CN220171157U - High-current lever elastic sheet and test jig - Google Patents
High-current lever elastic sheet and test jig Download PDFInfo
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- CN220171157U CN220171157U CN202320927482.XU CN202320927482U CN220171157U CN 220171157 U CN220171157 U CN 220171157U CN 202320927482 U CN202320927482 U CN 202320927482U CN 220171157 U CN220171157 U CN 220171157U
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- 238000012360 testing method Methods 0.000 title claims abstract description 49
- 230000009471 action Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
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- 239000000523 sample Substances 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
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Abstract
The utility model relates to the technical field of test equipment, and particularly discloses a high-current lever elastic sheet and a test fixture. The high-current lever elastic sheet and the testing jig provided by the utility model can effectively solve the problem of insufficient upward elasticity of the existing testing elastic sheet.
Description
Technical Field
The utility model relates to the technical field of test equipment, in particular to a high-current lever spring plate and a test fixture.
Background
Referring to fig. 1, the existing test fixture includes:
the jig comprises a jig body 1, wherein the jig body 1 is provided with a piece placing groove 101 for accommodating a device to be tested;
a test spring 2, wherein the test spring 2 is installed below the part placing groove 101;
and the jacking spring 3 is positioned below the test elastic sheet 2 and is used for jacking the test elastic sheet 2 upwards so that the test elastic sheet 2 can be fully contacted with a device to be tested, and test abnormality caused by poor contact is avoided.
Because the upward elasticity of the existing test elastic sheet 2 is insufficient, the jacking spring 3 is required to be arranged below the test elastic sheet 2, however, after the jacking spring 3 is additionally arranged, the material cost is increased, the assembly steps are increased, and the production cost is greatly increased.
Therefore, an improvement is needed to the existing test spring to solve the problem of insufficient upward elasticity.
The above information disclosed in this background section is only included to enhance understanding of the background of the disclosure and therefore may contain information that does not form the prior art that is presently known to those of ordinary skill in the art.
Disclosure of Invention
An object of the present utility model is to provide a high-current lever spring and a test fixture, which can effectively solve the problem of insufficient upward elasticity of the existing test spring.
In order to achieve the above object, in one aspect, the present utility model provides a high-current lever spring, which includes an abutting portion for contacting a device to be tested, a transverse portion with one end fixedly connected to the abutting portion, a longitudinal portion connected to the other end of the transverse portion and extending downward, and a fixing assembly connected to the lower end of the longitudinal portion.
Optionally, the transverse portion is in an upwardly arched configuration.
Optionally, the thickness dimension of the transverse portion is smaller than the thickness dimension of the longitudinal portion.
Optionally, the abutting portion and the transverse portion, the transverse portion and the longitudinal portion, and the longitudinal portion and the fixing component are all formed by stamping.
Optionally, the fixing component comprises a base plate connected with the lower end of the longitudinal part and a fixing block fixedly arranged on the base plate.
Optionally, the pin part is connected with the fixing component and is positioned on one side of the fixing component away from the longitudinal part.
Optionally, the pin part is in an L-shaped structure.
In another aspect, a test fixture is provided, comprising:
the jig comprises a jig body, wherein the jig body is provided with a piece placing groove for accommodating a device to be tested, a spring piece groove positioned below the piece placing groove and a through groove communicated with the spring piece groove and the piece placing groove;
the high-current lever spring plate comprises a jig body, wherein a fixing component of the high-current lever spring plate is fixedly connected with the jig body, a transverse part and a longitudinal part of the high-current lever spring plate are positioned in the spring plate groove, and a butt part of the high-current lever spring plate upwards extends into the piece placing groove through the through groove.
Optionally, the jig body is further provided with a pin groove for accommodating the pin part of the high-current lever elastic sheet.
The utility model has the beneficial effects that: when the device to be tested needs to be electrically detected, a test contact on the bottom surface of the device to be tested is placed in a piece placing groove, the contact part is pressed downwards, the contact part transmits the downward pressure of the device to be tested to a transverse part and a longitudinal part, one end of the transverse part, which is far away from the longitudinal part, is bent downwards by taking the connection position of the transverse part and the longitudinal part as a fulcrum, and the deformation can enable one end of the transverse part, which is far away from the longitudinal part, to have a larger deformation restoring force, so that larger upward elastic force can be provided for the contact part, and the contact part is forced to be pressed upwards to tightly press the device to be tested, so that poor contact between the device to be tested and the contact part is avoided;
further, when the transverse portion is bent downwards by taking the connection position of the transverse portion and the longitudinal portion as a fulcrum, the longitudinal portion is bent downwards by taking the connection position between the longitudinal portion and the fixing assembly as a fulcrum, and the deformation further increases the upward elastic force provided to the abutting portion, so that the abutting portion fully pushes up the device to be tested;
therefore, the high-current lever elastic sheet and the testing jig provided by the utility model can effectively solve the problem of insufficient upward elasticity of the existing testing elastic sheet, and can also push up a device to be tested without using a testing spring, thereby avoiding abnormal testing caused by poor contact.
