CN220419495U - Integrated circuit testing device - Google Patents
Integrated circuit testing device Download PDFInfo
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- CN220419495U CN220419495U CN202321843677.2U CN202321843677U CN220419495U CN 220419495 U CN220419495 U CN 220419495U CN 202321843677 U CN202321843677 U CN 202321843677U CN 220419495 U CN220419495 U CN 220419495U
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- 238000012360 testing method Methods 0.000 title claims abstract description 48
- 239000000428 dust Substances 0.000 claims abstract description 59
- 239000004065 semiconductor Substances 0.000 claims description 12
- 238000001816 cooling Methods 0.000 claims 11
- 230000005855 radiation Effects 0.000 abstract description 8
- 238000000034 method Methods 0.000 abstract description 7
- 238000001514 detection method Methods 0.000 abstract description 5
- 238000010438 heat treatment Methods 0.000 description 12
- 230000017525 heat dissipation Effects 0.000 description 6
- 238000005057 refrigeration Methods 0.000 description 6
- 230000001413 cellular effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 206010063385 Intellectualisation Diseases 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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Abstract
The utility model discloses an integrated circuit testing device, which comprises a workbench, supporting legs, a dust removing structure, a testing structure, a clamping structure and a heat radiating structure, wherein the supporting legs are arranged on the workbench; the landing leg fixed connection is in the bottom four corners of workstation, and dust removal structure fixed connection is in one side at workstation top, and test structure fixed connection is in one side that the dust removal structure was kept away from on the workstation top, and clamping structure fixed connection is in test structure's bottom, and heat radiation structure locates the inside of workstation. Compared with the prior art, the utility model has the advantages that: the utility model not only can remove dust on the integrated circuit board before testing, but also can continuously dissipate heat on the integrated circuit board in the testing process, thereby avoiding damage to the integrated circuit caused by overheat and further affecting the accuracy of the detection data of the integrated circuit.
Description
Technical Field
The utility model relates to the technical field of integrated circuit testing, in particular to an integrated circuit testing device.
Background
An integrated circuit is a miniature electronic device or component, which adopts a certain technology to interconnect the elements such as transistors, resistors, capacitors, inductors and the like required in a circuit together, and the elements are manufactured on a small semiconductor wafer or a medium substrate or a plurality of small semiconductor wafers, and then are packaged in a tube shell to form a miniature structure with the required circuit function, wherein all the elements are structurally combined into a whole, so that the electronic element has a great step towards microminiaturization, low power consumption, intellectualization and high reliability.
The patent number among the prior art is CN 216160768U's patent discloses an integrated circuit testing arrangement, the power distribution box comprises a box body, one side fixedly connected with motor of box, one side fixedly connected with threaded rod of motor, one side of threaded rod extends to the inside of box and through the inner wall swing joint of bearing and box, the both sides on threaded rod surface all overlap and are equipped with the screwed pipe, the top of screwed pipe is provided with the bracing piece, the top of bracing piece extends to the outside of box and fixedly connected with connecting plate, the fly leaf is all overlapped to front end and the rear end of connecting plate bottom, one side fixedly connected with supporting shoe of fly leaf, one side fixedly connected with fly leaf of supporting shoe, the surface of fly leaf and the inside sliding connection of connecting plate, the opposite side of fly leaf is provided with adjustment mechanism, the equal fixedly connected with first dead lever in both sides at box top. The utility model solves the problems that the existing testing device is inconvenient to carry out fixed test on integrated circuits with different specifications, is inconvenient for people to use and greatly reduces the testing efficiency.
However, the prior art patents suffer from several drawbacks:
(1) The prior art patent cannot remove dust from the integrated circuit board, dust can be attached to the integrated circuit board, resulting in inaccurate final detection results, and dust can easily be attached to the circuit board by manually placing the integrated circuit board.
(2) The prior art lacks a heat dissipation device, and the heat dissipation requirement of a high-power integrated circuit board can not be met during testing, so that the temperature of some devices with more heat is always reduced, and the devices are easy to damage.
