CN219132044U - Metallographic specimen holder - Google Patents

Abstract

The application provides a metallographic specimen holder, this metallographic specimen holder include the base and put the thing platform, put the thing platform with base swing joint, and can be relative the base reciprocates. The metallographic specimen holder can adjust the height, and the purpose that the distance between the observation surface of the metallographic specimen and the ocular is kept consistent is achieved.

Description

Metallographic specimen holder

Technical Field

The application belongs to the technical field of part clamps and relates to a metallographic specimen clamp holder.

Background

Metallographic examination is the work of examining macro and micro structures inside metal or nonmetal materials by using a metallographic method. The main process of metallographic examination comprises the following steps: sampling, mounting, grinding, polishing and tissue displaying. The metallographic examination process is not separated from a metallographic microscope, and the metallographic microscope is used for observing and examining the internal structure of a metallographic specimen by adopting a metallographic analysis method, so that the porosity, air holes, slag inclusion structure uniformity, cracks and the like of the material can be examined. Metallographic analysis can also provide the basis for adjusting procedures and modifying technological parameters, and guide industrial production.

In the preparation of a metallographic specimen in the early stage, a metallographic specimen holder is often required in order to simplify the operation steps of detecting a metallographic specimen at the time of metallographic microscope detection. However, the metallographic samples are different in size and different in height, so that the height cannot be adjusted in the prior art, and the distance between the observation surface of the metallographic sample and the eyepiece is kept consistent.

Disclosure of Invention

In view of the above-mentioned drawbacks of the prior art, an object of the present application is to provide a metallographic specimen holder for solving the problem that the height cannot be adjusted in the prior art and keeping the distance between the observation surface of the metallographic specimen and the eyepiece consistent.

In a first aspect, the present application provides a metallographic specimen holder comprising: the object placing table is movably connected with the base and can move up and down relative to the base.

In one implementation manner of the first aspect, the base includes: and the limiting structure is used for limiting the moving direction of the object placing table so that the object placing table can move up and down relative to the base, and the position adjusting structure is used for driving the object placing table to move up and down along the base.

In one implementation manner of the first aspect, the base has a first side wall, the limiting structure is a dovetail groove milled along an up-down direction of the first side wall, and the object placing table has a dovetail matched with the dovetail groove.

In an implementation manner of the first aspect, the rack is disposed below the object placing table, the position adjusting structure includes a gear shaft, the base further includes a second side wall, the second side wall includes a first through hole, the gear shaft is in driving connection with the rack, and a first end of the gear shaft passes through the first through hole.

In one implementation manner of the first aspect, the position adjustment structure further includes a rotation adjustment structure, and the rotation adjustment structure is disposed at a first end of the gear shaft.

In one implementation of the first aspect, the rotation adjustment structure includes a hand wheel.

In one implementation manner of the first aspect, the base further includes a third sidewall disposed opposite to the second sidewall, the third sidewall having a second through hole, and the second end of the gear shaft passes through the second through hole.

In one implementation of the first aspect, the second end of the gear shaft is threaded.

In an implementation manner of the first aspect, the locking structure is configured to lock the position adjustment structure when the object placing table moves to the target position.

In one implementation manner of the first aspect, the metallographic specimen holder includes a support seat, and the support seat is disposed below the base, and is used for supporting the base.

As described above, the metallographic specimen holder disclosed by the application has the following beneficial effects:

the metallographic specimen holder is provided with a storage table movably connected with the base, the storage table can move up and down relative to the base, the height of a metallographic specimen can be adjusted, and the purpose that the distance between an observation surface of the metallographic specimen and an ocular is kept consistent is achieved.

The application metallographic specimen holder still be provided with limit structure, limit structure can avoid metallographic specimen to put the rocking of thing platform, guarantees to put the thing platform and remove the stationarity of in-process.

Further, in some embodiments, the metallographic specimen holder described herein may further comprise a locking structure. The locking structure can be used for fixing the position of the object placing table, so that the height of the object placing table is unchanged in the observation process of a metallographic microscope, and the detection efficiency of the metallographic microscope is improved.

Drawings

Fig. 1 is a schematic structural view of a metallographic specimen holder according to an embodiment of the present application.

Fig. 2 is a schematic view of a limiting structure according to an embodiment of the present application.

Fig. 3 is a schematic structural view of a base according to an embodiment of the present application.

FIG. 4 is a cross-sectional view of a base along the direction A-A' according to one embodiment of the present application.

Fig. 5 is a schematic view of a position adjustment structure according to an embodiment of the present application.

Fig. 6 is a schematic structural view of a metallographic specimen holder according to an embodiment of the present application.

