CN220626477U - 1200A test probe - Google Patents
1200A test probe Download PDFInfo
- Publication number
- CN220626477U CN220626477U CN202321840979.4U CN202321840979U CN220626477U CN 220626477 U CN220626477 U CN 220626477U CN 202321840979 U CN202321840979 U CN 202321840979U CN 220626477 U CN220626477 U CN 220626477U
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- Prior art keywords
- probe
- voltage
- test
- current
- test probe
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- 239000000523 sample Substances 0.000 title claims abstract description 355
- 238000012360 testing method Methods 0.000 title claims abstract description 290
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 65
- 229910052802 copper Inorganic materials 0.000 claims abstract description 65
- 239000010949 copper Substances 0.000 claims abstract description 65
- 238000009434 installation Methods 0.000 claims description 15
- 238000010438 heat treatment Methods 0.000 abstract description 4
- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 238000009413 insulation Methods 0.000 description 13
- 238000010586 diagram Methods 0.000 description 8
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 1
- 238000004880 explosion Methods 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Measuring Leads Or Probes (AREA)
Abstract
The utility model provides a 1200A test probe, which comprises a probe fixing seat, a copper bar patch cord device and a test probe device, wherein the probe fixing seat is provided with a test probe mounting hole, the test probe device is embedded in the test probe mounting hole, the test probe device is provided with the copper bar patch cord device, and the copper bar patch cord device is electrically connected with the test probe device, and the utility model has the beneficial effects that: the structure is simple, the use is convenient and quick, and the test efficiency is effectively improved; the current contact area between the clamp and the positive and negative lugs of the battery cell of the battery to be tested is increased, the impedance is reduced, the heating is reduced, and the test stability and the test precision are improved.
Description
Technical Field
The utility model relates to the technical field of battery testing, in particular to a 1200A test probe.
Background
Along with the popularization of new energy, the application of the battery is also becoming wider and wider. The battery must pass through the test link before leaving the factory, and the anchor clamps that present use in the test process of heavy current battery are easy to generate heat in the test process of heavy current battery to lead to the test accuracy not high, and then can damage battery and test anchor clamps etc. and even probably the conflagration happens when serious.
Disclosure of Invention
The utility model aims to solve the technical problems and provide the novel 1200A test probe which has the advantages of simple structure, convenient and quick use and effective improvement of test efficiency; the current contact area between the clamp and the positive and negative lugs of the battery cell of the battery to be tested is increased, the impedance is reduced, the heating is reduced, and the test stability and the test precision are improved.
The utility model is realized by the following technical scheme:
the utility model provides a 1200A test probe, includes probe fixing base, copper bar keysets device, test probe device, be equipped with the test probe mounting hole on the probe fixing base, the test probe device embedding is in the test probe mounting hole, be equipped with copper bar keysets device on the test probe device, copper bar keysets device with the test probe device electricity is connected.
Further, the test probe device comprises a current test probe part, a voltage test probe part and a test probe base, wherein the current test probe part and the voltage test probe part are respectively installed in test probe installation holes on the probe fixing base, the test probe base is respectively provided with a current test installation hole and a voltage test installation hole, the upper ends of the current test probe part and the voltage test probe part are respectively connected with the copper bar adapter wire device, and the lower ends of the current test probe part and the voltage test probe part are respectively installed in the current test installation holes and the voltage test installation holes on the test probe base.
Further, the current test probe part comprises a current test seat, a current test probe, a current probe nut and a current probe spring, one end of the current test seat penetrates through a test probe mounting hole on the probe fixing seat and is locked on the probe fixing seat through the current probe nut, the current probe spring is arranged between the probe fixing seat and the current test seat, the other end of the current test seat is embedded into the current test mounting hole on the test probe base, the current test seat is internally provided with the current test probe mounting hole, the current test probe is mounted in the test probe mounting hole, the upper end of the current test probe extends to the outside of the probe fixing seat, and the lower end of the current test probe extends to the outside of the current test mounting hole on the test probe base.
