CN221211271U - Polishing amplitude inspection device and inspection system - Google Patents

Abstract

The present disclosure provides a polishing amplitude inspection apparatus and inspection system, and relates to the technical field of substrate glass production and manufacturing. The polishing amplitude inspection apparatus includes: the inspection box, the light source component, the reflectors and the camera; the inspection box is internally provided with a containing space, one side of the inspection box is provided with an inspection opening, and the inspection opening extends along a first direction and is communicated with the containing space; the light source component is arranged in the accommodating space and is spaced from the inspection opening by a preset distance; the reflectors are respectively arranged in the accommodating space and positioned at different sides of the inspection opening, the reflectors comprise first reflectors, and the reflecting surfaces of the reflectors form a preset angle; the camera is arranged in the accommodating space, the shooting direction of the lens of the camera is perpendicular to the first direction and forms a first angle with the first reflecting surface of the first reflecting mirror, so that the lens shoots the first reflecting surface. The device has the advantages of simple structure and reliable performance, and can realize the omnibearing high-efficiency and high-precision inspection of the ground part of the edge of the substrate glass.

Description

Polishing amplitude inspection device and inspection system

Technical Field

The disclosure relates to the technical field of substrate glass production and manufacturing, in particular to a grinding amplitude inspection device and an inspection system.

Background

In recent years, glass processing technology has been rapidly developed, and related technological processes have been developed toward automation, high definition and intelligence. In the glass processing process, the edge part of the glass is subjected to fine crack or piece falling after being scored, and the glass edge is subjected to grinding treatment, so that the glass can be prevented from being broken due to the crack or piece falling of the edge part in the transportation process, and meanwhile, the problem of local stress concentration at the edge of the glass can be solved.

The substrate glass for electro-optical display is thin, usually 0.7mm or less, and the edge part is polished by a polishing wheel with a concave cambered surface, and the edge part of the polished substrate glass has a circular arc-shaped cambered surface structure, namely a substrate glass polishing width which is called in the industry. In the process of polishing the edge portion of the substrate glass, there are defects such as edge burning, underpolishing, overpolishing and the like at the polished portion of the substrate glass due to improper equipment polishing process parameter setting, abnormal polishing wheel material or accumulated polishing wheel loss, so that it is necessary to manually inspect and evaluate the quality of the polished portion of the edge portion of the substrate glass.

However, with the improvement of quality requirements of substrate glass products for electro-optical display, the defect size control requirements of the edge portion of the current substrate glass products have reached the micrometer level, and the manual inspection by using a strong light flashlight is time-consuming and labor-consuming, and is difficult to comprehensively judge, so that the accuracy is low. Therefore, how to improve the inspection accuracy and inspection efficiency of the ground edge of the substrate glass is a technical problem that needs to be solved currently.

Disclosure of utility model

One technical problem to be solved by the present disclosure is: how to improve the inspection accuracy and inspection efficiency of the ground edge of the substrate glass.

To solve the above-mentioned problems, a first embodiment of the present disclosure provides a polishing amplitude inspection apparatus, including: the inspection box, the light source component, the reflectors and the camera; the inspection box is internally provided with a containing space, one side of the inspection box is provided with an inspection opening, and the inspection opening extends along a first direction and is communicated with the containing space; the light source component is arranged in the accommodating space and is spaced from the inspection opening by a preset distance; the reflectors are respectively arranged in the accommodating space and positioned at different sides of the inspection opening, the reflectors comprise first reflectors, and the reflecting surfaces of the reflectors form a preset angle; the camera is arranged in the accommodating space, the shooting direction of the lens of the camera is perpendicular to the first direction and forms a first angle with the first reflecting surface of the first reflecting mirror, so that the lens shoots the first reflecting surface.

