CN219142890U - Scanning ion conductance microscope system - Google Patents
Scanning ion conductance microscope system Download PDFInfo
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- CN219142890U CN219142890U CN202223033522.0U CN202223033522U CN219142890U CN 219142890 U CN219142890 U CN 219142890U CN 202223033522 U CN202223033522 U CN 202223033522U CN 219142890 U CN219142890 U CN 219142890U
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Abstract
The utility model provides a scanning ion conductance microscope system, which belongs to the technical field of scanning probe microscopes and comprises an acquisition motion system, a control operation system, a display operation system, a guide rail bracket system and a shell system; the acquisition motion system, the control operation system and the display operation system are electrically connected with each other, the control operation system is arranged above the guide rail bracket system, the acquisition motion system is connected with the upper part of the guide rail bracket system, and the display operation system is arranged on one side of the guide rail bracket system. The acquisition motion system, the control operation system and the shell system respectively form a Faraday cage structure, so that the interference of the outside on the system in the use process is reduced, and the accuracy and the stability of the test are ensured; the display operation system simplifies the operation procedure and reduces the operation difficulty of a user; the setting of guide rail bracket system has realized placing from inside to outside of microscope, satisfies different scene demands, when reduce cost, still can accomplish the use of many scenes.
Description
Technical Field
The utility model belongs to the technical field of scanning probe microscopes, and particularly relates to a scanning ion conductance microscope system.
Background
The scanning ion conductance microscope is a scanning probe microscope widely applied to the fields of medicine, biology, materials and the like, and can be used for scanning imaging of living cells and the surfaces of materials in micro-nano scale. The method is characterized in that the method can carry out non-contact and non-damage nanoscale imaging on living cells and the surfaces of materials in a physiological environment, does not need pretreatment such as fluorescent marking on samples, and is particularly suitable for observing soft samples such as living cells.
The principle of scanning ion conductance microscope is: an ultra-micro hollow glass tube with a conical tip (the radius of the conical tip is about tens to hundreds of nanometers) is used as a probe, a sample to be detected (such as living cells) is placed in a reaction vessel filled with electrolyte solution, the same electrolyte solution is filled in the probe, an Ag/AgCl electrode is respectively arranged in the probe and the reaction vessel, the probe is arranged on a probe holder, the probe holder is fixed on a piezoelectric scanning ceramic, at the moment, voltages are applied to the two ends of the electrode, so that a current signal is formed in the electrolyte solution, the distance between the tip at the bottom of the probe and the surface of the sample to be detected is constant through program control, the current signal is amplified, then transformation is carried out, the fluctuation height of the surface of the sample can be represented, and meanwhile, the transverse position of the probe tip is recorded, so that the three-dimensional characteristic of the surface of the sample can be described.
At present, the technology of a scanning ion conductance microscope is mature, a plurality of manufacturers have done achievement transformation to develop a scanning ion conductance microscope system based on the technical scheme, and the system is applied to different fields for basic research. However, the existing scanning ion conductance microscope system still has some defects:
the existing scanning ion conductivity microscope system takes a microscope as a framework, the microscope is surrounded for system construction, the system only envelopes a collection motion system, a control operation system, a display operation system and the like are all external and are in communication connection through cables, the integration degree of the system is low, and the system is easily interfered by external noise factors, so that the accuracy and the stability of system test are affected.
In addition, because the integration degree of the existing system is not high, an operator needs to build the system in advance before using the system, and in the using process, the system is interacted with by using peripheral equipment (a computer, an oscilloscope and the like) continuously, so that the use difficulty is high and the system is very complex, the requirement on the operator is extremely high, and the system is limited to be used in part of scientific research institutions and universities at present.
In addition, the microscopes used in the current scanning ion conductance microscope system are calibrated by manufacturers, cannot be interchanged according to the use habit of operators, cannot be expanded on the system, and therefore have single use scenes.
