to limit the present utility model. Various modifications and variations of the present utility model will be apparent to those skilled in the art. Any modification, equivalent replacement, improvement, etc. which come within the spirit and principles of the utility model are to be included in the scope of the claims of the present utility model.

Claims

1. A fault testing system for use in an industrial equipment network, the fault testing system comprising:

A first test cable;

a second test cable;

a primary station device comprising:

The test controller is used for generating addressing test instructions;

the first control terminal is connected with the test controller and one end of the first test cable;

A first device terminal array connecting the test controller with one end of the second test cable;

A slave station apparatus to be measured, comprising:

an addressing controller;

The second control terminal is connected with the addressing controller and the other end of the first test cable;

A second device terminal array connecting the addressing controller and the other end of the second test cable, wherein each terminal in the second device terminal array is connected with each accessory device of the to-be-tested slave station device, each accessory device comprises at least one sensor and/or at least one actuator, each terminal of the first device terminal array corresponds to each terminal in the second device terminal array one by one, a test transmission channel of each accessory device is formed in the second test cable, and each local addressing address configured by the addressing controller corresponds to each terminal;

Wherein the test controller is configured to send the addressing test instruction via one of the first test cable and the second test cable, and receive a test response of the addressing test instruction via the other;

Wherein the addressing controller is configured to forward the addressing test instruction between the second device terminal array and the second control terminal.

2. The fault testing system of claim 1, wherein the first device terminal array comprises a plurality of first near-end test terminals and a plurality of second near-end test terminals, the second device terminal array comprises a plurality of input device terminals and a plurality of output device terminals;

In the second test cable, the plurality of first near-end test terminals are in one-to-one correspondence with the input equipment terminals to form respective test transmission channels of a plurality of sensors;

The second near-end test terminals are in one-to-one correspondence with the output equipment terminals to form respective test transmission channels of the actuators.

3. The fault testing system of claim 1, wherein the master station device further comprises a test configuration interface and a third test cable connected between the test configuration interface and the test controller for generating the addressing test instructions in accordance with instructions of the test configuration interface.

4. A fault testing system according to claim 3, wherein the test configuration interface is provided outside a cabinet of the primary station device, the test controller being housed within the cabinet.

5. The fault testing system of claim 1, wherein the second control terminal is connected to a control pin of the addressed controller and the second device terminal array is connected to a device pin of the addressed controller.

6. The fault testing system of claim 5, wherein the addressing controller is disposed inside a cabinet of the slave device under test, and the second control terminal and the second device terminal array are disposed on an insulated terminal board outside the cabinet of the slave device under test.

7. The fault testing system of claim 6, wherein the second device terminal array is connected to device pins of the addressing controller via an external socket of the accessory device, the external socket being disposed on a socket expansion board outside a cabinet of the slave device under test.

8. The fault testing system of claim 1, wherein the second device terminal array includes an input device terminal connected to a sensor socket of the industrial device network, the addressing controller receiving the addressing test instruction via a test transmission channel corresponding to the input device terminal and forwarding the addressing test instruction to the second control terminal as the test response.

9. The fault testing system of claim 1, wherein the second device terminal array includes output device terminals connected to actuator sockets of the industrial device network, the addressing controller receiving the addressing test instructions via the second control terminals and forwarding the addressing test instructions to test transmission channels corresponding to the output device terminals as the test responses.

10. The fault testing system of claim 1, wherein the second device terminal array comprises input device terminals connected to sensor sockets of the industrial device network and output device terminals connected to actuator sockets of the industrial device network,

The addressing controller receives the addressing test instruction through a test transmission channel corresponding to the input device terminal, and forwards the addressing test instruction from the test transmission channel corresponding to the input device terminal to the test transmission channel corresponding to the output device terminal through the first control terminal as the test response.