Drawings
In order to more clearly illustrate the embodiments of the utility model or the technical solutions of the prior art, the drawings which are used in the description of the embodiments or the prior art will be briefly described, it being obvious that the drawings in the description below are only some embodiments of the utility model, and that other drawings can be obtained from these drawings without inventive faculty for a person skilled in the art.
FIG. 1 is a schematic diagram of a conventional test fixture according to the background art;
FIG. 2 is an overall schematic diagram of a test fixture according to an embodiment;
fig. 3 is a schematic cross-sectional view of a test fixture according to an embodiment.
In the figure:
1. a jig body; 101. a piece placing groove; 102. spring plate grooves; 103. a through groove; 104. a pin slot;
2. testing the spring plate;
3. a spring is tightly propped;
4. a high-current lever spring plate; 401. an abutting portion; 402. a transverse portion; 403. a longitudinal portion; 404. a fixing assembly; 4041. a substrate; 4042. a fixed block; 405. a pin part.
Detailed Description
In order to make the objects, features and advantages of the present utility model more obvious and understandable, the technical solutions of the embodiments of the present utility model will be clearly and completely described below with reference to the drawings in the embodiments of the present utility model, and it is apparent that the embodiments described below are only some embodiments of the present utility model, not all embodiments of the present utility model. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
In the description of the present utility model, it will be understood that when one component is referred to as being "connected" to another component, it can be directly connected to the other component or intervening components may also be present. When an element is referred to as being "disposed on" another element, it can be directly on the other element or intervening elements may also be present.
Furthermore, the terms "long," "short," "inner," "outer," and the like, as used herein, refer to an orientation or positional relationship based on that shown in the drawings, for convenience of description of the present utility model, and are not intended to indicate or imply that the apparatus or elements referred to must have this particular orientation, operate in a particular orientation configuration, and thus should not be construed as limiting the utility model.
The present utility model will be described in detail below with reference to specific embodiments shown in the drawings. These embodiments are not intended to limit the utility model and structural, methodological, or functional modifications of these embodiments that may be made by one of ordinary skill in the art are included within the scope of the utility model.
The utility model provides a high-current lever spring plate and a test jig, which are suitable for an application scene of electrically connecting a device to be tested to a test main board so as to electrically test the device to be tested, and can effectively solve the problem of insufficient upward elasticity of the existing test spring plate.
Referring to fig. 2 and 3, the test fixture provided in this embodiment includes a fixture body 1 and a plurality of high-current lever spring plates 4 for electrically connecting a device to be tested to a test motherboard.
The fixture body 1 is provided with a piece placing groove 101 for accommodating a device to be tested, a spring piece groove 102 positioned below the piece placing groove 101, a through groove 103 for communicating the spring piece groove 102 with the piece placing groove 101, and a pin groove 104 penetrating downwards through the fixture body 1.
The high-current lever spring 4 comprises an abutting part 401 for contacting with a device to be tested, a transverse part 402 with one end fixedly connected with the abutting part 401, a longitudinal part 403 connected with the other end of the transverse part 402 and extending downwards, a fixing assembly 404 connected with the lower end of the longitudinal part 403, and a pin part 405 connected with the fixing assembly 404 and positioned on one side of the fixing assembly 404 away from the longitudinal part 403.
Further, the fixing assembly 404 includes a base plate 4041 connected to a lower end of the longitudinal portion 403 and a fixing block 4042 fixed to the base plate 4041.
Specifically, the fixing component 404 is fixedly connected with the fixture body 1; the transverse part 402 and the longitudinal part 403 of the high-current lever spring 4 are positioned in the spring slot 102, the spring slot 102 has a larger size, and the transverse part 402 and the longitudinal part 403 have sufficient deformation space; the abutting part 401 of the high-current lever spring plate 4 extends upwards into the piece placing groove 101 through the through groove 103 so as to be in contact electrical connection with a test contact at the bottom of the device to be tested.
Further, the lead portion 405 is located in the inner lead slot 104 and extends downward from the lead slot 104 in an L-shaped configuration for electrical connection with the test motherboard.
When the device to be tested needs to be electrically tested, the device to be tested is placed in the piece placing groove 101, a test contact on the bottom surface of the device to be tested is contacted with the abutting part 401, the abutting part 401 is pressed downwards, the abutting part 401 transmits the downward pressure of the device to be tested to the transverse part 402 and the longitudinal part 403, one end of the transverse part 402, far away from the longitudinal part 403, is bent downwards by taking the connecting position of the transverse part 402 and the longitudinal part 403 as a fulcrum, and the deformation can enable one end of the transverse part 402, far away from the longitudinal part 403, to have a larger deformation restoring force, so that larger upward elastic force can be provided for the abutting part 401, the abutting part 401 is forced to be pressed upwards to tightly abut against the device to be tested, and poor contact between the device to be tested and the abutting part 401 is avoided, and the process is a primary lever effect;
further, when the lateral portion 402 is bent downward with the connection position between the lateral portion 402 and the longitudinal portion 403 as a fulcrum, the longitudinal portion 403 is bent and deformed in a direction away from the fixing component 404 with the connection position between the longitudinal portion 403 and the fixing component 404 as a fulcrum, and the deformation further increases the upward elastic force provided to the abutting portion 401, so that the abutting portion 401 sufficiently abuts against the device to be tested, and the process is a secondary lever action;
therefore, the high-current lever spring piece 4 and the testing jig provided by the embodiment can effectively solve the problem of insufficient upward elasticity of the existing testing spring piece 2 through the action of the lever twice, and can also push up the device to be tested even if the testing spring is not used, thereby reducing the material cost of the testing spring piece 2 and omitting the assembly step of the testing spring piece 2.