Chinese patent No. CN215728236U discloses a scanning probe microscope system, which comprises a probe frame, a mainframe probe, a tuning fork type sensing probe, a mainframe base, a measurement and control device and an optical microscope system. The host probe includes a probe holder mounting location. The probe holder is configured to be mounted to a probe holder mounting location. The tip of the tuning fork type sensing probe is perpendicular to the tuning fork of the tuning fork type sensing probe. The tuning fork type sensing probe is configured to be mounted to the probe holder with a receiving area between the host probe and the tuning fork type sensing probe. The host base is configured to support and be in signal connection with the host probe. The measurement and control device is connected with the base of the host computer in a signal way. In operation, the optical microscope system is partially disposed in the receiving area. The optical microscope system is in signal connection with the measurement and control device. The main controller and the computer of the system are all external and are in communication connection with each other through cables, the integration degree of the system is not high, and the system is easy to be interfered by external noise factors, so that the accuracy and the stability of the system test are affected.
Disclosure of Invention
Aiming at the problems in the prior art, the utility model provides a scanning ion conductance microscope system, and the technical problem to be solved by the utility model is how to improve the accuracy and stability of the scanning ion conductance microscope system, how to reduce the operation difficulty of a user and how to realize the expansion and use of multiple scenes.
In order to solve the technical problems, the utility model provides a scanning ion conductance microscope system, which comprises an acquisition motion system, a control operation system, a display operation system, a guide rail bracket system and a shell system;
the acquisition motion system, the control operation system and the display operation system are electrically connected with each other, the control operation system is arranged above the guide rail bracket system, the acquisition motion system is connected with the upper part of the guide rail bracket system, and the display operation system is arranged on one side of the guide rail bracket system;
the acquisition motion system, the control operation system, the display operation system and the guide rail bracket system are all arranged in the shell system, so that a complete system is constructed, and the system is different from the scheme that the control operation system and the display operation system are arranged externally.
The guide rail bracket system comprises guide rails and a sliding tray, the sliding tray is connected between the guide rails, the upper part of the sliding tray is connected with a collection motion system, and the sliding tray can drive the collection motion system to slide on the guide rails.
Furthermore, the shell system is a box body formed by processing metal materials, so that a first Faraday cage is formed, and the acquisition and movement system and the control and operation system inside the first Faraday cage are protected from being interfered by external noise, so that the accuracy and stability of system test are ensured;
further, gather motion system and include collection probe subassembly, piezoelectricity part, PCBA, shield cover and outline border member, collection probe subassembly is connected with the PCBA electricity, and piezoelectricity part is connected with the PCBA electricity, and the PCBA setting is in the inside of shield cover, and piezoelectricity part, collection probe subassembly, PCBA and shield cover are all installed in outline border member's inside.
Further, the outer frame member is made of metal. This constitutes a second faraday cage, protecting the piezoelectric element and the collection probe assembly inside from external noise. Moreover, the shielding cover is also arranged on the collection motion system to protect the PCBA of the external interface inside the collection motion system from being interfered by external noise, so that the accuracy and stability of system test are ensured.
Further, the control operation system comprises a control part, an operation part, a power part, a current amplifier part and a box body, wherein the control part, the operation part, the power part and the current amplifier part are electrically connected with each other, and the control part, the operation part, the power part and the current amplifier part are positioned in the box body.
Further, a terminal plate is arranged on the side face of the box body.
Further, the case is made of metal. The control part, the operation part, the power supply part and the current amplifier part are all arranged in the box body; the box is also a box formed by processing metal materials, so that a third Faraday cage is formed, and the control part, the operation part, the power supply part and the current amplifier part in the third Faraday cage are protected from being interfered by external noise, thereby ensuring the accuracy and the stability of system test.
Further, the display operation system comprises a touch control integrated machine, a mounting frame and a fixing frame, wherein the touch control integrated machine is arranged in an opening of the fixing frame, one side of the fixing frame is connected with the mounting frame, and the upper portion of the fixing frame is connected with the shell system.
Further, the housing system includes a first housing and a second housing, the first housing being coupled to the second housing, the interior forming a cavity.
Further, an opening is formed in the sliding tray, and the collection motion system is arranged in the opening.
