CN218674781U - Semiconductor device detection device - Google Patents

Semiconductor device detection device Download PDF

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Publication number
CN218674781U
CN218674781U CN202221969028.2U CN202221969028U CN218674781U CN 218674781 U CN218674781 U CN 218674781U CN 202221969028 U CN202221969028 U CN 202221969028U CN 218674781 U CN218674781 U CN 218674781U
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detection
semiconductor device
fixed
base
slide
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CN202221969028.2U
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郑双明
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Shanghai Chexin Technology Co ltd
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Shanghai Chexin Technology Co ltd
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

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Abstract

The utility model provides a semiconductor device detection device, which relates to the technical field of semiconductors and comprises a base, a fixed station and a detection table, wherein the fixed station is arranged at the upper end of the base, and the detection table is fixed on the upper surface of the base; the beneficial effects of the utility model reside in that: through letting electric telescopic handle use detection end and slide junction to stimulate left detection end as the axle center, or promote right the detection end, can let the detection end can change to semiconductor device's shooting angle, can let the user shoot the detection to semiconductor device as required, through letting the motor circular telegram and drive the threaded rod and rotate, and let the slide can control about leading to the inslot, convenient to use person adjusts the position that detects the end and detect the camera, thereby let the user detect semiconductor device through detecting the camera, through the combination with electric telescopic handle, be favorable to improving the practicality to semiconductor device detection device.