Disclosure of Invention
The utility model aims to overcome the technical defects, and provides a dust-removing integrated circuit board which can remove dust before testing and continuously dissipate heat of the integrated circuit board in the testing process so as to avoid damage to the integrated circuit caused by overheat and further influence the accuracy of the detection data of the integrated circuit.
In order to solve the problems, the technical scheme of the utility model is as follows: an integrated circuit testing device comprises a workbench, supporting legs, a dust removing structure, a testing structure, a clamping structure and a heat radiating structure;
the landing leg fixed connection is in the bottom four corners of workstation, dust removal structure fixed connection is in one side at workstation top, test structure fixed connection is in one side that the dust removal structure was kept away from on the workstation top, clamping structure fixed connection is in test structure's bottom, heat radiation structure locates the inside of workstation.
Further, dust removal structure includes electric telescopic handle, the workstation top is equipped with the recess, electric telescopic handle fixed connection is in one side of recess, electric telescopic handle's one end that stretches out and draws back the end and keep away from electric telescopic handle is equipped with the push pedal, the interior back wall fixedly connected with dust removal fan of recess, the interior front wall fixedly connected with dust catcher of recess.
Further, the test structure includes the support frame, support frame fixedly connected with in the both sides of workstation top recess, the top fixedly connected with cylinder of support frame, the output fixedly connected with connecting plate of cylinder, the bottom of connecting plate is equipped with the detector, the detector both sides all are equipped with the clamp plate, fixedly connected with spring telescopic link between clamp plate and the connecting plate.
Further, the clamping structure comprises a handle, the both ends fixedly connected with connecting rod that one side of handle is close to the workstation, the cover has the spring between connecting rod and the recess inner wall, the central point put fixedly connected with gag lever post of handle, one side fixedly connected with dwang that the gag lever post is close to the handle, one side fixedly connected with limiting plate that the gag lever post is kept away from the handle, the workstation side is equipped with the rectangle through-hole that uses with the limiting plate cooperation, the one end fixedly connected with grip block that the handle was kept away from to the connecting rod, one side fixedly connected with rubber pad that the handle was kept away from to the grip block.
Further, the heat radiation structure includes the heating panel one, heating panel one fixed connection is in recess bottom, heating panel one bottom is equipped with the mounting panel, mounting panel surface mounting has radiator fan one, the inlet port has been seted up to radiator fan one's bottom, the mounting panel bottom is equipped with the semiconductor refrigeration piece, semiconductor refrigeration piece bottom is equipped with the heating panel two, one side that the heating panel two is close to the dust catcher is equipped with radiator fan two.
Compared with the prior art, the utility model has the advantages that:
(1) The dust removing structure is arranged on the dust collector, the integrated circuit board can be pushed between the fan and the dust collector through the electric telescopic rod, the fan blows dust on the integrated circuit board and sucks the dust away by the dust collector, dust removal is facilitated, meanwhile, dust contamination caused by manual contact with the circuit board is avoided, and the test accuracy is improved;
(2) The utility model is provided with the heat radiation structure, and the heat radiation fan can blow the cool air generated by the semiconductor refrigerating sheet to the bottom of the circuit board in the test process, so as to continuously cool and radiate the integrated circuit board working in the test process, thereby effectively avoiding the phenomenon of damage caused by overhigh temperature of the circuit board in the detection process.
Drawings
FIG. 1 is a perspective view of an integrated circuit testing apparatus according to the present utility model.
Fig. 2 is a top view of an integrated circuit testing device according to the present utility model.
FIG. 3 is a perspective view of a testing apparatus for integrated circuits according to the present utility model.
Fig. 4 is a perspective view of an integrated circuit testing device according to the present utility model.