Due to the presence of the guide rails, the sliding tray can be in 2 states, respectively a contracted state and an expanded state. When the sliding tray is in a contracted state, the collecting and moving system is positioned in the shell system and is connected with a microscope placed in the guide rail bracket system, namely, the microscope is provided with a built-in use scheme. When the sliding tray is in a stretched state, the collection motion system 1 is positioned outside the shell system, and the microscope can be moved to the outside of the shell system at the moment so as to be connected with the shell system, namely the external use scheme of the microscope. The use of multiple scenes is realized through the internal and external placement of the microscope, so that different scene requirements are met.
The utility model provides a scanning ion conductance microscope system, wherein a faraday cage structure is formed by a collection motion system, a control operation system and a shell system respectively, so that the interference of the outside on the system in the use process is reduced, and the accuracy and the stability of the test are ensured; meanwhile, the operation procedure is simplified, and the operation difficulty of a user is reduced; in addition, the operator is not limited to using a calibrated microscope, can use the existing microscope on the own side, expands functions on the microscope, and can realize multi-scene use while reducing cost.
Drawings
Fig. 1 is a schematic diagram of an embodiment of a scanning ion conductance microscope system of the present utility model.
Fig. 2 is a schematic diagram of an acquisition motion system of a scanning ion conductance microscope system of the present utility model.
Fig. 3 is a schematic diagram of an acquisition motion system of a scanning ion conductance microscope system of the present utility model.
Fig. 4 is a schematic diagram of an acquisition motion system of a scanning ion conductance microscope system of the present utility model.
Fig. 5 is a schematic diagram of an acquisition motion system of a scanning ion conductance microscope system of the present utility model.
Fig. 6 is a schematic diagram of an acquisition motion system of a scanning ion conductance microscope system of the present utility model.
FIG. 7 is a schematic diagram of a control algorithm for a scanning ion conductance microscope system according to the present utility model.
FIG. 8 is a schematic diagram of a control algorithm for a scanning ion conductance microscope system according to the present utility model.
Fig. 9 is a schematic diagram of a display operating system of a scanning ion conductance microscope system of the present utility model.
Fig. 10 is a schematic diagram of a rail mount system of a scanning ion conductance microscope system of the present utility model.
Fig. 11 is a schematic diagram of a housing system of a scanning ion conductance microscope system of the present utility model.
FIG. 12 is a schematic diagram of the use of a scanning ion conductance microscope system of the present utility model.
Fig. 13 is a schematic diagram of the use of a scanning ion conductance microscope system of the present utility model.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present utility model more apparent, the technical solutions of the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model, and it is apparent that the described embodiments are some embodiments of the present utility model, but not all embodiments. All other embodiments, based on the embodiments of the utility model, which are apparent to those of ordinary skill in the art without inventive faculty, are intended to be within the scope of the utility model.
Thus, the following detailed description of the embodiments of the utility model, as presented in the figures, is not intended to limit the scope of the utility model, as claimed, but is merely representative of selected embodiments of the utility model. All other embodiments, based on the embodiments of the utility model, which are apparent to those of ordinary skill in the art without inventive faculty, are intended to be within the scope of the utility model.
It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further definition or explanation thereof is necessary in the following figures.
In the present utility model, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.
For a better understanding of the objects, structure and function of the utility model, a scanning ion conductance microscope system according to the utility model is described in further detail below with reference to the accompanying drawings.
Example 1:
referring to fig. 1, a scanning ion conductance microscope system is provided in an embodiment of the present utility model, which includes an acquisition motion system 1, a control operation system 2, a display operation system 3, a rail support system 4, and a housing system 5.
The acquisition motion system 1, the control operation system 2 and the display operation system 3 are electrically connected with each other. The acquisition motion system 1 and the control operation system 2 are arranged above the guide rail bracket system 4, and the display operation system 3 is arranged on one side of the guide rail bracket system 4.
The acquisition motion system 1, the control operation system 2, the display operation system 3 and the guide rail bracket system 4 are all arranged in the shell system 5, so that a complete system is constructed, the control operation system is different from the external scheme of the display operation system 3, the shell system 5 is a box body formed by processing metal materials, a first Faraday cage is formed, the acquisition motion system 1 and the control operation system 2 in the first Faraday cage are protected from being interfered by external noise, and the accuracy and the stability of system test are ensured.