In some embodiments of the first embodiment of the present disclosure, the plurality of mirrors further includes: the inspection opening is provided with two opposite edges extending along the first direction, the second reflector and the third reflector are respectively arranged at the two edges, the second reflecting surface of the second reflector and the third reflecting surface of the third reflector respectively face the inside of the accommodating space and form a first angle with each other, and the first reflecting surface respectively forms a second angle and a third angle with the second reflecting surface and the third reflecting surface.

In some embodiments of the first embodiment of the present disclosure, the light source assembly includes a first light source and a second light source, the first light source and the second light source being disposed at intervals along the second direction, and the first light source being located between the first reflective surface and the second reflective surface, and the second light source being located between the first reflective surface and the third reflective surface.

In some embodiments of the first embodiment of the present disclosure, the first light source and the second light source are spaced apart a distance in the second direction that is not less than a width dimension of the inspection port in the second direction.

In some embodiments of the first embodiment of the present disclosure, the polishing amplitude inspection apparatus further includes: an alarm assembly and a brightness sensor; the alarm component is arranged in the accommodating space; the brightness sensor is arranged in the accommodating space and is positioned on one side of the light source assembly, and the brightness sensor is preset with a brightness threshold value and is electrically connected with the alarm assembly.

In some embodiments of the first embodiment of the present disclosure, the camera is a line scan camera; and/or the first light source and the second light source are respectively diffuse reflection fluorescent lamps.

A second embodiment of the present disclosure provides a polishing amplitude inspection system including: a conveying mechanism and at least two polishing amplitude inspection devices provided in any one of the embodiments of the present disclosure; the conveying mechanism is used for conveying the substrate glass along a first direction; at least two polishing amplitude inspection means for inspecting two opposite edges of the substrate glass extending in the first direction, respectively; wherein the first direction is perpendicular to the longitudinal direction.

In some embodiments of the second embodiment of the present disclosure, the conveying mechanism includes: a roller assembly for conveying the substrate glass in a first direction; the at least two grinding amplitude inspection devices at least comprise a first inspection device and a second inspection device, the first inspection device and the second inspection device are arranged at intervals along the longitudinal direction, inspection openings of inspection boxes of the first inspection device and the second inspection device are opposite, and the two opposite ground edges of the substrate glass extending along the first direction are inspected.

In some embodiments of the second embodiment of the present disclosure, the conveying mechanism further includes: the air supporting strip assembly is located between the first inspection device and the second inspection device and comprises a plurality of air supporting strips which are arranged at intervals and extend along the first direction respectively, and a supporting surface is formed by the plurality of air supporting strips and used for supporting the substrate glass.

In some embodiments of the second embodiment of the present disclosure, the first inspection device and the second inspection device are spaced apart along the first direction.

According to the technical scheme, when the grinding amplitude inspection device provided by the application is used, after the ground part to be inspected on the edge of the substrate glass enters the accommodating space through the inspection opening, the light source assembly can irradiate the ground part to be inspected, the light path of the light rays irradiated by the light source assembly can reflect and refract according to the glass condition of the ground part, the reflected and refracted light rays are respectively reflected to the first reflecting surface of the first reflecting mirror by the reflecting surfaces of the plurality of reflecting mirrors, finally, the light rays are reflected to the lens of the camera by the first reflecting surface and are shot by the camera, the camera can send shot picture information to the upper computer, and an operator can compare the picture information of the qualified product predicted in the upper computer with the picture information shot by the camera, so that the unqualified product is screened. The grinding amplitude inspection device provided by the application has simple structure and reliable performance, can realize the omnibearing high-efficiency and high-precision inspection of the ground part of the edge of the substrate glass, the technical problems that the traditional manual flashlight visual inspection is time-consuming and labor-consuming, and the accuracy is low due to difficult comprehensive judgment are effectively solved.

Drawings

In order to more clearly illustrate the embodiments of the present disclosure or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present disclosure, and other drawings may be obtained according to these drawings without inventive effort to a person of ordinary skill in the art.

