CN219496571U - Conductivity testing device for circuit board connector - Google Patents
Conductivity testing device for circuit board connector Download PDFInfo
- Publication number
- CN219496571U CN219496571U CN202223072574.9U CN202223072574U CN219496571U CN 219496571 U CN219496571 U CN 219496571U CN 202223072574 U CN202223072574 U CN 202223072574U CN 219496571 U CN219496571 U CN 219496571U
- Authority
- CN
- China
- Prior art keywords
- contact
- circuit board
- connector
- probe
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The utility model provides a circuit board connector conductivity testing device, which comprises a conductive circuit board, a grounding connector and a testing probe, wherein the conductive circuit board is provided with the testing contact comprising a conductive contact, the testing probe comprises a first positive electrode probe and a negative electrode probe, the grounding connector is a connector male/female seat which is connected with the circuit board connector to be tested in a matching way, a positive electrode pin and a negative electrode pin of the grounding connector are respectively and electrically connected with the positive electrode conductive contact and the negative electrode conductive contact of the conductive testing contact in a one-to-one correspondence manner, the positive electrode conductive contact and the negative electrode conductive contact are respectively contacted and conducted with the first positive electrode probe and the first negative electrode probe, the circuit board connector to be tested is mounted in the grounding connector of the testing device, the testing contact on the conductive circuit board corresponding to the testing probe is conducted and tested, the pin can be independently conducted and no additional pressing force is generated in the testing process, so that the poor pin of the virtual welding is prevented from being conducted in a pressing way, and the testing accuracy is improved.
Description
Technical Field
The utility model relates to the field of electronic device inspection, in particular to a circuit board connector conductivity testing device.
Background
The board-to-board connector or the wire-to-board connector is commonly used in miniaturized and thinned product component connection, and a male seat and a female seat of the connector are welded on a circuit board and another circuit board or an integrated wire harness to be connected respectively, and the female seat and work are matched and butted to realize electrical and mechanical connection of the two components. In order to detect the welding quality of pins of a male seat or a female seat of a connector and a circuit board, a common pin conductivity test of the connector in the circuit board is to connect an impedance tester by adopting a large-diameter probe, and to contact and press the connector on the circuit board through the probe to perform the impedance test.
However, in the connector used in the miniaturized and thinned products, the diameter of the pins and the spacing between the adjacent pins are smaller than 1 mm, the diameter of the probe is far larger than the spacing between the adjacent pins of the connector, and the overall conductivity of a plurality of parallel pins can only be tested, so that the conductivity of each pin can not be tested independently. In addition, in the testing process, the probe presses the connector pin of the circuit board to generate certain pressing force, so that the bad pin with suspended virtual welding in the connector pin on the circuit board is contacted with the circuit board to be in a conducting state, and defective products are leaked and placed, and the yield of the testing result is inaccurate.
Disclosure of Invention
The technical problems to be solved by the utility model are as follows: the conductivity testing device for the circuit board connector can independently test the conductivity of each pin on the circuit board and improve the yield of the tested product.
In order to solve the technical problems, the utility model adopts the following technical scheme:
the device comprises a conductive circuit board, a lead connector and a test probe, wherein the conductive circuit board is provided with a test contact, the test contact comprises a conductive contact, the conductive contact comprises an anode conductive contact and a cathode conductive contact, the test probe comprises a first anode probe and a first cathode probe, and the lead connector is a connector male seat or a connector female seat which are connected with a circuit board connector to be tested in a matching way;
the positive electrode pins of the grounding connector are electrically connected with the positive electrode conducting contacts in one-to-one correspondence, and the negative electrode pins of the grounding connector are electrically connected with the negative electrode conducting contacts in one-to-one correspondence;
the positive electrode conduction contact is in contact conduction with the first positive electrode probe, and the negative electrode conduction contact is in contact conduction with the first negative electrode probe.
Further, the test contact further comprises a grounding contact, the grounding contact comprises a first contact, a second contact and a third contact, the test probe further comprises a second positive electrode probe and a second negative electrode probe, the second contact is electrically connected with a grounding pin of the grounding connector through a wire, the first contact is in contact conduction with the first positive electrode probe, the second contact is in contact conduction with the first negative electrode probe, the third contact is in contact conduction with the second negative electrode probe, and the second positive electrode probe is in contact conduction with a grounding end of the circuit board connector to be tested.
