CN221039236U - Wire sequence resistance test circuit and wire sequence resistance tester of RJ25 connecting wire - Google Patents
Wire sequence resistance test circuit and wire sequence resistance tester of RJ25 connecting wire Download PDFInfo
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- CN221039236U CN221039236U CN202322661138.3U CN202322661138U CN221039236U CN 221039236 U CN221039236 U CN 221039236U CN 202322661138 U CN202322661138 U CN 202322661138U CN 221039236 U CN221039236 U CN 221039236U
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Abstract
The application provides a line sequence resistance test circuit and a line sequence resistance tester of an RJ25 connecting line, wherein the other ends of six first switches of a first switch control circuit of the line sequence resistance test circuit are connected to a first connecting point, the first connecting point is connected with a constant current source, the first connecting point is also connected with the input end of a voltage comparison circuit, the output end of the voltage comparison circuit is connected with the input end of a singlechip, the six output ends of the singlechip are sequentially connected with the cathode of each light emitting diode, the anode of each light emitting diode is connected with a first power supply, and the other end of each second switch is grounded. According to the application, each spring wire in the RJ25 connecting wire can be sequentially detected, whether the spring wire has a problem or not is displayed through the corresponding light emitting diode, the detection efficiency of the RJ25 connecting wire is improved, and the problem of consuming a large amount of labor cost is avoided.
Description
Technical Field
The application relates to the technical field of line sequence testing, in particular to a line sequence resistance testing circuit of an RJ25 connecting line and a line sequence resistance tester.
Background
The RJ25 connecting wire is the spring wire of 6 cores, and the most application of RJ25 connecting wire is in the USB phone, and at present, when testing the RJ25 connecting wire, it detects to need to carry out resistance to every spring wire in the RJ25 connecting wire in proper order, and detection efficiency is low, consumes a large amount of cost of labor.
Disclosure of utility model
In view of the problems that the existing method needs to sequentially detect the resistance of each spring wire in the RJ25 connecting wire when testing the RJ25 connecting wire, the detection efficiency is low and a large amount of labor cost is consumed, the application provides a wire sequence resistance testing circuit and a wire sequence resistance tester for the RJ25 connecting wire, which can sequentially detect each spring wire in the RJ25 connecting wire, display whether each spring wire has a problem or not through a corresponding light emitting diode, improve the detection efficiency of the RJ25 connecting wire and avoid the problem of consuming a large amount of labor cost.
In a first aspect, the application provides a line sequence resistance test circuit of an RJ25 connecting line, the line sequence resistance test circuit comprises a first switch control circuit, a second switch control circuit, a voltage comparison circuit and a fault indication circuit, the fault indication circuit comprises a single chip microcomputer and six light emitting diodes, the first switch control circuit comprises six first switches, one end of each first switch is connected with six pins of the first RJ25 connecting seat according to a line sequence, the second switch control circuit comprises six second switches, one end of each second switch is connected with six pins of the second RJ25 connecting seat according to a line sequence, the first RJ25 connecting seat is connected with one end of the RJ25 connecting line, the second RJ25 connecting seat is connected with the other end of the RJ25 connecting line, the other ends of the six first switches of the first switch control circuit are all connected to a first connecting point, the first connecting point is connected with a constant current source, one end of each first switch is connected with an input end of the voltage comparison circuit, one end of the single chip microcomputer is connected with an output end of the voltage comparison circuit, one end of each second switch is connected with one anode of the other end of each light emitting diode, and the other end of each second switch is connected with one anode of the power source sequentially.
Optionally, the line-sequence resistance test circuit further comprises a constant current source input circuit, wherein the constant current source input circuit comprises a constant current source chip, a first resistor and a second resistor, the input end of the constant current source chip is connected with a second power supply, the output end of the constant current source chip is connected with one end of the first resistor, the other end of the first resistor is used as a constant current source to be connected with the first connection point, one end of the second resistor is connected with one end of the first resistor, the other end of the second resistor is connected with the other end of the first resistor, and the grounding end of the constant current source chip is connected with the other end of the second resistor.
Optionally, the voltage comparison circuit includes a protection circuit and a comparison circuit, wherein, one end of the protection circuit is connected with the first connection point as the input end of the voltage comparison circuit, the other end of the protection circuit is connected with the input end of the comparison circuit, and the output end of the comparison circuit is connected with the input end of the singlechip as the output end of the voltage comparison circuit.