Example 2:
referring to fig. 1, a scanning ion conductance microscope system is provided in an embodiment of the present utility model, which includes an acquisition motion system 1, a control operation system 2, a display operation system 3, a rail support system 4, and a housing system 5.
The acquisition motion system 1, the control operation system 2 and the display operation system 3 are electrically connected with each other. The acquisition motion system 1 and the control operation system 2 are arranged above the guide rail bracket system 4, and the display operation system 3 is arranged on one side of the guide rail bracket system 4.
The acquisition motion system 1, the control operation system 2, the display operation system 3 and the guide rail bracket system 4 are all arranged in the shell system 5, so that a complete system is constructed, the control operation system 2 and the display operation system 3 are different from an external scheme, the shell system 5 is a box body formed by processing metal materials, a first Faraday cage is formed, the acquisition motion system 1 and the control operation system 2 in the first Faraday cage are protected from being interfered by external noise, and the accuracy and the stability of system testing are ensured.
The present embodiment is different from the first embodiment in that:
as shown in fig. 2 and 3, the pick motion system 1 includes a pick probe assembly 11, a piezoelectric component 12, a PCBA13, a shield 14, and an outer frame member 15.
The piezoelectric member 12 is a piezoelectric ceramic member.
The collection probe assembly 11 is electrically connected to the PCBA13, the piezoelectric member 12 is electrically connected to the PCBA13, the PCBA13 is disposed inside the shield can 14, and the piezoelectric member 12, the collection probe assembly 11, the PCBA13 and the shield can 14 are all mounted inside the outer frame member 15.
The piezoelectric component 11, the acquisition probe assembly 12, the PCBA13 and the shielding can 14 are all arranged inside the outer frame component 15; the outer frame member 15 is a case formed of a metal material, thus forming a second faraday cage, and protecting the piezoelectric member 11 and the collection probe assembly 12 inside thereof from external noise. Moreover, the shielding cover 14 is also arranged on the collection motion system 1 to protect the PCBA13 of the external interface inside the collection motion system from being interfered by external noise, so that the accuracy and stability of system test are ensured.
Example 3:
referring to fig. 1, a scanning ion conductance microscope system is provided in an embodiment of the present utility model, which includes an acquisition motion system 1, a control operation system 2, a display operation system 3, a rail support system 4, and a housing system 5.
The acquisition motion system 1, the control operation system 2 and the display operation system 3 are electrically connected with each other. The acquisition motion system 1 and the control operation system 2 are arranged above the guide rail bracket system 4, and the display operation system 3 is arranged on one side of the guide rail bracket system 4.
The acquisition motion system 1, the control operation system 2, the display operation system 3 and the guide rail bracket system 4 are all arranged in the shell system 5, so that a complete system is constructed, the control operation system 2 and the display operation system 3 are different from an external scheme, the shell system 5 is a box body formed by processing metal materials, a first Faraday cage is formed, the acquisition motion system 1 and the control operation system 2 in the first Faraday cage are protected from being interfered by external noise, and the accuracy and the stability of system testing are ensured.
The acquisition motion system 1 includes an acquisition probe assembly 11, a piezoelectric member 12, a PCBA13, a shield 14, and an outer frame member 15.
The collection probe assembly 11 is electrically connected to the PCBA13, the piezoelectric member 12 is electrically connected to the PCBA13, the PCBA13 is disposed inside the shield can 14, and the piezoelectric member 12, the collection probe assembly 11, the PCBA13 and the shield can 14 are all mounted inside the outer frame member 15.
The piezoelectric member 12 is a piezoelectric ceramic member.
The piezoelectric component 11, the acquisition probe assembly 12, the PCBA13 and the shielding can 14 are all arranged inside the outer frame component 15; the outer frame member 15 is a case formed of a metal material, thus forming a second faraday cage, and protecting the piezoelectric member 11 and the collection probe assembly 12 inside thereof from external noise. Moreover, the shielding cover 14 is also arranged on the collection motion system 1 to protect the PCBA13 of the external interface inside the collection motion system from being interfered by external noise, so that the accuracy and stability of system test are ensured.
