CN219065626U

CN219065626U - 60Hz temperature rise test device

Info

Publication number: CN219065626U
Application number: CN202223229751.XU
Authority: CN
Inventors: 胡崴; 张长春; 张俊岭; 王鹏; 赵尚; 王广大; 关海亮; 李宁
Original assignee: Qingdao Marine Equipment Research Institute Co ltd
Current assignee: Qingdao Marine Equipment Research Institute Co ltd
Priority date: 2022-12-02
Filing date: 2022-12-02
Publication date: 2023-05-23
Anticipated expiration: 2032-12-02

Abstract

The utility model relates to a 60Hz temperature rise test device, which comprises a test loop and a centralized control system, wherein a programmable alternating voltage source in the test loop is connected with the power supply input of a sample cabinet through a disconnecting switch and a current booster in sequence, the power supply output of the sample cabinet is connected back to the programmable alternating voltage source, a loop measurer is connected with the front stage and the rear stage of the current booster, and a data collector is connected with an I/O interface of the sample cabinet; the centralized control system comprises a control and protection module and an upper computer; the input end of the control and protection module is connected with the loop measurer, and the output end of the control and protection module is respectively connected with the programmable alternating current voltage source and the isolating switch; the input end of the upper computer is connected with the data collector. The 60Hz temperature rise test device can directly perform 60Hz temperature rise test, realizes accurate control of various test parameters, meets test requirements of diversification and convenience, effectively prevents test loop faults or damages caused by equipment or tested products, and improves reliability of the device.

Description

60Hz temperature rise test device

Technical Field

The utility model relates to the technical field of electrical equipment test detection, in particular to a 60Hz temperature rise test device.

Background

The traditional alternating-current temperature rise test power supply system generally adopts a power grid to directly supply power, and the power supply frequency of the existing power grid is 50Hz, so that most test systems can only meet the temperature rise test requirement of 50Hz, and the temperature rise test with the frequency of 50Hz can not be directly realized. However, with the continuous expansion of the market and the increase of the test requirements of some marine electrical equipment, the 60Hz temperature rise test device which is stable, reliable and convenient to use becomes the requirement of the electrical equipment industry.

Disclosure of Invention

The utility model aims to solve the technical problems that: aiming at the situation that the temperature rise test under the frequency of 60Hz can not be directly realized under the power supply of the existing power grid, the 60Hz temperature rise test device is provided, the 60Hz temperature rise test can be directly carried out by taking a programmable alternating current voltage source as a test power supply on the basis of meeting the requirement of the traditional conventional 50Hz temperature rise test, the accurate control of various test parameters is realized, the local control or the remote control is realized by matching with a centralized control system, the test requirements of diversification and convenience are met, and in addition, the overvoltage and overcurrent protection is carried out on a test loop by utilizing a control protection module, so that the faults or the damages of the test loop caused by equipment or the reasons of tested products can be effectively prevented, and the reliability of the device is improved.

The 60Hz temperature rise test device comprises a programmable alternating current voltage source, a current booster, a test article cabinet, a data acquisition device, a loop measurer, an isolating switch and a centralized control system which is in communication connection with the test loop, wherein the programmable alternating current voltage source in the test loop is connected with the power supply input of the test article cabinet through the isolating switch and the current booster in sequence, the power supply output of the test article cabinet is connected back to the programmable alternating current voltage source, the loop measurer is connected with the front stage and the rear stage of the current booster, and the data acquisition device is connected with the I/O interface of the test article cabinet; the centralized control system comprises a control and protection module and an upper computer; the input end of the control and protection module is connected with the loop measurer, and the output end of the control and protection module is respectively connected with the programmable alternating current voltage source and the isolating switch; the input end of the upper computer is connected with the data acquisition device.

The circuit measurer is electrically connected with the control and protection module and outputs an analog signal to the control and protection module; the output end of the control and protection module is electrically connected with the programmable alternating-current voltage source and the isolating switch, and outputs switching value signals to the programmable alternating-current voltage source and the isolating switch.

In order to ensure the stability of signals, when a wired communication connection scheme is adopted, the data collector is in data connection with the upper computer through the RS485 interface module and the twisted pair, and outputs data signals to the upper computer.

