CN219551690U - LED chip facula illuminance testing device - Google Patents
LED chip facula illuminance testing device Download PDFInfo
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- CN219551690U CN219551690U CN202223249559.7U CN202223249559U CN219551690U CN 219551690 U CN219551690 U CN 219551690U CN 202223249559 U CN202223249559 U CN 202223249559U CN 219551690 U CN219551690 U CN 219551690U
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- lamp bead
- illuminometer
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- 239000011324 bead Substances 0.000 claims abstract description 52
- 230000009286 beneficial effect Effects 0.000 abstract description 3
- 238000005286 illumination Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
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Abstract
The utility model relates to the technical field of LED chips, in particular to an LED chip facula illuminance testing device; the upper surface of the working platform is provided with a transverse rail and a longitudinal rail; the lamp bead support is connected with the transverse rail in a sliding manner; the electric vehicle is movably arranged on the longitudinal rail, and the illuminometer is arranged on the electric vehicle; the side wall of one side of the lamp bead support, which faces the illuminometer, is provided with a plurality of placing grooves. The utility model has the beneficial effects that: by using the LED chip facula illuminance testing device provided by the utility model, a plurality of LED chips can be subjected to illuminance testing at the same time; the distance from the LED chip to the illuminometer is convenient to adjust, and the efficiency of the illuminance test of the LED chip is improved.
Description
Technical Field
The utility model relates to the technical field of LED chips, in particular to an LED chip facula illuminance testing device.
Background
LED (Light Emitting Diode), light emitting diode, is a solid state semiconductor device that converts electrical energy into light energy. As a novel light emitting device, an LED has advantages of high light efficiency, energy saving, long service life, short response time, environmental protection, etc., and thus is called a new generation of light source with the highest potential, and is very common in the application field of the lighting field. For the LED chip with high application field, such as the LED chip of the car lamp, the LED chip is packaged into a lamp bead, and then the spot illumination value at the position of 3-5 meters is required to be tested. However, in the prior art, a device suitable for measuring the spot illuminance value of the LED chip is lacking.
Disclosure of Invention
The technical problems to be solved by the utility model are as follows: an LED chip facula illuminance testing device is provided.
In order to solve the technical problems, the utility model adopts a technical scheme that: the LED chip facula illuminance testing device comprises a working platform, a lamp bead bracket, an electric vehicle and an illuminometer;
the upper surface of the working platform is provided with a transverse rail and a longitudinal rail; the lamp bead support is connected with the transverse rail in a sliding manner; the electric vehicle is movably arranged on the longitudinal rail, and the illuminometer is arranged on the electric vehicle;
a plurality of placing grooves are formed in the side wall of one side, facing the illuminometer, of the lamp bead support, and the placing grooves are uniformly formed in the length direction of the transverse rail; and a power supply pin is arranged on the lamp bead bracket.
Further, a transverse guide rail and a vertical guide rail are arranged on the electric vehicle; the length direction of the transverse guide rail is parallel to the length direction of the transverse rail; the vertical guide rail is connected with the transverse guide rail in a sliding mode, the length direction of the vertical guide rail is vertical, and the illuminometer is connected with the vertical guide rail in a sliding mode.
Further, the lamp bead support is connected to the transverse rail in a sliding mode through the sliding block and the bolt penetrates through the lamp bead support to be connected with the sliding block in a threaded mode.
Further, the device also comprises a sliding block and a screw rod; the lamp bead support is connected to the transverse rail in a sliding manner through a sliding block; the screw rod penetrates through the sliding block along the length direction of the transverse rail, and the screw rod is connected to the transverse rail in a self-rotating mode.
Further, one end of the screw rod extends out of the transverse rail and is connected with a handle.
Further, a length scale is arranged on the working platform at one side of the longitudinal rail.