The present embodiment is different from the first and second embodiments in that:
as shown in fig. 7 and 8, the control arithmetic system 2 includes a control section 21, an arithmetic section 22, a power supply section 23, a current amplifier section 24, and a case 25.
The side of the case 25 is provided with a terminal plate 251, and the terminal plate 251 can cover the control operation system 2, so that external electromagnetic interference does not interfere with the control operation system 2.
The control section 21, the operation section 22, the power supply section 23, and the current amplifier section 24 are electrically connected to each other.
The control section 21, the operation section 22, the power supply section 23, and the current amplifier section 24 are all installed inside the case 25; the case 25 is also a case made of metal, thus forming a third faraday cage, and protecting the control unit 21, the operation unit 22, the power unit 23 and the current amplifier unit 24 from external noise, thereby ensuring accuracy and stability of system test.
The acquisition motion system 1, the control operation system 2 and the display operation system 3 are all connected and communicated in the shell system 5, so that the trouble that an external scheme needs temporary connection and communication is avoided; in addition, in the working process of the system, the control instruction of the system can be issued and completed by controlling the display operation system 3, and interaction with peripheral equipment is not needed from time to time, so that the operation difficulty of a user is greatly reduced.
Example 4:
referring to fig. 1, a scanning ion conductance microscope system is provided in an embodiment of the present utility model, which includes an acquisition motion system 1, a control operation system 2, a display operation system 3, a rail support system 4, and a housing system 5.
The acquisition motion system 1, the control operation system 2 and the display operation system 3 are electrically connected with each other. The acquisition motion system 1 and the control operation system 2 are arranged above the guide rail bracket system 4, and the display operation system 3 is arranged on one side of the guide rail bracket system 4.
The acquisition motion system 1, the control operation system 2, the display operation system 3 and the guide rail bracket system 4 are all arranged in the shell system 5, so that a complete system is constructed, the control operation system 2 and the display operation system 3 are different from an external scheme, the shell system 5 is a box body formed by processing metal materials, a first Faraday cage is formed, the acquisition motion system 1 and the control operation system 2 in the first Faraday cage are protected from being interfered by external noise, and the accuracy and the stability of system testing are ensured.
The acquisition motion system 1 is composed of an acquisition probe assembly 11, a piezoelectric member 12, a PCBA13, a shield 14, and an outer frame member 15.
The acquisition probe assembly 11 is electrically connected to the PCBA13, the piezoelectric member 12 is electrically connected to the PCBA13, and the PCBA13 is disposed inside the shield can 14. As shown in FIG. 6, the piezoelectric member 12, the acquisition probe assembly 11, the PCBA13 and the shield can 14 are all mounted inside the housing member 15.
The piezoelectric member 12 is a piezoelectric ceramic member.
The piezoelectric component 11, the acquisition probe assembly 12, the PCBA13 and the shielding can 14 are all arranged inside the outer frame component 15; the outer frame member 15 is a case formed of a metal material, thus forming a second faraday cage, and protecting the piezoelectric member 11 and the collection probe assembly 12 inside thereof from external noise. Furthermore, as shown in fig. 5, a shielding cover 14 is also arranged on the collection motion system 1 to protect the external interface PCBA13 inside the collection motion system from being interfered by external noise, thereby ensuring the accuracy and stability of system test.
The control operation system 2 includes a control unit 21, an operation unit 22, a power supply unit 23, a current amplifier unit 24, and a case 25.
The control section 21, the operation section 22, the power supply section 23, and the current amplifier section 24 are electrically connected to each other.
The control section 21, the operation section 22, the power supply section 23, and the current amplifier section 24 are all installed inside the case 25; the case 25 is also a case made of metal, thus forming a third faraday cage, and protecting the control unit 21, the operation unit 22, the power unit 23 and the current amplifier unit 24 from external noise, thereby ensuring accuracy and stability of system test.
The present embodiment is different from the first, second, and third embodiments in that:
as shown in fig. 9, the display operating system 3 includes a touch-control all-in-one machine 31, a mounting frame 32, and a fixing frame 33.