Further, the voltage test probe part comprises a voltage test seat, a voltage test probe, a voltage probe nut and a voltage probe spring, one end of the voltage test seat penetrates through a test probe mounting hole on the probe fixing seat and is locked on the probe fixing seat through the voltage probe nut, the voltage probe spring is arranged between the probe fixing seat and the voltage test seat, the other end of the voltage test seat is embedded into the voltage test mounting hole on the test probe base, the voltage test seat is internally provided with the voltage test probe mounting hole, the voltage test probe is mounted in the test probe mounting hole, the upper end of the voltage test probe extends to the outside of the probe fixing seat, and the lower end of the voltage test probe extends to the outside of the voltage test mounting hole on the test probe base.
Further, the upper end of the current test probe mounting hole is provided with a current needle thread, and the lower end of the current test probe mounting hole is provided with a current connecting rod clamping groove.
Further, the upper end of the voltage test probe mounting hole is provided with a voltage pin thread, and the lower end of the voltage test probe mounting hole is provided with a voltage connecting rod clamping groove.
Further, the current test probe comprises a current probe, a current probe spring, a current probe upper insulating ring, a current probe fastening ring and a current insulating sleeve, wherein the upper end of the current probe penetrates through a current probe thread at the upper end of a current test probe mounting hole and is locked in the current probe thread through the current probe upper insulating ring, a probe spring mounting position is arranged on the current probe, the current probe spring is mounted in the probe spring mounting position and is locked on the current probe through the current probe fastening ring, and the lower end of the current probe is embedded in a current connecting rod clamping groove at the lower end of the current test probe mounting hole and is locked in a current test mounting hole of a test probe base through the current insulating sleeve.
Further, the voltage test probe comprises a voltage probe, a voltage probe spring, a voltage probe upper insulation ring, a voltage probe confinement ring and a voltage insulation sleeve, wherein the upper end of the voltage probe penetrates through a voltage probe thread at the upper end of a voltage test probe mounting hole and is locked in the voltage probe thread through the voltage probe upper insulation ring, a probe spring mounting position is arranged on the voltage probe, the voltage probe spring is mounted in the probe spring mounting position and is locked on the voltage probe through the voltage probe confinement ring, and the lower end of the voltage probe is embedded in a voltage connecting rod clamping groove at the lower end of the voltage test probe mounting hole and is locked in a voltage test mounting hole of a test probe base through the voltage insulation sleeve.
Further, the copper bar switching wire device comprises a current copper bar switching wire seat, a voltage copper bar switching wire seat, a current copper bar switching wire and a voltage copper bar switching wire, wherein the current copper bar switching wire seat is arranged at the upper end of the current test seat and is locked at the upper end of the current test seat through a current probe nut, the current copper bar switching wire seat is provided with a current copper bar switching wire, and the current copper bar switching wire is electrically connected with the current test probe; the voltage copper bar switching wire seat is installed at the upper end of the voltage testing seat and locked at the upper end of the voltage testing seat through a voltage probe nut, a voltage copper bar switching wire is arranged on the voltage copper bar switching wire seat, and the voltage copper bar switching wire is electrically connected with the voltage testing probe.
Further, the current copper bar switching wire seat and the voltage copper bar switching wire seat are L-shaped.
The utility model has the beneficial effects that: the structure is simple, the use is convenient and quick, and the test efficiency is effectively improved; the current contact area between the clamp and the positive and negative lugs of the battery cell of the battery to be tested is increased, the impedance is reduced, the heating is reduced, and the test stability and the test precision are improved.
Drawings
FIG. 1 is a schematic diagram of a test probe 1200A according to the present utility model;
FIG. 2 is a schematic diagram of an explosion structure of a test probe 1200A according to the present utility model;
FIG. 3 is a schematic diagram of a test probe device according to the present utility model;
FIG. 4 is a schematic diagram of an exploded view of a test probe device according to the present utility model;
FIG. 5 is a schematic diagram of the structure of the current test probe component of the present utility model;
FIG. 6 is a schematic diagram of an exploded view of a current test probe assembly according to the present utility model;
FIG. 7 is a schematic diagram of the components of the voltage test probe of the present utility model;
FIG. 8 is a schematic diagram of an exploded view of a voltage test probe assembly according to the present utility model;
reference numerals: 1. a probe fixing seat; 11. testing the probe mounting hole; 2. a copper bar patch cord device; 21. a current copper bar patch cord seat; 22. a voltage copper bar patch cord seat; 23. a current copper bar patch cord; 24. a voltage copper bar patch cord; 3. testing the probe device; 31. a current test probe assembly; 310. a current test socket; 311. a current test probe; 3110. a current probe; 3111. a current probe spring; 3112. an insulating ring is arranged on the current needle; 3113. a current needle confinement ring; 3114. a current insulation sleeve; 312. a current probe nut; 313. a current needle spring; 32. a voltage test probe assembly; 320. a voltage test seat; 321. a voltage test probe; 3210. a voltage probe; 3211. a voltage probe spring; 3212. an insulating ring is arranged on the voltage pin; 3213. a voltage pin confinement ring; 3214. a voltage insulating sleeve; 322. a voltage probe nut; 323. a voltage pin spring; 33. a test probe base; 330. a current test mounting hole; 331. and a voltage test mounting hole.
