CN220323357U - Sensor high temperature performance test system - Google Patents

Sensor high temperature performance test system Download PDF

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Publication number
CN220323357U
CN220323357U CN202320786736.0U CN202320786736U CN220323357U CN 220323357 U CN220323357 U CN 220323357U CN 202320786736 U CN202320786736 U CN 202320786736U CN 220323357 U CN220323357 U CN 220323357U
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sensor
temperature
test system
performance test
data acquisition
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CN202320786736.0U
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Inventor
邸甲峻
罗少杰
王颖
徐北
***
吴鹏
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SHAANXI WEIFENG NUCLEAR INSTRUMENT Inc
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SHAANXI WEIFENG NUCLEAR INSTRUMENT Inc
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Abstract

The utility model relates to a sensor high-temperature performance test system, in particular to an acceleration sensor high-temperature performance test system, which comprises a vibration exciter, a high-temperature environment box, a data acquisition card and a data storage module, wherein a standard sensor and a long connecting rod are arranged on the vibration exciter, a tested sensor is arranged at the other end of the long connecting rod, and the tested sensor is positioned in the high-temperature environment box; according to the utility model, the temperature in the high-temperature environment box is regulated by controlling the heating component through the controller, so that each performance test is carried out on the tested sensor in the environment of 0-650 ℃, parameters such as the working frequency range, the relation of sensitivity along with temperature change and the like of the tested sensor in different temperature environments are obtained, and then the parameters are compared with each performance parameter value of the standard sensor, so that the stability of each performance of the acceleration sensor in different temperature environments is analyzed, and the high-temperature performance parameter test index of the acceleration sensor is perfected.

