CN220040656U - High-speed flying probe tester - Google Patents
High-speed flying probe tester Download PDFInfo
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- CN220040656U CN220040656U CN202321283269.6U CN202321283269U CN220040656U CN 220040656 U CN220040656 U CN 220040656U CN 202321283269 U CN202321283269 U CN 202321283269U CN 220040656 U CN220040656 U CN 220040656U
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- speed flying
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- 239000000523 sample Substances 0.000 title claims abstract description 48
- 238000012360 testing method Methods 0.000 claims abstract description 71
- 238000001514 detection method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000005286 illumination Methods 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 2
- 230000002349 favourable effect Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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Abstract
The utility model discloses a high-speed flying probe testing machine, which comprises a machine table, wherein the machine table is provided with a control device; the clamp is arranged on the machine table; the X moving device is arranged on the machine table; the Y mobile device is arranged on the X mobile device; the testing device is arranged on the Y moving device and comprises a probe, a camera and an illuminating device, and the illuminating device surrounds the outside of the camera and illuminates towards the direction of the clamp. When the circuit board is subjected to the flying probe test, the traditional flying probe test is inaccurate in positioning due to the light problem when the test point is positioned, so that the lighting device for improving the test environment of the probe is added, the lighting device is used for improving the brightness in the shooting range of the camera so as to enable the shooting of the camera to be clearer, the positioning accuracy is further improved, the flying probe test is more accurate, and the test accuracy and the test efficiency are effectively improved.
Description
Technical Field
The utility model relates to the technical field of circuit boards, in particular to a high-speed flying probe tester.
Background
Flying probe testing is the latest solution to some major problems of current electrical testing; the probe replaces the needle bed, a plurality of electric probes which are driven by a motor and can move rapidly are used for contacting with pins of a device and carrying out electric measurement, and after the flying needle contacts with the pins on the circuit board, whether the electronic element is normal or not is determined by judging whether a circuit is in a path or not, so that the testing efficiency of the circuit board is greatly improved.
However, in the existing flying probe test, inaccurate positioning exists, so that the test efficiency is low.
Disclosure of Invention
The present utility model aims to solve at least one of the technical problems existing in the prior art. Therefore, the utility model provides a high-speed flying probe tester, which effectively improves the testing efficiency.
According to an embodiment of the utility model, a high-speed flying probe tester comprises:
the machine is provided with a control device;
the clamp is arranged on the machine table;
the X moving device is arranged on the machine table;
the Y mobile device is arranged on the X mobile device;
the testing device is arranged on the Y moving device and comprises a probe, a camera and an illuminating device, and the illuminating device surrounds the outside of the camera and illuminates towards the direction of the clamp.
The high-speed flying probe tester provided by the embodiment of the utility model has at least the following beneficial effects: when the circuit board is subjected to the flying probe test, the traditional flying probe test is inaccurate in positioning due to the light problem when the test point is positioned, so that the lighting device for improving the test environment of the probe is added, the lighting device is used for improving the brightness in the shooting range of the camera so as to enable the shooting of the camera to be clearer, the positioning accuracy is further improved, the flying probe test is more accurate, and the test accuracy and the test efficiency are effectively improved.
According to the high-speed flying probe testing machine provided by the embodiment of the utility model, the X moving device comprises the first guide rail and the first drive, the first guide rail is arranged at the side of the clamp, and the first drive is arranged at one end of the first guide rail. The first drive drives the Y-axis moving device to reciprocate in the X-axis direction so as to realize the movement of the testing device in the X-axis direction.
According to the high-speed flying probe testing machine provided by the embodiment of the utility model, the Y moving device comprises the second guide rail and the second drive, the second guide rail is arranged on the first guide rail, the output end of the first drive is connected to the second guide rail, and the second drive is arranged at one end of the second guide rail. The output end of the second drive is connected to the testing device, the second drive drives the testing device to reciprocate along the second guide rail in the Y-axis direction, and the X-axis moving device and the Y-axis moving device are matched to realize comprehensive displacement of the testing device on the X-axis and the Y-axis, so that the positioning precision is improved, and the testing precision is ensured.