In order to realize convenient and flexible connection of the test loop and the centralized control system, when the wireless communication connection scheme is adopted, the data acquisition device is in data connection with the upper computer through the wireless transparent transmission module and outputs data signals to the upper computer.

According to the 60Hz temperature rise test device, aiming at the condition that the temperature rise test at the frequency of 60Hz can not be directly realized under the power supply of the existing power grid, on the basis that the traditional conventional 50Hz temperature rise test requirement can be met, the 60Hz temperature rise test can be directly carried out by taking the programmable alternating current voltage source as a test power supply, the accurate control of various test parameters is realized, the local control or the remote control is realized by matching with a centralized control system, the test requirements of diversification and convenience are met, and in addition, the overvoltage and overcurrent protection is carried out on a test loop by utilizing a control protection module, so that the fault or the damage of the test loop caused by equipment or a tested product can be effectively prevented, and the reliability of the device is improved.

Drawings

The 60Hz temperature rise test device of the utility model is further described below with reference to the accompanying drawings:

FIG. 1 is a schematic diagram showing the connection of the logic structure of embodiment 1 of the 60Hz temperature rise test device;

FIG. 2 is a schematic diagram showing the connection of the logic structure of embodiment 2 of the 60Hz temperature rise test device;

FIG. 3 is a circuit diagram of the test circuit of the 60Hz temperature rise test device.

In the figure:

1-a test loop; 11-programmable alternating current voltage source, 12-current booster, 13-sample cabinet, 14-loop measurer, 15-data collector and 16-isolating switch;

2-a centralized control system; 21-control and protection module, 22-upper computer.

Detailed Description

In the present utility model, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.

In the description of the present utility model, it should be understood that the terms "left", "right", "front", "rear", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are merely for convenience in describing the present utility model and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present utility model.

The technical scheme of the present utility model will be further described by the following specific examples, but the scope of the present utility model is not limited to the following examples.

Embodiment 1: as shown in fig. 1 and 3, the 60Hz temperature rise test device comprises a programmable alternating voltage source 11, a current booster 12, a test object cabinet 13, a data acquisition unit 14, a loop measurer 15, a disconnecting switch 16 and a centralized control system 2 which is in communication connection with the test object cabinet 1, wherein in the test object cabinet 1, the programmable alternating voltage source 11 is connected with a power supply input of the test object cabinet 13 through the disconnecting switch 16 and the current booster 12 in sequence, a power supply output of the test object cabinet 13 is connected with the programmable alternating voltage source 11, the loop measurer 14 is connected with a front stage and a rear stage of the current booster 12, and the data acquisition unit 15 is connected with an I/O interface of the test object cabinet 13; the centralized control system 2 comprises a control and protection module 21 and an upper computer 22; the input end of the control and protection module 21 is connected with the loop measurer 14, and the output end of the control and protection module 21 is respectively connected with the programmable alternating current voltage source 11 and the isolating switch 16; the input end of the upper computer 22 is connected with the data collector 15.

The loop measurer 14 is electrically connected with the control and protection module 21, and outputs an analog signal to the control and protection module 21; the output end of the control and protection module 21 is electrically connected with the programmable alternating voltage source 11 and the isolating switch 16, and outputs switching value signals to the programmable alternating voltage source 11 and the isolating switch 16. The data collector 15 is in data connection with the upper computer 22 through an RS485 interface module and a twisted pair, and outputs data signals to the upper computer 22. And an in-situ control scheme of wired communication connection is adopted, so that the signal stability is ensured.

Embodiment 2: as shown in FIG. 2, the data collector 15 of the 60Hz temperature rise test device is in data connection with the upper computer 22 through a wireless transparent transmission module, and outputs data signals to the upper computer 22. The test loop is connected with the centralized control system conveniently and flexibly by adopting a remote control scheme of wireless communication connection. The remaining structures and components are as described in embodiment 1, and a description thereof will not be repeated.