Description

Semiconductor device detection device
Technical Field
The utility model relates to the field of semiconductor technology, mainly relate to a semiconductor device detection device.
Background
The semiconductor device is an electronic device which has the conductivity between a good electric conductor and an insulator and utilizes the special electric characteristics of a semiconductor material to complete a specific function, the semiconductor device can be used for generating, controlling, receiving, converting, amplifying signals and carrying out energy conversion, the semiconductor device needs to be detected after production in order to ensure the subsequent usability of the semiconductor device, the surface of the semiconductor device can be prevented from being worn or defective to influence the subsequent use, the surface of the semiconductor device needs to be shot and detected when the surface of the semiconductor device is detected, and when the conventional semiconductor device detection device is used for shooting and detecting the semiconductor device, the shooting end position is usually fixed, so that the shooting angle is difficult to be effectively adjusted, and the shooting and detection of the semiconductor device is limited.
SUMMERY OF THE UTILITY MODEL
The utility model aims at the problem that above-mentioned exists with not enough, provide a semiconductor device detection device to solve the problem that proposes in the above-mentioned background art.
In order to achieve the purpose, the adopted technical scheme is as follows:
a semiconductor device detection device comprises a base, a fixed table and a detection table, wherein the fixed table is arranged at the upper end of the base, and the detection table is fixed on the upper surface of the base;
the detection device comprises a base, a fixed table and a detection plate, and is characterized in that the detection plate is arranged between the base and the fixed table, an adjusting assembly is arranged on the detection plate, the adjusting assembly comprises a threaded rod, a sliding seat and a detection end, a through groove penetrating through the lower surface of the detection plate is formed in the detection plate, the threaded rod is rotatably connected in the through groove, the sliding seat is embedded on the surface of the threaded rod in a threaded sliding manner, the detection end is rotatably arranged at the lower end of the sliding seat, and an electric telescopic rod is arranged at the rear end of the sliding seat.
Preferably, the fixed table is provided with a driving end, and the output end of the driving end is fixed with the upper surface of the detection plate.
The detection device comprises a base, wherein the left side and the right side of the upper surface of the base are respectively fixed with a support rod, the upper end of each support rod penetrates through a detection plate and is connected with a fixing table, and the detection plates are connected with the support rods in a sliding mode.
The preference includes, the side channel has all been seted up to logical inslot wall front and back side, both sides surface all is fixed with the stopper around the slide, the stopper slides and imbeds the side channel, the electric telescopic handle output is connected with detection end rear side, detection end lower extreme passes through out logical groove and is provided with the detection camera.
The detection table is characterized in that clamping plates are arranged on the left side and the right side of the detection table, protective pads are fixed on the lower surfaces of the clamping plates, and fixing rods connected with the clamping plates in a rotating mode are fixed on the surfaces of the left side and the right side of the detection table.
The detection table is characterized in that the left and right side surfaces of the detection table are respectively fixed with an adjusting rod, the adjusting rods are located at the lower ends of the fixing rods, springs are embedded at the inner ends of the outer surfaces of the adjusting rods, the lower ends of the clamping plates are slidably embedded in the surfaces of the adjusting rods and are in contact with the outer ends of the springs, fastening sleeves are embedded in the outer ends of the adjusting rods in a threaded manner, and the right ends of the fastening sleeves are in contact with the right sides of the lower ends of the clamping plates.
By adopting the technical scheme, the beneficial effects are as follows:
through letting electric telescopic handle use detection end and slide junction to stimulate left detection end as the axle center, or promote right the detection end, can let the detection end can change to semiconductor device's shooting angle, can let the user shoot the detection to semiconductor device as required, through letting the motor circular telegram and drive the threaded rod and rotate, and let the slide can control about leading to the inslot, convenient to use person adjusts the position that detects the end and detect the camera, thereby let the user detect semiconductor device through detecting the camera, through the combination with electric telescopic handle, be favorable to improving the practicality to semiconductor device detection device.
Through letting the grip block use the dead lever as the axle center under the adapter sleeve promotes and slide along adjusting the pole, the grip block of being convenient for carries out the centre gripping to semiconductor device, and the protection on the grip block fills up and can support semiconductor device, can play better centre gripping guard action to semiconductor device to this, convenient to use person carries out the centre gripping to semiconductor device fixedly, and the centre gripping regulative mode is simple and convenient.
Drawings
Fig. 1 is a schematic view of the overall front view cross-sectional structure of the present invention;
FIG. 2 is a schematic view of the cross-section A of FIG. 1 according to the present invention;
fig. 3 is a schematic view of the left-side sectional structure of the detection plate of the present invention.
The labels in the figure are: the device comprises a base 1, a fixed table 2, a supporting rod 3, a detection plate 4, a detection table 5, a clamping plate 6, a motor 7, a threaded rod 8, a sliding seat 9, a detection end 10, a detection camera 11, an electric telescopic rod 12, a driving end 13, a protection pad 14, a fixed rod 15, an adjusting rod 16, a fastening sleeve 17, a spring 18 and a limiting block 19.
Detailed Description
In order to make the purpose, technical features and technical effects of the technical solution of the present invention clearer, the drawings of the embodiments of the present invention are combined together, and the example solution of the embodiments of the present invention is clearly and completely described.
Referring to fig. 1 to 3, the present application is a semiconductor device inspection apparatus, including a base 1, a fixing stage 2 and an inspection stage 5, wherein the fixing stage 2 is disposed at an upper end of the base 1, and the inspection stage 5 is fixed on an upper surface of the base 1;
clamping plates 6 are arranged on the left side and the right side of the detection table 5, protective pads 14 are fixed on the lower surfaces of the clamping plates 6, fixing rods 15 rotatably connected with the clamping plates 6 are fixed on the surfaces of the left side and the right side of the detection table 5, adjusting rods 16 are fixed on the surfaces of the left side and the right side of the detection table 5, the adjusting rods 16 are located at the lower ends of the fixing rods 15, springs 18 are nested at the inner ends of the outer surfaces of the adjusting rods 16, the lower ends of the clamping plates 6 are slidably nested on the surfaces of the adjusting rods 16 and are in contact with the outer ends of the springs 18, fastening sleeves 17 are nested at the outer ends of the adjusting rods 16 in a threaded manner, and the right ends of the fastening sleeves 17 are in contact with the right sides of the lower ends of the clamping plates 6;
as shown in fig. 1 and fig. 2, when the semiconductor device clamping device is used, the fastening sleeve 17 is rotated to push the lower end of the clamping plate 6, and the clamping plate 6 is rotatably connected with the fixing rod 15, so that the clamping plate 6 slides along the adjusting rod 16 by taking the fixing rod 15 as an axis under the pushing of the fastening sleeve 17, meanwhile, the lower end of the clamping plate 6 applies pressure to the spring 18 and contracts, then the upper end of the clamping plate 6 tilts outwards, then, a user places the semiconductor device to be detected on the detection table 5, and then, rotates the fastening sleeve 17 again and moves outwards along the adjusting rod 16, and the clamping plate 6 recovers an initial position by taking the fixing rod 15 as an axis under the elastic force of the spring 18, and then, the clamping plate 6 clamps the semiconductor device on the detection table 5, and the protection pad 14 on the clamping plate 6 abuts against the semiconductor device, so that the semiconductor device can be well clamped and protected, and thus, the user can clamp and fix the semiconductor device conveniently, the clamping and adjusting manner is simple and convenient for the user to operate;
a detection plate 4 is arranged between the base 1 and the fixed table 2, a driving end 13 is arranged on the fixed table 2, the output end of the driving end 13 is fixed with the upper surface of the detection plate 4, support rods 3 are fixed on the left side and the right side of the upper surface of the base 1, the upper ends of the support rods 3 penetrate through the detection plate 4 and are connected with the fixed table 2, and the detection plate 4 is connected with the support rods 3 in a sliding manner;
an adjusting assembly is arranged on the detection plate 4 and comprises a threaded rod 8, a sliding seat 9 and a detection end 10, a through groove penetrating through the lower surface of the detection plate 4 is formed in the detection plate 4, the threaded rod 8 is rotatably connected in the through groove, the sliding seat 9 is in threaded sliding nesting with the surface of the threaded rod 8, the detection end 10 is rotatably arranged at the lower end of the sliding seat 9, an electric telescopic rod 12 is arranged at the rear end of the sliding seat 9, side grooves are formed in the front and rear sides of the inner wall of the through groove, limiting blocks 19 are fixed on the surfaces of the front and rear sides of the sliding seat 9, the limiting blocks 19 are slidably embedded in the side grooves, the output end of the electric telescopic rod 12 is connected with the rear side of the detection end 10, and the lower end of the detection end 10 penetrates through the through groove and is provided with a detection camera 11;
after the above operations are completed, as can be seen from fig. 1 and 3, by connecting and energizing the driving end 13 to an external power source, then the driving end 13 pushes the detection board 4 downwards, then the detection board 4 moves downwards along the support bar 3, then, when the detection end 10 moves downwards and the detection camera 11 approaches the semiconductor device, the detection of the semiconductor device can be performed by the detection camera 11, by bringing the detection camera 11 close to or away from the semiconductor device, the user can adjust the sharpness of the shot detection of the semiconductor device as desired, the user can detect the semiconductor device, during this shot detection, by connecting and energizing the electric telescopic rod 12 to an external power source, then, the electric telescopic rod 12 pulls the detection end 10 leftwards with the connection between the detection end 10 and the slide 9 as an axis, or pushes the detection end 10 rightwards, at this time, the shooting angle of the semiconductor device by the detection end 10 changes, the user can shoot the semiconductor device as desired, which is advantageous for improving the practicality of the detection of the semiconductor device, furthermore, by energizing the motor 7 and driving the threaded rod 8 to rotate, since the slide 9 slides in the slide 9 along the detection groove 19, the detection end 9, and the slide is inserted in the detection groove 19, the detection of the detection device, and the slide, the detection device can be easily moved by the detection device, and the detection of the detection device, and the detection device can be easily moved by the detection device, and the detection device can be easily moved in the detection device, the practicability of the detection camera 11 for detecting the semiconductor device can be effectively improved.