As shown in the figure: 1. a work table; 2. a support leg; 3. a dust removal structure; 31. an electric telescopic rod; 32. a push plate; 33. a dust removal fan; 34. a dust collector; 4. a test structure; 41. a support frame; 42. a cylinder; 43. a connecting plate; 44. a spring telescoping rod; 45. a pressing plate; 46. a detector; 5. a clamping structure; 51. a handle; 52. a connecting rod; 53. a spring; 54. a rotating block; 55. a limit rod; 56. a limiting plate; 57. a clamping plate; 58. a rubber pad; 6. a heat dissipation structure; 61. a first heat dissipation plate; 62. a first heat radiation fan; 63. a mounting plate; 64. an air inlet hole; 65. a semiconductor refrigeration sheet; 66. a second heat dissipation plate; 67. and a second heat dissipation fan.
Detailed Description
Specific embodiments of the present utility model will be further described below with reference to the accompanying drawings. Wherein like parts are designated by like reference numerals.
It should be noted that the words "front", "rear", "left", "right", "upper" and "lower" used in the following description refer to directions in the drawings, and the words "inner" and "outer" refer to directions toward or away from, respectively, the geometric center of a particular component.
In order to make the contents of the present utility model more clearly understood, the technical solutions in the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model.
As shown in fig. 1 to 4, an integrated circuit testing device comprises a workbench 1, a supporting leg 2, a dust removing structure 3, a testing structure 4, a clamping structure 5 and a heat radiating structure 6; the landing leg 2 fixed connection is in the bottom four corners of workstation 1, and dust removal structure 3 fixed connection is in one side at workstation 1 top, and test structure 4 fixed connection is in one side that dust removal structure 3 was kept away from on workstation 1 top, and clamping structure 5 fixed connection is in test structure 4's bottom, and heat radiation structure 6 locates the inside of workstation 1.
The dust collection structure 3 includes electric telescopic rod 31, workstation 1 top is equipped with the recess, electric telescopic rod 31 fixed connection is in one side of recess, electric telescopic rod 31's one end that stretches out and draws the end to keep away from electric telescopic rod 31 is equipped with push pedal 32, push pedal 32's bottom is slightly higher than the recess bottom, push pedal 32 is soft rubber material and avoids causing the damage to the circuit board, the interior back wall fixedly connected with dust removal fan 33 of recess, the interior front wall fixedly connected with dust catcher 34 of recess, dust removal fan 33 and dust catcher 34 are located same water flat line, when electric telescopic rod 31 will place the integrated circuit board slowly push to dust removal fan 33 and dust catcher 34 between, dust removal fan 33 blows up the dust on the integrated circuit board, dust catcher 34 will blow up the dust and absorb in the dust collection box of dust catcher 34 inside as much as possible simultaneously.
The test structure 4 includes support frame 41, support frame 41 fixedly connected with in the both sides of workstation 1 top recess, the top fixedly connected with cylinder 42 of support frame 41, the output fixedly connected with connecting plate 43 of cylinder 42, the bottom of connecting plate 43 is equipped with detector 46, the detector 46 both sides all are equipped with clamp plate 45, fixedly connected with spring telescopic link 44 between clamp plate 45 and the connecting plate 43, cylinder 42 drives detector 46 and clamp plate 45 downwardly moving through connecting plate 43 during the use, adjust clamp plate 45 under spring telescopic link 44 effect and further limit the integrated circuit board, detector 46 tests integrated circuit this moment.
The clamping structure 5 comprises a handle 51, a connecting rod 52 is fixedly connected to two ends of one side of the handle 51, which is close to the workbench 1, a spring 53 is sleeved between the connecting rod 52 and the inner wall of the groove, one end of the connecting rod 52, which is far away from the handle 51, is fixedly connected with a clamping plate 57, one side of the clamping plate 57, which is far away from the handle 51, is fixedly connected with a rubber pad 58, the rubber pad 58 is soft enough, damage to an integrated circuit is avoided, the friction force of a rubber material is large, the integrated circuit can be better fixed, a limiting rod 55 is fixedly connected to the central position of the handle 51, a rotating block 54 is fixedly connected to one side of the limiting rod 55, which is close to the handle 51, a limiting plate 56 is fixedly connected to one side of the limiting rod 55, which is far away from the handle 51, a rectangular through hole matched with the limiting plate 56 is formed in the side of the workbench 1, the limiting plate 56 is driven by the rotating block 54 through the handle 51 during use, the fixing of the clamping structure 5 is realized, and when the integrated circuit board is clamped, the rotating block 54 is only needs to rotate again, and the limiting plate 56 is enabled to pass through the rectangular through the side hole of the workbench 1, and the stable clamping of the integrated circuit board is completed under the effect of the spring 53.