The utility model has the beneficial effects that: in the LED chip facula illuminance testing device provided by the utility model, the LED chips are respectively arranged in one placing groove of the lamp bead bracket; the power supply pin of lamp pearl support makes things convenient for lamp pearl support to switch on a plurality of LED chips simultaneously, lamp pearl support sliding connection makes all LED chips just to the illuminometer after the staff removes the lamp pearl support to this accomplishes an illuminometer test.
The illuminometer is arranged on the electric vehicle, and after illumination test, the electric vehicle moves on the longitudinal rail to adjust the distance from the illuminometer to the lamp bead bracket, so that each LED chip can perform illumination test at different distances from the illuminometer.
Therefore, by using the LED chip facula illuminance testing device provided by the utility model, a plurality of LED chips can be subjected to illuminance testing at the same time; the distance from the LED chip to the illuminometer is convenient to adjust, and the efficiency of the illuminance test of the LED chip is improved.
Drawings
Fig. 1 is a schematic diagram of the overall structure of an LED chip spot illuminance testing apparatus according to an embodiment of the present utility model;
fig. 2 is a schematic diagram of the overall structure of an LED chip spot illuminance testing apparatus according to an embodiment of the present utility model;
description of the reference numerals:
1. a working platform; 11. a transverse rail; 12. a longitudinal rail;
2. a lamp bead bracket; 21. a power supply pin;
3. an electric vehicle; 31. a transverse guide rail; 32. a vertical guide rail;
4. an illuminometer; 5. a slide block; 6. and a screw rod.
Detailed Description
In order to describe the technical contents, the achieved objects and effects of the present utility model in detail, the following description will be made with reference to the embodiments in conjunction with the accompanying drawings.
Referring to fig. 1-2, an LED chip spot illuminance testing apparatus includes a working platform 1, a lamp bead bracket 2, an electric vehicle 3, and an illuminometer 4;
the upper surface of the working platform 1 is provided with a transverse rail 11 and a longitudinal rail 12; the lamp bead bracket 2 is connected with the transverse rail 11 in a sliding manner; the electric vehicle 3 is movably arranged on the longitudinal rail 12, and the illuminometer 4 is arranged on the electric vehicle 3;
a plurality of placing grooves are formed in the side wall of the lamp bead support 2, which faces one side of the illuminometer 4, and the placing grooves are uniformly formed in the length direction of the transverse rail 11; the lamp bead support 2 is provided with a power pin 21.
From the above description, the beneficial effects of the utility model are as follows: in the LED chip facula illuminance testing device provided by the utility model, LED chips are respectively arranged in one placing groove of the lamp bead bracket 2; the power pin 21 of the lamp bead support 2 facilitates the lamp bead support 2 to electrify a plurality of LED chips simultaneously, the lamp bead support 2 is connected to the transverse rail 11 in a sliding mode, and after the lamp bead support 2 is moved by a worker, all the LED chips are right opposite to the illuminometer 4, so that one-time illuminance test is completed.
The illuminometer 4 is arranged on the electric vehicle 3, after each illuminance test, the electric vehicle 3 moves on the longitudinal rail 12 to adjust the distance from the illuminometer 4 to the lamp bead bracket 2, so that each LED chip can perform the illuminance test at different distances from the illuminometer 4.
Therefore, by using the LED chip facula illuminance testing device provided by the utility model, a plurality of LED chips can be subjected to illuminance testing at the same time; the distance from the LED chip to the illuminometer 4 is convenient to adjust, and the efficiency of the illuminance test of the LED chip is improved.
Further, the electric vehicle 3 is provided with a transverse guide rail 31 and a vertical guide rail 32; the length direction of the transverse guide rail 31 is parallel to the length direction of the transverse rail 11; the vertical guide rail 32 is slidably connected to the transverse guide rail 31, the length direction of the vertical guide rail 32 is vertical, and the illuminometer 4 is slidably connected to the vertical guide rail 32.