Fig. 7 is a schematic view of a position adjustment structure according to an embodiment of the present application.

FIG. 8 is a cross-sectional view of a metallographic specimen holder according to an embodiment of the present application along the direction B-B'.

Description of element reference numerals

1. Metallographic specimen holder

11. Object placing table

111. Dovetail tenon

112. Platform part

113. Rack bar

12. Base seat

121. First side wall

122. A second side wall

1221. First through hole

123. A third side wall

1231. Second through hole

124. Dovetail groove

125. Locking structure

13. Position adjusting structure

131. Gear shaft

1311. Screw thread

132. Rotary adjusting structure

1321. Hand wheel

14. Supporting seat

Detailed Description

Other advantages and effects of the present application will become apparent to those skilled in the art from the present disclosure, when the following description of the embodiments is taken in conjunction with the accompanying drawings. The present application may be embodied or carried out in other specific embodiments, and the details of the present application may be modified or changed from various points of view and applications without departing from the spirit of the present application. It should be noted that the following embodiments and features in the embodiments may be combined with each other without conflict.

It should be noted that, the illustrations provided in the following embodiments merely illustrate the basic concepts of the application by way of illustration, and only the components related to the application are shown in the drawings and are not drawn according to the number, shape and size of the components in actual implementation, and the form, number and proportion of the components in actual implementation may be arbitrarily changed, and the layout of the components may be more complex.

In the description of the present application, it should be understood that the terms "center," "longitudinal," "transverse," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," etc. indicate or are based on the orientation or positional relationship shown in the drawings, merely for convenience of description and to simplify the description, and do not indicate or imply that the apparatus or element referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present application.

In this application, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

In the preparation of a metallographic specimen in the early stage, a metallographic specimen holder is often required, and the operation steps for detecting the metallographic specimen can be simplified in the detection of a metallographic microscope. However, the metallographic samples are different in size and different in height, so that the height cannot be adjusted in the prior art, and the distance between the observation surface of the metallographic sample and the eyepiece is kept consistent.

At least in view of the foregoing, embodiments of the present application provide a metallographic specimen holder, including: the object placing table is movably connected with the base and can move up and down relative to the base. The metallographic specimen holder is provided with a storage table movably connected with the base, the storage table can move up and down relative to the base, the height of a metallographic specimen can be adjusted, and the purpose that the distance between an observation surface of the metallographic specimen and an ocular is kept consistent is achieved. The application metallographic specimen holder still be provided with limit structure, limit structure can avoid the rocking of metallographic specimen, guarantees to put the thing platform at the stationarity of removal in-process. Further, in some embodiments, the metallographic specimen holder described herein may further comprise a locking structure. The locking structure can be used for fixing the position of the object placing table, so that the height of the object placing table is unchanged in the observation process of a metallographic microscope, and the detection efficiency of the metallographic microscope is improved.

For the purposes of making the objects, technical solutions and advantages of the embodiments of the present application more clear, the technical solutions of the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is apparent that the described embodiments are some of the embodiments of the present application, but not all of the embodiments. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure. Accordingly, the following detailed description of the embodiments of the present application, provided in the accompanying drawings, is not intended to limit the scope of the application, as claimed, but is merely representative of selected embodiments of the application. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.

Fig. 1 is a schematic structural view of a metallographic specimen holder according to an embodiment of the present application. As shown in fig. 1, the metallographic specimen holder 1 includes a placement table 11 and a base 12. The placement table 11 is movably connected with the base 12 and can move up and down relative to the base 12. In some possible implementations, the storage stage 11 may be a square platform structure. In other possible implementations, the placement table 11 may also be a platform structure with concave holes. In some possible implementations, the base 12 may be a prism movably connected to the table 11. In other possible implementations, the base 12 may also be a hollow frame that is movably connected to the table 11. It should be noted that the above is only a possible embodiment of the present application, and the present application is not limited thereto.

In still another embodiment of the present application, the placement table 11 may be used for placing metallographic plasticine, a metallographic specimen to be detected may be placed on the metallographic plasticine, and the placement table 11 drives the metallographic specimen to move up and down while moving up and down relative to the base 12. The height of the metallographic specimen can be adjusted, and the aim of keeping the distance between the observation surface of the metallographic specimen and the ocular lens consistent is fulfilled.