The heat radiation structure 6 includes the first 61 of heating panel, the first 61 of heating panel fixed connection is in the recess bottom, the first 61 of heating panel adopts cellular through-hole structure, the radiating efficiency is higher, the first 61 of heating panel bottom is equipped with mounting panel 63, mounting panel 63 surface mounting has radiator fan one 62, the inlet port 64 has been seted up to radiator fan one 62's bottom, mounting panel 63 bottom is equipped with semiconductor refrigeration piece 65, the low temperature air that semiconductor refrigeration piece 65 produced is continuously blown to the bottom of integrated circuit board by radiator fan one 62 through inlet port 64, can last to dispel the heat the temperature to the circuit board in the test process, avoid the integrated circuit and influence the error of integrated circuit detection data, the second 66 of heating panel is equipped with the heating panel, one side that the second 66 of heating panel is close to the dust catcher 34 is equipped with radiator fan two 67, radiator panel two 66 also adopt the cellular through-hole structure that the heat dispersion is better, radiator fan two 67 can accelerate the circulation of the heat that two 66 bottoms were given off, avoid semiconductor refrigeration piece 65 overload.
In specific use, firstly, the integrated circuit board to be tested is placed in the groove at the top of the workbench 1, when the electric telescopic rod 31 is started to slowly push the placed integrated circuit board to a position between the dust removing fan 33 and the dust collector 34, the dust removing fan 33 blows dust on the integrated circuit board, meanwhile, the dust collector 34 sucks the blown dust into the dust collection box inside the dust collector 34 as much as possible, afterwards, the electric telescopic rod 31 pushes the integrated circuit board to the center position of the first radiating plate 61, afterwards, the rotating blocks 54 at the front side, the rear side and the right side of the workbench are rotated, the limiting plate 56 passes through the rectangular through holes at the side of the workbench 1, the clamping plate 57 is enabled to finish stable clamping of the integrated circuit board under the action of the spring 53, then the air cylinder 42 is started to drive the detector 46 and the pressing plate 45 to move downwards under the action of the spring telescopic rod 44, the pressing plate 45 further limits the integrated circuit board, at the moment, the detector 46 tests the integrated circuit, the semiconductor refrigerating plate 65 and the second radiating fan 67 are started simultaneously in the testing process, the generated low-temperature air is continuously blown to the bottom of the first radiating plate 62 through the air inlet 64, the second radiating plate is continuously tested to the bottom of the first radiating plate 62, the second radiating plate is prevented from being influenced by the second radiating plate, and the second radiating plate is continuously cooled down, the second radiating plate is prevented from the second radiating error is continuously influenced by the second radiating plate, and the heat of the second radiating plate is continuously cooled down, and the second radiating plate is further, and the second radiating plate, and the heat is further, and the second, and the heat is further, and the heat.
The utility model and its embodiments have been described above with no limitation, and the actual construction is not limited to the embodiments of the utility model as shown in the drawings. In summary, if one of ordinary skill in the art is informed by this disclosure, a structural manner and an embodiment similar to the technical solution should not be creatively devised without departing from the gist of the present utility model.