Optionally, the protection circuit includes a third resistor and a first capacitor, where one end of the third resistor is connected to the first connection point as one end of the protection circuit, the other end of the third resistor is connected to the first input end of the comparison circuit as the other end of the protection circuit, one end of the first capacitor is connected to the other end of the third resistor, and the other end of the first capacitor is grounded.
Optionally, the comparison circuit includes a comparator, a fourth resistor, a fifth resistor, and a sixth resistor, where the positive input end of the comparator is used as the input end of the comparison circuit and connected to the other end of the protection circuit, the grounding of the comparator is grounded, the power supply end of the comparator is connected to the first power supply, one end of the fourth resistor is connected to the first power supply, the other end of the fourth resistor is connected to the negative input end of the comparator, one end of the fifth resistor is connected to one end of the fourth resistor, the other end of the fifth resistor is connected to the other end of the fourth resistor, one end of the sixth resistor is connected to the first power supply, the other end of the sixth resistor is connected to the output end of the comparator, and the output end of the comparator is used as the output end of the comparison circuit and connected to the input end of the singlechip.
Optionally, the line-sequence resistance test circuit further comprises a voltage conversion circuit, wherein an input end of the voltage conversion circuit is connected with an anode of the battery, a first output end of the voltage conversion circuit outputs a first power supply, and a second output end of the voltage conversion circuit outputs a second power supply.
Optionally, the voltage conversion circuit includes a switch, a second capacitor, a third capacitor, a fourth capacitor, a fifth capacitor, a sixth capacitor, a voltage conversion chip, a seventh light emitting diode, and a seventh resistor, where one end of the switch is connected to the positive electrode of the battery as an input end of the voltage conversion circuit, the other end of the switch is connected to the input end of the voltage conversion chip, the other end of the switch is also used as a first output end of the voltage conversion circuit to output a first power supply, one end of the second capacitor is connected to the other end of the switch, the other end of the second capacitor is grounded, one end of the third capacitor is connected to one end of the second capacitor, the other end of the third capacitor is grounded, the output end of the voltage conversion chip is connected to the positive electrode of the seventh light emitting diode, the negative electrode of the seventh light emitting diode is connected to one end of the seventh resistor, the other end of the seventh resistor is grounded, the output end of the voltage conversion chip is used as a second output end of the voltage conversion circuit to output a second power supply, one end of the fourth capacitor is connected to the output end of the voltage conversion chip, the other end of the fourth capacitor is grounded, the other end of the fourth capacitor is connected to the other end of the fourth capacitor is grounded, and the other end of the fourth capacitor is grounded.
Optionally, the first switch control circuit is a first switch analog chip, the second switch control circuit is a second switch analog chip, the first switch analog chip and the second switch analog chip all include six switch analog pins, the six switch analog pins of the first switch analog chip are connected with the six pins of the first RJ25 connecting seat according to a line sequence, the six switch analog pins of the second switch analog chip are connected with the six pins of the second RJ25 connecting seat according to a line sequence, the control pins of the first switch analog chip and the second switch analog chip are used for receiving control signals, the input end of the first switch analog chip is connected with the constant current source, the first switch analog chip and the second switch analog chip are controlled to be conducted according to the control signals, and the output end of the first switch analog chip is connected with the input end of the voltage comparison circuit.
Optionally, the fault indication circuit further includes six light emitting diode protection resistors, and the six light emitting diode protection resistors are respectively connected between six output ends of the singlechip and cathodes of the six light emitting diodes.
In a second aspect, the present application provides a line-sequence resistance tester, which includes the line-sequence resistance testing circuit of the RJ25 connection line described in any one of the above.
According to the line sequence resistance testing circuit and the line sequence resistance tester for the RJ25 connecting line, which are provided by the application, each spring line in the RJ25 connecting line can be sequentially detected, whether each spring line has a problem or not is displayed through the corresponding light emitting diode, the detection efficiency of the RJ25 connecting line is improved, and the problem of consuming a large amount of labor cost is avoided.
