CN220829564U - Patch resistor insulation voltage-withstanding measurement experiment device - Google Patents
Patch resistor insulation voltage-withstanding measurement experiment device Download PDFInfo
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- CN220829564U CN220829564U CN202322162053.0U CN202322162053U CN220829564U CN 220829564 U CN220829564 U CN 220829564U CN 202322162053 U CN202322162053 U CN 202322162053U CN 220829564 U CN220829564 U CN 220829564U
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- pressing plate
- chip resistor
- shaft pin
- host
- vertical plate
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- 238000009413 insulation Methods 0.000 title claims abstract description 18
- 238000002474 experimental method Methods 0.000 title claims abstract description 13
- 238000005259 measurement Methods 0.000 title claims abstract description 13
- 238000003825 pressing Methods 0.000 claims abstract description 56
- 238000012360 testing method Methods 0.000 claims abstract description 14
- 238000006073 displacement reaction Methods 0.000 abstract description 6
- 238000002788 crimping Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The utility model discloses a chip resistor insulation voltage withstand measurement experiment device, and particularly relates to the technical field of chip resistor testing. According to the utility model, through arranging the experimental assembly, the high-voltage generator and the host machine are used for carrying out a pressure-resistant test, and the magnetic attraction column and the host machine are adsorbed together for limiting the displacement stroke of the pressing plate, so that the damage of the conductive piece and the resistor caused by the excessive pressure of pressing down the pressing plate is avoided, the pressing plate can be limited, and the broken touch phenomenon is avoided.
Description
Technical Field
The utility model relates to the technical field of chip resistor testing, in particular to a chip resistor insulation voltage withstand measurement experiment device.
Background
The device is used for measuring the insulating property of the chip resistor under high voltage. The device generally comprises a high voltage generator, a current measuring instrument, a test fixture and other components;
And mounting the chip resistor on a test fixture to ensure that pins of the resistor are correctly connected. The voltage value of the high-voltage generator is set, and is generally set according to the insulation grade and specification of the chip resistor. The high voltage generator is connected with the resistor pins on the test fixture and ensures that the circuit connection is correct. And opening the high-voltage generator to enable the high-voltage generator to output a high-voltage power supply to the chip resistor. And the leakage current on the chip resistor is measured by using a current measuring instrument, so that the leakage current is ensured to be within a specified range.
The utility model patent with the patent application number of CN202023079704.2 discloses an insulation and voltage resistance testing tool for a patch device, which comprises an insulation frame, and a conductive gasket and a spring positioning needle which are arranged on the insulation frame; the conductive gasket and the spring positioning needle are respectively connected with a lead wire, the conductive gasket is arranged on the axis of the spring positioning needle, and the spring positioning needle is used for crimping the patch device to be tested on the conductive gasket;
When the structure is used, the operation of connecting the lead on the patch device to be tested in a welding mode is omitted in a certain sense through the pre-connection of the lead, but when the structure is used, the stability of the connection of the clamp and the circuit cannot be ensured, and the inaccuracy of a test result caused by poor contact is easy to occur.
Disclosure of utility model
In order to overcome the defects in the prior art, the utility model provides a chip resistor insulation voltage withstand measurement experimental device, which aims to solve the problems in the background art.
The utility model is realized in such a way that the utility model provides the following technical scheme: the patch resistor insulation voltage withstand measurement experiment device comprises a host, wherein an experiment component is arranged on the host;
The experimental assembly comprises a pressing plate which is arranged at the top of the main machine and can be displaced up and down, a high-voltage generator is arranged at the top of the pressing plate, a plurality of magnetic attraction columns are arranged at the outer side of the pressing plate, and a conductive piece which penetrates through the pressing plate and is connected with the high-voltage generator is arranged between the magnetic attraction columns and is positioned right below the high-voltage generator;
The upper surface of the main machine and the bottom of the pressing plate are provided with limit grooves, and the two sides of the pressing plate are respectively provided with an outer sloping plate;
According to the technical scheme, when the pressing plate is displaced downwards, each magnetic attraction column is also contacted with the host machine, and the magnetic attraction columns and the host machine are adsorbed together to limit the displacement stroke of the pressing plate, so that the damage to the conductive piece and the resistor caused by overlarge pressing force of the pressing plate is avoided, the pressing plate can be limited, the conductive piece can be only attached to the resistor, and the broken contact phenomenon is avoided;
Optionally, in a possible implementation manner, the experiment assembly further includes a first vertical plate disposed at one end of the pressing plate and used for supporting, the first vertical plate is disposed at the top of the host and is detachably connected with the host, a second vertical plate detachably connected with the first vertical plate and used for supporting is disposed at one side of the top of the first vertical plate, a guide cylinder used for guiding is disposed at the bottom of the second vertical plate, a push rod is slidably connected in the guide cylinder, a shaft pin piece is movably connected to the top of the push rod through a shaft pin, the bottom of the push rod is disposed on the pressing plate and is detachably connected with the pressing plate, a swing rod is movably connected to the top of the shaft pin piece through a shaft pin, a rubber sleeve is disposed on the swing rod, one end of the swing rod extends to the second vertical plate and is movably connected with the second vertical plate through a shaft pin, two guide rods which are all mounted on the host and used for guiding are respectively slidably connected with a sliding sleeve mounted on the pressing plate;
According to the technical scheme, the swing rod firstly rotates along the axis point of the joint of the swing rod and the second vertical plate, so that the shaft pin piece can displace through the traction force caused by the rotation of the swing rod, the shaft pin piece displaces to drive the ejector rod to displace downwards through the guide of the guide cylinder, the conductive piece can firstly contact with the resistor, the pressure resistance test is carried out through the high-voltage generator and the host, and when the pressing plate displaces, the guiding rod and the sliding sleeve can play a role in guiding the stroke of the pressing plate, so that the stability of the pressing plate when the pressing plate displaces is ensured.