Further, the positive electrode conducting contact and the negative electrode conducting contact are two parallel columns of metal contacts, the first contact is arranged in a metal contact array where the positive electrode conducting contact is located, the second contact is arranged in a metal contact array where the negative electrode conducting contact is located, and the third contact is arranged at an adjacent position of the first contact.
Further, the device further comprises a base and a cover plate, the conducting circuit board is arranged on the base, the lead-in connector is arranged on the conducting circuit board, the cover plate is arranged above the base and corresponds to the conducting circuit board, and the first positive electrode probe, the first negative electrode probe, the second positive electrode probe and the second negative electrode probe are arranged on the cover plate and correspond to the positions of the test contacts.
Further, the base is movably arranged on a table top of the connector testing machine, and the cover plate is arranged on a mechanical arm of the connector testing machine.
Further, a test groove and an accommodating groove are formed in one side, facing the cover plate, of the base, the test groove is communicated with the accommodating groove, the conducting circuit board is arranged in the test groove, and the accommodating groove is used for accommodating products associated with the circuit board connector to be tested.
Further, foam is arranged at the position of the cover plate corresponding to the accommodating groove.
The utility model has the beneficial effects that: the pins of the circuit board connector are electrically connected to the conducting circuit board in a one-to-one correspondence manner through the connection connector and the circuit board connector on the circuit board to be tested, the pins of the corresponding circuit board connector are arranged to be paired positive and negative test contacts on the conducting circuit board, so that a positive test contact, a positive pin of the connection connector, a positive pin of the circuit board connector to be tested, a product connected with the circuit board connector to be tested, a negative pin of the connection connector and a test path connected with the negative test contact in series in sequence are formed, the impedance data of the path is obtained through the test probe, the conductivity of a group of positive and negative pins of the circuit board connector can be obtained according to the impedance data, and no additional pressing force is generated on the circuit board connector in the test process, so that the press-fit conduction of defective pins of the virtual welding is avoided, the conductivity of each pin of the circuit board connector can be tested independently, the accuracy of the test is improved, and the product yield after the test is further improved.
Drawings
Fig. 1 is a schematic structural diagram of a circuit board connector conductivity testing device according to a first embodiment of the present utility model;
fig. 2 is a schematic structural diagram of a base of a circuit board connector conductivity testing device according to a first embodiment of the present utility model;
fig. 3 is a partial enlarged view a of a base of a circuit board connector conductivity testing device according to a first embodiment of the present utility model;
fig. 4 is a schematic top structure diagram of a cover plate of a circuit board connector conductivity testing device according to a first embodiment of the present utility model;
fig. 5 is a schematic diagram of a bottom structure of a cover plate of a circuit board connector conductivity testing device according to a first embodiment of the present utility model;
fig. 6 is a schematic structural diagram of a conductive circuit board of a circuit board connector conductivity testing device according to an embodiment of the utility model.
Description of the reference numerals:
1. a base; 11. a test groove; 12. an accommodating groove; 2. a cover plate; 3. conducting the circuit board; 4. a test probe; 41. a first positive electrode probe; 42. a first negative electrode probe; 43. a second positive electrode probe; 44. a second negative electrode probe; 5. a test contact; 51. conducting the contacts; 511. a positive electrode conductive contact; 512. a negative electrode conductive contact; 52. a ground contact; 521. a first contact; 522. a second contact; 523. a third contact; 6. a lead connector; 7. and soaking cotton.
Detailed Description
In order to describe the technical contents, the achieved objects and effects of the present utility model in detail, the following description will be made with reference to the embodiments in conjunction with the accompanying drawings.
The device comprises a conductive circuit board, a lead connector and a test probe, wherein the conductive circuit board is provided with a test contact, the test contact comprises a conductive contact, the conductive contact comprises an anode conductive contact and a cathode conductive contact, the test probe comprises a first anode probe and a first cathode probe, and the lead connector is a connector male seat or a connector female seat which are connected with a circuit board connector to be tested in a matching way;
the positive electrode pins of the grounding connector are electrically connected with the positive electrode conducting contacts in one-to-one correspondence, and the negative electrode pins of the grounding connector are electrically connected with the negative electrode conducting contacts in one-to-one correspondence;
the positive electrode conduction contact is in contact conduction with the first positive electrode probe, and the negative electrode conduction contact is in contact conduction with the first negative electrode probe.