Fig. 2 is a schematic view of a limiting structure according to an embodiment of the present application. As shown in fig. 2, the base 12 includes a limiting structure for limiting a moving direction of the object placing table 11 so that the object placing table 11 can move up and down relative to the base, and a position adjusting structure for driving the object placing table 11 to move up and down along the base. The base 12 has a first side wall, the limiting structure is a dovetail groove 124 milled along the up-down direction of the first side wall 121, and the object placing table 11 has a dovetail 111 matched with the dovetail groove. The dovetail groove 124 includes two concave corner structures, which can be used to fix the position. Dovetail 111 includes two male angular structures that mate with dovetail slot 124 and may be adapted to movably couple with female structures of dovetail slot 124. The limiting structure can avoid shaking of the metallographic specimen, and stability of the object placing table in the moving process is guaranteed. In some possible implementations, the dovetail 111 of the placement stage 11 is engaged with the dovetail groove 124 of the base 12 to form a limiting structure that can assist in fixing the placement stage 11 to the base 12 and moving in the up-down direction of the base 12. The limiting structure can avoid the shaking of the metallographic specimen, and ensures the stability of the object placing table 11 in the moving process.

Fig. 3 is a schematic structural view of a base according to an embodiment of the present application. As shown in fig. 3, the base 12 includes a first sidewall 121, a second sidewall 122, a third sidewall 123, and a first through hole 1221. Wherein the first via 1221 is located on the second sidewall 122. In some possible implementations, the through hole 1221 may be a round hole structure or a square hole structure, which is not limited in this application.

FIG. 4 is a cross-sectional view of a base along the direction A-A' according to one embodiment of the present application. As shown in fig. 4, the base 12 includes a first sidewall 121, a second sidewall 122, a third sidewall 123, a first through hole 1221, and a second through hole 1231. Wherein the first through hole 1221 is located on the second sidewall 122, and the second through hole 1231 is located on the third sidewall 123. In some possible implementations, the position of the through hole 1221 of the second side wall 122 on the second side wall 122 corresponds to the position of the through hole 1231 of the third side wall 123 on the third side wall 123, for fixing the position adjustment structure of the metallographic specimen holder 1 described herein. In other possible implementations, the position of the through hole 1221 of the second side wall 122 on the second side wall 122 may not correspond to the position of the through hole 1231 of the third side wall 123 on the third side wall 123, and only the position adjustment structure of the metallographic specimen holder 1 described in the present application need to be fixed. It should be noted that the above is only two possible implementations of the present application, and the present application is not limited thereto.

Fig. 5 is a schematic view of a position adjustment structure according to an embodiment of the present application. As shown in fig. 5, the storage table 11 includes a dovetail 111, a platform portion 112, and a rack 113, the rack 113 being located below the storage table 11. The position adjustment structure 13 comprises a gear shaft 131, the gear shaft 131 being in driving connection with the rack 113. The rack 113 is connected to the storage platform 11, and in some possible implementations, the rack 113 is fixedly connected to a platform of the storage platform 11, and the connection manner may be welding, plugging, or screw connection, but the application is not limited thereto. The position adjusting structure comprises a gear shaft 131, and the gear shaft 131 is in transmission connection with the rack 113. In some possible implementations, the driving connection of the gear shaft 131 with the rack 113 may be a gear driving connection, the effect of which is achieved by tooth-to-tooth engagement. For example, counterclockwise rotation of the gear shaft 131 may drive the rack 113 to move downward, and clockwise rotation of the gear shaft 131 may drive the rack 113 to move upward. It should be noted that the above is only one possible implementation manner of the present application, and the present application is not limited thereto.

Fig. 6 is a schematic structural view of a metallographic specimen holder according to an embodiment of the present application. As shown in fig. 6, the position adjustment structure 13 further includes a rotation adjustment structure 132, and the rotation adjustment structure 132 is disposed at a first end of the gear shaft 131.

In yet another embodiment of the present application, the rotation adjustment structure 132 further includes a hand wheel 1321. In some possible implementations, the handwheel 1321 may be a cylindrical rotatable structure. In other possible implementations, the handwheel 1321 may be a swingable handle, which is not limited to this disclosure.

In yet another embodiment of the present application, the base 12 further comprises a locking structure 125, wherein the locking structure 125 is configured to lock the position adjustment structure 13 when the table 11 is moved to the target position. In some possible implementations, the locking structure 125 may be a bolt that mates with threads 1311 of the second end of the gear shaft 131 in the position adjustment structure 13. It should be understood that the above is only one possible way of implementing the embodiments of the present application, and in other possible implementations, the locking structure 125 may be other structures that can lock the position adjustment structure 13, such as a buckle and a slot.

In yet another embodiment of the present application, the metallographic specimen holder 1 includes a placement table 11, a base 12, a position adjustment structure 13, and a support base 14. The supporting seat 14 is disposed below the base 12, and is used for supporting the base 12, and can be used for avoiding the influence of shaking of the base 12 on the stability of the metallographic specimen.