Description

Sensor high temperature performance test system
Technical Field
The utility model relates to a high-temperature performance test system of a sensor, in particular to a high-temperature performance test system of an acceleration sensor.
Background
At present, an acceleration sensor is usually subjected to vibration test on normal temperature test equipment, wherein stability and service life are important indexes of the test and mainly depend on performance stability of sensitive meta-materials and stability of a sensor structure; in addition, there are important indexes such as the relation between the operating frequency range and the sensitivity of the acceleration sensor with the temperature change, but these indexes cannot be realized only by the normal temperature test equipment.
Therefore, the high-temperature performance testing system of the sensor is provided for testing the high-temperature performance parameters of the acceleration sensor under different temperature environments.
Disclosure of Invention
The utility model aims to provide a sensor high-temperature performance test system, which mainly solves the technical problems in the prior art.
In order to achieve the above purpose, the present utility model provides the following technical solutions:
a sensor high temperature performance test system comprising:
the vibration exciter is provided with a standard sensor and a long connecting rod, the other end of the long connecting rod is provided with a sensor to be tested, and the input end of the vibration exciter is electrically connected with a signal generator through a power amplifier and is used for driving the vibration exciter to vibrate;
the high-temperature environment box is used for providing a high-temperature test environment for the tested sensor;
the output end of the standard sensor is electrically connected with the data acquisition card through a first charge amplifier, the output end of the tested sensor is electrically connected with the data acquisition card through a second charge amplifier, and the data acquisition card is used for collecting electric signals output by the first charge amplifier and the second charge amplifier and obtaining various performance parameters of the standard sensor and the tested sensor;
the data storage module is electrically connected with the data acquisition card and used for storing various performance parameters of the standard sensor and the measured sensor obtained by the data acquisition card.
Preferably, the frequency range of the vibration exciter is 20kHz, and the rated force is larger than 20N.
Preferably, the acquisition frequency of the data acquisition card is not less than 100kHz.
Preferably, a closed cavity is arranged in the high-temperature environment box and is used for accommodating the sensor to be tested;
a heating component and a temperature sensor are arranged in the high-temperature environment box, and the heating component and the temperature sensor are respectively and electrically connected with a controller and an external power supply;
the heating temperature of the heating component is set to be 0-650 ℃.
Preferably, the data storage module is configured as a computer.
Preferably, the signal generator is capable of emitting a sinusoidal wave of 20 kHz.
Compared with the prior art, the utility model has the beneficial effects that:
according to the utility model, the temperature in the high-temperature environment box is regulated by controlling the heating component through the controller, and the temperature sensor is used for monitoring, so that the measured sensor performs various performance tests in the environment of 0-650 ℃, and parameters such as the working frequency range, the relation of sensitivity along with temperature change and the like of the measured sensor in different temperature environments are obtained, and then the parameters are compared with various performance parameter values of the standard sensor, so that the stability of various performances of the acceleration sensor in different temperature environments is analyzed, and the high-temperature performance parameter test index of the acceleration sensor is perfected.
Drawings
In order to more clearly illustrate the embodiments of the present utility model or the technical solutions in the prior art, the drawings that are needed in the description of the embodiments or the prior art will be briefly described, and it is obvious that the drawings in the description below are some embodiments of the present utility model, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.
FIG. 1 is a block diagram of a sensor high temperature performance test system of the present utility model;
in the figure: the vibration exciter 1, the high-temperature environment box 2, the heating component 3, the temperature sensor 4, the standard sensor 5, the long connecting rod 6, the measured sensor 7, the signal generator 8, the power amplifier 9, the first charge amplifier 10, the second charge amplifier 11, the data acquisition card 12 and the data storage module 13.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
As shown in fig. 1, the utility model provides a sensor high-temperature performance test system, which comprises a vibration exciter 1, a high-temperature environment box 2, a data acquisition card 12 and a data storage module 13, wherein a standard sensor 5 and a long connecting rod 6 are fixedly arranged on a vibration table of the vibration exciter 1 (the frequency range is 20kHz, the rated force is larger than 20N), a tested sensor 7 is fixedly arranged at the other end of the long connecting rod 6, and a signal input end of the vibration exciter 1 is electrically connected with a signal generator 8 (capable of emitting a sine wave of 20 kHz) through a power amplifier 9 and is used for driving the vibration exciter 1 to vibrate; the measured sensor 7 is positioned in the high-temperature environment box 2, and the high-temperature environment box 2 is used for providing a high-temperature test environment for the measured sensor 7; the inside of the high-temperature environment box 2 is provided with a closed cavity for accommodating a tested sensor 7, and the high-temperature environment box 2 is also internally provided with a heating component 3 and a temperature sensor 4 (the model is TK50PT 100), and the heating component 3 and the temperature sensor 4 are respectively and electrically connected with a controller (a PC-20-F20B-0000 controller is selected) and an external power supply for adjusting and controlling the testing temperature in the high-temperature environment box 2; the output end of the standard sensor 5 is electrically connected with a data acquisition card 12 (the acquisition frequency is not less than 100 kHz) through a first charge amplifier 10, the output end of the measured sensor 7 is electrically connected with the data acquisition card 12 through a second charge amplifier 11, and the data acquisition card 12 is used for collecting electric signals output by the first charge amplifier 10 and the second charge amplifier 11 (the frequency ranges of the first charge amplifier 10 and the second charge amplifier 11 are DC-40 kHZ) and obtaining various performance parameters of the standard sensor 5 and the measured sensor 7; the data storage module 13 is set as a computer, and the computer is electrically connected with the data acquisition card 12 and is used for storing various performance parameters of the standard sensor 5 and the tested sensor 7 obtained by the data acquisition card 12, so that the subsequent check is facilitated.
In this embodiment, when the performance test is performed on the acceleration sensor, the high-temperature performance test system for the sensor provides two acceleration sensors at first, one of the two acceleration sensors is fixedly installed on the vibration table of the vibration exciter 1 as a standard sensor 5, the other acceleration sensor is fixedly installed on the vibration table of the vibration exciter 1 as a tested sensor 7 through a long connecting rod 6, the tested sensor 7 is placed in the high-temperature environment box 2, then the control signal generator 8 sends out a driving signal, the driving signal is amplified and regulated through the power amplifier 9 and then is input to the vibration exciter 1, the vibration exciter 1 is driven to vibrate, the standard sensor 5 and the tested sensor 7 are driven to vibrate synchronously, then the output signals of the standard sensor 5 and the tested sensor 7 are processed through the first charge amplifier 10 and the second charge amplifier 11 respectively, and the processed output signals are sent to the data acquisition card 12, so that the data acquisition card 12 obtains various performance parameters of the standard sensor 5 and the tested sensor 7 and stores the data into a computer; meanwhile, in the testing process, the temperature in the high-temperature environment box 2 is regulated by controlling the heating component 3 through the controller, and the temperature sensor 4 is used for monitoring, so that each performance test of the tested sensor 7 is carried out in the environment of 0-650 ℃, parameters such as the working frequency range, the relation of the sensitivity along with the temperature change and the like of the tested sensor 7 in the environment of different temperatures are obtained, and then the parameters are compared with each performance parameter value of the standard sensor 5, so that the stability of each performance of the acceleration sensor in the environment of different temperatures is analyzed, and the high-temperature performance parameter test index of the acceleration sensor is perfected.
It should be noted that: the heating element 3 in this embodiment adopts the resistance heating principle, and uses heat energy generated by the joule effect of current flowing through the conductor to heat the material, so long as the heating of the inside of the high-temperature environment tank 2 to the range of 0 ℃ to 650 ℃ can be achieved, and the heating method is not limited to the heating method described in this embodiment.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present utility model, and not for limiting the same; although the utility model has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some or all of the technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the utility model.