Claims (5)
1. An integrated circuit testing device, characterized in that: the device comprises a workbench (1), supporting legs (2), a dust removing structure (3), a testing structure (4), a clamping structure (5) and a heat radiating structure (6);
the support leg (2) is fixedly connected to the four corners of the bottom of the workbench (1), the dust removing structure (3) is fixedly connected to one side of the top of the workbench (1), the test structure (4) is fixedly connected to one side, far away from the dust removing structure (3), of the top end of the workbench (1), the clamping structure (5) is fixedly connected to the bottom of the test structure (4), and the heat radiating structure (6) is arranged inside the workbench (1).
2. An integrated circuit testing device according to claim 1, wherein: the dust removing structure (3) comprises an electric telescopic rod (31), a groove is formed in the top of the workbench (1), the electric telescopic rod (31) is fixedly connected to one side of the groove, the electric telescopic rod (31) is close to a push plate (32) fixedly connected with a heat radiating structure (6), a dust removing fan (33) is fixedly connected to the middle of a groove wall on one side in the groove, and a dust collector (34) is fixedly connected to the groove wall on one side, away from the dust removing fan (33), inside the groove.
3. An integrated circuit testing device according to claim 1, wherein: the test structure (4) comprises a supporting frame (41), the supporting frame (41) is fixedly connected to two sides of a groove at the top of the workbench (1), an air cylinder (42) is fixedly connected to the top of the supporting frame (41), a connecting plate (43) is fixedly connected to the output end of the air cylinder (42), the connecting plate (43) is located at the bottom of the closed end of the supporting frame (41), a detector (46) is arranged at the bottom end of the connecting plate (43), pressing plates (45) are arranged on two sides of the detector (46), and a spring telescopic rod (44) is fixedly connected between the pressing plates (45) and the connecting plate (43).
4. An integrated circuit testing device according to claim 1, wherein: the clamping structure (5) comprises a handle (51), two ends of one side of the handle (51) close to a workbench (1) are fixedly connected with a connecting rod (52), a spring (53) is sleeved between the connecting rod (52) and the inner wall of a groove, a limiting rod (55) is fixedly connected with the center position of the handle (51), a rotating block (54) is fixedly connected with one side of the limiting rod (55) close to the handle (51), a limiting plate (56) is fixedly connected with one side of the limiting rod (55) away from the handle (51), a rectangular through hole matched with the limiting plate (56) is formed in the side face of the workbench (1), one end of the connecting rod (52) away from the handle (51) is fixedly connected with a clamping plate (57), and one side of the clamping plate (57) away from the handle (51) is fixedly connected with a rubber pad (58).
5. An integrated circuit testing device according to claim 1, wherein: the cooling structure (6) comprises a first cooling plate (61), the first cooling plate (61) is fixedly connected to the bottom of the groove, a mounting plate (63) is arranged at the bottom of the first cooling plate (61), a first cooling fan (62) is arranged on the surface of the mounting plate (63), an air inlet hole (64) is formed in the bottom of the first cooling fan (62), a semiconductor cooling plate (65) is arranged at the bottom of the mounting plate (63), a second cooling plate (66) is arranged at the bottom of the semiconductor cooling plate (65), and a second cooling fan (67) is arranged on one side, close to the dust collector (34), of the second cooling plate (66).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321843677.2U CN220419495U (en) | 2023-07-13 | 2023-07-13 | Integrated circuit testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321843677.2U CN220419495U (en) | 2023-07-13 | 2023-07-13 | Integrated circuit testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220419495U true CN220419495U (en) | 2024-01-30 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321843677.2U Active CN220419495U (en) | 2023-07-13 | 2023-07-13 | Integrated circuit testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220419495U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117890772A (en) * | 2024-03-18 | 2024-04-16 | 盐城市嘉鸿微电子有限公司 | Adjustable integrated circuit test fixture |
-
2023
- 2023-07-13 CN CN202321843677.2U patent/CN220419495U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117890772A (en) * | 2024-03-18 | 2024-04-16 | 盐城市嘉鸿微电子有限公司 | Adjustable integrated circuit test fixture |
| CN117890772B (en) * | 2024-03-18 | 2024-05-28 | 盐城市嘉鸿微电子有限公司 | Adjustable integrated circuit test fixture |
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