In the test loop: the programmable alternating current voltage source is used for providing required voltage and frequency for the test, meets the requirement of a temperature rise test, can output the highest 1000V phase voltage, is adjustable in voltage value, and can adjust the output frequency within the range of 40 Hz-65 Hz; the programmable alternating current voltage source can select a specified phase output voltage, and the value, frequency and phase of the output voltage are adjustable; and the programmable ac voltage source can be operated according to a preset program, and the waveform of the output voltage can be set, etc. The booster is used for regulating voltage and boosting the voltage output by the programmable alternating-current voltage source. The isolating switch is used for connecting and disconnecting the circuit, and when the circuit measurer detects an overvoltage and overcurrent signal, the circuit is disconnected according to the output switching value of the control and protection module. The data acquisition device is used for acquiring temperature data of each part of the tested product and temporarily storing temperature rise test data. The loop measurer is used for collecting and storing parameters such as voltage, current and the like of the test loop and the tested product.

In the centralized control system: the control and protection module is used for controlling the programmable alternating current voltage source, the current booster and the isolating switch, outputting an off instruction signal to the isolating switch when receiving the overcurrent and overvoltage signal, and preventing equipment in the test loop from being damaged.

The upper computer is used for displaying and storing the temperature data of each part of the sample acquired by the data acquisition unit, and generating a temperature change curve through analysis.

The 60Hz temperature rise test device has the beneficial effects that the 60Hz temperature rise test device can directly realize the condition that the temperature rise test under the 60Hz frequency can not be directly realized under the power supply of the existing power grid, on the basis that the traditional conventional 50Hz temperature rise test requirement can be met, the 60Hz temperature rise test can be directly carried out by taking the programmable alternating current voltage source as a test power supply, the accurate control of various test parameters is realized, the local control or the remote control is realized by matching with a centralized control system, the test requirements of diversification and convenience are met, and in addition, the overvoltage and overcurrent protection is carried out on a test loop by utilizing a control protection module, so that the test loop faults or damages caused by equipment or the reasons of tested products can be effectively prevented, and the reliability of the device is improved.

The foregoing description illustrates the major features, principles, and advantages of the utility model. It will be evident to those skilled in the art that the utility model is not limited to the details of the foregoing illustrative embodiments or examples, and that the present utility model may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The foregoing implementations or examples should be regarded as illustrative rather than limiting. The scope of the utility model is indicated by the appended claims rather than by the foregoing description, and all changes that come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Furthermore, it should be understood that although the present disclosure describes embodiments, not every embodiment is provided with a separate embodiment, and that this description is provided for clarity only, and that the disclosure is not limited to the embodiments described in detail below, and that the embodiments described in the examples may be combined as appropriate to form other embodiments that will be apparent to those skilled in the art.

Claims

1. A60 Hz temperature rise test device is characterized in that: comprises a programmable alternating current voltage source (11), a current booster (12), a sample cabinet (13), a loop measurer (14), a data collector (15), an isolating switch (16) and a centralized control system (2) which is in communication connection with the test loop (1),

in the test loop (1), a programmable alternating current voltage source (11) is connected with a power supply input of a sample cabinet (13) through a disconnecting switch (16) and a current booster (12), a power supply output of the sample cabinet (13) is connected back to the programmable alternating current voltage source (11), a loop measurer (14) is connected with a front stage and a rear stage of the current booster (12), and a data collector (15) is connected with an I/O interface of the sample cabinet (13);

the centralized control system (2) comprises a control and protection module (21) and an upper computer (22); the input end of the control and protection module (21) is connected with the loop measurer (14), and the output end of the control and protection module (21) is respectively connected with the programmable alternating current voltage source (11) and the isolating switch (16); the input end of the upper computer (22) is connected with the data collector (15).

2. The 60Hz temperature rise test apparatus of claim 1 wherein: the loop measurer (14) is electrically connected with the control and protection module (21) and outputs an analog signal to the control and protection module (21); the output end of the control and protection module (21) is electrically connected with the programmable alternating voltage source (11) and the isolating switch (16) and outputs switching value signals to the programmable alternating voltage source (11) and the isolating switch (16).

3. The 60Hz temperature rise test apparatus of claim 2 wherein: the data collector (15) is in data connection with the upper computer (22) through the RS485 interface module and the twisted pair, and outputs data signals to the upper computer (22).

4. The 60Hz temperature rise test apparatus of claim 2 wherein: the data collector (15) is in data connection with the upper computer (22) through the wireless transparent transmission module, and outputs data signals to the upper computer (22).