Claims (6)

1. The high-temperature performance test system of the sensor is characterized by comprising:
the vibration exciter (1), a standard sensor (5) and a long connecting rod (6) are arranged on the vibration exciter (1), a tested sensor (7) is arranged at the other end of the long connecting rod (6), and the input end of the vibration exciter (1) is electrically connected with a signal generator (8) through a power amplifier (9) and is used for driving the vibration exciter (1) to vibrate;
a high-temperature environment box (2), wherein the detected sensor (7) is positioned in the high-temperature environment box (2), and the high-temperature environment box (2) is used for providing a high-temperature test environment for the detected sensor (7);
the data acquisition card (12), the output end of the standard sensor (5) is electrically connected with the data acquisition card (12) through a first charge amplifier (10), the output end of the tested sensor (7) is electrically connected with the data acquisition card (12) through a second charge amplifier (11), and the data acquisition card (12) is used for collecting the electric signals output by the first charge amplifier (10) and the second charge amplifier (11) and obtaining various performance parameters of the standard sensor (5) and the tested sensor (7);
the data storage module (13) is electrically connected with the data acquisition card (12) and is used for storing various performance parameters of the standard sensor (5) and the tested sensor (7) obtained by the data acquisition card (12);
the frequency ranges of the first charge amplifier (10) and the second charge amplifier (11) are both DC-40kHZ.
2. The sensor high temperature performance test system of claim 1, wherein: the frequency range of the vibration exciter (1) is 20kHz, and the rated force is larger than 20N.
3. The sensor high temperature performance test system of claim 1, wherein: the acquisition frequency of the data acquisition card (12) is not less than 100kHz.
4. The sensor high temperature performance test system of claim 1, wherein: the inside of the high-temperature environment box (2) is provided with a closed cavity for accommodating a sensor (7) to be tested;
a heating component (3) and a temperature sensor (4) are arranged in the high-temperature environment box (2), and the heating component (3) and the temperature sensor (4) are respectively and electrically connected with a controller and an external power supply;
the heating temperature range of the heating component (3) is set to be 0-650 ℃.
5. The sensor high temperature performance test system of claim 1, wherein: the data storage module (13) is configured as a computer.
6. The sensor high temperature performance test system of claim 1, wherein: the signal generator (8) is capable of emitting a sinusoidal wave of 20 kHz.
CN202320786736.0U 2023-04-10 2023-04-10 Sensor high temperature performance test system Active CN220323357U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202320786736.0U CN220323357U (en) 2023-04-10 2023-04-10 Sensor high temperature performance test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202320786736.0U CN220323357U (en) 2023-04-10 2023-04-10 Sensor high temperature performance test system

Publications (1)

Publication Number Publication Date
CN220323357U true CN220323357U (en) 2024-01-09

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202320786736.0U Active CN220323357U (en) 2023-04-10 2023-04-10 Sensor high temperature performance test system

Country Status (1)

Country Link
CN (1) CN220323357U (en)

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