Claims (6)

1. The utility model provides a semiconductor device detection device, includes base (1), fixed station (2) and examines test table (5), base (1) upper end is located in fixed station (2), examine test table (5) and be fixed in base (1) upper surface, its characterized in that:
be provided with pick-up plate (4) between base (1) and fixed station (2), be provided with adjusting part on pick-up plate (4), adjusting part includes threaded rod (8), slide (9) and test end (10), the inside logical groove that runs through its lower surface that is provided with of pick-up plate (4), threaded rod (8) are rotated and are connected in leading to the inslot, slide (9) screw thread slides and nests in threaded rod (8) surface, test end (10) are rotated and are set up in slide (9) lower extreme, slide (9) rear end is provided with electric telescopic handle (12).
2. A semiconductor device inspection apparatus according to claim 1, characterized in that: the detection device is characterized in that a driving end head (13) is arranged on the fixed table (2), and the output end of the driving end head (13) is fixed with the upper surface of the detection plate (4).
3. A semiconductor device inspection apparatus according to claim 1, characterized in that: the portable detection device is characterized in that supporting rods (3) are fixed on the left side and the right side of the upper surface of the base (1), the upper ends of the supporting rods (3) penetrate through the detection plate (4) and are connected with the fixing table (2), and the detection plate (4) is connected with the supporting rods (3) in a sliding mode.
4. A semiconductor device inspection apparatus according to claim 1, wherein: lead to the groove inner wall front and back side and all seted up the side channel, both sides surface all is fixed with stopper (19) around slide (9), stopper (19) slip embedding side channel, electric telescopic handle (12) output is connected with detection end (10) rear side, detection end (10) lower extreme runs through out logical groove and is provided with and detects camera (11).
5. A semiconductor device inspection apparatus according to claim 1, characterized in that: the utility model discloses a test table, including test table (5), it all is provided with grip block (6) to examine test table (5) left and right sides, grip block (6) lower fixed surface has protection pad (14), examine test table (5) left and right sides surface all be fixed with grip block (6) rotate dead lever (15) of being connected.
6. The semiconductor device inspection apparatus according to claim 5, wherein: detect platform (5) left and right sides surface and all be fixed with regulation pole (16), it is located dead lever (15) lower extreme to adjust pole (16), it has spring (18) to adjust pole (16) surface inner nested, grip block (6) lower extreme slip nested in adjust pole (16) surface and with spring (18) outer end contact, it has adapter sleeve (17) to adjust pole (16) outer end thread nested, adapter sleeve (17) right-hand member and grip block (6) lower extreme right side contact.
CN202221969028.2U 2022-07-28 2022-07-28 Semiconductor device detection device Active CN218674781U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202221969028.2U CN218674781U (en) 2022-07-28 2022-07-28 Semiconductor device detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202221969028.2U CN218674781U (en) 2022-07-28 2022-07-28 Semiconductor device detection device

Publications (1)

Publication Number Publication Date
CN218674781U true CN218674781U (en) 2023-03-21

Family

ID=85552445

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202221969028.2U Active CN218674781U (en) 2022-07-28 2022-07-28 Semiconductor device detection device

Country Status (1)

Country Link
CN (1) CN218674781U (en)

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