FIG. 1 is a schematic diagram of a polishing amplitude inspection apparatus according to an embodiment of the present utility model;

FIG. 2 is an enlarged schematic view of a portion of the structure of portion A of FIG. 1;

Fig. 3 is a schematic diagram of a polishing amplitude inspection system according to a second embodiment of the present utility model.

Reference numerals illustrate:

1. Checking the box; 1a, a first inspection device; 1b, a second inspection device; 101. an accommodating space; 201. a first light source; 202. a second light source; 301. a first mirror; 302. a second mirror; 303. a third mirror; 4. a camera; 5. an alarm assembly; 6. a brightness sensor; 7. a substrate glass; 701. a first dividing line; 701a, a first light path; 702. a second dividing line; 702a, a second light path; 703. a third dividing line; 703a, a third light path; 8. a roller assembly; 9. an air floatation strip assembly; x, a first direction; y, second direction.

Detailed Description

Embodiments of the present disclosure are described in further detail below with reference to the drawings and examples. The following detailed description of the embodiments and the accompanying drawings are provided to illustrate the principles of the disclosure and not to limit the scope of the disclosure, which may be embodied in many different forms and not limited to the specific embodiments disclosed herein, but rather to include all technical solutions falling within the scope of the claims.

The present disclosure provides these embodiments in order to make the present disclosure thorough and complete, and fully convey the scope of the disclosure to those skilled in the art. It should be noted that: the relative arrangement of parts and steps, the composition of materials, numerical expressions and numerical values set forth in these embodiments should be construed as exemplary only and not limiting unless otherwise specifically stated.

In the description of the present disclosure, unless otherwise indicated, the meaning of "plurality" is greater than or equal to two; the terms "upper," "lower," "left," "right," "inner," "outer," and the like indicate an orientation or positional relationship merely for convenience of describing the present disclosure and simplifying the description, and do not indicate or imply that the devices or elements being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus are not to be construed as limiting the present disclosure. When the absolute position of the object to be described is changed, the relative positional relationship may be changed accordingly.

Furthermore, the use of the terms first, second, and the like in this disclosure do not denote any order, quantity, or importance, but rather are used to distinguish one element from another. The "vertical" is not strictly vertical but is within the allowable error range. "parallel" is not strictly parallel but is within the tolerance of the error. The word "comprising" or "comprises" and the like means that elements preceding the word encompass the elements recited after the word, and not exclude the possibility of also encompassing other elements.

It should also be noted that, in the description of the present disclosure, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be directly connected or indirectly connected through an intermediate medium. The specific meaning of the terms in the present disclosure may be understood as appropriate by those of ordinary skill in the art. When a particular device is described as being located between a first device and a second device, there may or may not be an intervening device between the particular device and either the first device or the second device.

All terms used in the present disclosure have the same meaning as understood by one of ordinary skill in the art to which the present disclosure pertains, unless specifically defined otherwise. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.

Techniques, methods, and apparatus known to one of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, the techniques, methods, and apparatus should be considered part of the specification.

Example 1

Referring to fig. 1 and 2, a polishing amplitude inspection apparatus according to an embodiment of the present utility model includes: an inspection box 1, a light source assembly, a plurality of reflectors and a camera 4; the inspection box 1 is internally provided with a containing space 101, one side of the inspection box 1 is provided with an inspection opening, and the inspection opening extends along a first direction X and is communicated with the containing space 101; the light source component is arranged in the accommodating space 101 and is spaced from the inspection opening by a preset distance; the reflectors are respectively arranged in the accommodating space 101 and positioned at different sides of the inspection opening, the reflectors comprise a first reflector 301, and the reflecting surfaces of the reflectors form a preset angle with each other; the camera 4 is disposed in the accommodating space 101, and a shooting direction of a lens of the camera 4 is perpendicular to the first direction X and forms a first angle with the first reflecting surface of the first reflector 301, so that the lens shoots the first reflecting surface.