According to the high-speed flying probe testing machine provided by the embodiment of the utility model, the clamp comprises a lower fixing mechanism and an upper fixing mechanism. The upper fixing mechanism and the lower fixing mechanism are used for clamping the two ends of the tested circuit board so as to improve the stability of the circuit board when being detected, and the circuit board is favorable for ensuring accurate positioning and accurate detection.
According to the high-speed flying probe testing machine provided by the embodiment of the utility model, the lower fixing mechanism and the upper fixing mechanism comprise two clamping blocks which are arranged in a mirror image manner and a fourth drive, the fourth drive is arranged on any clamping block, and the other clamping block is arranged at the output end of the fourth drive. When the circuit board is placed on the lower fixing mechanism, that is, after the circuit board is inserted into the gap between the two clamping blocks of the lower fixing mechanism, the fourth driving of the lower fixing mechanism is started to enable one clamping block to move towards the circuit board and clamp the circuit board, and then the upper fixing mechanism repeats the movement of the lower fixing mechanism and clamps the other end of the fixed circuit board.
According to the high-speed flying probe testing machine provided by the embodiment of the utility model, the clamping blocks on the same sides of the upper fixing mechanism and the lower fixing mechanism are provided with the alignment marks, so that a worker can conveniently insert the circuit board into the clamp in a positioning manner, and meanwhile, the alignment marks are also used as initial points for starting the testing of the testing device, so that the positioning precision of the testing device and the circuit board can be ensured.
According to the high-speed flying probe testing machine provided by the embodiment of the utility model, the clamp further comprises a third guide rail and a third drive, the third drive and an upper fixing mechanism are arranged on the third guide rail, and the upper fixing mechanism is connected with the output end of the third drive. The third drive is used for driving the upper fixing mechanism to move along the third guide rail in the Y-axis direction so as to adapt to clamping of circuit boards with different sizes.
According to the high-speed flying probe testing machine provided by the embodiment of the utility model, the machine table is provided with the working chamber, and the clamp, the X moving device and the Y moving device are arranged in the working chamber.
According to the high-speed flying probe testing machine provided by the embodiment of the utility model, the working chamber is a darkroom, so that the interference of external light can be isolated, the positioning accuracy is ensured, and the testing accuracy is improved.
According to the high-speed flying probe testing machine provided by the embodiment of the utility model, the X moving devices are arranged at two sides of the clamp and are respectively arranged at two sides of the clamp, and the Y moving devices are correspondingly arranged at two groups, so that the simultaneous detection of two sides of a circuit board can be realized, and the testing efficiency is effectively improved.
Additional aspects and advantages of the utility model will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the utility model.
Drawings
The foregoing and/or additional aspects and advantages of the utility model will become apparent and may be better understood from the following description of embodiments taken in conjunction with the accompanying drawings in which:
FIG. 1 is a schematic diagram of a high-speed flying probe tester according to an embodiment of the present utility model;
FIG. 2 is a schematic diagram illustrating the installation of an upper fixing mechanism and a lower fixing mechanism according to an embodiment of the present utility model;
fig. 3 is an installation schematic diagram of an illumination device and a camera according to an embodiment of the present utility model.
Reference numerals illustrate:
a machine 100; a darkroom 110;
a testing device 200;
a lighting device 300;
x mobile device 400; a first rail 410; a first drive 420;
y mobile device 500; a second guide rail 510; a second drive 520;
a lower fixing mechanism 600; a clamp block 610; a fourth drive 620; alignment marks 630;
an upper fixing mechanism 700;
a third rail 800; and a third drive 900.
Detailed Description
Embodiments of the present utility model are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative only and are not to be construed as limiting the utility model.
In the description of the present utility model, it should be understood that references to orientation descriptions such as upper, lower, front, rear, left, right, etc. are based on the orientation or positional relationship shown in the drawings, are merely for convenience of description of the present utility model and to simplify the description, and do not indicate or imply that the apparatus or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present utility model.