As can be seen from the above description, the illuminometer 4 may also be equivalent to the electric vehicle 3 moving, and the illuminometer 4 moves in a vertical plane, because in order to improve accuracy and comprehensiveness of the illuminance test of the LED chip, 5 points on the light spot formed by the LED chip need to be tested, the light spot of the LED chip may be considered to be a vertically-arranged circle, the illuminometer 4 needs to move to the center of the circle to perform a test, and move to above, below, to the left and to the right of the center of the circle to perform a test respectively.
Further, the lamp bead support 2 is slidably connected to the transverse rail 11 through the slide block 5, and the bolt penetrates through the lamp bead support 2 and is in threaded connection with the slide block 5.
It can be seen from the above description that, in order to protect the lamp bead support 2, the sliding block 5 is provided to replace the lamp bead support 2 to be slidably connected with the transverse rail 11, and the above arrangement provides a structure in which the lamp bead support 2 is detachably connected with the sliding block 5, so that the lamp bead support 2 can be replaced conveniently.
Further, the device also comprises a sliding block 5 and a screw rod 6; the lamp bead bracket 2 is connected with the transverse rail 11 in a sliding way through the sliding block 5; the screw rod 6 penetrates through the sliding block 5 along the length direction of the transverse rail 11, and the screw rod 6 is connected to the transverse rail 11 in a self-rotating mode.
As can be seen from the above description, in order to protect the lamp bead support 2, a slider 5 is provided in place of the lamp bead support 2 to be slidably connected to the transverse rail 11, and a worker rotates the screw 6 to slide the slider 5 on the transverse rail 11.
Further, one end of the screw rod 6 extends out of the transverse rail 11 and is connected with a handle.
As is apparent from the above description, the handle facilitates the worker to rotate the screw 6.
Further, a length scale is arranged on the working platform 1 at one side of the longitudinal rail 12.
From the above description, a worker can supervise whether the electric vehicle 3 moves to a prescribed position through the length scale and the electric vehicle 3.
The application background of the LED chip facula illuminance testing device provided by the utility model is as follows: when the LED chip needs to be subjected to illumination test.
Example 1
Referring to fig. 1-2, an LED chip spot illuminance testing apparatus includes a working platform 1, a lamp bead bracket 2, an electric vehicle 3, and an illuminometer 4;
the upper surface of the working platform 1 is provided with a transverse rail 11 and a longitudinal rail 12; the lamp bead bracket 2 is connected with the transverse rail 11 in a sliding manner; the electric vehicle 3 is movably arranged on the longitudinal rail 12, and the illuminometer 4 is arranged on the electric vehicle 3;
a plurality of placing grooves are formed in the side wall of the lamp bead support 2, which faces one side of the illuminometer 4, and the placing grooves are uniformly formed in the length direction of the transverse rail 11; the lamp bead support 2 is provided with a power pin 21.
The electric vehicle 3 is provided with a transverse guide rail 31 and a vertical guide rail 32; the length direction of the transverse guide rail 31 is parallel to the length direction of the transverse rail 11; the vertical guide rail 32 is slidably connected to the transverse guide rail 31, the length direction of the vertical guide rail 32 is vertical, and the illuminometer 4 is slidably connected to the vertical guide rail 32.
The LED chip facula illuminance testing device further comprises a sliding block 5, a bolt and a screw rod 6, wherein the lamp bead support 2 is connected to the transverse rail 11 in a sliding mode through the sliding block 5, and the bolt penetrates through the lamp bead support 2 to be connected with the sliding block 5 in a threaded mode.
The lamp bead bracket 2 is connected with the transverse rail 11 in a sliding way through the sliding block 5; the screw rod 6 penetrates through the sliding block 5 along the length direction of the transverse rail 11, and the screw rod 6 is connected to the transverse rail 11 in a self-rotating mode. One end of the screw rod 6 extends out of the transverse rail 11 and is connected with a handle. A length scale is arranged on the working platform 1 at one side of the longitudinal rail 12.
The utility model provides a use and principle of an LED chip facula illuminance testing device:
when the LED chips need to be subjected to illuminance test, a worker installs a plurality of LED chips in the placement groove of the lamp bead bracket 2, and energizes the plurality of LED chips through the power supply pins 21.
The electric motor car 3 is adjusted in advance to be 23-5 meters away from the lamp bead support, the lamp bead support 2 is moved on the transverse rail 11 through the sliding block 5, the illuminometer 4 is arranged on the electric motor car 3, and the distance from the LED chip, which is opposite to the illuminometer 4, to the illuminometer 4 is changed when the lamp bead support 2 is moved because the transverse rail 11 is perpendicular to the longitudinal rail 12. After the staff moves the lamp bead bracket 2 to enable each LED chip to face the illuminometer 4, the illuminance test is completed once.
In each illuminance test, the illuminometer 4 also needs to move on a vertical plane through the vertical guide rail 32 and the transverse guide rail 31 to test 5 points on the light spot formed by the LED chip, so that the illuminance test is more comprehensive and accurate.
After each illuminance test, the staff needs to operate the electric vehicle 3 to move, so that the distances from the illuminometer 4 to the lamp bead bracket 2 are different in each illuminance test, and the accuracy of the illuminance test is improved.
The foregoing description is only illustrative of the present utility model and is not intended to limit the scope of the utility model, and all equivalent changes made by the specification and drawings of the present utility model, or direct or indirect application in the relevant art, are included in the scope of the present utility model.
Claims (6)
1. The LED chip facula illuminance testing device is characterized by comprising a working platform, a lamp bead bracket, an electric vehicle and an illuminometer;
the upper surface of the working platform is provided with a transverse rail and a longitudinal rail; the lamp bead support is connected with the transverse rail in a sliding manner; the electric vehicle is movably arranged on the longitudinal rail, and the illuminometer is arranged on the electric vehicle;
a plurality of placing grooves are formed in the side wall of one side, facing the illuminometer, of the lamp bead support, and the placing grooves are uniformly formed in the length direction of the transverse rail; and a power supply pin is arranged on the lamp bead bracket.
2. The LED chip light spot illuminance testing device of claim 1 wherein the electric vehicle is provided with a transverse guide rail and a vertical guide rail; the length direction of the transverse guide rail is parallel to the length direction of the transverse rail; the vertical guide rail is connected with the transverse guide rail in a sliding mode, the length direction of the vertical guide rail is vertical, and the illuminometer is connected with the vertical guide rail in a sliding mode.
3. The LED chip spot illuminance testing apparatus of claim 1, further comprising a slider and a bolt, wherein the bead support is slidably connected to the transverse rail by the slider, and the bolt is threaded through the bead support to the slider.
4. The LED chip spot illuminance testing apparatus of claim 1, further comprising a slider and a screw; the lamp bead support is connected to the transverse rail in a sliding manner through a sliding block; the screw rod penetrates through the sliding block along the length direction of the transverse rail, and the screw rod is connected to the transverse rail in a self-rotating mode.
5. The device for testing the spot illuminance of an LED chip of claim 4 wherein one end of the screw rod extends out of the transverse rail and is connected to a handle.
6. The device for testing the spot illuminance of the LED chip of claim 1 wherein a length scale is provided on the working platform at one side of the longitudinal rail.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223249559.7U CN219551690U (en) | 2022-12-05 | 2022-12-05 | LED chip facula illuminance testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223249559.7U CN219551690U (en) | 2022-12-05 | 2022-12-05 | LED chip facula illuminance testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219551690U true CN219551690U (en) | 2023-08-18 |
Family
ID=87736735
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202223249559.7U Active CN219551690U (en) | 2022-12-05 | 2022-12-05 | LED chip facula illuminance testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219551690U (en) |
-
2022
- 2022-12-05 CN CN202223249559.7U patent/CN219551690U/en active Active
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