The utility model has the technical effects and advantages that:
Compared with the prior art, the experimental assembly is simple in overall design and reasonable in structure, through corresponding matching use of the structures, the pin piece is displaced to drive the ejector rod to downwards displace through the guide of the guide cylinder, so that the conductive piece can be contacted with the resistor first, and a voltage withstand test is carried out through the high-voltage generator and the host;
the magnetic attraction column and the host adsorb together to limit the displacement stroke of the pressing plate, so that the damage to the conductive piece and the resistor caused by overlarge pressing force of the pressing plate is avoided, and the pressing plate can be limited, so that the conductive piece can be attached to the resistor only to avoid the phenomenon of broken contact.
Drawings
In order to more clearly illustrate the technical solutions of the present disclosure, the drawings that need to be used in some embodiments of the present disclosure will be briefly described below, and it is apparent that the drawings in the following description are only drawings of some embodiments of the present disclosure, and other drawings may be obtained according to these drawings to those of ordinary skill in the art. Furthermore, the drawings in the following description may be regarded as schematic diagrams, not limiting the actual size of the products, the actual flow of the methods, the actual timing of the signals, etc. according to the embodiments of the present disclosure.
Fig. 1 is a front view of the overall structure of the present utility model.
Fig. 2 is a side view of the overall structure of the present utility model.
FIG. 3 is a side view of the platen, ejector pins and guide cylinder of the present utility model.
Fig. 4 is an exploded view of the various structures on the platen of the present utility model.
The reference numerals are: 1. a host; 2. a pressing plate; 3. a high voltage generator; 4. a magnetic suction column; 5. a conductive member; 6. a limit groove; 7. a vertical plate; 8. a vertical plate; 9. a guide cylinder; 10. a push rod; 11. a shaft pin member; 12. swing rod; 13. a guide rod; 14. a sliding sleeve; 15. an outer sloping plate.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
In the embodiment, as shown in fig. 1-4, the chip resistor insulation voltage withstand measurement experiment device is provided with an experiment assembly on the host 1, the chip resistor can be contacted with the resistor firstly through the conductive piece 5, the voltage withstand test is carried out through the high voltage generator 3 and the host 1, the conductive piece 5 can be tightly attached to the resistor, the phenomenon of breaking contact is avoided, and the specific structure of the assembly is as follows;
The experimental assembly comprises a pressing plate 2 which is arranged at the top of a host machine 1 and can move up and down, a high-voltage generator 3 is arranged at the top of the pressing plate 2, a plurality of magnetic attraction columns 4 are arranged at the outer side of the pressing plate 2, and a conductive piece 5 which penetrates through the pressing plate 2 and is connected with the high-voltage generator 3 is arranged between the magnetic attraction columns 4 and is positioned under the high-voltage generator 3;
The upper surface of the main machine 1 and the bottom of the pressing plate 2 are provided with limit grooves 6, and the two sides of the pressing plate 2 are respectively provided with an outer sloping plate 15;
The experimental assembly further comprises a first vertical plate 7 arranged at one end of the pressing plate 2 and used for supporting, the first vertical plate 7 is arranged at the top of the host machine 1 and is detachably connected with the host machine 1, a second vertical plate 8 detachably connected with the first vertical plate 7 and used for supporting is arranged at one side of the top of the first vertical plate 7, a guide cylinder 9 used for guiding is arranged at the bottom of the second vertical plate 8, a push rod 10 is slidably connected in the guide cylinder 9, a shaft pin piece 11 is movably connected to the top of the push rod 10 through a shaft pin, the bottom of the push rod 10 is arranged on the pressing plate 2 and is detachably connected with the pressing plate 2, a swing rod 12 is movably connected to the top of the shaft pin piece 11 through a shaft pin, a rubber sleeve is arranged on the swing rod 12, one end of the swing rod 12 extends to the second vertical plate 8 and is movably connected with the second vertical plate 8 through a shaft pin, two guide rods 13 which are all installed on the host machine 1 and are used for guiding, and sliding sleeves 14 which are respectively and slidably connected to the pressing plate 2.