The touch-control all-in-one machine 31 is arranged in an opening of the fixing frame 33, and one side of the fixing frame 33 is connected with the mounting frame 32.
As shown in fig. 11, the housing system includes a first housing 51 and a second housing 52, the first housing 51 being connected to the second housing 52, and a cavity being formed inside.
As shown in fig. 10, the rail bracket system 4 includes rails 41 and a slide tray 42, the slide tray 42 being connected between the rails 41.
As shown in fig. 12 and 13, the guide rail 41 and the sliding tray 42 are disposed on the guide rail bracket system 4, and an opening is disposed on the sliding tray 42, and the collecting motion system 1 is fixedly connected to the opening, and due to the existence of the guide rail 41, the sliding tray 42 can be in 2 states, namely a contracted state and an extended state.
When the sliding tray 42 is in the contracted state, the collection motion system 1 is positioned inside the shell system 5, and the collection motion system 1 is connected with a microscope placed inside the guide rail bracket system 4, namely, a built-in use scheme of the microscope. When the sliding tray 42 is in a stretched state, the collection motion system 1 is outside the shell system 5, and the microscope can be moved to the outside of the shell system to connect the two, namely, the external use scheme of the microscope. The use of multiple scenes is realized through the internal and external placement of the microscope, so that different scene requirements are met.
The acquisition motion system 1, the control operation system 2 and the display operation system 3 are all connected and communicated in the shell system 5, so that the trouble that an external scheme needs temporary connection and communication is avoided; in addition, in the working process of the system, the display operating system 3 is controlled, so that the control instruction of the system can be issued and completed, and interaction with peripheral equipment is not needed at all times, thereby greatly reducing the operation difficulty of a user.
As shown in fig. 3, the acquisition probe assembly 11 includes an acquisition probe anchor 111, an acquisition probe member 112, an acquisition probe base 113, a Z-direction piezoelectric ceramic 114, a Z-direction adapter plate 115, and a Z-direction piezoelectric screw 116.
The acquisition probe member 112 is secured to the acquisition probe base 113 by an acquisition probe anchor 111.
The acquisition probe base 113 is fixedly connected to the Z-direction piezoelectric ceramic 114 through a screw.
The Z-direction piezoelectric ceramic 114 is fixedly connected to the Z-direction adapter plate 115 through a screw.
The Z-direction adapter plate 115 is screwed to the Z-direction piezoelectric screw 116.
The Z-direction piezoelectric screw 116 is electrically connected to the PCBA 13.
As shown in fig. 4, the piezoelectric member 12 includes a cuvette tray 121, a cuvette 122, an XY-direction piezoelectric ceramic 123, an XY-direction adapter plate 124, and an XY-direction piezoelectric screw 125.
The reaction cuvette 122 is placed on a reaction cuvette tray 121.
The cuvette tray 121 is fixed to the XY piezoelectric ceramics 123 by screws.
The XY piezoelectric ceramics 123 are fixed on the XY interposer 124 by screws.
The XY-direction adapter plate 124 is fixed to the XY-direction piezoelectric screw 125 by screws.
The XY piezoelectric screw 125 is electrically connected to the PCBA 13.
The embodiment also comprises a system installation base which is connected to the lower end of the shell system.
The working process of the scanning ion conductance microscope system is as follows:
step S1, starting up;
the scanning ion conductance microscope system is energized. The acquisition motion system 1, the control operation system 2 and the display operation system 3 are in a state of being ready to work.
Step S2, constructing a loop between the working electrode and the reference electrode;
firstly, taking down the glass probe from the collecting probe assembly 11, injecting PPS solution from the tip of the glass probe by using a syringe, and reloading the glass probe back to the collecting probe assembly 11; then placing the measured object into the reaction vessel 122, injecting PPS solution into the transparent reaction vessel 122 by using a syringe, and submerging the measured object; the reference electrode is then placed in a transparent reaction dish 122. Thus, a loop is formed between the working electrode and the reference electrode through the PPS solution, and signal acquisition can be performed.