Specifically, the inspection box 1 of the polishing amplitude detection apparatus has a housing space 101, and the housing space 101 can be used as a darkroom, and a camera 4, a light source assembly and a plurality of reflectors are disposed therein. Wherein, the inspection box 1 is provided with a detection port extending along the first direction X and communicated with the accommodating space 101, and the detection port is used for passing through the edge to be inspected of the substrate glass 7. The light source component is arranged in the accommodating space 101 and is spaced from the inspection opening by a preset distance, and the light source component can irradiate the ground part to be inspected on the edge of the passing substrate glass 7. The reflectors are respectively arranged on different sides of the inspection opening, and the reflecting surfaces of the reflectors form a preset angle with each other. Wherein the reflecting surface of the first mirror 301 among the plurality of mirrors forms a first angle with the photographing direction of the lens.

According to the above list, when the ground part to be inspected at the edge of the substrate glass 7 enters the accommodating space 101 through the inspection opening, the light source assembly can irradiate the ground part to be inspected, the light path of the light irradiated by the light source assembly reflects and refracts according to the glass condition of the ground part, the reflected and refracted light is respectively reflected to the first reflecting surface of the first reflecting mirror 301 by the reflecting surfaces of the plurality of reflecting mirrors, the final light is reflected to the lens of the camera 4 by the first reflecting surface and is shot by the camera 4, the camera 4 can send the shot picture information to the upper computer, and the operator can compare the picture information of the qualified product predicted in the upper computer with the picture information shot by the camera 4, so as to screen out the unqualified product.

In some embodiments, referring to fig. 1 and fig. 2, in an embodiment of the polishing amplitude inspection apparatus according to the present utility model, the plurality of mirrors further includes: the inspection opening has two opposite edges extending along the first direction X, the second reflective mirror 302 and the third reflective mirror 303 are respectively disposed at the two edges, the second reflective surface of the second reflective mirror 302 and the third reflective surface of the third reflective mirror 303 respectively face the inside of the accommodating space 101 and form a first angle with each other, and the first reflective surface respectively forms a second angle and a third angle with the second reflective surface and the third reflective surface.

In some embodiments, referring to fig. 1 and 2, in an embodiment of the polishing amplitude inspection apparatus according to the present utility model, a light source assembly includes a first light source 201 and a second light source 202, where the first light source 201 and the second light source 202 are spaced apart along a second direction Y, and the first light source 201 is located between a first reflecting surface and a second reflecting surface, and the second light source 202 is located between the first reflecting surface and a third reflecting surface.

Specifically, when the first light source 201 and the second light source 202 irradiate the edge to be inspected of the substrate glass 7, refraction and reflection are generated at the edge of the light path, the refraction and reflection light paths are respectively reflected through the reflecting surfaces of the three reflectors and finally shot by the camera 4, the camera 4 can store and upload the shot pictures to the upper computer, and an operator can compare the pre-stored image information of the qualified substrate glass 7 with the shot information of the camera 4 through the upper computer, so that the unqualified substrate glass 7 is screened out.

Specifically, taking the preferred embodiment shown in fig. 1 and fig. 2 as an example, when three mirrors are placed as shown in the drawings, the edge to be inspected of the substrate glass 7 forms an illumination boundary, that is, the first boundary 701, the second boundary 702 and the third boundary 703 in fig. 2, the area surrounded by the first boundary 701 and the second boundary 702 in the counterclockwise direction is defined as a first grinding area, the area surrounded by the second boundary 702 and the third boundary 703 in the counterclockwise direction is defined as a second grinding area, the area surrounded by the third boundary 703 and the first boundary 701 in the counterclockwise direction is defined as a third grinding area, and after the first light source 201 and the second light source 202 irradiate the edge to be inspected of the substrate glass 7, the first light path 701a, the second light path 702a and the third light path 703a reflected by the first grinding area, the second light path 301 a and the third grinding area respectively are reflected by the second mirror 302 and the third mirror 303 respectively, and finally three light paths reflected by the first mirror 301 are received by the lens of the camera 4, so that the grinding operation at the three inspection areas can be realized.

In some embodiments, referring to fig. 1 and 2, in an embodiment of the polishing amplitude inspection apparatus according to the first embodiment of the present utility model, in a specific implementation, a separation distance between the first light source 201 and the second light source 202 in the second direction Y is not smaller than a width dimension of the inspection opening in the second direction Y.

Specifically, the distance between the first light source 201 and the second light source 202 in the second direction Y is not smaller than the width dimension of the inspection opening in the second direction Y, so that when the edge to be inspected of the substrate glass 7 passes through the inspection opening, the first light source 201 and the second light source 202 have a larger irradiation range on the edge of the substrate glass 7, so as to improve the inspection range of the grinding amplitude inspection device, avoid the missing inspection phenomenon, and effectively improve the accuracy of the inspection result.

In some embodiments, referring to fig. 1 and fig. 2, a polishing amplitude inspection apparatus according to a first embodiment of the present utility model, in a specific implementation, further includes: an alarm assembly 5 and a brightness sensor 6; the alarm component 5 is arranged in the accommodating space 101; the brightness sensor 6 is disposed in the accommodating space 101 and located at one side of the light source assembly, and the brightness sensor 6 is preset with a brightness threshold and electrically connected with the alarm assembly 5.

Specifically, the luminance sensor 6 and the alarm assembly 5 can be arranged near the light source assembly, the luminance sensor 6 can provide signals for the alarm assembly 5 through electric connection, the alarm device can be in data communication connection with an upper computer, the luminance sensor 6 is preset with a luminance threshold value, and when the luminance in the accommodating space 101 is lower than the preset luminance threshold value due to abnormal operation of the light source assembly, the luminance sensor 6 transmits signals to the alarm assembly 5 through potential change. The alarm assembly 5 can comprise an alarm indicator lamp and a buzzer, when the alarm assembly 5 receives an alarm signal sent by the brightness sensor 6, audible and visual alarm can be realized through the alarm indicator lamp and the buzzer, and meanwhile, alarm data information is transmitted to an upper computer, and related alarm information is displayed through the upper computer, so that an operator can process the alarm in time.

In some embodiments, referring to fig. 1 and 2, a grinding amplitude inspection device according to a first embodiment of the present utility model is provided, and in a specific implementation, the camera 4 is a line scan camera; and/or the first light source 201 and the second light source 202 are respectively diffuse reflective fluorescent lamps.

In particular, in some preferred embodiments of the first embodiment of the present utility model, the camera 4 may employ a line scan camera with 4K resolution to achieve better image capturing effect; the first light source 201 and the second light source 202 each employ a diffuse reflection fluorescent lamp to achieve a larger illumination range and illumination effect.

Example two

Referring to fig. 3, a second embodiment of the present utility model provides a polishing amplitude inspection system, which includes: a conveying mechanism and at least two polishing amplitude inspection devices provided in any one of the embodiments of the present disclosure; the conveying mechanism is used for conveying the substrate glass 7 along the first direction X; at least two polishing amplitude inspection means for inspecting two opposite edges of the substrate glass 7 extending in the first direction X, respectively; wherein the first direction X is perpendicular to the longitudinal direction.

Specifically, the polishing amplitude inspection system includes a conveying mechanism and at least two polishing amplitude inspection devices, and during the process of conveying the substrate glass 7 by the conveying mechanism, two opposite edges of the substrate glass 7 can respectively pass through the polishing amplitude inspection devices, and the polished positions of the two opposite edges of the substrate glass 7 can be inspected by the polishing amplitude inspection devices.