According to the structure, when the device is used, a worker installs the device at a designated position, when the device is used, the worker places the resistor to be tested on the host 1, the resistor to be tested is positioned firstly through the limiting groove 6, then the worker rotates the swing rod 12 firstly along the axis point of the connection part of the swing rod 12 and the second vertical plate 8 by snapping the swing rod 12, so that the shaft pin 11 can displace through the traction force cause when the swing rod 12 rotates, the rest shaft pin 11 displaces, and the shaft pin 11 drives the ejector rod 10 to displace downwards through the guide of the guide cylinder 9 when displacing, so that the conductive piece 5 can be contacted with the resistor firstly, and a withstand voltage test is performed through the high-voltage generator 3 and the host 1;
When the pressing plate 2 moves downwards, each magnetic attraction column 4 is also contacted with the host 1, and the magnetic attraction columns 4 and the host 1 are adsorbed together to limit the displacement stroke of the pressing plate 2, so that the damage to the conductive piece 5 and the resistor caused by overlarge pressing force of the pressing plate 2 is avoided, the pressing plate 2 can be limited, the conductive piece 5 can be tightly attached to the resistor, and the phenomenon of disconnection is avoided;
Meanwhile, when the pressing plate 2 is displaced, the displacement stroke of the pressing plate 2 can be guided through the arrangement of the guide rod 13 and the sliding sleeve 14, and the stability of the pressing plate 2 during displacement is ensured.
Compared with the prior art, the application discloses a patch resistor insulation voltage withstand measurement experimental device, which can be firstly contacted with a resistor through a conductive piece 5, and can be used for performing voltage withstand test through a high-voltage generator 3 and a host 1, so that the conductive piece 5 can be tightly attached to the resistor, and the phenomenon of disconnection is avoided.
The foregoing is only illustrative of the preferred embodiments of the present utility model and is not to be construed as limiting the utility model, but rather as various modifications, equivalent arrangements, improvements, etc., within the spirit and principles of the present utility model.
Claims (6)
1. The utility model provides a chip resistor insulation pressure resistance measurement experimental apparatus which characterized in that: the experimental device comprises a host (1), wherein an experimental component is arranged on the host (1);
The experimental assembly comprises a pressing plate (2) which is arranged at the top of a host machine (1) and can move up and down, a high-voltage generator (3) is arranged at the top of the pressing plate (2), a plurality of magnetic suction columns (4) are arranged at the outer side of the pressing plate (2), and a conductive piece (5) which penetrates through the pressing plate (2) and is connected with the high-voltage generator (3) is arranged between the magnetic suction columns (4) and is positioned under the high-voltage generator (3);
Limiting grooves (6) are formed in the upper surface of the main machine (1) and located at the bottom of the pressing plate (2), and outer inclined plates (15) are respectively arranged on two sides of the pressing plate (2).
2. The chip resistor insulation voltage resistance measurement experiment device according to claim 1, wherein: the experimental assembly further comprises a first vertical plate (7) arranged at one end of the pressing plate (2) and used for supporting, and the first vertical plate (7) is arranged at the top of the host machine (1) and is detachably connected with the host machine (1).
3. The chip resistor insulation voltage resistance measurement experiment device according to claim 2, wherein: the top one side of first riser (7) is provided with second riser (8) that are used for supporting with first riser (7) detachable connection, the bottom of second riser (8) is provided with guide cylinder (9) that are used for the direction.
4. The chip resistor insulation voltage resistance measurement experiment device according to claim 3, wherein: the guide cylinder (9) is connected with a push rod (10) in a sliding mode, the top of the push rod (10) is movably connected with a shaft pin piece (11) through a shaft pin, and the bottom of the push rod (10) is arranged on the pressing plate (2) and is detachably connected with the pressing plate (2).
5. The device for testing insulation and voltage resistance of chip resistor according to claim 4, wherein: the top of the shaft pin piece (11) is movably connected with a swing rod (12) through a shaft pin, a rubber sleeve is arranged on the swing rod (12), and one end of the swing rod (12) extends to the second vertical plate (8) and is movably connected with the second vertical plate (8) through the shaft pin.
6. The chip resistor insulation voltage resistance measurement experiment device according to claim 2, wherein: the bottom of the first vertical plate (7) is provided with two guide rods (13) which are both installed on the host machine (1) and used for guiding, and sliding sleeves (14) installed on the pressing plate (2) are respectively and slidably connected to the two guide rods (13).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322162053.0U CN220829564U (en) | 2023-08-11 | 2023-08-11 | Patch resistor insulation voltage-withstanding measurement experiment device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322162053.0U CN220829564U (en) | 2023-08-11 | 2023-08-11 | Patch resistor insulation voltage-withstanding measurement experiment device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220829564U true CN220829564U (en) | 2024-04-23 |
Family
ID=90722556
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202322162053.0U Active CN220829564U (en) | 2023-08-11 | 2023-08-11 | Patch resistor insulation voltage-withstanding measurement experiment device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220829564U (en) |
-
2023
- 2023-08-11 CN CN202322162053.0U patent/CN220829564U/en active Active
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