In order to make the above objects, features and advantages of the present application more comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments will be briefly described below, it being understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 shows a schematic diagram of a line sequence resistance test circuit for an RJ25 connection line;
FIG. 2 shows a schematic diagram of a line sequence resistance test circuit of another RJ25 connection line;
Fig. 3 shows a schematic diagram of a voltage conversion circuit.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present application more apparent, the technical solutions of the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application, and it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. The components of the embodiments of the present application generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the application, as presented in the figures, is not intended to limit the scope of the application, as claimed, but is merely representative of selected embodiments of the application. Based on the embodiments of the present application, every other embodiment obtained by a person skilled in the art without making any inventive effort falls within the scope of protection of the present application.
It should be noted that the term "comprising" will be used in embodiments of the application to indicate the presence of the features stated hereafter, but not to exclude the addition of other features.
The application relates to a line sequence resistance test circuit and a line sequence resistance tester for RJ25 connecting lines, which can sequentially detect each spring line in the RJ25 connecting lines and display whether each spring line has a problem or not through a corresponding light emitting diode, thereby improving the detection efficiency of the RJ25 connecting lines and avoiding the problem of consuming a large amount of labor cost.
Referring to fig. 1, fig. 1 is a schematic diagram of a line-sequential resistance testing circuit of an RJ25 connection line. As shown in fig. 1, the line-sequential resistance testing circuit of the RJ25 connection line includes: the first switch control circuit 101, the first RJ25 connection seat 102, the second RJ25 connection seat 104, the RJ25 connection wire 103, the second switch control circuit 105, the voltage comparison circuit 106 and the fault indication circuit 107, wherein the fault indication circuit 107 comprises a single chip microcomputer 1071, a first light emitting diode D1, a second light emitting diode D2, a third light emitting diode D3, a fourth light emitting diode D4, a fifth light emitting diode D5 and a sixth light emitting diode D6.
The first switch control circuit comprises six first switches, one end of each first switch is connected with six pins of a first RJ25 connecting seat according to a wire sequence, the second switch control circuit comprises six second switches, one end of each second switch is connected with six pins of a second RJ25 connecting seat according to the wire sequence, the first RJ25 connecting seat is connected with one end of an RJ25 connecting wire, the second RJ25 connecting seat is connected with the other end of the RJ25 connecting wire, the other ends of the six first switches of the first switch control circuit are connected to first connecting points, the first connecting points are connected with constant current sources, the first connecting points are also connected with the input end of a voltage comparison circuit, the output end of the voltage comparison circuit is connected with the input end of a single chip microcomputer, the six output ends of the single chip microcomputer are sequentially connected with the cathodes of each light emitting diode, the anode of each light emitting diode is connected with a first power supply, and the other end of each second switch is grounded.
The constant current source may be a 100 milliamp current source, the on-resistance of each first switch and each second switch in the first switch control circuit and the second switch control circuit is 4.5 ohms, the resistance of each spring wire of the RJ25 connecting wire is less than 1 ohm, six first switches and six second switches in the first switch control circuit and the second switch control circuit are sequentially controlled to be sequentially closed, the voltage of the first connecting point is less than 1V when one group of the first switches and the second switches are closed, the voltage value is compared through the voltage comparison circuit, when a certain wire sequence (spring wire) of the detected RJ25 is qualified, the voltage comparison circuit outputs a low level, when the certain wire sequence (spring wire) of the detected RJ25 is not qualified, the voltage comparison circuit outputs a high level, and the singlechip displays whether the current wire sequence (spring wire) is qualified or not through the light emitting diode corresponding to the wire sequence based on the currently detected wire sequence, for example, if the current wire sequence (spring wire) is not qualified, the red light indicates that the current wire sequence (spring wire) is not qualified, and the red light is not lighted.
For example, six first switches and six second switches in the first switch control circuit and the second switch control circuit can be controlled to be closed in sequence, and each time the first switches and the second switches are closed in sequence, the singlechip controls the light emitting diode to indicate based on the received level signals, for example, when the singlechip sequentially receives low level, high level, low level and low level, the singlechip controls the light emitting diode corresponding to the third wire sequence (spring wire) to light up, so that whether each spring wire in the RJ25 connecting wire is abnormal or not can be determined through the indication of the light emitting diode.
According to the line sequence resistance test circuit for the RJ25 connecting line, each spring line in the RJ25 connecting line can be sequentially detected, whether each spring line has a problem or not is displayed through the corresponding light emitting diode, the detection efficiency of the RJ25 connecting line is improved, and the problem of consuming a large amount of labor cost is avoided.