From the above description, the beneficial effects of the utility model are as follows: the pins of the circuit board connector are electrically connected to the conducting circuit board in a one-to-one correspondence manner through the connection connector and the circuit board connector on the circuit board to be tested, the pins of the corresponding circuit board connector are arranged to be paired positive and negative test contacts on the conducting circuit board, so that a positive test contact, a positive pin of the connection connector, a positive pin of the circuit board connector to be tested, a product connected with the circuit board connector to be tested, a negative pin of the connection connector and a test path connected with the negative test contact in series in sequence are formed, the impedance data of the path is obtained through the test probe, the conductivity of a group of positive and negative pins of the circuit board connector can be obtained according to the impedance data, and no additional pressing force is generated on the circuit board connector in the test process, so that the press-fit conduction of defective pins of the virtual welding is avoided, the conductivity of each pin of the circuit board connector can be tested independently, the accuracy of the test is improved, and the product yield after the test is further improved.
Further, the test contact further comprises a grounding contact, the grounding contact comprises a first contact, a second contact and a third contact, the test probe further comprises a second positive electrode probe and a second negative electrode probe, the second contact is electrically connected with a grounding pin of the grounding connector through a wire, the first contact is in contact conduction with the first positive electrode probe, the second contact is in contact conduction with the first negative electrode probe, the third contact is in contact conduction with the second negative electrode probe, and the second positive electrode probe is in contact conduction with a grounding end of the circuit board connector to be tested.
As can be seen from the above description, the first contact, the second contact and the third contact are provided, the first contact is connected to the ground pin of the lead connector and then is connected to a ground pin of the circuit board connector to be tested, a ground detection line is formed with the second contact, another ground detection line is formed by the third contact and the reinforced steel sheet on the back of the circuit board connector to be tested, the first positive electrode probe and the first negative electrode probe are respectively contacted with the first contact and the second contact to conduct the ground quality test, and the second positive electrode probe and the second negative electrode probe are respectively contacted with the third contact and the reinforced steel sheet to conduct the impedance parameters of the ground pin of the circuit board connector to be tested on the circuit board of the product, so that the quality condition of the ground pin of the circuit board connector to be tested is obtained, the conductivity test of the pin for signal or electric quantity transmission can be performed, and the ground condition test of the ground pin can be performed simultaneously.
Further, the positive electrode conducting contact and the negative electrode conducting contact are two parallel columns of metal contacts, the first contact is arranged in a metal contact array where the positive electrode conducting contact is located, the second contact is arranged in a metal contact array where the negative electrode conducting contact is located, and the third contact is arranged at an adjacent position of the first contact.
The above description shows that the test contacts on the conductive circuit board are all metal contacts, and are electrically connected with the lead connector through wires in the circuit board, the first contacts and the plurality of positive conductive contacts are arranged in a row at intervals of 2 mm, and the second contacts and the plurality of negative conductive contacts are arranged in a row at intervals of 2 mm and parallel to the negative conductive contacts, so that the two groups of contact test contacts fixed by the positive and negative probes can be controlled to test, and the test is more convenient and can be mechanized and automated.
Further, the device further comprises a base and a cover plate, the conducting circuit board is arranged on the base, the lead-in connector is arranged on the conducting circuit board, the cover plate is arranged above the base and corresponds to the conducting circuit board, and the first positive electrode probe, the first negative electrode probe, the second positive electrode probe and the second negative electrode probe are arranged on the cover plate and correspond to the positions of the test contacts.
As can be seen from the above description, the base is provided for mounting the conductive circuit board, the lead connector and the product containing the connector of the circuit board to be tested, the first positive and negative electrode probes and the second positive and negative electrode probes are mounted and fixed by the cover plate, and the cover plate is aligned to the test contact on the base and pressed down to be in contact conduction for testing.
Further, the base is movably arranged on a table top of the connector testing machine, and the cover plate is arranged on a mechanical arm of the connector testing machine.
According to the above description, the base is installed on the table top of the connector testing machine and is connected with the sliding device capable of automatically translating, the sliding device of the testing machine drives the base to move, the cover plate is installed on the automatically-lifting electric control mechanical arm of the connector testing machine, accordingly, the electric control system of the testing machine can control the base to automatically translate to move the corresponding testing contact to the position right below the corresponding probe on the cover plate, the cover plate is controlled to automatically lift and contact with the testing contact, and accordingly, the circuit board conductivity test can be automatically performed, the efficiency is higher, and the test is more accurate.