Detailed Description
The utility model is further described with reference to the accompanying drawings and detailed description below:
unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used in the description of the applications herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application; the terms "comprising" and "having" and any variations thereof in the description and claims of the present application and in the description of the figures above are intended to cover non-exclusive inclusions. The terms first, second and the like in the description and in the claims or in the above-described figures, are used for distinguishing between different objects and not necessarily for describing a sequential or chronological order.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the present application. The appearances of such phrases in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments.
Referring to fig. 1-8, an embodiment of a 1200A test probe includes a probe fixing seat 1, a copper bar patch cord device 2, and a test probe device 3, where a test probe mounting hole 11 is provided on the probe fixing seat 1, the test probe device 3 is embedded in the test probe mounting hole 11, and the test probe device 3 is provided with the copper bar patch cord device 2, and the copper bar patch cord device 2 is electrically connected with the test probe device 3.
Preferably, the test probe device 3 includes a current test probe component 31, a voltage test probe component 32, and a test probe base 33, the current test probe component 32 and the voltage test probe component 32 are respectively installed in the test probe installation hole 11 on the probe fixing base 1, the test probe base 33 is respectively provided with a current test installation hole 330 and a voltage test installation hole 331, the upper ends of the current test probe component 31 and the voltage test probe component 32 are respectively connected with the copper bar patch cord device 2, and the lower ends of the current test probe component 31 and the voltage test probe component 32 are respectively installed in the current test installation hole 330 and the voltage test installation hole 331 on the test probe base 33.
Preferably, the current test probe part 31 includes a current test socket 310, a current test probe 311, a current probe nut 312, and a current probe spring 313, one end of the current test socket 310 passes through the test probe mounting hole 11 of the probe fixing socket 1 and is locked on the probe fixing socket 1 by the current probe nut 312, the current probe spring 313 is disposed between the probe fixing socket 1 and the current test socket 310, the other end of the current test socket 310 is embedded in the current test mounting hole 330 of the test probe base 33, the current test probe mounting hole is disposed in the current test socket 33, the current test probe 311 is mounted in the test probe mounting hole in the current test socket 33, the upper end extends to the outside of the probe fixing socket 1, and the lower end extends to the outside of the current test mounting hole in the test probe base 33.
Preferably, the voltage test probe part 32 includes a voltage test socket 320, a voltage test probe 321, a voltage probe nut 322, and a voltage probe spring 323, one end of the voltage test socket 320 passes through the test probe mounting hole 11 on the probe fixing base 1 and is locked on the probe fixing base 1 by the voltage probe nut 322, a voltage probe spring 323 is disposed between the probe fixing base 1 and the voltage test socket 320, the other end of the voltage test socket 320 is embedded in the voltage test mounting hole 311 on the test probe base 33, a voltage test probe mounting hole is disposed in the voltage test socket 320, the voltage test probe 321 is mounted in the test probe mounting hole in the voltage test socket 320, the upper end extends to the outside of the probe fixing base 1, and the lower end extends to the outside of the voltage test mounting hole on the test probe base 33.
Preferably, the upper end of the current test probe mounting hole is provided with a current needle thread, and the lower end of the current test probe mounting hole is provided with a current connecting rod clamping groove.
Preferably, the upper end of the voltage test probe mounting hole is provided with a voltage pin thread, and the lower end of the voltage test probe mounting hole is provided with a voltage connecting rod clamping groove.