S3, carrying out alignment of the acquisition probe component and the measured object;
the built-in use scheme of the microscope is found as follows:
firstly, controlling the movement of the collection probe assembly 11 through the touch control integrated machine 31, and stopping downward movement of the collection probe assembly 11 when the needle tip of the collection probe assembly 11 is about to contact the bottom of the reaction vessel 122; focusing a microscope built in the shell system 5 until the tip of the glass probe can be clearly observed; and then the reaction vessel tray 121 and the reaction vessel 122 are controlled to move along the horizontal direction by the touch control integrated machine, the measured object in the reaction vessel 122 is observed to move into the range of the glass probe of the collection probe assembly 11, the reaction vessel tray 121 and the reaction vessel 122 are controlled to stop moving (namely, the vertical projection of the glass probe can be projected into the range of the measured object), and thus the collection probe component and the measured object are aligned. Because the microscope is built-in, the condition that can't directly observe and focus through the eyepiece, the solution is that on transferring the interface of eyepiece with the digital camera, transmit real-time collection picture to the touch-control all-in-one through the data line, the external use scheme of microscope of observing is looked for:
pulling the sliding tray 42 on the guide rail bracket system 4 out of the shell system 5, pulling the acquisition motion system 1 fixedly connected with the sliding tray out, controlling the movement of the acquisition probe assembly 11 through the touch control integrated machine 31, and stopping downward movement of the acquisition probe assembly 11 when the needle tip of the acquisition probe assembly 11 is about to contact the bottom of the reaction vessel 122; focusing a microscope built in the shell system 5 until the tip of the glass probe can be clearly observed; and then the reaction vessel tray 121 and the reaction vessel 122 are controlled to move along the horizontal direction by the touch control integrated machine, the measured object in the reaction vessel 122 is observed to move into the range of the glass probe of the collection probe assembly 11, the reaction vessel tray 121 and the reaction vessel 122 are controlled to stop moving (namely, the vertical projection of the glass probe can be projected into the range of the measured object), and thus the collection probe component and the measured object are aligned. The observation method of the external scheme is that the human eye directly observes and focuses through an ocular lens of a microscope.
S4, performing pre-positioning of the glass probe Z direction of the acquisition probe assembly 11;
the touch control integrated machine 31 controls the glass probe of the acquisition probe assembly 11 to move downwards (move in the vertical direction) for 30 mu m, at the same time, observes the change of the current of the upper computer, if the current is not changed, lifts the glass probe upwards for 15 mu m, then moves downwards for 30 mu m in the full stroke, searches again, and sequentially performs the above steps until the signal is searched, and after the signal is searched, the pre-positioning of the glass probe in the Z direction is completed, and the scanning work is ready.
When a current signal is generated between the working electrode and the reference electrode (when the distance is far, the current value is almost 0), the signal is transmitted to the current amplifier 24 by means of a communication wire for processing and amplifying the signal; then, the processed signal is transmitted to an oscilloscope controlling the operation system 2 by means of a communication line; then, the oscilloscope processes the signal, transmits the signal to the touch control integrated machine 31 for presentation by means of a communication line, and when the current value is 0, the upper computer software of the control operation system 2 is controlled, and an instruction is applied to the Z-direction piezoelectric screw controller to enable the Z-direction piezoelectric screw 116 to be commanded to work.
S5, starting scanning;
the touch-control all-in-one machine 31 sets the scanning current, the scanning single frame precision, the scanning range and the scanning speed, and after the parameter setting is completed, the instrument starts scanning by clicking. In the scanning process, the system records the coordinate value and the height value of each point, and stores the information in a text format for later data processing.
During the scanning process, a current signal is generated between the working electrode and the reference electrode, and the signal is transmitted to the current amplifier 24 by means of a communication wire for signal processing and amplification; then, the processed signals are transmitted to the BNC adapter plate of the acquisition motion system 1 by means of a communication line; then the BNC adapter plate directly transmits the received signal to a current acquisition card of the control operation system 2; then, the current acquisition card processes the received signal, one port is transmitted to an oscilloscope of the operation display system 3 for processing, waveform presentation is carried out on the touch control integrated machine 31, the other port returns the signal to the current acquisition card, and the current acquisition card transmits the signal to the piezoelectric ceramic controller; finally, the piezoelectric ceramic controller controls the XY-direction piezoelectric ceramic 123 and the Z-direction piezoelectric ceramic 116 to work.