Optionally, the line-sequence resistance test circuit further comprises a constant current source input circuit, wherein the constant current source input circuit comprises a constant current source chip, a first resistor and a second resistor, the input end of the constant current source chip is connected with a second power supply, the output end of the constant current source chip is connected with one end of the first resistor, the other end of the first resistor is used as a constant current source to be connected with the first connection point, one end of the second resistor is connected with one end of the first resistor, the other end of the second resistor is connected with the other end of the first resistor, and the grounding end of the constant current source chip is connected with the other end of the second resistor.
Optionally, the voltage comparison circuit includes a protection circuit and a comparison circuit, wherein, one end of the protection circuit is connected with the first connection point as the input end of the voltage comparison circuit, the other end of the protection circuit is connected with the input end of the comparison circuit, and the output end of the comparison circuit is connected with the input end of the singlechip as the output end of the voltage comparison circuit.
Optionally, the protection circuit includes a third resistor and a first capacitor, where one end of the third resistor is connected to the first connection point as one end of the protection circuit, the other end of the third resistor is connected to the first input end of the comparison circuit as the other end of the protection circuit, one end of the first capacitor is connected to the other end of the third resistor, and the other end of the first capacitor is grounded.
Optionally, the comparison circuit includes a comparator, a fourth resistor, a fifth resistor, and a sixth resistor, where the positive input end of the comparator is used as the input end of the comparison circuit and connected to the other end of the protection circuit, the grounding of the comparator is grounded, the power supply end of the comparator is connected to the first power supply, one end of the fourth resistor is connected to the first power supply, the other end of the fourth resistor is connected to the negative input end of the comparator, one end of the fifth resistor is connected to one end of the fourth resistor, the other end of the fifth resistor is connected to the other end of the fourth resistor, one end of the sixth resistor is connected to the first power supply, the other end of the sixth resistor is connected to the output end of the comparator, and the output end of the comparator is used as the output end of the comparison circuit and connected to the input end of the singlechip.
Optionally, the line-sequence resistance test circuit further comprises a voltage conversion circuit, wherein an input end of the voltage conversion circuit is connected with an anode of the battery, a first output end of the voltage conversion circuit outputs a first power supply, and a second output end of the voltage conversion circuit outputs a second power supply.
Optionally, the voltage conversion circuit includes a switch, a second capacitor, a third capacitor, a fourth capacitor, a fifth capacitor, a sixth capacitor, a voltage conversion chip, a seventh light emitting diode, and a seventh resistor, where one end of the switch is connected to the positive electrode of the battery as an input end of the voltage conversion circuit, the other end of the switch is connected to the input end of the voltage conversion chip, the other end of the switch is also used as a first output end of the voltage conversion circuit to output a first power supply, one end of the second capacitor is connected to the other end of the switch, the other end of the second capacitor is grounded, one end of the third capacitor is connected to one end of the second capacitor, the other end of the third capacitor is grounded, the output end of the voltage conversion chip is connected to the positive electrode of the seventh light emitting diode, the negative electrode of the seventh light emitting diode is connected to one end of the seventh resistor, the other end of the seventh resistor is grounded, the output end of the voltage conversion chip is used as a second output end of the voltage conversion circuit to output a second power supply, one end of the fourth capacitor is connected to the output end of the voltage conversion chip, the other end of the fourth capacitor is grounded, the other end of the fourth capacitor is connected to the other end of the fourth capacitor is grounded, and the other end of the fourth capacitor is grounded.
Optionally, the first switch control circuit is a first switch analog chip, the second switch control circuit is a second switch analog chip, the first switch analog chip and the second switch analog chip all include six switch analog pins, the six switch analog pins of the first switch analog chip are connected with the six pins of the first RJ25 connecting seat according to a line sequence, the six switch analog pins of the second switch analog chip are connected with the six pins of the second RJ25 connecting seat according to a line sequence, the control pins of the first switch analog chip and the second switch analog chip are used for receiving control signals, the input end of the first switch analog chip is connected with the constant current source, the first switch analog chip and the second switch analog chip are controlled to be conducted according to the control signals, and the output end of the first switch analog chip is connected with the input end of the voltage comparison circuit.
Optionally, the fault indication circuit further includes six light emitting diode protection resistors, and the six light emitting diode protection resistors are respectively connected between six output ends of the singlechip and cathodes of the six light emitting diodes.
Referring to fig. 2, fig. 2 is a schematic diagram of a line-sequential resistance testing circuit of another RJ25 connection line. As shown in fig. 2, the line-sequential resistance testing circuit of the RJ25 connection line includes: the first switch analog chip 201, the second switch analog chip 202, the first RJ25 connection seat 102, the second RJ25 connection seat 104, the RJ25 connection wire 103, the constant current source input circuit 203, the voltage comparison circuit 106 and the fault indication circuit 107, wherein the constant current source input circuit 203 comprises a constant current source chip 2031, a first resistor R1 and a second resistor R2, the voltage comparison circuit 106 comprises a protection circuit 1062 and a comparison circuit, the protection circuit 1062 comprises a third resistor R3 and a first capacitor C1, the comparison circuit comprises a comparator 1061, a fourth resistor R4, a fifth resistor R5 and a sixth resistor R6, and the fault indication circuit 107 comprises a singlechip 1071, a first light emitting diode D1, a second light emitting diode D2, a third light emitting diode D3, a fourth light emitting diode D4, a fifth light emitting diode D5, a sixth light emitting diode D6, a seventh resistor R7, an eighth resistor R8, a ninth resistor R9, a tenth resistor R10, an eleventh resistor R11 and a twelfth resistor R12.
The input end of the constant current source chip is connected with a second power supply, the output end of the constant current source chip is connected with one end of a first resistor, the other end of the first resistor is used as a constant current source to be connected with the first connecting point, one end of the second resistor is connected with one end of the first resistor, the other end of the second resistor is connected with the other end of the first resistor, and the grounding end of the constant current source chip is connected with the other end of the second resistor.
One end of the protection circuit is connected with the first connection point as an input end of the voltage comparison circuit, the other end of the protection circuit is connected with an input end of the comparison circuit, and an output end of the comparison circuit is connected with an input end of the singlechip as an output end of the voltage comparison circuit.
Specifically, one end of the third resistor is used as one end of the protection circuit to be connected with the first connection point, the other end of the third resistor is used as the other end of the protection circuit to be connected with the first input end of the comparison circuit, one end of the first capacitor is connected with the other end of the third resistor, and the other end of the first capacitor is grounded.
Specifically, the positive electrode input end of the comparator is used as the input end of the comparison circuit and is connected with the other end of the protection circuit, the grounding end of the comparator is grounded, the power supply end of the comparator is connected with a first power supply, one end of the fourth resistor is connected with the first power supply, the other end of the fourth resistor is connected with the negative electrode input end of the comparator, one end of the fifth resistor is connected with one end of the fourth resistor, the other end of the fifth resistor is connected with the other end of the fourth resistor, one end of the sixth resistor is connected with the first power supply, the other end of the sixth resistor is connected with the output end of the comparator, and the output end of the comparator is used as the output end of the comparison circuit and is connected with the input end of the singlechip.
The seventh resistor R7, the eighth resistor R8, the ninth resistor R9, the tenth resistor R10, the eleventh resistor R11 and the twelfth resistor R12 are six light emitting diode protection resistors, and the six light emitting diode protection resistors are respectively connected between six output ends of the singlechip and cathodes of the six light emitting diodes.
Here, first switch control circuit is first switch analog chip, second switch control circuit is second switch analog chip, first switch analog chip and second switch analog chip all include six switch analog pins, six switch analog pins of first switch analog chip are connected with six pins of first RJ25 connecting seat according to the line preface, six switch analog pins of second switch analog chip are connected with six pins of second RJ25 connecting seat according to the line preface, the control pin of first switch analog chip and second switch analog chip is used for receiving control signal, the input of first switch analog chip is connected with the constant current source, first switch analog chip and second switch analog chip and according to control first switch analog chip and second switch analog switch on, the output of first switch analog chip is connected with the input of voltage comparison circuit.
The connection relationship and the function among the first switch analog chip 201, the second switch analog chip 202, the first RJ25 connection socket 102, the second RJ25 connection socket 104, and the RJ25 connection wire 103 are the same as those of the first switch control circuit 101, the first RJ25 connection socket 102, the second RJ25 connection socket 104, the RJ25 connection wire 103, and the second switch control circuit 105 in fig. 1, and are not described herein.
For example, referring to fig. 3, fig. 3 shows a schematic diagram of a voltage conversion circuit. As shown in fig. 3, the voltage conversion circuit includes: the battery 301, the switch 302, the second capacitor C2, the third capacitor C3, the fourth capacitor C4, the fifth capacitor C5, the sixth capacitor C6, the voltage conversion chip 303, the seventh light emitting diode D7, and the seventh resistor R7.
One end of the switch is used as an input end of the voltage conversion circuit to be connected with an anode of the battery, the other end of the switch is connected with an input end of the voltage conversion chip, the other end of the switch is also used as a first output end of the voltage conversion circuit to output a first power supply, one end of the second capacitor is connected with the other end of the switch, the other end of the second capacitor is grounded, one end of the third capacitor is connected with one end of the second capacitor, the other end of the third capacitor is grounded, an output end of the voltage conversion chip is connected with an anode of a seventh light emitting diode, a cathode of the seventh light emitting diode is connected with one end of a seventh resistor, the other end of the seventh resistor is grounded, the output end of the voltage conversion chip is used as a second output end of the voltage conversion circuit to output a second power supply, one end of the fourth capacitor is connected with the output end of the voltage conversion chip, the other end of the fourth capacitor is grounded, one end of the fifth capacitor is connected with one end of the fourth capacitor, the other end of the fifth capacitor is grounded, and the other end of the fifth capacitor is grounded.
According to the line sequence resistance testing circuit and the line sequence resistance tester for the RJ25 connecting line, which are provided by the application, each spring line in the RJ25 connecting line can be sequentially detected, whether each spring line has a problem or not is displayed through the corresponding light emitting diode, the detection efficiency of the RJ25 connecting line is improved, and the problem of consuming a large amount of labor cost is avoided.
In the description of the present application, it should be noted that the directions or positional relationships indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present application and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present application. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present application, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present application will be understood in specific cases by those of ordinary skill in the art.
In addition, the technical solutions of the embodiments may be combined with each other, but it is necessary to base that the technical solutions can be realized by those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should be considered to be absent and not within the scope of protection claimed in the present application.
The foregoing description is only of the preferred embodiments of the present application, and is not intended to limit the scope of the application, and all the structural equivalents of the application described in the specification and drawings are included in the scope of the application, or the application may be directly/indirectly applied to other related technical fields.
Claims (10)
1. A line sequence resistance test circuit of an RJ25 connecting line is characterized by comprising a first switch control circuit, a second switch control circuit, a voltage comparison circuit and a fault indication circuit, wherein the fault indication circuit comprises a singlechip and six light emitting diodes,
The first switch control circuit comprises six first switches, one end of each first switch is connected with six pins of a first RJ25 connecting seat according to a wire sequence, the second switch control circuit comprises six second switches, one end of each second switch is connected with six pins of a second RJ25 connecting seat according to the wire sequence, the first RJ25 connecting seat is connected with one end of an RJ25 connecting wire, the second RJ25 connecting seat is connected with the other end of the RJ25 connecting wire, the other ends of the six first switches of the first switch control circuit are connected to first connecting points, the first connecting points are connected with constant current sources, the first connecting points are also connected with the input end of a voltage comparison circuit, the output end of the voltage comparison circuit is connected with the input end of a single chip microcomputer, the six output ends of the single chip microcomputer are sequentially connected with the cathodes of each light emitting diode, the anode of each light emitting diode is connected with a first power supply, and the other end of each second switch is grounded.
2. The circuit of claim 1, wherein the line-sequence resistance test circuit further comprises a constant current source input circuit comprising a constant current source chip, a first resistor, a second resistor,
The input end of the constant current source chip is connected with a second power supply, the output end of the constant current source chip is connected with one end of a first resistor, the other end of the first resistor is used as a constant current source to be connected with the first connecting point, one end of the second resistor is connected with one end of the first resistor, the other end of the second resistor is connected with the other end of the first resistor, and the grounding end of the constant current source chip is connected with the other end of the second resistor.
3. The circuit of claim 1, wherein the voltage comparison circuit comprises a protection circuit and a comparison circuit,
One end of the protection circuit is connected with the first connection point as an input end of the voltage comparison circuit, the other end of the protection circuit is connected with an input end of the comparison circuit, and an output end of the comparison circuit is connected with an input end of the singlechip as an output end of the voltage comparison circuit.
4. The circuit of claim 3, wherein the protection circuit comprises a third resistor and a first capacitor,
One end of the third resistor is used as one end of the protection circuit to be connected with the first connection point, the other end of the third resistor is used as the other end of the protection circuit to be connected with the first input end of the comparison circuit, one end of the first capacitor is connected with the other end of the third resistor, and the other end of the first capacitor is grounded.
5. The circuit of claim 3 wherein the comparison circuit comprises a comparator, a fourth resistor, a fifth resistor, a sixth resistor,
The positive electrode input end of the comparator is used as the input end of the comparison circuit and is connected with the other end of the protection circuit, the grounding end of the comparator is connected with a first power supply, one end of the fourth resistor is connected with the first power supply, the other end of the fourth resistor is connected with the negative electrode input end of the comparator, one end of the fifth resistor is connected with one end of the fourth resistor, the other end of the fifth resistor is connected with the other end of the fourth resistor, one end of the sixth resistor is connected with the first power supply, the other end of the sixth resistor is connected with the output end of the comparator, and the output end of the comparator is used as the output end of the comparison circuit and is connected with the input end of the singlechip.
6. The circuit of claim 1, wherein the line-sequence resistance test circuit further comprises a voltage conversion circuit,
The input end of the voltage conversion circuit is connected with the positive electrode of the battery, the first output end of the voltage conversion circuit outputs a first power supply, and the second output end of the voltage conversion circuit outputs a second power supply.
7. The circuit of claim 6, wherein the voltage conversion circuit comprises a switch, a second capacitor, a third capacitor, a fourth capacitor, a fifth capacitor, a sixth capacitor, a voltage conversion chip, a seventh light emitting diode, a seventh resistor,
One end of the switch is used as an input end of the voltage conversion circuit to be connected with an anode of the battery, the other end of the switch is connected with an input end of the voltage conversion chip, the other end of the switch is also used as a first output end of the voltage conversion circuit to output a first power supply, one end of the second capacitor is connected with the other end of the switch, the other end of the second capacitor is grounded, one end of the third capacitor is connected with one end of the second capacitor, the other end of the third capacitor is grounded, an output end of the voltage conversion chip is connected with an anode of a seventh light emitting diode, a cathode of the seventh light emitting diode is connected with one end of a seventh resistor, the other end of the seventh resistor is grounded, the output end of the voltage conversion chip is used as a second output end of the voltage conversion circuit to output a second power supply, one end of the fourth capacitor is connected with the output end of the voltage conversion chip, the other end of the fourth capacitor is grounded, one end of the fifth capacitor is connected with one end of the fourth capacitor, the other end of the fifth capacitor is grounded, and the other end of the fifth capacitor is grounded.
8. The circuit of claim 1, wherein the first switch control circuit is a first switch analog chip, the second switch control circuit is a second switch analog chip, the first switch analog chip and the second switch analog chip each comprise six switch analog pins, the six switch analog pins of the first switch analog chip are connected with the six pins of the first RJ25 connection seat in line sequence, the six switch analog pins of the second switch analog chip are connected with the six pins of the second RJ25 connection seat in line sequence, the control pins of the first switch analog chip and the second switch analog chip are used for receiving control signals, the input ends of the first switch analog chip are connected with the constant current source, the first switch analog chip and the second switch analog chip are controlled to conduct according to the control signals, and the output ends of the first switch analog chip are connected with the input ends of the voltage comparison circuit.
9. The circuit of claim 1, wherein the fault indication circuit further comprises six led protection resistors connected between the six output terminals of the single chip microcomputer and the cathodes of the six leds, respectively.
10. A line sequence resistance tester, characterized in that it comprises a line sequence resistance testing circuit of an RJ25 connection line according to any one of claims 1-9.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322661138.3U CN221039236U (en) | 2023-09-28 | 2023-09-28 | Wire sequence resistance test circuit and wire sequence resistance tester of RJ25 connecting wire |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322661138.3U CN221039236U (en) | 2023-09-28 | 2023-09-28 | Wire sequence resistance test circuit and wire sequence resistance tester of RJ25 connecting wire |
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| Publication Number | Publication Date |
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| CN221039236U true CN221039236U (en) | 2024-05-28 |
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| CN202322661138.3U Active CN221039236U (en) | 2023-09-28 | 2023-09-28 | Wire sequence resistance test circuit and wire sequence resistance tester of RJ25 connecting wire |
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| Country | Link |
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| CN (1) | CN221039236U (en) |
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2023
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