In the description of the utility model, the meaning of a number is one or more, the meaning of a plurality is two or more, and greater than, less than, exceeding, etc. are understood to not include the present number, and the above, below, within, etc. are understood to include the present number. The description of the first and second is for the purpose of distinguishing between technical features only and should not be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present utility model, unless explicitly defined otherwise, terms such as arrangement, installation, connection, etc. should be construed broadly and the specific meaning of the terms in the present utility model can be reasonably determined by a person skilled in the art in combination with the specific contents of the technical scheme.
Referring to fig. 1 to 3, the embodiment of the utility model provides a high-speed flying probe tester, which comprises a machine 100, wherein the machine 100 is provided with a control device; a jig provided on the machine 100; the X moving device 400, the X moving device 400 is disposed on the machine 100; a Y moving device 500, the Y moving device 500 being disposed on the X moving device 400; the testing device 200, the testing device 200 is installed on the Y moving device 500, the testing device 200 comprises a probe, a camera and an illumination device 300, and the illumination device 300 surrounds the exterior of the camera and illuminates towards the direction of the fixture. When the circuit board is subjected to the flying probe test, the traditional flying probe test is inaccurate in positioning due to the light problem when the test point is positioned, so that the lighting device 300 for improving the probe test environment is added, the lighting device 300 is utilized to improve the brightness in the shooting range of the camera so as to enable the shooting of the camera to be clearer, the positioning accuracy is further improved, the flying probe test is more accurate, and the test accuracy and the test efficiency are effectively improved.
According to some embodiments of the present utility model, the X-moving device 400 includes a first rail 410 and a first driver 420, the first rail 410 is disposed beside the clamp, and the first driver 420 is disposed at one end of the first rail 410. The first driver 420 drives the Y-axis moving device to reciprocate in the X-axis direction, so as to move the testing device 200 in the X-axis direction.
According to some embodiments of the present utility model, the Y moving device 500 includes a second rail 510 and a second drive 520, the second rail 510 is disposed on the first rail 410, an output end of the first drive 420 is connected to the second rail 510, and the second drive 520 is mounted on one end of the second rail 510. The output end of the second drive 520 is connected to the testing device 200, the second drive 520 drives the testing device 200 to reciprocate along the second guide rail 510 in the Y-axis direction, and the X-axis moving device and the Y-axis moving device cooperate to realize comprehensive displacement of the testing device 200 on the X-axis and the Y-axis, thereby improving positioning accuracy and ensuring testing accuracy.
According to some embodiments of the utility model, the clamp includes a lower securing mechanism 600 and an upper securing mechanism 700. The upper fixing mechanism and the lower fixing mechanism are used for clamping the two ends of the tested circuit board so as to improve the stability of the circuit board when being detected, and the circuit board is favorable for ensuring accurate positioning and accurate detection.
According to some embodiments of the present utility model, the lower fixing mechanism 600 and the upper fixing mechanism 700 each include two clamp blocks 610 arranged in mirror image and a fourth drive 620, the fourth drive 620 being mounted on either clamp block 610, and the other clamp block 610 being mounted on an output end of the fourth drive 620. When a circuit board is placed on the lower fixing mechanism 600, that is, after the circuit board is first inserted into the gap between the two clamping blocks 610 of the lower fixing mechanism 600, the fourth drive 620 of the lower fixing mechanism 600 is activated to move one of the clamping blocks 610 toward the circuit board and clamp the circuit board, and then the upper fixing mechanism 700 repeats the movement of the lower fixing mechanism 600 and clamp the other end of the fixed circuit board.
According to some embodiments of the present utility model, the clamping blocks 610 on the same side of the upper fixing mechanism 700 and the lower fixing mechanism 600 are provided with alignment marks 630, so that a worker can insert the circuit board into the fixture, and at the same time, the alignment marks 630 are also used as initial points for starting the test of the test device 200, so that the positioning accuracy of the test device 200 and the circuit board can be ensured.