In this embodiment, the transverse portion 402 has an arc structure slightly arched upward, which is beneficial to increasing the upward thrust provided by the transverse portion 402 to the abutment portion 401.
In this embodiment, the longitudinal portion 403 serves as a deformation fulcrum for the transverse portion 402, so that the structural strength of the longitudinal portion 403 is high, and the thickness dimension of the transverse portion 402 can be made smaller than the thickness dimension of the longitudinal portion 403.
In this embodiment, the abutting portion 401 and the transverse portion 402, the transverse portion 402 and the longitudinal portion 403, and the longitudinal portion 403 and the fixing component 404 are all formed by press forming, and the high-current lever spring 4 can be obtained by one press forming operation, so that the production efficiency is high.
It should be noted that, if the spring probe is used for electrical connection, since the contact area between the spring probe and the device to be tested is smaller, the test current generally can only pass through the test current lower than 40A, but the contact area between the current lever spring 4 and the device to be tested is larger, the single large current lever spring 4 can pass 45A current, and the whole test fixture can pass 2000A current, which can be understood that the number of the large current lever spring can be further increased or reduced according to different large current requirements.
It should be understood that although the present disclosure describes embodiments, not every embodiment is provided with a separate embodiment, and that this description is for clarity only, and that the skilled artisan should recognize that the embodiments may be combined as appropriate to form other embodiments that will be understood by those skilled in the art.
The above list of detailed descriptions is only specific to practical embodiments of the present utility model, and they are not intended to limit the scope of the present utility model, and all equivalent embodiments or modifications that do not depart from the spirit of the present utility model should be included in the scope of the present utility model.
Claims (9)
1. The high-current lever spring piece (4) is characterized by comprising an abutting part (401) for contacting a device to be tested, a transverse part (402) with one end fixedly connected with the abutting part (401), a longitudinal part (403) connected with the other end of the transverse part (402) and extending downwards, and a fixing assembly (404) connected with the lower end of the longitudinal part (403).
2. The high current lever spring (4) of claim 1 wherein the transverse portion (402) is in an upwardly arched arcuate configuration.
3. The high-current lever dome (4) according to claim 1, characterized in that the thickness dimension of the transverse portion (402) is smaller than the thickness dimension of the longitudinal portion (403).
4. The high-current lever spring (4) according to claim 1, wherein the abutment portion (401) and the lateral portion (402), the lateral portion (402) and the longitudinal portion (403), and the longitudinal portion (403) and the fixing member (404) are each of a press-formed connection structure.
5. The high-current lever spring (4) according to claim 1, wherein the fixing assembly (404) comprises a base plate (4041) connected with the lower end of the longitudinal portion (403) and a fixing block (4042) fixedly arranged on the base plate (4041).
6. The high current lever spring (4) according to claim 1, further comprising a pin portion (405) connected to the fixing member (404) and located on a side of the fixing member (404) remote from the longitudinal portion (403).
7. The high current lever clip (4) of claim 6, wherein the pin portion (405) is L-shaped in configuration.
8. A test fixture, its characterized in that includes:
the jig comprises a jig body (1), wherein the jig body (1) is provided with a piece placing groove (101) for accommodating a device to be tested, a spring piece groove (102) positioned below the piece placing groove (101) and a through groove (103) communicated with the spring piece groove (102) and the piece placing groove (101);
the high-current lever spring piece (4) according to any one of claims 1 to 7, wherein a fixing component (404) of the high-current lever spring piece (4) is fixedly connected with the jig body (1), a transverse portion (402) and a longitudinal portion (403) of the high-current lever spring piece (4) are positioned in the spring piece groove (102), and an abutting portion (401) of the high-current lever spring piece (4) extends upwards into the piece placing groove (101) through the through groove (103).
9. The test fixture according to claim 8, characterized in that the fixture body (1) is further provided with a pin slot (104) for receiving a pin portion (405) of the high current lever spring (4).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320927482.XU CN220171157U (en) | 2023-04-23 | 2023-04-23 | High-current lever elastic sheet and test jig |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320927482.XU CN220171157U (en) | 2023-04-23 | 2023-04-23 | High-current lever elastic sheet and test jig |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220171157U true CN220171157U (en) | 2023-12-12 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320927482.XU Active CN220171157U (en) | 2023-04-23 | 2023-04-23 | High-current lever elastic sheet and test jig |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220171157U (en) |
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2023
- 2023-04-23 CN CN202320927482.XU patent/CN220171157U/en active Active
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