Further, a test groove and an accommodating groove are formed in one side, facing the cover plate, of the base, the test groove is communicated with the accommodating groove, the conducting circuit board is arranged in the test groove, and the accommodating groove is used for accommodating products associated with the circuit board connector to be tested.
It can be seen from the above description that the grooves are formed in the base, and the conductive circuit board and the product with the connector of the circuit board to be tested are connected through the grooves, when the test probe contacts the conductive circuit board under the cover plate, the lower surface of the cover plate is attached to the upper surface of the base, so that the force of the test probe touching the conductive circuit board is controlled conveniently, and the conductive circuit board and the product are protected.
Further, foam is arranged at the position of the cover plate corresponding to the accommodating groove.
As can be seen from the above description, when the test probe contacts the conductive circuit board under the cover plate, the test probe is blocked from the integrated circuit on the base, so that the product on the base is prevented from being damaged when the test probe is pressed down, and the single-sided tilting of the circuit board connector to be tested and poor connection with the lead connector are prevented.
The testing device can be applied to the conductivity test of the pins welded on the circuit board of the product by the circuit board connector, the circuit board connector to be tested is arranged in the lead-in connector of the testing device, and the test contacts on the contact conduction circuit board corresponding to the test probes of the cover plate are conducted for testing, so that the independent conduction test of all the pins of the circuit board connector can be realized.
Referring to fig. 1 to 6, a first embodiment of the present utility model is as follows:
the circuit board connector conductivity testing device comprises a base 1, a cover plate 2, a conductive circuit board 3, a connection connector 6 and a test probe 4 as shown in fig. 5. The lead connector 6 is a connector male seat or a connector female seat for matching and connecting the circuit board connector to be tested, in this embodiment, the circuit board connector to be tested provided on the product is a connector male seat with six groups of pins, and the back surface of the connector male seat welded with the circuit board is provided with conductive steel sheets; correspondingly, the lead connector 6 is a mating connector female.
As shown in fig. 1 to 3, the base 1 is mounted on a skid on the surface of a connector tester and is movable in translation on the skid by the tester drive. The upper surface of the base 1 is provided with a test groove 11 and a containing groove 12, the conductive circuit board 3 is fixed in the test groove 11, and a product connected with a circuit board connector to be tested is placed in the containing groove 12. As shown in fig. 6, a test contact 5 made of a metal disc is arranged in the upper middle area of the conductive circuit board 3, the test contact 5 comprises a conductive contact 51 and a grounding contact 52, the conductive contact 51 comprises five positive conductive contacts 511 and five negative conductive contacts 512, and the grounding contact 52 comprises a first contact 521, a second contact 522 and a third contact 523. The positive conductive contacts 511 and the first contacts 521 are arranged in a row at the same pitch, the negative conductive contacts 512 and the second contacts 522 are arranged in another row at the same pitch, and the two rows are parallel and correspond to each other one by one, that is, one positive conductive contact 511 corresponds to one negative conductive contact 512 as a group, the first contacts 521 correspond to the second contacts 522, and the third contacts 523 are disposed at positions adjacent to the first contacts 521. The lead connector 6 is welded on the conductive circuit board 3 at the adjacent position of the test contact 5, a wire is arranged between the lead connector 6 and the test contact 5 on the conductive circuit board 3, the positive electrode pin of the lead connector 6 is electrically connected with the positive electrode conductive contact 511 in one-to-one correspondence through the wire, the negative electrode pin of the lead connector 6 is electrically connected with the negative electrode conductive contact 512 in one-to-one correspondence through the wire, and the ground pin of the lead connector 6 is electrically connected with the second contact 522 through the wire. During testing, the circuit board connector to be tested is matched and clamped with the lead connector 6, so that a continuous path from the positive conducting contact 511 to the positive pin of the lead connector 6 to the positive pin of the circuit board connector to be tested to the product circuit board to the negative pin of the circuit board connector to be tested to the negative pin of the lead connector 6 to the negative conducting contact 512 can be formed.