In some embodiments, referring to fig. 3, a polishing amplitude inspection apparatus according to a second embodiment of the present utility model, in a specific implementation, the conveying mechanism includes: a roller assembly 8 for conveying the substrate glass 7 in a first direction X; wherein the at least two polishing amplitude inspection apparatuses at least comprise a first inspection apparatus 1a and a second inspection apparatus 1b, the first inspection apparatus 1a and the second inspection apparatus 1b are arranged at intervals in the longitudinal direction, and inspection openings of the inspection boxes 1 of the first inspection apparatus 1a and the second inspection apparatus 1b are opposite to each other for inspecting two opposite edges to be polished of the substrate glass 7 extending in the first direction X.

Specifically, in order to automatically perform grinding amplitude inspection on two edges of the substrate glass 7 in the conveying process of the substrate glass 7, in the technical scheme adopted by the utility model, the grinding amplitude inspection system comprises a conveying mechanism formed by a roller assembly 8, and the roller assembly 8 can be driven by a driving motor, so that the substrate glass 7 is conveyed under the transmission of the roller assembly 8. During the conveyance of the substrate glass 7, two opposite edges of the substrate glass 7 extending in the first direction X may pass through the inspection ports of the first inspection device 1a and the second inspection device 1b, respectively, so that the ground portions of the two edges of the substrate glass 7 are inspected by the first inspection device 1a and the second inspection device 1 b.

In some embodiments, referring to fig. 3, in the polishing amplitude checking apparatus according to the second embodiment of the present utility model, in a specific implementation, the conveying mechanism further includes: the air-float strip assembly 9, the air-float strip assembly 9 is located between the first inspection device 1a and the second inspection device 1b, the air-float strip assembly 9 includes a plurality of air-float strips that are arranged at intervals and respectively extend along the first direction X, and the plurality of air-float strips form a supporting surface for supporting the substrate glass 7.

Specifically, in order to prevent the surface of the substrate glass 7 from being scratched when the substrate glass 7 is conveyed by the conveying mechanism, in the technical scheme adopted by the utility model, the grinding amplitude inspection system further comprises an air floatation strip assembly 9, wherein the air floatation strip assembly 9 is formed by a plurality of air floatation strips which are arranged at intervals and respectively extend along the first direction X, the air floatation strips can play a role in air floatation supporting after compressed air is introduced, the plurality of air floatation strips can form a supporting surface through the introduced compressed air, and the substrate glass 7 can be supported in the conveying process of the substrate glass 7 through the supporting surface, so that the surface of the substrate glass 7 is prevented from being scratched.

In some embodiments, referring to fig. 3, in a polishing amplitude inspection apparatus according to a second embodiment of the present utility model, in a specific implementation, a first inspection apparatus 1a and a second inspection apparatus 1b are disposed at intervals along a first direction X.

Specifically, in order to prevent the first inspection device 1a and the second inspection device 1b from interfering with each other when inspecting the substrate glass 7 to be inspected, in the technical solution adopted in the present utility model, since the glass has light transmittance, when the light source assemblies in the two inspection boxes 1 irradiate the substrate glass 7, there may be a certain interference effect on the light paths between each other, so the first inspection device 1a and the second inspection device 1b need to be disposed at intervals along the first direction X, and the interference of the light sources of the two inspection devices is avoided by the interval distance.

Thus, various embodiments of the present disclosure have been described in detail. In order to avoid obscuring the concepts of the present disclosure, some details known in the art are not described. How to implement the solutions disclosed herein will be fully apparent to those skilled in the art from the above description.

Although some specific embodiments of the present disclosure have been described in detail by way of example, it should be understood by those skilled in the art that the above examples are for illustration only and are not intended to limit the scope of the present disclosure. It will be understood by those skilled in the art that the foregoing embodiments may be modified and equivalents substituted for elements thereof without departing from the scope and spirit of the disclosure. In particular, the technical features mentioned in the respective embodiments may be combined in any manner as long as there is no structural conflict.

Claims (10)

1. A polishing amplitude inspection apparatus, comprising:

The inspection box (1) is internally provided with a containing space (101), one side of the inspection box (1) is provided with an inspection opening, and the inspection opening extends along a first direction (X) and is communicated with the containing space (101);

The light source assembly is arranged in the accommodating space (101) and is spaced from the inspection opening by a preset distance;

The reflectors are respectively arranged in the accommodating space (101) and positioned at different side parts of the inspection opening, the reflectors comprise first reflectors (301), and the reflecting surfaces of the reflectors form a preset angle; and

The camera (4) is arranged in the accommodating space (101), the shooting direction of the lens of the camera (4) is a second direction (Y), and the second direction (Y) is perpendicular to the first direction (X) and forms a first angle with the first reflecting surface of the first reflecting mirror (301), so that the lens shoots the first reflecting surface.

2. The polishing amplitude inspection apparatus according to claim 1, wherein,

The plurality of mirrors further includes: the inspection opening is provided with two opposite edges extending along a first direction (X), the second reflecting mirror (302) and the third reflecting mirror (303) are respectively arranged at the two edges, a second reflecting surface of the second reflecting mirror (302) and a third reflecting surface of the third reflecting mirror (303) respectively face the inside of the accommodating space (101) and form a first angle with each other, and the first reflecting surface respectively forms a second angle and a third angle with the second reflecting surface and the third reflecting surface.

3. The polishing amplitude inspection apparatus according to claim 2, wherein,

The light source assembly comprises a first light source (201) and a second light source (202), the first light source (201) and the second light source (202) are arranged at intervals along the second direction (Y), the first light source (201) is located between the first reflecting surface and the second reflecting surface, and the second light source (202) is located between the first reflecting surface and the third reflecting surface.

4. The polishing amplitude inspection apparatus according to claim 3, wherein,

The first light source (201) and the second light source (202) are spaced apart by a distance in the second direction (Y) that is not less than the width dimension of the inspection opening in the second direction (Y).

5. The polishing amplitude inspection apparatus according to claim 4, further comprising:

the alarm assembly (5) is arranged in the accommodating space (101);

The brightness sensor (6) is arranged in the accommodating space (101) and is positioned on one side of the light source assembly, and the brightness sensor (6) is preset with a brightness threshold and is electrically connected with the alarm assembly (5).

6. The polishing amplitude inspection apparatus according to claim 5, wherein,

The camera (4) is a line scanning camera; and/or

The first light source (201) and the second light source (202) are respectively diffuse reflection fluorescent lamps.

7. A grinding amplitude inspection system, comprising:

A conveying mechanism for conveying the substrate glass (7) along a first direction (X); and

At least two grinding amplitude inspection devices according to any one of claims 1 to 6, for inspecting two opposite ground edges of the substrate glass (7) extending in the first direction (X), respectively;

wherein the first direction (X) is perpendicular to the longitudinal direction.

8. The polishing amplitude inspection system of claim 7, wherein,

The conveying mechanism comprises: a roller assembly (8) for conveying the substrate glass (7) in the first direction (X);

wherein the at least two grinding amplitude inspection devices at least comprise a first inspection device (1 a) and a second inspection device (1 b), the first inspection device (1 a) and the second inspection device (1 b) are arranged at intervals along the longitudinal direction, and inspection openings of the inspection boxes (1) of the first inspection device (1 a) and the second inspection device (1 b) are opposite and are used for inspecting two opposite ground edges of the substrate glass (7) extending along the first direction (X).

9. The polishing amplitude inspection system of claim 8, wherein,

The conveying mechanism further includes: the air supporting strip assembly (9), air supporting strip assembly (9) are located between first inspection device (1 a) and second inspection device (1 b), air supporting strip assembly (9) are including a plurality of intervals setting and respectively along air supporting strip that first direction (X) extends, a plurality of air supporting strips form the supporting surface, are used for supporting base plate glass (7).

10. The polishing amplitude inspection system of claim 8, wherein,

The first inspection device (1 a) and the second inspection device (1 b) are arranged at intervals along the first direction (X).