According to some embodiments of the utility model, the clamp further comprises a third rail 800 and a third drive 900, the third drive 900 and the upper fixing mechanism 700 are mounted on the third rail 800, the upper fixing mechanism 700 being connected to an output of the third drive 900. The third drive 900 is used for driving the upper fixing mechanism 700 to move along the third guide rail 800 in the Y-axis direction, so as to adapt to clamping circuit boards with different sizes.
According to some embodiments of the present utility model, the machine 100 is provided with a working chamber, and the fixture, the X moving device 400, and the Y moving device 500 are all disposed in the working chamber. Specifically, the working chamber is the darkroom 110, which can isolate the interference of external light, so as to ensure the positioning accuracy and improve the testing accuracy.
According to some embodiments of the present utility model, the X-moving device 400 is provided with two moving devices and is provided separately at both sides of the jig, the Y moving device 500 is correspondingly provided with two groups, so that two sides of the circuit board can be detected simultaneously, and the testing efficiency is effectively improved.
In the description of the present specification, reference to the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the utility model. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
While embodiments of the present utility model have been shown and described, it will be understood by those of ordinary skill in the art that: many changes, modifications, substitutions and variations may be made to the embodiments without departing from the spirit and principles of the utility model, the scope of which is defined by the claims and their equivalents.
Claims (10)
1. The high-speed flying probe tester is characterized by comprising:
the machine is provided with a control device;
the clamp is arranged on the machine table;
the X moving device is arranged on the machine table;
the Y mobile device is arranged on the X mobile device;
the testing device is arranged on the Y moving device and comprises a probe, a camera and an illuminating device, and the illuminating device surrounds the outside of the camera and illuminates towards the direction of the clamp.
2. The high-speed flying probe testing machine according to claim 1, wherein the X-moving device comprises a first guide rail and a first drive, the first guide rail is disposed beside the fixture, and the first drive is disposed at one end of the first guide rail.
3. The high-speed flying probe testing machine according to claim 2, wherein the Y moving device comprises a second guide rail and a second drive, the second guide rail is arranged on the first guide rail, the output end of the first drive is connected to the second guide rail, and the second drive is mounted at one end of the second guide rail.
4. The high speed flying probe tester of claim 1 wherein the clamp comprises a lower fixture mechanism and an upper fixture mechanism.
5. The high-speed flying probe testing machine according to claim 4, wherein the lower fixing mechanism and the upper fixing mechanism each comprise two clamping blocks arranged in a mirror image mode and a fourth drive, the fourth drive is installed on any one of the clamping blocks, and the other clamping block is installed at an output end of the fourth drive.
6. The high speed flying probe tester according to claim 5, wherein the clamping blocks on the same side of the upper fixing mechanism and the lower fixing mechanism are provided with alignment marks.
7. The high speed flying probe testing machine according to claim 4, wherein said clamp further comprises a third rail and a third drive, said third drive and said upper fixture being mounted on said third rail, said upper fixture being connected to an output of said third drive.
8. The high-speed flying probe testing machine according to claim 1, wherein the machine is provided with a working chamber, and the clamp, the X moving device and the Y moving device are all arranged in the working chamber.
9. The high speed flying probe testing machine according to claim 8, wherein said working chamber is a darkroom.
10. The high-speed flying probe testing machine according to claim 1, wherein the X moving devices are provided with two groups and are respectively arranged on two sides of the clamp, and the Y moving devices are correspondingly provided with two groups.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321283269.6U CN220040656U (en) | 2023-05-24 | 2023-05-24 | High-speed flying probe tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321283269.6U CN220040656U (en) | 2023-05-24 | 2023-05-24 | High-speed flying probe tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220040656U true CN220040656U (en) | 2023-11-17 |
Family
ID=88737604
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321283269.6U Active CN220040656U (en) | 2023-05-24 | 2023-05-24 | High-speed flying probe tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220040656U (en) |
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2023
- 2023-05-24 CN CN202321283269.6U patent/CN220040656U/en active Active
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