As shown in fig. 4 to 5, the cover plate 2 is disposed on a mechanical arm of the connector tester and is located right above the base 1, the test probes 4 are mounted on the cover plate 2 at positions corresponding to the test contacts 5, and foam 7 is disposed on the cover plate 2 at positions corresponding to the accommodating grooves 12. The test probe 4 includes a first positive electrode probe 41, a first negative electrode probe 42, a second positive electrode probe 43, and a second negative electrode probe 44, the first positive electrode probe 41 and the first negative electrode probe 42 being a set, the second positive electrode probe 43 and the second negative electrode probe 44 being a set, respectively connected to the impedance test system. During testing, the base 1 moves below the cover plate 2, the cover plate 2 is pressed down, so that the first positive electrode probe 41 and the first negative electrode probe 42 are in contact conduction with a group of positive electrode conduction contacts 511 and negative electrode conduction contacts 512, and impedance data corresponding to the group are obtained; the cover plate 2 is lifted, the base 1 translates to enable the positions of the next group of positive electrode conducting contacts 511 and negative electrode conducting contacts 512 to correspond to the falling points of the first positive electrode probe 41 and the first negative electrode probe 42, and the cover plate 2 is pressed down to measure impedance data of the next group; when the base 1 moves to the state that the grounding contact 52 is in contact conduction with the first positive electrode probe 41 and the first negative electrode probe 42, the second positive electrode probe 43 is in contact conduction with the third contact 523, and the second negative electrode probe 44 is in contact with a steel sheet on the back surface of the circuit board to be tested, which is welded with the circuit board connector.
The working principle of the testing device of the utility model is as follows:
inserting the circuit board connector to be tested into the lead connector 6, wherein a group of positive electrode conduction contacts 512 and a group of negative electrode conduction contacts correspond to a group of positive electrode pins and negative electrode pins of the circuit board connector to be tested, a sliding device of the tester drives a base 1 carrying the circuit board connector to be tested to move below a cover plate 2, a mechanical arm of the tester drives the cover plate 2 to descend, so that a test probe 4 is in conduction with a contact corresponding to a test contact 5, and test data acquisition processing is started when the contact is performed, so that conductivity data of a group of pins of the circuit board connector are obtained; the mechanical arm of the testing machine drives the cover plate 2 to lift, the sliding device of the testing machine drives the base 1 to move, a group of positive electrode conduction contacts 511 and negative electrode conduction contacts 512 corresponding to the next pin move to the position right below the testing probe 4, the mechanical arm of the testing machine drives the cover plate 2 to descend, and the testing probe 4 and the testing contact 5 are contacted and conducted again to collect conductivity data of the next group of pins; the above steps are repeated to test the conduction performance of each pin of the circuit board connector independently.
In summary, according to the circuit board connector conductivity testing device provided by the utility model, the connection connector is connected with the circuit board connector on the circuit board of the product to be tested to form the epitaxial testing path of the circuit board connector pin to be tested corresponding to the testing contact, the impedance data of the path is obtained by connecting the testing probe to the impedance testing system, the conductivity of a group of positive and negative pins of the circuit board connector can be obtained according to the impedance data, no additional pressing force is generated on the circuit board connector in the testing process, the poor pin press-fit conduction of the cold joint is avoided, the conductivity of each pin of the circuit board connector can be independently tested, the testing accuracy is improved, the product yield after the testing is further improved, and the device can be installed on a testing machine to automatically perform the testing.
The foregoing description is only illustrative of the present utility model and is not intended to limit the scope of the utility model, and all equivalent changes made by the specification and drawings of the present utility model, or direct or indirect application in the relevant art, are included in the scope of the present utility model.
Claims (7)
1. The device is characterized by comprising a conductive circuit board, a lead connector and a test probe, wherein the conductive circuit board is provided with a test contact, the test contact comprises a conductive contact, the conductive contact comprises a positive conductive contact and a negative conductive contact, the test probe comprises a first positive probe and a first negative probe, and the lead connector is a connector male seat or a connector female seat which are connected with the circuit board connector to be tested in a matching way;
the positive electrode pins of the grounding connector are electrically connected with the positive electrode conducting contacts in one-to-one correspondence, and the negative electrode pins of the grounding connector are electrically connected with the negative electrode conducting contacts in one-to-one correspondence;
the positive electrode conduction contact is in contact conduction with the first positive electrode probe, and the negative electrode conduction contact is in contact conduction with the first negative electrode probe.