Fig. 7 is a schematic view of a position adjustment structure according to an embodiment of the present application. As shown in fig. 7, the position adjustment structure 13 includes a gear shaft 131 and a rotation adjustment structure 132. The second end of the gear shaft 131 has threads 1311, the first end of the gear shaft 131 has a rotation adjustment structure 132 having a hand wheel 1321.

FIG. 8 is a cross-sectional view of a metallographic specimen holder according to an embodiment of the present application along the direction B-B'. As shown in fig. 8, the metallographic specimen holder 1 includes a placement table 11, a base 12, a position adjustment structure 13, and a support base 14. The storage platform 11 includes a dovetail 111, a platform portion 112, and a rack 113. The base 12 includes a first side wall 121, a second side wall 122, a third side wall 123, a dovetail slot 124, and a locking structure 125. The second sidewall has a first through hole 1221 and the third sidewall 123 has a second through hole 1231. The position adjustment structure 13 includes a gear shaft 131 and a rotation adjustment structure 132. The gear shaft 131 includes threads 1311 and the rotation adjustment structure 132 includes a hand wheel 1321.

In some possible implementations, the method of using the metallographic specimen holder 1 is as follows: the placement table 11 is adjusted to a proper height by the position adjusting structure 13 and is fixed by the locking structure 125 of the base. A proper amount of metallographic plasticine is placed on the platform part 112 of the object placing table 11, and the observation surface of the metallographic specimen is upward and placed on the metallographic plasticine. And placing dust-free paper on the metallographic sample, and flattening the metallographic sample by using a flattening device. And (3) loosening the flattening device, slightly shaking the metallographic specimen holder 1, checking whether the metallographic specimen is loose or not, and if the observation surface is obviously inclined or not, detecting the metallographic specimen by using a metallographic microscope.

To sum up, the application provides a metallographic specimen holder, this application metallographic specimen holder be provided with put thing platform with base swing joint, put thing platform can reciprocate relative to the base, adjusts the height of metallographic specimen, realizes the metallographic specimen and observes the purpose that the face keeps unanimous with the distance of eyepiece. The application metallographic specimen holder still be provided with limit structure, limit structure can avoid the rocking of metallographic specimen, guarantees to put the thing platform at the stationarity of removal in-process. Further, in some embodiments, the metallographic specimen holder described herein may further comprise a locking structure. The locking structure can be used for fixing the position of the object placing table, so that the height of the object placing table is unchanged in the observation process of a metallographic microscope, and the detection efficiency of the metallographic microscope is improved.

The description of the corresponding structures in the above drawings has emphasis, and for the part of a structure that is not described in detail, reference may be made to the related description of other structures.

The foregoing embodiments are merely illustrative of the principles of the present application and their effectiveness, and are not intended to limit the application. Modifications and variations may be made to the above-described embodiments by those of ordinary skill in the art without departing from the spirit and scope of the present application. Accordingly, it is intended that all equivalent modifications and variations which may be accomplished by persons skilled in the art without departing from the spirit and technical spirit of the disclosure be covered by the claims of this application.

Claims (9)

1. A metallographic specimen holder, comprising: the object placing table is movably connected with the base and can move up and down relative to the base; wherein, the base includes:

the limiting structure is used for limiting the moving direction of the object placing table so that the object placing table can move up and down relative to the base;

and the position adjusting structure is used for driving the object placing table to move up and down along the base.

2. The metallographic specimen holder according to claim 1, wherein the base has a first side wall, the limit structure is a dovetail groove milled in an up-down direction of the first side wall, and the stage has a dovetail matched with the dovetail groove.

3. The metallographic specimen holder according to claim 2, wherein the rack is arranged below the object placing table, the position adjusting structure comprises a gear shaft, the base is further provided with a second side wall, the second side wall is provided with a first through hole, the gear shaft is in transmission connection with the rack, and the first end of the gear shaft penetrates through the first through hole.

4. A metallographic specimen holder according to claim 3, wherein the position adjustment structure further comprises a rotation adjustment structure provided at a first end of the gear shaft.

5. The metallographic specimen holder according to claim 4, wherein the rotation adjustment structure comprises a handwheel.

6. A metallographic specimen holder according to claim 3, wherein the base further comprises a third side wall disposed opposite the second side wall, the third side wall having a second through hole through which the second end of the gear shaft passes.

7. The metallographic specimen holder according to claim 6, wherein the second end of the gear shaft is threaded.

8. The metallographic specimen holder according to claim 1, wherein the base further comprises a locking structure for locking the position adjustment structure when the deposit table is moved to a target position.

9. The metallographic specimen holder according to claim 1, comprising a support base disposed below the base for supporting the base.

Images