S6, processing scanned data;
and importing the scanned data into related software for processing, and performing three-dimensional reconstruction by utilizing the coordinate value and the height value of each point, thereby describing the surface morphology of the measured object.
The utility model provides a scanning ion conductance microscope system, wherein a faraday cage structure is formed by a collection motion system, a control operation system and a shell system respectively, so that the interference of the outside on the system in the use process is reduced, and the accuracy and the stability of the test are ensured; the instruction is directly issued through the display operation system 3, so that the operation procedure is simplified, and the operation difficulty of a user is reduced; in addition, the operator is not limited to using a calibrated microscope, can use the existing microscope on the own side, expands functions on the microscope, and can realize multi-scene use while reducing cost.
The above description is only of the preferred embodiments of the present utility model and is not intended to limit the present utility model, but various modifications and variations can be made to the present utility model by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present utility model are included in the protection scope of the present utility model.
Claims (10)
1. The scanning ion conductance microscope system is characterized by comprising an acquisition motion system, a control operation system, a display operation system, a guide rail bracket system and a shell system;
the acquisition motion system, the control operation system and the display operation system are electrically connected with each other, the control operation system is arranged above the guide rail bracket system, the acquisition motion system is connected with the upper part of the guide rail bracket system, and the display operation system is arranged on one side of the guide rail bracket system;
the acquisition motion system, the control operation system, the display operation system and the guide rail bracket system are all arranged in the shell system;
the guide rail bracket system comprises guide rails and a sliding tray, the sliding tray is connected between the guide rails, the upper part of the sliding tray is connected with a collection motion system, and the sliding tray can drive the collection motion system to slide on the guide rails.
2. The scanning ion conductance microscope system of claim 1, wherein the housing system is made of metal, constituting a first faraday cage.
3. The scanning ion conductance microscope system of claim 1, wherein the collection motion system comprises a collection probe assembly, a piezoelectric component, a PCBA, a shield and an enclosure member, the collection probe assembly is electrically connected to the PCBA, the piezoelectric component is electrically connected to the PCBA, the PCBA is disposed within the enclosure member, and the piezoelectric component, the collection probe assembly, the PCBA and the shield are all mounted within the enclosure member.
4. A scanning ion conductivity microscope system according to claim 3 wherein the outer frame member is made of metal and forms a second faraday cage.
5. The system of claim 1, wherein the control computing system comprises a control component, a computing component, a power supply component, a current amplifier component, and a housing, the control component, the computing component, the power supply component, and the current amplifier component being electrically coupled to one another, the control component, the computing component, the power supply component, and the current amplifier component being located within the housing.
6. The scanning ion conductance microscope system of claim 5, wherein the side of the housing is provided with a terminal plate.
7. The scanning ion conductance microscope system of any one of claims 5-6, wherein said housing is made of metal, constituting a third faraday cage.
8. The system of claim 1, wherein the display operation system comprises a touch control integrated machine, a mounting frame and a fixing frame, the touch control integrated machine is arranged in an opening of the fixing frame, one side of the fixing frame is connected with the mounting frame, and the upper part of the fixing frame is connected with the shell system.
9. The scanning ion conductance microscope system of claim 1, wherein the housing system comprises a first housing and a second housing, the first housing being connected to the second housing, the interior forming a cavity.
10. The scanning ion conductance microscope system of claim 1, wherein the sliding tray is provided with an opening.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223033522.0U CN219142890U (en) | 2022-11-14 | 2022-11-14 | Scanning ion conductance microscope system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223033522.0U CN219142890U (en) | 2022-11-14 | 2022-11-14 | Scanning ion conductance microscope system |
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| Publication Number | Publication Date |
|---|---|
| CN219142890U true CN219142890U (en) | 2023-06-06 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202223033522.0U Active CN219142890U (en) | 2022-11-14 | 2022-11-14 | Scanning ion conductance microscope system |
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| Country | Link |
|---|---|
| CN (1) | CN219142890U (en) |
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