2. The circuit board connector conductivity testing device of claim 1, wherein the testing contact further comprises a ground contact, the ground contact comprises a first contact, a second contact and a third contact, the testing probe further comprises a second positive electrode probe and a second negative electrode probe, the second contact is electrically connected with the ground pin of the ground lead connector through a wire, the first contact is in contact conduction with the first positive electrode probe, the second contact is in contact conduction with the first negative electrode probe, the third contact is in conduction with the second negative electrode probe, and the second positive electrode probe is in contact conduction with the ground contact of the circuit board connector to be tested.
3. The device for testing continuity of a circuit board connector according to claim 2, wherein the positive conductive contact and the negative conductive contact are two parallel rows of metal contacts, a first contact is disposed in a metal contact queue where the positive conductive contact is located, a second contact is disposed in a metal contact queue where the negative conductive contact is located, and a third contact is disposed adjacent to the first contact.
4. The device for testing conductivity of a circuit board connector according to claim 2, further comprising a base and a cover plate, wherein the conductive circuit board is disposed on the base, the lead-in connector is disposed on the conductive circuit board, the cover plate is disposed above the base at a position corresponding to the conductive circuit board, and the first positive electrode probe, the first negative electrode probe, the second positive electrode probe and the second negative electrode probe are disposed on the cover plate at positions corresponding to the test contacts.
5. The device of claim 4, wherein the base is movably disposed on a table of the connector tester, and the cover is disposed on a robotic arm of the connector tester.
6. The device for testing the conductivity of a circuit board connector according to claim 4, wherein a testing groove and a receiving groove are formed in a side of the base facing the cover plate, the testing groove and the receiving groove are communicated, the conductive circuit board is disposed in the testing groove, and the receiving groove is used for receiving a product associated with the circuit board connector to be tested.
7. The device for testing conductivity of a circuit board connector according to claim 6, wherein foam is disposed at a position of said cover plate corresponding to said receiving recess.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223072574.9U CN219496571U (en) | 2022-11-18 | 2022-11-18 | Conductivity testing device for circuit board connector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223072574.9U CN219496571U (en) | 2022-11-18 | 2022-11-18 | Conductivity testing device for circuit board connector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219496571U true CN219496571U (en) | 2023-08-08 |
Family
ID=87505556
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202223072574.9U Active CN219496571U (en) | 2022-11-18 | 2022-11-18 | Conductivity testing device for circuit board connector |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219496571U (en) |
-
2022
- 2022-11-18 CN CN202223072574.9U patent/CN219496571U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2012524905A (en) | Conductive Kelvin contacts for microcircuit testers | |
| KR20130132444A (en) | Testing apparatus for photovoltaic cells | |
| CN113253100A (en) | Testing device and detection system | |
| CN219496571U (en) | Conductivity testing device for circuit board connector | |
| CN201867426U (en) | Electrical testing device | |
| CN211554060U (en) | Multifunctional circuit board test fixture | |
| CN218902758U (en) | Automatic electric measuring device of connector | |
| CN210294443U (en) | Switching device for signal conduction | |
| CN218677874U (en) | Loose wire adaptive module for micro rectangular connector with wire and test tool | |
| CN210254661U (en) | Terminal insertion cap press-in electric detection assembly | |
| EP3114491B1 (en) | Method and device for testing the connections of batteries | |
| CN115290943A (en) | Automatic testing equipment and testing method for flat capacitor | |
| CN101769979A (en) | Connector test fixture | |
| CN201327520Y (en) | Test tool for connector | |
| CN217467062U (en) | SMD-0.3 encapsulation pottery pastes product normal atmospheric temperature testing arrangement | |
| CN215525904U (en) | Power high-voltage test fixture | |
| CN101329363A (en) | System and method for testing carrier plate and integrated circuit element | |
| CN220626595U (en) | Test structure and test device | |
| CN114740334A (en) | Electrical test device and test method for multi-channel probe card | |
| CN218240168U (en) | Automatic testing equipment for flat capacitor | |
| CN214585867U (en) | Electric parameter testing device for thin film force sensitive core | |
| CN214067228U (en) | Quick clamping test fixture | |
| CN218956635U (en) | Small-size B2B connection structure | |
| CN221078864U (en) | Point finding testing device | |
| CN217718001U (en) | Packaging module testing device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |