CN219496798U - Measurement microscope specimen positioning platform - Google Patents
Measurement microscope specimen positioning platform Download PDFInfo
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- CN219496798U CN219496798U CN202320216744.1U CN202320216744U CN219496798U CN 219496798 U CN219496798 U CN 219496798U CN 202320216744 U CN202320216744 U CN 202320216744U CN 219496798 U CN219496798 U CN 219496798U
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- positioning
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- sliding
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P40/00—Technologies relating to the processing of minerals
- Y02P40/50—Glass production, e.g. reusing waste heat during processing or shaping
- Y02P40/57—Improving the yield, e-g- reduction of reject rates
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Abstract
The application provides a measurement microscope specimen positioning platform, belongs to microscope technical field. This measurement microscope sample positioning platform, including location structure and adjusting structure, location structure includes bottom plate, support column, slip post, locating platform and locating component, the support column with the bottom plate rotates to be connected, the slip post with support column sliding connection, the locating platform with the slip post is connected, the locating platform both sides all are provided with locating component, adjusting structure includes bearing I, commentaries on classics piece, locating pin and rotating component, bottom plate one side is inlayed and is equipped with bearing I, the support column with bearing I inner circle interference fit, the support column both sides all are provided with the commentaries on classics piece, the commentaries on classics piece passes through the locating pin with the bottom plate is fixed. In this application, the height and the angle of measurement microscope sample location platform convenient to the location platform are adjusted, have promoted the practicality.
Description
Technical Field
The application relates to the field of microscopes, in particular to a positioning platform for measuring a microscope specimen.
Background
The specimen is an animal, plant, mineral and other objects, can be preserved for a long time after various preservative treatments, and can maintain the original appearance as much as possible, so as to be used for various researches.
Along with the development of society, most microscopes observe the sample through the location platform when using, and most sample location platforms at present are fixed a position the glass piece through using the mode of pressing from both sides tightly, but when using, the glass piece atress easily appears the gliding condition, increases the damage rate of glass piece, has reduced the practicality of sample location platform, increases user's economic loss, is unfavorable for the normal use of sample location platform.
To this chinese patent application No. CN202122421732.6, a specimen positioning platform for microscope is disclosed, including main part, thin slice and stabilising arrangement, the thin slice has been placed on the surface of main part, stabilising arrangement sets up on the surface of main part, stabilising arrangement includes the slide, the surface fixed connection of slide and main part, the surface sliding connection of slide has the snap ring, the surface of snap ring is the fillet, the snap ring cover is established on the surface of main part, the snap ring cover is established on the surface of thin slice, the surface fixed connection of snap ring has the pull piece, fixedly connected with pulling spring between pull piece and the main part, the pulling spring is the level setting. Through setting up stabilising arrangement, fix a position the glass piece effectively, reduce the glass piece atress and appear gliding probability, reduce the damage rate of glass piece, improved sample positioning platform's practicality, reduce user's economic loss, the normal use of the equipment of being convenient for.
However, in the process of implementing the technical solution in the embodiment of the present application, the applicant of the present application finds that when the microscope is used, the specimen is positioned on the positioning table, so that when the height and the angle of the specimen need to be adjusted, the specimen is very inconvenient, thereby reducing the practicability of the device.
Disclosure of Invention
In order to make up for the defects, the application provides a measurement microscope specimen positioning platform, which aims to solve the problem that the height and the angle of the positioning platform are inconvenient to adjust.
The embodiment of the application provides a measurement microscope specimen positioning platform, including location structure and regulation structure, location structure includes bottom plate, support column, slip post, locating platform and locating component, the support column with the bottom plate rotates to be connected, the slip post with support column sliding connection, the locating platform with the slip post is connected, the locating platform both sides all are provided with locating component, regulation structure includes bearing I, commentaries on classics piece, locating pin and rotating component, bottom plate one side inlays and is equipped with bearing I, the support column with bearing I inner circle interference fit, the support column both sides all are provided with the commentaries on classics piece, the commentaries on classics piece passes through the locating pin with the bottom plate is fixed, rotating component set up in the support column, the slip post with rotating component connects.
In a specific embodiment, the positioning assembly comprises a positioning frame, a spring, a supporting strip and two supporting blocks, wherein the positioning frame is in sliding connection with the positioning table, two ends of the spring are respectively connected with the positioning frame and the sliding column, the supporting strip is arranged on one side of the positioning frame, and the two supporting blocks are arranged at two ends of the supporting strip.
In the implementation process, the glass sheet can be conveniently positioned through the positioning frame, the springs, the supporting strips and the two supporting blocks, so that the probability of sliding of the stressed glass sheet is reduced, and the damage rate of the glass sheet is reduced.
In a specific embodiment, a sliding block is arranged on one side of the positioning frame, a sliding groove I is formed in the positioning table, and the sliding block is in sliding connection with the sliding groove I.
In the implementation process, the sliding connection between the sliding block and the sliding groove I can facilitate the sliding connection between the positioning frame and the positioning table, and meanwhile, the sliding of the positioning frame is limited.
In a specific embodiment, the rotating assembly comprises a rotating rod, a bevel gear I, a bevel gear II, a ball screw pair and a screw nut pair, wherein the rotating rod is rotationally connected with the supporting column, the bevel gear I is connected with the rotating rod, the ball screw pair is rotationally connected with the supporting column, the bevel gear II is connected with the ball screw pair, the bevel gear I is meshed with the bevel gear II, the screw nut pair is connected with the ball screw pair, and the sliding column is connected with the screw nut pair.
In the realization process, through the setting of bull stick, bevel gear I, bevel gear II, ball screw pair and screw nut pair, can conveniently drive the locating bench up-and-down motion to adjust the height of sample, promoted the practicality.
In a specific embodiment, the two ends of the supporting column are embedded with a bearing II, and the ball screw pair is in interference fit with an inner ring of the bearing II.
In the implementation process, through the ball screw pair and the inner ring interference fit of the bearing II, the ball screw pair can be conveniently connected with the rotation of the support column, and meanwhile, the loss generated by rotation is reduced.
In a specific embodiment, one side of the rotating rod is provided with an L-shaped handle.
In the implementation process, the L-shaped handle is arranged on one side of the rotating rod, so that the rotating rod can be rotated by a user conveniently, and is labor-saving and convenient.
In a specific embodiment, a sliding groove II adapted to the sliding column is formed at one end of the supporting column, and the sliding column is in sliding connection with the sliding groove II.
In the implementation process, through sliding connection of the sliding column and the sliding groove II, sliding connection of the sliding column and the supporting column can be facilitated, and meanwhile sliding of the sliding column is limited.
In a specific embodiment, a plurality of positioning grooves matched with the positioning pins are formed in one side of the bottom plate, and the positioning pins are attached to the positioning grooves.
In the implementation process, through the setting of constant head tank, can conveniently realize the fixed of different angles to the support column, conveniently adjust and fix the angle of sample.
Compared with the prior art, the beneficial effect of this application: through bottom plate, support column, slip post, locating platform and locating component's setting, can conveniently fix a position the glass piece, reduced the glass piece atress and appear gliding probability, reduced the damage rate of glass piece, through bearing I, commentaries on classics piece, locating pin and rotating the setting of subassembly, can conveniently adjust the height and the angle of sample, promoted the practicality of device.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments will be briefly described below, it being understood that the following drawings only illustrate some examples of the present application and therefore should not be considered as limiting the scope, and that other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic structural view of a positioning platform for a specimen of a measurement microscope according to an embodiment of the present application;
fig. 2 is a schematic front view structure of a positioning platform for a specimen of a measurement microscope according to an embodiment of the present application;
FIG. 3 is a schematic cross-sectional view of a positioning structure according to an embodiment of the present disclosure;
fig. 4 is a schematic cross-sectional structure of a positioning platform for a measurement microscope according to an embodiment of the present application.
In the figure: 10-positioning structure; 110-a bottom plate; 120-supporting columns; 130-a sliding column; 140-positioning table; 150-positioning assembly; 151-positioning frame; 152-springs; 153-abutting strips; 154-abutting blocks; 160-sliding blocks; 20-an adjustment structure; 210-bearing I; 220-turning blocks; 230-locating pins; 240-a rotating assembly; 241-rotating rod; 242-bevel gear I; 243-bevel gear II; 244-ball screw pair; 245-a screw nut pair; 250-positioning groove.
Detailed Description
The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application.
For the purposes of making the objects, technical solutions and advantages of the embodiments of the present application more clear, the technical solutions of the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is apparent that the described embodiments are some of the embodiments of the present application, but not all of the embodiments. All other embodiments, based on the embodiments herein, which would be apparent to one of ordinary skill in the art without undue burden are within the scope of the present application.
Examples
Referring to fig. 1, the present application provides a positioning platform for a measurement microscope specimen, which includes a positioning structure 10 and an adjusting structure 20.
Specifically, the positioning structure 10 is convenient to position the glass sheet, and the adjusting structure 20 is convenient to adjust the height and the angle of the specimen, so that the practicability of the device is improved.
Referring to fig. 1, 2 and 3, the positioning structure 10 includes a base plate 110, a support column 120, a sliding column 130, a positioning table 140 and a positioning assembly 150, the support column 120 is rotatably connected with the base plate 110, the sliding column 130 is slidably connected with the support column 120, the positioning table 140 is connected with the sliding column 130, and the positioning assemblies 150 are disposed on two sides of the positioning table 140.
When specifically setting up, locating component 150 includes locating frame 151, spring 152, supports strip 153 and two pieces 154 that support, locating frame 151 with locating bench 140 sliding connection, spring 152 both ends respectively with locating frame 151 with sliding column 130 is connected, support strip 153 set up in locating frame 151 one side, two support piece 154 set up in support strip 153 both ends, wherein, through locating frame 151, spring 152, support strip 153 and two pieces 154's setting, can conveniently fix a position the glass piece, reduced the probability that the glass piece atress slided appears, reduced the damage rate of glass piece.
When specifically setting up, locating frame 151 one side is provided with slider 160, spout I has been seted up to locating bench 140, slider 160 and spout I sliding connection, wherein, through slider 160 and spout I sliding connection, can make things convenient for locating frame 151 and locating bench 140's sliding connection, carry out spacingly to the slip of locating frame 151 simultaneously.
When specifically setting up, support column 120 one end seted up with slide column 130 adaptation's spout II, slide column 130 and spout II sliding connection, wherein, through slide column 130 and spout II sliding connection can make things convenient for slide column 130 and support column 120's sliding connection, carries out spacingly to slide column 130's slip simultaneously.
Referring to fig. 1, 2 and 4, the adjusting structure 20 includes a bearing i 210, a rotating block 220, a positioning pin 230 and a rotating assembly 240, the bearing i 210 is embedded in one side of the base plate 110, the supporting columns 120 are in interference fit with the inner ring of the bearing i 210, the rotating blocks 220 are disposed on two sides of the supporting columns 120, the rotating blocks 220 are fixed to the base plate 110 through the positioning pin 230, the rotating assembly 240 is disposed in the supporting columns 120, and the sliding columns 130 are connected with the rotating assembly 240.
When specifically setting up, rotating assembly 240 includes bull stick 241, bevel gear I242, bevel gear II 243, ball screw pair 244 and screw nut pair 245, bull stick 241 with support column 120 rotates to be connected, bevel gear I242 with bull stick 241 is connected, ball screw pair 244 with support column 120 rotates to be connected, bevel gear II 243 with ball screw pair 244 is connected, bevel gear I242 with bevel gear II 243 meshing, screw nut pair 245 with ball screw pair 244 is connected, sliding column 130 with screw nut pair 245 is connected, wherein, through the setting of bull stick 241, bevel gear I242, bevel gear II 243, ball screw pair 244 and screw nut pair 245, can conveniently drive the up-and-down motion of locating bench 140 to adjust the height of sample, promoted the practicality.
When specifically setting up, support column 120 both ends all inlay and are equipped with bearing II, ball screw pair 244 and bearing II inner race interference fit, wherein, through ball screw pair 244 and bearing II inner race interference fit, can make things convenient for ball screw pair 244 to be connected with the rotation of support column 120, reduced the produced loss of rotation simultaneously.
When specifically setting up, bull stick 241 one side is provided with L type handle, wherein, through be provided with L type handle on one side of bull stick 241, can facilitate the use rotatory, laborsaving convenience.
When specifically setting up, a plurality of with constant head tank 250 that constant head pin 230 suited has been seted up to bottom plate 110 one side, constant head pin 230 with constant head tank 250 laminating, wherein, through setting up of constant head tank 250, can conveniently realize the fixed of different angles to support column 120, conveniently adjust and fix the angle of sample.
The working principle of the measuring microscope specimen positioning platform is as follows: when the measuring microscope specimen positioning platform is used, the positioning frame 151 is pulled, so that the supporting strip 153 and the two supporting blocks 154 are driven to slide to one side, the spring 152 is stretched, the glass sheet is placed on the positioning table 140, the positioning frame 151 is loosened, the elasticity of the spring 152 is utilized to position the glass sheet, when the height and the angle of a specimen need to be adjusted, the rotating rod 241 is rotated, the bevel gear I242 is driven to rotate through the rotating rod 241, the bevel gear II 243 is driven to rotate, the ball screw pair 244 is rotated, the screw nut pair 245 is driven to move, the sliding column 130 moves in the supporting column 120, the height is adjusted, the positioning pin 230 is removed, the supporting column 120 is driven to rotate on the bottom plate 110 through the rotation of the rotating block 220, and the fixing is carried out through the cooperation of the positioning pin 230 and the positioning groove 250.
It should be noted that, specific model specifications of the abutment 153 and the abutment 154 need to be determined by selecting a model according to an actual specification of the device, and a specific model selection calculation method adopts the prior art in the field, so detailed descriptions thereof are omitted.
The foregoing is merely specific embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily think about changes or substitutions within the technical scope of the present application, and the changes and substitutions are intended to be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (8)
1. A measurement microscope specimen positioning platform, comprising
The positioning structure comprises a bottom plate, a support column, a sliding column, positioning tables and positioning components, wherein the support column is rotationally connected with the bottom plate, the sliding column is in sliding connection with the support column, the positioning tables are connected with the sliding column, and the positioning components are arranged on two sides of each positioning table;
the adjusting structure comprises a bearing I, rotating blocks, a locating pin and a rotating assembly, wherein the bearing I is embedded on one side of a bottom plate, a support column is in interference fit with an inner ring of the bearing I, the rotating blocks are arranged on two sides of the support column, the rotating blocks are fixed with the bottom plate through the locating pin, the rotating assembly is arranged in the support column, and a sliding column is connected with the rotating assembly.
2. The positioning platform of claim 1, wherein the positioning assembly comprises a positioning frame, a spring, a supporting strip and two supporting blocks, the positioning frame is slidably connected with the positioning table, two ends of the spring are respectively connected with the positioning frame and the sliding column, the supporting strip is arranged on one side of the positioning frame, and the two supporting blocks are arranged at two ends of the supporting strip.
3. The positioning platform for the specimen of the measurement microscope according to claim 2, wherein a slide block is arranged on one side of the positioning frame, a slide groove I is formed in the positioning platform, and the slide block is in sliding connection with the slide groove I.
4. The measurement microscope specimen positioning platform according to claim 1, wherein the rotation assembly comprises a rotating rod, a bevel gear i, a bevel gear ii, a ball screw pair and a screw nut pair, the rotating rod is rotatably connected with the support column, the bevel gear i is connected with the rotating rod, the ball screw pair is rotatably connected with the support column, the bevel gear ii is connected with the ball screw pair, the bevel gear i is meshed with the bevel gear ii, the screw nut pair is connected with the ball screw pair, and the sliding column is connected with the screw nut pair.
5. The positioning platform for the specimen of the measurement microscope according to claim 4, wherein bearings II are embedded at two ends of the supporting column, and the ball screw pair is in interference fit with an inner ring of the bearings II.
6. The stage of claim 4, wherein the rotating bar is provided with an L-shaped handle on one side.
7. The positioning platform for a specimen of a measurement microscope according to claim 1, wherein a sliding groove II adapted to the sliding column is formed at one end of the supporting column, and the sliding column is slidably connected with the sliding groove II.
8. The positioning platform for a specimen of a measurement microscope according to claim 1, wherein a plurality of positioning grooves adapted to the positioning pins are formed in one side of the bottom plate, and the positioning pins are attached to the positioning grooves.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320216744.1U CN219496798U (en) | 2023-02-15 | 2023-02-15 | Measurement microscope specimen positioning platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320216744.1U CN219496798U (en) | 2023-02-15 | 2023-02-15 | Measurement microscope specimen positioning platform |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219496798U true CN219496798U (en) | 2023-08-08 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320216744.1U Active CN219496798U (en) | 2023-02-15 | 2023-02-15 | Measurement microscope specimen positioning platform |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219496798U (en) |
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2023
- 2023-02-15 CN CN202320216744.1U patent/CN219496798U/en active Active
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