Preferably, the current test probe 311 comprises a current probe 3110, a current probe spring 3111, a current probe upper insulation ring 3112, a current probe confinement ring 3113 and a current insulation sleeve 3114, wherein the upper end of the current probe 3110 passes through a current probe thread at the upper end of a current test probe mounting hole and is locked in the current probe thread through the current probe upper insulation ring 3112, a probe spring mounting position is arranged on the current probe 3110, the current probe spring 3111 is mounted in the probe spring mounting position and is locked on the current probe 3110 through the current probe confinement ring 3113, and the lower end of the current probe 3110 is embedded in a current connecting rod clamping groove at the lower end of the current test probe mounting hole and is locked in a current test mounting hole 330 of the test probe base 33 through the current insulation sleeve 3114.
Preferably, the voltage test probe 321 comprises a voltage probe 3210, a voltage probe spring 3211, a voltage probe upper insulation ring 3212, a voltage probe fastening ring 3213 and a voltage insulation sleeve 3214, wherein the upper end of the voltage probe 3210 penetrates through a voltage probe thread at the upper end of a voltage test probe mounting hole and is locked in the voltage probe thread through the voltage probe upper insulation ring 3212, a probe spring mounting position is arranged on the voltage probe 3210, the voltage probe spring 3211 is mounted in the probe spring mounting position and is locked on the voltage probe 3210 through the voltage probe fastening ring 3213, and the lower end of the voltage probe 3210 is embedded in a voltage connecting rod clamping groove at the lower end of the voltage test probe mounting hole and is locked in a voltage test mounting hole 331 of the test probe base 33 through the voltage insulation sleeve 3214.
Preferably, the copper bar switching wire device 2 includes a current copper bar switching wire seat 21, a voltage copper bar switching wire seat 22, a current copper bar switching wire 23, and a voltage copper bar switching wire 24, wherein the current copper bar switching wire seat 21 is installed at the upper end of the current test seat 310 and locked at the upper end of the current test seat 310 by a current probe nut 312, the current copper bar switching wire seat 21 is provided with the current copper bar switching wire 23, and the current copper bar switching wire 23 is electrically connected with the current test probe 3110; the voltage copper bar adapter seat 22 is mounted at the upper end of the voltage test seat 320 and locked at the upper end of the voltage test seat 320 through a voltage probe nut 322, the voltage copper bar adapter seat 22 is provided with a voltage copper bar adapter 24, and the voltage copper bar adapter 24 is electrically connected with a voltage test probe 3210.
Preferably, the current copper bar patch cord seat 21 and the voltage copper bar patch cord seat 22 are L-shaped.
In conclusion, the 1200A test probe has the advantages of simple structure, convenient and quick use and effective improvement of test efficiency; the current contact area between the clamp and the positive and negative lugs of the battery cell of the battery to be tested is increased, the impedance is reduced, the heating is reduced, and the test stability and the test precision are improved.
Modifications and variations of the above embodiments will be apparent to those skilled in the art in light of the above teachings. Therefore, the utility model is not limited to the specific embodiments disclosed and described above, but some modifications and changes of the utility model should be also included in the scope of the claims of the utility model. In addition, although specific terms are used in the present specification, these terms are for convenience of description only and do not limit the present utility model in any way.
Claims (9)
1. A 1200A test probe, characterized by: the test probe comprises a probe fixing seat, a copper bar patch cord device and a test probe device, wherein a test probe mounting hole is formed in the probe fixing seat, the test probe device is embedded in the test probe mounting hole, the copper bar patch cord device is arranged on the test probe device, and the copper bar patch cord device is electrically connected with the test probe device; the test probe device comprises a current test probe component, a voltage test probe component and a test probe base, wherein the current test probe component and the voltage test probe component are respectively installed in test probe installation holes on the probe fixing base, the test probe base is respectively provided with a current test installation hole and a voltage test installation hole, the upper ends of the current test probe component and the voltage test probe component are respectively connected with the copper bar patch cord device, and the lower ends of the current test probe component and the voltage test probe component are respectively installed in the current test installation holes and the voltage test installation holes on the test probe base.
2. The 1200A test probe of claim 1, wherein: the current test probe component comprises a current test seat, a current test probe, a current probe nut and a current probe spring, one end of the current test seat penetrates through a test probe mounting hole on the probe fixing seat and is locked on the probe fixing seat through the current probe nut, the current probe spring is arranged between the probe fixing seat and the current test seat, the other end of the current test seat is embedded into the current test mounting hole on the test probe base, the current test seat is internally provided with the current test probe mounting hole, the current test probe is mounted in the test probe mounting hole, the upper end of the current test probe extends to the outside of the probe fixing seat, and the lower end of the current test probe extends to the outside of the current test mounting hole on the test probe base.
3. The 1200A test probe of claim 1, wherein: the voltage test probe component comprises a voltage test seat, a voltage test probe nut and a voltage probe spring, one end of the voltage test seat penetrates through a test probe mounting hole in the probe fixing seat and is locked on the probe fixing seat through the voltage probe nut, the voltage probe spring is arranged between the probe fixing seat and the voltage test seat, the other end of the voltage test seat is embedded into the voltage test mounting hole in the test probe base, the voltage test seat is internally provided with the voltage test probe mounting hole, the voltage test probe is mounted in the test probe mounting hole, the upper end of the voltage test probe extends to the outside of the probe fixing seat, and the lower end of the voltage test probe extends to the outside of the voltage test mounting hole in the test probe base.
4. The 1200A test probe of claim 2, wherein: the upper end of the current test probe mounting hole is provided with a current needle thread, and the lower end of the current test probe mounting hole is provided with a current connecting rod clamping groove.
5. A 1200A test probe according to claim 3, wherein: the upper end of the voltage test probe mounting hole is provided with a voltage pin thread, and the lower end of the voltage test probe mounting hole is provided with a voltage connecting rod clamping groove.
6. The 1200A test probe of claim 4, wherein: the current test probe comprises a current probe, a current probe spring, a current probe upper insulating ring, a current probe confining ring and a current insulating sleeve, wherein the upper end of the current probe penetrates through a current probe thread at the upper end of a current test probe mounting hole and is locked in the current probe thread through the current probe upper insulating ring, a probe spring mounting position is arranged on the current probe, the current probe spring is mounted in the probe spring mounting position and is locked on the current probe through the current probe confining ring, and the lower end of the current probe is embedded in a current connecting rod clamping groove at the lower end of the current test probe mounting hole and is locked in a current test mounting hole of a test probe base through the current insulating sleeve.
7. The 1200A test probe of claim 5, wherein: the voltage test probe comprises a voltage probe, a voltage probe spring, a voltage probe upper insulating ring, a voltage probe confining ring and a voltage insulating sleeve, wherein the upper end of the voltage probe penetrates through a voltage probe thread at the upper end of a voltage test probe mounting hole and is locked in the voltage probe thread through the voltage probe upper insulating ring, a probe spring mounting position is arranged on the voltage probe, the voltage probe spring is mounted in the probe spring mounting position and is locked on the voltage probe through the voltage probe confining ring, and the lower end of the voltage probe is embedded in a voltage connecting rod clamping groove at the lower end of the voltage test probe mounting hole and is locked in a voltage test mounting hole of a test probe base through the voltage insulating sleeve.
8. The 1200A test probe of claim 1, wherein: the copper bar switching wire device comprises a current copper bar switching wire seat, a voltage copper bar switching wire seat, a current copper bar switching wire and a voltage copper bar switching wire, wherein the current copper bar switching wire seat is arranged at the upper end of a current test seat and is locked at the upper end of the current test seat through a current probe nut, the current copper bar switching wire seat is provided with a current copper bar switching wire, and the current copper bar switching wire is electrically connected with a current test probe; the voltage copper bar switching wire seat is arranged at the upper end of the voltage testing seat and locked at the upper end of the voltage testing seat through the voltage probe nut, the voltage copper bar switching wire seat is provided with a voltage copper bar switching wire, and the voltage copper bar switching wire is electrically connected with the voltage testing probe.
9. The 1200A test probe of claim 8, wherein: the current copper bar switching wire seat and the voltage copper bar switching wire seat are L-shaped.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321840979.4U CN220626477U (en) | 2023-07-13 | 2023-07-13 | 1200A test probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321840979.4U CN220626477U (en) | 2023-07-13 | 2023-07-13 | 1200A test probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220626477U true CN220626477U (en) | 2024-03-19 |
Family
ID=90229582
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321840979.4U Active CN220626477U (en) | 2023-07-13 | 2023-07-13 | 1200A test probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220626477U (en) |
-
2023
- 2023-07-13 CN CN202321840979.4U patent/CN220626477U/en active Active
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